JPH0569189B2 - - Google Patents
Info
- Publication number
- JPH0569189B2 JPH0569189B2 JP60142065A JP14206585A JPH0569189B2 JP H0569189 B2 JPH0569189 B2 JP H0569189B2 JP 60142065 A JP60142065 A JP 60142065A JP 14206585 A JP14206585 A JP 14206585A JP H0569189 B2 JPH0569189 B2 JP H0569189B2
- Authority
- JP
- Japan
- Prior art keywords
- dead center
- elevating
- pair
- lifting
- roof guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003028 elevating effect Effects 0.000 claims description 72
- 238000005259 measurement Methods 0.000 claims description 22
- 210000001015 abdomen Anatomy 0.000 claims description 5
- 230000006835 compression Effects 0.000 description 4
- 238000007906 compression Methods 0.000 description 4
- 230000001105 regulatory effect Effects 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Landscapes
- Manipulator (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60142065A JPS622172A (ja) | 1985-06-28 | 1985-06-28 | Ｉｃハンドラの測定部 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60142065A JPS622172A (ja) | 1985-06-28 | 1985-06-28 | Ｉｃハンドラの測定部 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS622172A JPS622172A (ja) | 1987-01-08 |
| JPH0569189B2 true JPH0569189B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-09-30 |
Family
ID=15306613
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60142065A Granted JPS622172A (ja) | 1985-06-28 | 1985-06-28 | Ｉｃハンドラの測定部 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS622172A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0246157U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1988-09-22 | 1990-03-29 | ||
| JP2552184Y2 (ja) * | 1990-02-13 | 1997-10-27 | 株式会社アドバンテスト | レーザダイオードソケット用コンタクタ |
| JP2550120Y2 (ja) * | 1990-02-19 | 1997-10-08 | 株式会社アドバンテスト | Ｉｃ試験用ｉｃ接続装置 |
| JPH08220189A (ja) * | 1995-02-14 | 1996-08-30 | Advantest Corp | Ｉｃ試験装置用ハンドラのコンタクト構造 |
-
1985
- 1985-06-28 JP JP60142065A patent/JPS622172A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS622172A (ja) | 1987-01-08 |