JPH05503992A - 化学的及びイオンセンサの試験用流体ヘッド - Google Patents
化学的及びイオンセンサの試験用流体ヘッドInfo
- Publication number
- JPH05503992A JPH05503992A JP3500540A JP50054091A JPH05503992A JP H05503992 A JPH05503992 A JP H05503992A JP 3500540 A JP3500540 A JP 3500540A JP 50054091 A JP50054091 A JP 50054091A JP H05503992 A JPH05503992 A JP H05503992A
- Authority
- JP
- Japan
- Prior art keywords
- fluid
- orifice
- test
- restriction cell
- cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Health & Medical Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Engineering & Computer Science (AREA)
- Electrochemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Molecular Biology (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
- Examining Or Testing Airtightness (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1 化学的及びイオン化検出電気回路装置を自動的に試験するための流体ヘット 又は列状をなした複数の流体ヘットであって、既知の試験流体を収容する少なく とも1の開口オリフィスを持つ流体制限セル、 前記オリフィスが試験すべき前記検出電気回路装置と漏洩のない係合状態にある ときに、前記試験流体を前記開口オリフィスに充填しかつ前記試験流体を前記開 口オリフィスから放出するための手段、及び、 前記検出電気回路装置を前記試験流体により試験する目的で、前記検出電気回路 装置に電気的接触を与える手段、とからなる、流体ヘット又は列状をなす複数の 流体ヘット。 2 前記開口オリフィスは、前記試験流体の放出及び他の試験流体の充填の間に 、前記流体制限セル内の流体汚染が最小となるような内面形状を持つことを特徴 とする、請求項1記載の流体ヘッド。 3 前記充填手段は、前記流体制限セル内に1の入口開口と1の出口開口を有し ていることを特徴とする、請求項1記載の流体ヘッド。 4 前記入口開口と出口開口は、前記制限セルの対向する端部にそれぞれ位置し ていることを特徴とする、請求項3記載の流体ヘッド。 5 前記開口オリフィスは、前記入口及び出口開口の形状と近似した形状である ことを特徴とする、請求項3記載の流体ヘッド。 6 前記少なくとも1の開口オリフィスを持つ流体制限セルは、前記検出電気回 路装置の試験の間、嵩溶液特性が優勢であることを十分に保証しうる内部容積及 び形態を有していることを特徴とする、請求項1記載の流体ヘッド。 7 前記流体制限セルは、前記液体制限セルの開口オリフィスが試験すべき前記 検出電気回路装置と漏洩のない係合をすべく押圧されたときに、座屈変形しない 形状であることを特徴とする、請求項1記載の流体ヘッド。 8 前記流体制限セルは、丸みを持つ外縁端を持つ楔型の形状である支持構造を 有していて、それにより試験すべき前記検出電気回路装置との間に漏洩のない係 合を形成するようになっていることを特徴とする、請求項7記載の流体ヘッド。 9 前記流体制限セルは、1)使用する流体に対して化学的に不活性であり、b )非吸着性であり、c)制御された変形及びシールをなすことができかつ試験す べき回路に対して押圧されるとき及び流体の流れの間、座屈変形しない物理的強 度を有し、かつ、d)気密及び液密を形成可能である、材料により構成されてい ることを特徴とする、請求項1記載の流体ヘッド。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/434,660 US5008616A (en) | 1989-11-09 | 1989-11-09 | Fluidics head for testing chemical and ionic sensors |
US434,660 | 1989-11-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH05503992A true JPH05503992A (ja) | 1993-06-24 |
JP2995088B2 JP2995088B2 (ja) | 1999-12-27 |
Family
ID=23725127
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3500540A Expired - Fee Related JP2995088B2 (ja) | 1989-11-09 | 1990-11-08 | 化学的及びイオンセンサの試験用流体ヘッド |
Country Status (11)
Country | Link |
---|---|
US (1) | US5008616A (ja) |
EP (1) | EP0504169B1 (ja) |
JP (1) | JP2995088B2 (ja) |
KR (1) | KR100197747B1 (ja) |
AT (1) | ATE148563T1 (ja) |
CA (1) | CA2068213C (ja) |
DE (1) | DE69029862T2 (ja) |
DK (1) | DK0504169T3 (ja) |
ES (1) | ES2100181T3 (ja) |
GR (1) | GR3023284T3 (ja) |
WO (1) | WO1991007667A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57167626A (en) * | 1981-03-31 | 1982-10-15 | Fujitsu Ltd | Electron beam exposure equipment |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2057995C (en) * | 1990-12-30 | 1995-07-25 | Takeshi Mori | Water quality tester |
US6773671B1 (en) | 1998-11-30 | 2004-08-10 | Abbott Laboratories | Multichemistry measuring device and test strips |
US6232790B1 (en) * | 1999-03-08 | 2001-05-15 | Honeywell Inc. | Method and apparatus for amplifying electrical test signals from a micromechanical device |
US6896778B2 (en) * | 2001-06-04 | 2005-05-24 | Epocal Inc. | Electrode module |
US7214300B2 (en) * | 2001-06-04 | 2007-05-08 | Epocal Inc. | Integrated electrokinetic devices and methods of manufacture |
AU2003234944A1 (en) * | 2002-08-27 | 2004-03-18 | Bayer Healthcare, Llc | Methods of Determining Glucose Concentration in Whole Blood Samples |
US7842234B2 (en) * | 2002-12-02 | 2010-11-30 | Epocal Inc. | Diagnostic devices incorporating fluidics and methods of manufacture |
US7767068B2 (en) | 2002-12-02 | 2010-08-03 | Epocal Inc. | Heterogeneous membrane electrodes |
US6936496B2 (en) * | 2002-12-20 | 2005-08-30 | Hewlett-Packard Development Company, L.P. | Nanowire filament |
US20040176705A1 (en) * | 2003-03-04 | 2004-09-09 | Stevens Timothy A. | Cartridge having an integrated collection element for point of care system |
US20040176704A1 (en) * | 2003-03-04 | 2004-09-09 | Stevens Timothy A | Collection device adapted to accept cartridge for point of care system |
US7722817B2 (en) * | 2003-08-28 | 2010-05-25 | Epocal Inc. | Lateral flow diagnostic devices with instrument controlled fluidics |
US7223611B2 (en) * | 2003-10-07 | 2007-05-29 | Hewlett-Packard Development Company, L.P. | Fabrication of nanowires |
US7132298B2 (en) * | 2003-10-07 | 2006-11-07 | Hewlett-Packard Development Company, L.P. | Fabrication of nano-object array |
US7407738B2 (en) * | 2004-04-02 | 2008-08-05 | Pavel Kornilovich | Fabrication and use of superlattice |
US7683435B2 (en) | 2004-04-30 | 2010-03-23 | Hewlett-Packard Development Company, L.P. | Misalignment-tolerant multiplexing/demultiplexing architectures |
US7247531B2 (en) | 2004-04-30 | 2007-07-24 | Hewlett-Packard Development Company, L.P. | Field-effect-transistor multiplexing/demultiplexing architectures and methods of forming the same |
US20050241959A1 (en) * | 2004-04-30 | 2005-11-03 | Kenneth Ward | Chemical-sensing devices |
US20060024814A1 (en) * | 2004-07-29 | 2006-02-02 | Peters Kevin F | Aptamer-functionalized electrochemical sensors and methods of fabricating and using the same |
US7375012B2 (en) * | 2005-02-28 | 2008-05-20 | Pavel Kornilovich | Method of forming multilayer film |
JP4939910B2 (ja) | 2006-11-29 | 2012-05-30 | 株式会社東芝 | マイクロ化学分析システム及びマイクロ化学分析装置 |
JP5433139B2 (ja) | 2007-06-29 | 2014-03-05 | 株式会社東芝 | マイクロ化学分析装置、その測定方法、及びマイクロカセット |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4641249A (en) * | 1983-06-22 | 1987-02-03 | Kuraray Co., Ltd. | Method and device for compensating temperature-dependent characteristic changes in ion-sensitive FET transducer |
US4864229A (en) * | 1986-05-03 | 1989-09-05 | Integrated Ionics, Inc. | Method and apparatus for testing chemical and ionic sensors |
-
1989
- 1989-11-09 US US07/434,660 patent/US5008616A/en not_active Expired - Lifetime
-
1990
- 1990-11-08 EP EP90917410A patent/EP0504169B1/en not_active Expired - Lifetime
- 1990-11-08 DE DE69029862T patent/DE69029862T2/de not_active Expired - Lifetime
- 1990-11-08 KR KR1019920701085A patent/KR100197747B1/ko not_active IP Right Cessation
- 1990-11-08 JP JP3500540A patent/JP2995088B2/ja not_active Expired - Fee Related
- 1990-11-08 DK DK90917410.4T patent/DK0504169T3/da active
- 1990-11-08 CA CA002068213A patent/CA2068213C/en not_active Expired - Lifetime
- 1990-11-08 WO PCT/US1990/006523 patent/WO1991007667A1/en active IP Right Grant
- 1990-11-08 ES ES90917410T patent/ES2100181T3/es not_active Expired - Lifetime
- 1990-11-08 AT AT90917410T patent/ATE148563T1/de not_active IP Right Cessation
-
1997
- 1997-04-29 GR GR970400948T patent/GR3023284T3/el unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57167626A (en) * | 1981-03-31 | 1982-10-15 | Fujitsu Ltd | Electron beam exposure equipment |
Also Published As
Publication number | Publication date |
---|---|
KR920704146A (ko) | 1992-12-19 |
JP2995088B2 (ja) | 1999-12-27 |
DE69029862D1 (de) | 1997-03-13 |
EP0504169B1 (en) | 1997-01-29 |
ATE148563T1 (de) | 1997-02-15 |
CA2068213A1 (en) | 1991-05-10 |
CA2068213C (en) | 2002-09-24 |
US5008616A (en) | 1991-04-16 |
DK0504169T3 (da) | 1997-07-14 |
GR3023284T3 (en) | 1997-07-30 |
WO1991007667A1 (en) | 1991-05-30 |
ES2100181T3 (es) | 1997-06-16 |
EP0504169A4 (en) | 1993-05-05 |
KR100197747B1 (ko) | 1999-06-15 |
EP0504169A1 (en) | 1992-09-23 |
DE69029862T2 (de) | 1997-09-04 |
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