JPH0539556Y2 - - Google Patents
Info
- Publication number
- JPH0539556Y2 JPH0539556Y2 JP12612986U JP12612986U JPH0539556Y2 JP H0539556 Y2 JPH0539556 Y2 JP H0539556Y2 JP 12612986 U JP12612986 U JP 12612986U JP 12612986 U JP12612986 U JP 12612986U JP H0539556 Y2 JPH0539556 Y2 JP H0539556Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- hole
- cutting
- sample holder
- shaft
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004458 analytical method Methods 0.000 description 9
- 230000006835 compression Effects 0.000 description 7
- 238000007906 compression Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- 238000004453 electron probe microanalysis Methods 0.000 description 5
- 239000002344 surface layer Substances 0.000 description 5
- 238000004445 quantitative analysis Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- 238000005530 etching Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000012958 reprocessing Methods 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12612986U JPH0539556Y2 (hu) | 1986-08-19 | 1986-08-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12612986U JPH0539556Y2 (hu) | 1986-08-19 | 1986-08-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6332444U JPS6332444U (hu) | 1988-03-02 |
| JPH0539556Y2 true JPH0539556Y2 (hu) | 1993-10-07 |
Family
ID=31019644
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12612986U Expired - Lifetime JPH0539556Y2 (hu) | 1986-08-19 | 1986-08-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0539556Y2 (hu) |
-
1986
- 1986-08-19 JP JP12612986U patent/JPH0539556Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6332444U (hu) | 1988-03-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0539556Y2 (hu) | ||
| KR100840732B1 (ko) | 시편 제조 장치 및 방법 | |
| US7479399B1 (en) | System and method for providing automated sample preparation for plan view transmission electron microscopy | |
| US5336895A (en) | Impurity free reference grid for use charged partiole beam spectroscopes | |
| Segal et al. | A Rotating Specimen Mount for Use with X‐Ray Spectrometer in Measuring Crystallite Orientation of Cellulosic and Other Textile Fibers | |
| US4303859A (en) | Infra-red analysis apparatus and method | |
| JPS6321535A (ja) | 試料装置 | |
| JP2740631B2 (ja) | ミニプレーン | |
| JPS6234283Y2 (hu) | ||
| KR100382608B1 (ko) | 투과전자현미경을 위한 시료 제작방법_ | |
| JP3724404B2 (ja) | 薄膜硬度測定法 | |
| US6007409A (en) | Sample holder for parallel lapping tool and method of using | |
| JPH0318913Y2 (hu) | ||
| JPH11160210A (ja) | 透過型電子顕微鏡用の観察試料とその作製方法 | |
| JP3591231B2 (ja) | オージェ電子分光分析方法 | |
| JP4052951B2 (ja) | 薄膜分析法および薄膜分析装置 | |
| JPH11183410A (ja) | Ｅｄｓ分析方法及びそのためのサンプル装置 | |
| JPH0269635A (ja) | 試料調製法 | |
| JPS6093948A (ja) | 二次イオン質量分析用の試料台 | |
| JP2598444Y2 (ja) | サンプルホルダおよび表面汚染検査装置 | |
| JPS6139612B2 (hu) | ||
| JP3453992B2 (ja) | 粒度分布測定用試料のサンプリング方法 | |
| JP2957482B2 (ja) | 表面分析法およびその装置 | |
| JPH09231931A (ja) | 走査電子顕微鏡による分析方法 | |
| JPS58178948A (ja) | 電子線照射型分析装置の試料装置 |