JPH0565805B2 - - Google Patents
Info
- Publication number
- JPH0565805B2 JPH0565805B2 JP58234652A JP23465283A JPH0565805B2 JP H0565805 B2 JPH0565805 B2 JP H0565805B2 JP 58234652 A JP58234652 A JP 58234652A JP 23465283 A JP23465283 A JP 23465283A JP H0565805 B2 JPH0565805 B2 JP H0565805B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- resistor
- detection device
- value
- calibrating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000010355 oscillation Effects 0.000 claims description 27
- 238000001514 detection method Methods 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 9
- 239000010408 film Substances 0.000 claims description 2
- 239000010409 thin film Substances 0.000 claims description 2
- 238000009966 trimming Methods 0.000 claims description 2
- 239000003990 capacitor Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Description
【発明の詳細な説明】
〔発明の技術分野〕
この発明は、発振回路に感温抵抗および基準抵
抗を備え、感温抵抗を用いた場合の発振周波数と
基準抵抗を用いた場合の発振周波数を比較するこ
とにより温度を計測する構成の温度検出装置を対
象とし、これを校正するための校正方法に関する
ものである。[Detailed Description of the Invention] [Technical Field of the Invention] The present invention provides an oscillation circuit with a temperature-sensitive resistor and a reference resistor, and a method for determining the oscillation frequency when the temperature-sensitive resistor is used and the oscillation frequency when the reference resistor is used. The present invention is directed to a temperature detection device configured to measure temperature by comparison, and relates to a calibration method for calibrating the same.
感温抵抗は素子自体に固有のバラツキをもつて
いるため、温度検出用として用いる場合には、抵
抗値のバラツキを補正する必要がある。
Since temperature-sensitive resistors have variations inherent to the elements themselves, when used for temperature detection, it is necessary to correct variations in resistance values.
従来、上記のような発振回路に感温抵抗および
基準抵抗を備えた温度検出装置を校正するには、
表示された温度や温度に換算されたデータを見な
がら基準抵抗の値を調整することが行なわれてい
た。しかし、この方法によると、周波数を温度に
変換するのに比較的長い時間を必要とし、基準抵
抗を調整する場合に周期毎にしか調整結果を得ら
れないので、ある程度の精度を得るためには、非
常に長い時間をかけなければならなかつた。ま
た、得られる精度は、表示された温度の最小桁あ
るいは温度に換算されたデータの最小ビツトが限
界であり精度の面でも不充分なものであつた。 Conventionally, in order to calibrate a temperature detection device equipped with a temperature-sensitive resistor and a reference resistor in the oscillation circuit as described above,
The value of the reference resistance was adjusted while looking at the displayed temperature and data converted to temperature. However, according to this method, it takes a relatively long time to convert the frequency to temperature, and when adjusting the reference resistance, the adjustment result can only be obtained every cycle, so it is difficult to obtain a certain degree of accuracy. , had to take a very long time. Furthermore, the accuracy that can be obtained is limited to the minimum digit of the displayed temperature or the minimum bit of data converted to temperature, and is insufficient in terms of accuracy.
しかも、この方法は人間の手で調整するもので
あるため、調整者の熟練度により精度および調整
時間が左右され、信頼性欠ける欠点があつた。 Furthermore, since this method requires manual adjustment, the accuracy and adjustment time depend on the skill level of the adjuster, resulting in a lack of reliability.
この発明は上記の事情に基づきなされたもの
で、短時間にしかも高精度な温度校正を安定して
行ない得る温度検出装置の校正方法を提供しよう
とするものである。
The present invention has been made based on the above-mentioned circumstances, and it is an object of the present invention to provide a method for calibrating a temperature detection device that can stably perform temperature calibration with high precision in a short time.
この発明は、発振器に感温抵抗および基準抵抗
を備えてこれらを切換えることにより得られる二
つの発振周波数を比較し、その差により温度を測
定する温度検出装置を対象としていて、その校正
を行う際に、温度Ｔで前記基準抵抗を接続したと
きの発振周波数fsが、感温抵抗を接続したときの
発振周波数fxと、温度Ｔと基準温度TSの差の数値
との比に基づいた値になるように基準抵抗を自動
的に調整するようにしたことを特徴としている。
This invention is directed to a temperature detection device that compares two oscillation frequencies obtained by switching between an oscillator with a temperature-sensitive resistor and a reference resistor, and measures the temperature based on the difference. , the oscillation frequency f s when the reference resistor is connected at temperature T is based on the ratio of the oscillation frequency f x when the temperature-sensitive resistor is connected and the numerical value of the difference between temperature T and reference temperature TS . The feature is that the reference resistance is automatically adjusted so that the value is the same.
この発明によれば、温度検出装置の校正の際の
基準抵抗の調整を、感温抵抗を接続したときの発
振周波数fxの実測値を用い、この実測値と温度Ｔ
と基準温度TSの差の数値の比に基づいて発振周
波数fsの調整値を求めるようになるので、きめ細
かく、精度の高い校正を実現することが可能にな
る。
According to this invention, the reference resistance is adjusted when calibrating the temperature detection device using the actual measured value of the oscillation frequency f x when the temperature sensitive resistor is connected, and this measured value and the temperature T
Since the adjustment value of the oscillation frequency f s is determined based on the ratio of the numerical value of the difference between the oscillation frequency f s and the reference temperature T s , it becomes possible to realize detailed and highly accurate calibration.
以下、図面を参照してこの発明の一実施例を説
明する。
Hereinafter, one embodiment of the present invention will be described with reference to the drawings.
まず、第１図によりこの発明の対象とする温度
検出装置について述べれば、第１図において、１
は温度に対して線形な特性を有する感温抵抗、２
は基準温度における感温抵抗１の抵抗値と等しい
値に調整される基準抵抗であり、これらの抵抗１
および２はスイツチ３により切換えられる構成が
とられている。 First, referring to FIG. 1, the temperature detection device to which the present invention is applied will be described.
is a temperature-sensitive resistor with linear characteristics with respect to temperature, 2
is a reference resistance that is adjusted to a value equal to the resistance value of temperature-sensitive resistor 1 at the reference temperature, and these resistances 1
and 2 are configured to be switched by a switch 3.
感温抵抗１および基準抵抗２はこれらの抵抗と
時定数回路を構成するコンデンサ４とともに発振
回路５に接続されている。 The temperature sensitive resistor 1 and the reference resistor 2 are connected to an oscillation circuit 5 together with a capacitor 4 that constitutes a time constant circuit.
ステツプコントローラ６は第１の制御信号S1を
発生しスイツチ３を切換える。発振回路５は、ス
イツチ３の切換えにより感温抵抗１が接続された
ときに発振周波数xの出力を発生し、また基準
抵抗２が接続されたときに発振周波数sの出力を
発生する。 The step controller 6 generates a first control signal S1 to switch the switch 3. The oscillation circuit 5 generates an output at an oscillation frequency x when the temperature sensitive resistor 1 is connected by switching the switch 3, and generates an output at an oscillation frequency s when the reference resistor 2 is connected.
比較演算手段としての比較演算回路７は、発振
周波数xとsの差をとり、演算を行なうことに
より温度差に変換する。温度差に換算されたデー
タは、所定周期でラツチ回路８にラツチされ、表
示手段としての表示回路９においてデイジタル表
示される。 A comparison calculation circuit 7 serving as a comparison calculation means takes the difference between the oscillation frequencies x and s and converts it into a temperature difference by performing calculations. The data converted into a temperature difference is latched in a latch circuit 8 at a predetermined period and digitally displayed on a display circuit 9 serving as a display means.
温度校正時には、外部より校正用インターフエ
イス１０を通して周波数切換信号を入力し、周波
数x、，sがそれぞれ出力される。 During temperature calibration, a frequency switching signal is input from the outside through the calibration interface 10, and frequencies x, , and s are output, respectively.
いま感温抵抗１の温度係数をα、基準温度を
Tsとすると、温度Ｔのときの周波数xは下式で
示される。 Now let the temperature coefficient of temperature sensitive resistor 1 be α, and the reference temperature be
Assuming Ts, the frequency x at temperature T is expressed by the following formula.
x＝s｛１＋α（Ｔ−Ts）｝ ……(1)
(1)式より温度Ｔを求めると、(2)式のように表わ
される。 x=s{1+α(T-Ts)}...(1) When temperature T is determined from equation (1), it is expressed as equation (2).
Ｔ＝Ts＋１／αs（x−s） ……(2)
比較演算回路７において(2)式に示す演算が行な
われ温度が求められる。 T=Ts+1/αs(x−s) (2) The comparison calculation circuit 7 performs the calculation shown in equation (2) to obtain the temperature.
第２図は、このような温度検出装置を対象とし
これに対して温度の校正を行なうこの発明の実施
例を示している。 FIG. 2 shows an embodiment of the present invention which targets such a temperature detection device and performs temperature calibration on it.
図において温度検出装置は全体を１１で示さ
れ、その感温抵抗１はこれを校正温度に保つため
の温槽１２に収容されている。また制御装置１３
は、発振周波数xとsを切換えるための切換回
路１４と、発振周波数xおよびsを入力して調
整値を算出する演算回路１５と、この演算回路１
５の出力により調整用ドライバー１７を駆動する
駆動回路１６によつて構成される。なお、理解の
便宜上第２図において第１図と同一部分は同一符
号によつて表示している。 In the figure, the temperature detecting device is indicated as a whole by 11, and its temperature sensitive resistor 1 is housed in a temperature bath 12 for maintaining it at a calibrated temperature. Also, the control device 13
consists of a switching circuit 14 for switching the oscillation frequencies x and s, an arithmetic circuit 15 for calculating an adjustment value by inputting the oscillation frequencies x and s, and this arithmetic circuit 1.
The adjustment driver 17 is configured by a drive circuit 16 that drives an adjustment driver 17 using the output of the driver 5. For convenience of understanding, parts in FIG. 2 that are the same as those in FIG. 1 are designated by the same reference numerals.
温度校正を行なう場合には、まず温槽１２によ
り感温抵抗１の温度を安定に保つ。制御装置１３
は切換回路１４から切換信号S2を温度検出装置１
１の校正用インターフエイス１０に出力する。温
度検出装置１１はこの切換信号S2に基づき発振周
波数xまたはsを校正用インターフエイス１０
から出力する。演算回路１５は発振周波数xお
よびsより調整値を算出する。 When performing temperature calibration, first the temperature of the temperature sensitive resistor 1 is kept stable using the hot bath 12. Control device 13
The switching signal S2 is sent from the switching circuit 14 to the temperature detection device 1.
output to the calibration interface 10 of No. 1. The temperature detection device 11 calibrates the oscillation frequency x or s based on this switching signal S2 .
Output from. Arithmetic circuit 15 calculates an adjustment value from oscillation frequencies x and s.
温槽１２の温度が基準温度Tsであれば、s＝
xとなるような調整値を算出する。また、温槽
１２の温度が基準温度よりずれた場合でも、(1)式
より(3)式のように変形できるので、(3)式によりs
がxに対して一定比率になる調整値を算出する
ことができる。 If the temperature of the hot tub 12 is the reference temperature Ts, s=
Calculate the adjustment value that will result in x. Also, even if the temperature of the hot tub 12 deviates from the reference temperature, it can be transformed from equation (1) to equation (3), so using equation (3), s
It is possible to calculate an adjustment value that makes x a constant ratio to x.
s＝x／１＋α（Ｔ−Ts） ……(3)
この調整値により駆動回路１６は、調整用ドラ
イバー１７に対して、これを所要の角度回転させ
る信号を出力する。基準抵抗２は回転型可変抵抗
器で構成されているので、調整用ドライバー１７
は回転して基準抵抗２の自動的な調整を行なうこ
とができる。 s=x/1+α(T-Ts) (3) Based on this adjustment value, the drive circuit 16 outputs a signal to the adjustment driver 17 to rotate it by a required angle. Since the reference resistor 2 is composed of a rotary variable resistor, the adjustment driver 17
can be rotated to automatically adjust the reference resistance 2.
このように、切換信号S2を出力してから基準抵
抗２を調整するまでの流れを何回か繰返すことに
より、一定の精度まで基準抵抗２を調整すること
ができる。 In this way, by repeating the flow from outputting the switching signal S 2 to adjusting the reference resistance 2 several times, the reference resistance 2 can be adjusted to a certain degree of accuracy.
この場合に、調整用ドライバー１７は作業員が
手で持つて基準抵抗２に押し当て自動的に回転さ
せるようにしてもよく、またロボツト等により自
動的に基準抵抗２に押し当てるようにしてもよ
い。 In this case, the adjustment screwdriver 17 may be held in the hand of a worker and automatically rotated by pressing it against the reference resistance 2, or it may be automatically pressed against the reference resistance 2 by a robot or the like. good.
この方法によれば、温度検出装置の校正の際の
基準抵抗の調整を、感温抵抗を接続したときの発
振周波数fxの実測値を用い、この実測値と温度Ｔ
と基準温度TSの差の数値の比に基づいて発振周
波数fsの調整値を求めるようになるので、きめ細
かく、精度の高い校正を実現することが可能にな
る。 According to this method, the reference resistance is adjusted when calibrating the temperature detection device using the actual measured value of the oscillation frequency f x when the temperature sensitive resistor is connected, and this measured value and the temperature T
Since the adjustment value of the oscillation frequency f s is determined based on the ratio of the numerical value of the difference between the oscillation frequency f s and the reference temperature T s , it becomes possible to realize detailed and highly accurate calibration.
なお、この発明は上記実施例に限定されるもの
ではなく要旨を変更しない範囲において種々変形
して実施することができる。 Note that the present invention is not limited to the above-mentioned embodiments, and can be implemented with various modifications without changing the gist.
上記実施例は基準抵抗２が回転型可変抵抗器の
場合を示しているが、これに厚膜もしくは薄膜の
抵抗体を用い、調整量をレーザトリミングするた
めの光量に変換させることにより校正を行なうこ
ともできる。 The above embodiment shows a case where the reference resistor 2 is a rotary variable resistor, but calibration is performed by using a thick film or thin film resistor and converting the adjustment amount into the light amount for laser trimming. You can also do that.
また発振周波数の計測は直接的でなく非接触の
状態で行なうこともできる。 Further, the oscillation frequency can also be measured not directly but in a non-contact manner.
第１図はこの発明の対象となる温度検出装置の
一例のブロツク図、第２図はこの発明の一実施例
のブロツク図である。
１……感温抵抗、２……基準抵抗、３……スイ
ツチ、４……コンデンサ、５……発振回路、６…
…ステツプコントローラ、７……比較演算回路、
１０……校正用インターフエイス、１１……温度
検出装置、１２……温槽、１３……制御装置、１
４……切換回路、１５……演算回路、１６……駆
動回路、１７……調整用ドライバー。
FIG. 1 is a block diagram of an example of a temperature detection device to which the present invention is applied, and FIG. 2 is a block diagram of an embodiment of the present invention. 1... Temperature sensitive resistor, 2... Reference resistor, 3... Switch, 4... Capacitor, 5... Oscillation circuit, 6...
...step controller, 7...comparison calculation circuit,
10... Calibration interface, 11... Temperature detection device, 12... Temperature tank, 13... Control device, 1
4...Switching circuit, 15...Arithmetic circuit, 16...Drive circuit, 17...Adjustment driver.
Claims (1)
つの抵抗のいずれか一方と時定数回路を構成する
発振器と、この発振器の発生する二つの発振周波
数を比較しその差により温度値を換算する比較演
算手段と、この比較演算手段の出力に基づいた温
度値を表示する表示手段とを備えて温度検出装置
の校正に際して、 温度Ｔで前記基準抵抗を接続したときの前記発
振器の発振周波数fsが、前記感温抵抗を接続した
ときの前記発振器の発振周波数fxと、温度Ｔと基
準温度TSの差の数値との比に基づいた値になる
ように前記基準抵抗を自動的に調整することを特
徴とする温度検出装置の校正方法。 ２ 基準抵抗は回転調整型の可変抵抗器でありこ
れを回転させることにより自動調整させることを
特徴とする、特許請求の範囲第１項記載の温度検
出装置の校正方法。 ３ 基準抵抗は、厚膜もしくは薄膜の抵抗体であ
りレーザトリミングによりその抵抗値を自動調整
するものであることを特徴とする特許請求の範囲
第１項記載の温度検出装置の校正方法。[Claims] 1. An oscillator that configures a time constant circuit with one of these two resistors by switching a temperature-sensitive resistor and a reference resistor, and compares two oscillation frequencies generated by this oscillator, and determines the temperature based on the difference. When calibrating a temperature detection device that is equipped with a comparison calculation means for converting a value and a display means for displaying a temperature value based on the output of the comparison calculation means, the oscillator when the reference resistor is connected at a temperature T is provided. The reference resistor is set so that the oscillation frequency f s becomes a value based on the ratio of the oscillation frequency f x of the oscillator when the temperature sensitive resistor is connected to the value of the difference between the temperature T and the reference temperature T S. A method for calibrating a temperature detection device characterized by automatic adjustment. 2. The method for calibrating a temperature detection device according to claim 1, wherein the reference resistor is a rotary adjustable variable resistor, and is automatically adjusted by rotating the reference resistor. 3. The method for calibrating a temperature detection device according to claim 1, wherein the reference resistor is a thick-film or thin-film resistor whose resistance value is automatically adjusted by laser trimming.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23465283A JPS60127433A (en) | 1983-12-13 | 1983-12-13 | Calibrating method of temperature detecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23465283A JPS60127433A (en) | 1983-12-13 | 1983-12-13 | Calibrating method of temperature detecting apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60127433A JPS60127433A (en) | 1985-07-08 |
| JPH0565805B2 true JPH0565805B2 (en) | 1993-09-20 |
Family
ID=16974369
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23465283A Granted JPS60127433A (en) | 1983-12-13 | 1983-12-13 | Calibrating method of temperature detecting apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60127433A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0820314B2 (en) * | 1984-09-27 | 1996-03-04 | 塩尻工業株式会社 | Electronic thermometer |
| JPH03152431A (en) * | 1989-11-10 | 1991-06-28 | Terumo Corp | Adjusting apparatus for characteristics of detecting device, electronic clinical thermometer adjusted thereby and adjusting method for electronic clinical thermometer |
| SG55452A1 (en) * | 1997-02-12 | 1998-12-21 | Int Rectifier Corp | Method and circuit to sense the tj of mos-gated power semi conductor devices |
| CN110702252A (en) * | 2019-11-12 | 2020-01-17 | 天津津航计算技术研究所 | Platinum resistance temperature measuring instrument with quick self-checking function |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59225325A (en) * | 1983-06-06 | 1984-12-18 | Terumo Corp | Preparation of electronic thermometer |
| JPS59225324A (en) * | 1983-06-06 | 1984-12-18 | Terumo Corp | Electronic thermometer |
| JPS59225323A (en) * | 1983-06-06 | 1984-12-18 | Terumo Corp | Electronic thermometer |
-
1983
- 1983-12-13 JP JP23465283A patent/JPS60127433A/en active Granted
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59225325A (en) * | 1983-06-06 | 1984-12-18 | Terumo Corp | Preparation of electronic thermometer |
| JPS59225324A (en) * | 1983-06-06 | 1984-12-18 | Terumo Corp | Electronic thermometer |
| JPS59225323A (en) * | 1983-06-06 | 1984-12-18 | Terumo Corp | Electronic thermometer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60127433A (en) | 1985-07-08 |
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| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |