JPH056340B2 - - Google Patents
Info
- Publication number
- JPH056340B2 JPH056340B2 JP58187391A JP18739183A JPH056340B2 JP H056340 B2 JPH056340 B2 JP H056340B2 JP 58187391 A JP58187391 A JP 58187391A JP 18739183 A JP18739183 A JP 18739183A JP H056340 B2 JPH056340 B2 JP H056340B2
- Authority
- JP
- Japan
- Prior art keywords
- deflection
- electron beam
- exposed
- height
- exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H10P95/00—
Landscapes
- Electron Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58187391A JPS6079722A (ja) | 1983-10-06 | 1983-10-06 | 電子線露光方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58187391A JPS6079722A (ja) | 1983-10-06 | 1983-10-06 | 電子線露光方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6079722A JPS6079722A (ja) | 1985-05-07 |
| JPH056340B2 true JPH056340B2 (OSRAM) | 1993-01-26 |
Family
ID=16205200
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58187391A Granted JPS6079722A (ja) | 1983-10-06 | 1983-10-06 | 電子線露光方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6079722A (OSRAM) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000091225A (ja) | 1998-07-16 | 2000-03-31 | Advantest Corp | 荷電粒子ビ―ム露光装置及び露光方法 |
| KR100334636B1 (ko) * | 1998-07-16 | 2002-04-27 | 히로시 오우라 | 노출된 시료의 표면 상에 부분적인 불균일이 있는 경우에도 고도로 정밀한 노출을 할 수 있는 대전 입자빔 노출 장치 및 노출 방법 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5760205A (en) * | 1980-09-30 | 1982-04-12 | Jeol Ltd | Exposure be electron beam |
| JPS57140734U (OSRAM) * | 1981-02-27 | 1982-09-03 | ||
| US4468565A (en) * | 1981-12-31 | 1984-08-28 | International Business Machines Corporation | Automatic focus and deflection correction in E-beam system using optical target height measurements |
-
1983
- 1983-10-06 JP JP58187391A patent/JPS6079722A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6079722A (ja) | 1985-05-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4289400A (en) | Apparatus for measuring a gradient of a surface | |
| JPH0324771B2 (OSRAM) | ||
| US4800269A (en) | Scanning type optical microscope | |
| JPH0135493B2 (OSRAM) | ||
| US5030986A (en) | Film printing and reading system | |
| JPS6341401B2 (OSRAM) | ||
| JPH056340B2 (OSRAM) | ||
| JPS6316687B2 (OSRAM) | ||
| JPH054603B2 (OSRAM) | ||
| JPS6253049B2 (OSRAM) | ||
| JPH01164031A (ja) | アライメント装置 | |
| JP2692890B2 (ja) | 位置関係検出装置 | |
| JP3202322B2 (ja) | マスク検査装置 | |
| JP2000182925A (ja) | ビーム照射装置および電子線露光装置 | |
| JPS61134605A (ja) | 物体の表面高さ測定装置 | |
| JPH07120618B2 (ja) | 粒子線描画方法 | |
| JPH10227617A (ja) | 微小線幅測定方法及び微小線幅測定装置 | |
| JPH09106945A (ja) | 粒子線のアライメント方法及びそれを用いた照射方法並びに装置 | |
| JPS6327642B2 (OSRAM) | ||
| JPH0945598A (ja) | 電子ビーム描画装置及び描画方法 | |
| JPH054604B2 (OSRAM) | ||
| JPH077742B2 (ja) | 電子ビーム露光方法 | |
| JPH0474644B2 (OSRAM) | ||
| JPH0618448A (ja) | X線光学系用mtf 計測装置 | |
| JPH0312451B2 (OSRAM) |