JPH056669Y2 - - Google Patents
Info
- Publication number
- JPH056669Y2 JPH056669Y2 JP1985145606U JP14560685U JPH056669Y2 JP H056669 Y2 JPH056669 Y2 JP H056669Y2 JP 1985145606 U JP1985145606 U JP 1985145606U JP 14560685 U JP14560685 U JP 14560685U JP H056669 Y2 JPH056669 Y2 JP H056669Y2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- data
- test
- output
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 claims description 83
- 238000007689 inspection Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985145606U JPH056669Y2 (US20080094685A1-20080424-C00004.png) | 1985-09-24 | 1985-09-24 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985145606U JPH056669Y2 (US20080094685A1-20080424-C00004.png) | 1985-09-24 | 1985-09-24 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6252948U JPS6252948U (US20080094685A1-20080424-C00004.png) | 1987-04-02 |
JPH056669Y2 true JPH056669Y2 (US20080094685A1-20080424-C00004.png) | 1993-02-19 |
Family
ID=31057301
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1985145606U Expired - Lifetime JPH056669Y2 (US20080094685A1-20080424-C00004.png) | 1985-09-24 | 1985-09-24 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH056669Y2 (US20080094685A1-20080424-C00004.png) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5442522B2 (ja) * | 2010-04-12 | 2014-03-12 | 株式会社メガチップス | 半導体集積回路のテスト回路 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57210640A (en) * | 1981-06-18 | 1982-12-24 | Matsushita Electric Ind Co Ltd | Large scale integrated circuit |
JPS60169147A (ja) * | 1984-02-13 | 1985-09-02 | Nec Corp | 半導体集積回路 |
-
1985
- 1985-09-24 JP JP1985145606U patent/JPH056669Y2/ja not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57210640A (en) * | 1981-06-18 | 1982-12-24 | Matsushita Electric Ind Co Ltd | Large scale integrated circuit |
JPS60169147A (ja) * | 1984-02-13 | 1985-09-02 | Nec Corp | 半導体集積回路 |
Also Published As
Publication number | Publication date |
---|---|
JPS6252948U (US20080094685A1-20080424-C00004.png) | 1987-04-02 |
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