JPH0545895B2 - - Google Patents

Info

Publication number
JPH0545895B2
JPH0545895B2 JP16026187A JP16026187A JPH0545895B2 JP H0545895 B2 JPH0545895 B2 JP H0545895B2 JP 16026187 A JP16026187 A JP 16026187A JP 16026187 A JP16026187 A JP 16026187A JP H0545895 B2 JPH0545895 B2 JP H0545895B2
Authority
JP
Japan
Prior art keywords
angle
waveguide
prism
deflection
refractive index
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP16026187A
Other languages
English (en)
Japanese (ja)
Other versions
JPS643536A (en
Inventor
Tadao Arima
Koji Okamura
Masaji Miki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16026187A priority Critical patent/JPS643536A/ja
Publication of JPS643536A publication Critical patent/JPS643536A/ja
Publication of JPH0545895B2 publication Critical patent/JPH0545895B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP16026187A 1987-06-26 1987-06-26 Instrument for measuring refractive index of waveguide Granted JPS643536A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16026187A JPS643536A (en) 1987-06-26 1987-06-26 Instrument for measuring refractive index of waveguide

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16026187A JPS643536A (en) 1987-06-26 1987-06-26 Instrument for measuring refractive index of waveguide

Publications (2)

Publication Number Publication Date
JPS643536A JPS643536A (en) 1989-01-09
JPH0545895B2 true JPH0545895B2 (US20100268047A1-20101021-C00003.png) 1993-07-12

Family

ID=15711180

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16026187A Granted JPS643536A (en) 1987-06-26 1987-06-26 Instrument for measuring refractive index of waveguide

Country Status (1)

Country Link
JP (1) JPS643536A (US20100268047A1-20101021-C00003.png)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU676049B2 (en) * 1993-05-17 1997-02-27 Yoshino Kogyosho Co., Ltd. Bottle of synthetic resin provided with handle and method of manufacturing same
EP1038786A4 (en) * 1997-11-28 2009-04-08 Mitsubishi Plastics Inc HANDLE FOR PLASTIC LASER AND BOTTLE WITH HANDLE

Also Published As

Publication number Publication date
JPS643536A (en) 1989-01-09

Similar Documents

Publication Publication Date Title
JP2804073B2 (ja) 物質の屈折率を測定する装置及び方法
JPH0432704A (ja) ギャップ測定装置および表面形状測定装置
JPH0545895B2 (US20100268047A1-20101021-C00003.png)
US5182612A (en) Method of measurement of an angle of incidence of a luminous beam, measuring device for carrying out the method and use of the device for the measurement of distances
US3438712A (en) Magneto-optical displacement sensing device
JPH0843499A (ja) ティップ型回路試験用電界センサおよびその電界検出方法
JPS58151509A (ja) 表面あらさの光学的測定方法
US5497228A (en) Laser bevel meter
RU2025656C1 (ru) Устройство для неразрушающего измерения толщины диэлектрических и полупроводниковых пленок в фиксированной точке
JPH07159114A (ja) 微小変位計
JP2003097911A (ja) 変位測定装置およびそれを用いた変位測定方法
RU1796901C (ru) Устройство дл бесконтактного измерени профил деталей
JPS6136884Y2 (US20100268047A1-20101021-C00003.png)
JPH09119821A (ja) 光線の入射角の示差測定方法、およびその装置
JPS60211304A (ja) 平行度測定装置
JPH03235006A (ja) 移動体の直進性測定方法及び装置
JP2544789B2 (ja) 光学式変位測定装置
JPH0252827B2 (US20100268047A1-20101021-C00003.png)
JPH01250039A (ja) 液体屈折率測定装置
JPS6231281B2 (US20100268047A1-20101021-C00003.png)
JPS6244603B2 (US20100268047A1-20101021-C00003.png)
JPS60128330A (ja) 薄膜の屈折率測定装置
JPS59228128A (ja) 偏波面保存光フアイバを用いた光センサ
JP3145798B2 (ja) 光磁界センサおよび磁界測定装置
JPH0575086B2 (US20100268047A1-20101021-C00003.png)