JPH0537960U - Substrate holder for thin film processing equipment - Google Patents

Substrate holder for thin film processing equipment

Info

Publication number
JPH0537960U
JPH0537960U JP9462191U JP9462191U JPH0537960U JP H0537960 U JPH0537960 U JP H0537960U JP 9462191 U JP9462191 U JP 9462191U JP 9462191 U JP9462191 U JP 9462191U JP H0537960 U JPH0537960 U JP H0537960U
Authority
JP
Japan
Prior art keywords
substrate
annular member
substrate holder
film
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9462191U
Other languages
Japanese (ja)
Other versions
JPH0745563Y2 (en
Inventor
俊一 村上
Original Assignee
日電アネルバ株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日電アネルバ株式会社 filed Critical 日電アネルバ株式会社
Priority to JP9462191U priority Critical patent/JPH0745563Y2/en
Publication of JPH0537960U publication Critical patent/JPH0537960U/en
Application granted granted Critical
Publication of JPH0745563Y2 publication Critical patent/JPH0745563Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Physical Vapour Deposition (AREA)
  • ing And Chemical Polishing (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

(57)【要約】 (修正有) 【目的】 基板の表面に対しエッチングその他の加工を
行う薄膜加工装置における基板ホルダーに関する。基板
ホルダーを構成する環状部材に付着する膜が内部応力に
よって剥離したり、付着膜の内部応力で環状部材が破損
しないようにすることを目的とする。 【構成】 2個の環状部材12間に被加工基板11を挟
持する基板ホルダーである。環状部材12は複数のセグ
メント部品13を結合して構成してある。
(57) [Summary] (Modified) [Purpose] The present invention relates to a substrate holder in a thin film processing apparatus that performs etching and other processing on the surface of a substrate. It is an object of the present invention to prevent a film attached to an annular member that constitutes a substrate holder from being peeled off by an internal stress and from being damaged by an internal stress of an attached film. [Structure] A substrate holder that holds a substrate 11 to be processed between two annular members 12. The annular member 12 is formed by connecting a plurality of segment parts 13.

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】[Industrial applications]

この考案は、基板の表面に薄膜を形成する薄膜加工装置、或いは基板の表面を エッチングする薄膜加工装置における基板ホルダーに関する。 The present invention relates to a thin film processing apparatus for forming a thin film on the surface of a substrate, or a substrate holder in a thin film processing apparatus for etching the surface of the substrate.

【0002】[0002]

【従来の技術】[Prior Art]

従来、前記薄膜加工装置における基板ホルダーとして図4に示したように、2 個の環状部材1、1の間に基板2を挟持するようにしたものが知られている。各 環状部材1の内縁には爪片3、3が突設され、この爪片3、3を基板2の縁部に 掛止させて、基板2を支持するようにしている。図に示した基板ホルダーの場合 、円形の基板2がどのような方向でも支持できるようにしたものである。 Conventionally, as a substrate holder in the above-mentioned thin film processing apparatus, as shown in FIG. 4, one in which a substrate 2 is sandwiched between two annular members 1, 1 is known. Claw pieces 3 and 3 are provided so as to project from the inner edge of each annular member 1, and the claw pieces 3 and 3 are hooked on the edges of the substrate 2 to support the substrate 2. In the case of the substrate holder shown in the figure, the circular substrate 2 can be supported in any direction.

【0003】 前記環状部材1の材質は、基板2がシリコン基板である場合には、石英とされ 、爪片3、3と一体構造で製作されていた。If the substrate 2 is a silicon substrate, the material of the annular member 1 is quartz, and the annular member 1 is manufactured integrally with the claw pieces 3 and 3.

【0004】[0004]

【考案が解決しようとする課題】[Problems to be solved by the device]

前記のような基板ホルダーを用いて、基板の表面に対するエッチング、デポジ ション等の薄膜加工を行った場合、前記環状部材1には、不純物膜が付着するこ とになりこの付着膜に起因する問題点があった。 When the substrate holder as described above is used to perform thin film processing such as etching and deposition on the surface of the substrate, an impurity film is attached to the annular member 1, which causes a problem caused by the attached film. There was a point.

【0005】 例えば、基板をシリコン基板とし、環状部材を石英として、シリコン基板の表 面に形成された薄膜をエッチングする場合には、次のような問題点があった。For example, when the substrate is a silicon substrate and the annular member is quartz, and a thin film formed on the surface of the silicon substrate is etched, there are the following problems.

【0006】 即ち、エッチング工程で発生した物質が環状部材に付着、堆積し、この堆積膜 が厚くなるに従って内部応力が増大する。この結果、内部応力がある値以上にな ると、堆積膜の剥離が起り、剥離膜が基板に対する汚染源となっていた。堆積膜 の剥離が起らない場合もあるが、増大した内部応力によって石英製の環状部材が 破損されることもあった。That is, the substance generated in the etching process adheres to and deposits on the annular member, and the internal stress increases as the thickness of the deposited film increases. As a result, when the internal stress exceeds a certain value, the deposited film peels off, and the peeled film was a source of contamination on the substrate. In some cases, the exfoliation of the deposited film did not occur, but the increased internal stress sometimes damaged the quartz ring member.

【0007】 又、前記と同様のシリコン基板と環状部材で、シリコン基板の表面に二酸化硅 素薄膜を付着させる場合でも、環状部材に付着する二酸化硅素の膜厚の増大に従 って内部応力が増大し、環状部材と同一の材質であるにもかかわらず、付着した 膜の剥離が起り、シリコン基板に対する汚染源となったり、剥離が起らないで環 状部材を破損する原因となることもあった。Even when a silicon dioxide thin film is attached to the surface of the silicon substrate using the same silicon substrate and annular member as described above, the internal stress increases as the film thickness of the silicon dioxide attached to the annular member increases. Even though the material is the same as that of the annular member, the adhered film may peel off, which may be a source of contamination on the silicon substrate, or may cause damage to the annular member without peeling off. It was

【0008】[0008]

【課題を解決するための手段】[Means for Solving the Problems]

この考案は前記のような問題点に鑑みてなされたもので、基板に対する加工を 行った際に環状部材に付着する膜の内部応力によって、付着膜の剥離や、環状部 材の破損が起らない基板ホルダーを提供することを目的としている。 The present invention has been made in view of the above problems, and the internal stress of the film adhered to the annular member when the substrate is processed may cause the exfoliation of the adhered film or the damage of the annular member. It is intended to provide a board holder that does not.

【0009】 前記目的を違成するこの考案の基板ホルダーは、2個の環状部材間に、被加工 基板を挟持する基板ホルダーにおいて、前記環状部材が複数のセグメント部品を 結合して構成してあることを特徴としている。The substrate holder of the present invention, which has a different purpose from the above, is a substrate holder for sandwiching a substrate to be processed between two annular members, and the annular member is formed by coupling a plurality of segment parts. It is characterized by

【0010】[0010]

【作用】[Action]

この考案の薄膜加工装置における基板ホルダーによれば、環状部材を複数のセ グメント部品に分割したので、環状部材に付着した膜の内部応力を、セグメント 部品の数に反比例の関係で小さくすることができる。この結果、付着膜の剥離、 環状部材の破損を防止することができる。 According to the substrate holder in the thin film processing apparatus of the present invention, since the annular member is divided into a plurality of segment parts, the internal stress of the film attached to the annular member can be reduced in inverse proportion to the number of segment parts. it can. As a result, peeling of the adhered film and damage to the annular member can be prevented.

【0011】[0011]

【実施例】【Example】

以下この考案の実施例を図を参照して説明する。 An embodiment of this invention will be described below with reference to the drawings.

【0012】 図1は円盤状のシリコン基板11を挟持するように、2個の環状部材12、1 2で構成した基板ホルダーであって、各環状部材には、石英製としてあり、4個 のセグメント部品13、13を環状に結合してある。結合部は図2に示したよう に、セグメント部品13、13の端部に形成した段部14、15を合せてビス、 ナット等の固定部品16で結合してある。各セグメント部品13、13には、内 側縁中央部に、爪片17、17が一一体的に形成してある。FIG. 1 shows a substrate holder composed of two annular members 12 and 12 so as to sandwich a disk-shaped silicon substrate 11, and each annular member is made of quartz and has four pieces. The segment parts 13, 13 are connected in an annular shape. As shown in FIG. 2, the connecting portion is formed by connecting the step portions 14 and 15 formed at the ends of the segment components 13 and 13 together by a fixing component 16 such as a screw or a nut. Claw pieces 17, 17 are integrally formed at the center of the inner side edges of each of the segment parts 13, 13.

【0013】 図3は、セグメント部品13、13の端部の結合部の別の実施例を表わしたも ので、段部14、15の面内に、方形波状の凹凸18、19(図(a))や、三 角波上の凹凸20、21(図(b))や、正弦波状の凹凸22、23(図(c) )を形成し、凹凸を互いに嵌合させて結合できるようにしてある。FIG. 3 shows another embodiment of the joint portion at the ends of the segment parts 13 and 13. Therefore, the corrugated irregularities 18 and 19 (see FIG. )), Asperities 20 and 21 on a triangular wave (FIG. (B)) and sinusoidal asperities 22 and 23 (FIG. (C)) are formed so that the concavities and convexities can be fitted and coupled to each other. is there.

【0014】 上記実施例の基板ホルダーでシリコン基板11を挟持するには、シリコン基板 11を間に挾んだ状態で、環状部材12、12を互いに近接させ、図示してない クランプ器具で、環状部材の近接状態を維持する。シリコン基板11の縁部は各 環状部材12、12の爪片17、17に掛止して支持される。In order to sandwich the silicon substrate 11 with the substrate holder of the above-described embodiment, the annular members 12 and 12 are brought close to each other with the silicon substrate 11 sandwiched therebetween, and the annular member is clamped with a clamp device (not shown). Maintain close proximity of members. The edge portion of the silicon substrate 11 is hooked and supported by the claw pieces 17, 17 of the annular members 12, 12.

【0015】 支持したシリコン基板11に対して、エッチングやデポジション等の表面加工 を行うと、環状部材12、12の表面に、エッチング時に生成される物質が付着 し、デポジションでは、シリコン基板11に形成される薄膜と同一の膜が付着す る。従って、エッチング或いはデポジション加工を多数のシリコン基板に繰り返 し行うと、環状部材12の表面に付着した膜の厚さが次第に増大し、内部応力も 高まって行くが、環状部材12は複数のセグメント部品13、13に分割して構 成したので、付着した膜の内部応力を小さく抑えることができる。この結果、付 着膜が剥離してシリコン基板11の表面を汚染することを無くし、又、環状部材 12を破損することも無くすることができる。When surface processing such as etching and deposition is performed on the supported silicon substrate 11, substances generated during etching adhere to the surfaces of the annular members 12 and 12. In deposition, the silicon substrate 11 is deposited. The same film as the thin film formed on the surface adheres. Therefore, when etching or deposition processing is repeated on a large number of silicon substrates, the thickness of the film attached to the surface of the annular member 12 gradually increases, and the internal stress also increases, but the annular member 12 has a plurality of layers. Since the segment parts 13 and 13 are configured by being divided, the internal stress of the attached film can be suppressed to be small. As a result, it is possible to prevent the adhesion film from peeling off and contaminating the surface of the silicon substrate 11, and also to prevent the annular member 12 from being damaged.

【0016】 以上、円盤状のシリコン基板11に対して円環状の環状部材12とした実施例 について説明したが、方形の基板に対して角環状の環状部材とするなど、この考 案は実施例以外の形状にも実施することができる。又、前記環状部材12の材質 も、石英に代えてシリコンとすることも可能である。環状部材の材質は基板の材 質や、基板に対する加工雰囲気を考慮して決定されるものである。Although the embodiment in which the annular silicon ring member 12 is used for the disk-shaped silicon substrate 11 has been described above, the present invention is not limited to this embodiment, such as a square ring-shaped annular member for a square substrate. Other shapes can be implemented. Also, the material of the annular member 12 may be silicon instead of quartz. The material of the annular member is determined in consideration of the material of the substrate and the processing atmosphere for the substrate.

【0017】[0017]

【考案の効果】[Effect of the device]

この考案によれば、環状部材に付着した膜の内部応力を小さくできるので、膜 剥離による基板の汚染を防止し、又、破損のおそれが無く、長期間、安定して使 用できる基板ホルダーが提供できる効果がある。 According to this invention, since the internal stress of the film attached to the annular member can be reduced, the substrate holder can be prevented from being contaminated by the film peeling, and can be used stably for a long time without the risk of damage. There is an effect that can be provided.

【図面の簡単な説明】[Brief description of drawings]

【図1】この考案の実施例の分解斜視図である。FIG. 1 is an exploded perspective view of an embodiment of the present invention.

【図2】同じく実施例の一部拡大断面図である。FIG. 2 is a partially enlarged cross-sectional view of the same embodiment.

【図3】(a)、(b)、(c)はこの考案の別の実施
例の一部拡大断面図である。
3 (a), (b) and (c) are partially enlarged sectional views of another embodiment of the present invention.

【図4】従来例の分解斜視図である。FIG. 4 is an exploded perspective view of a conventional example.

【符号の説明】[Explanation of symbols]

11 シリコン基板 12 環状部材 13 セグメント部品 16 固定部品 17 爪片 11 Silicon Substrate 12 Annular Member 13 Segment Component 16 Fixed Component 17 Claw Piece

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 2個の環状部材間に、被加工基板を挟持
する基板ホルダーにおいて、前記環状部材が複数のセグ
メント部品を結合して構成してあることを特徴とした薄
膜加工装置における基板ホルダー。
1. A substrate holder for holding a substrate to be processed between two annular members, wherein the annular member is formed by joining a plurality of segment parts together. .
JP9462191U 1991-10-22 1991-10-22 Substrate holder for thin film processing equipment Expired - Lifetime JPH0745563Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9462191U JPH0745563Y2 (en) 1991-10-22 1991-10-22 Substrate holder for thin film processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9462191U JPH0745563Y2 (en) 1991-10-22 1991-10-22 Substrate holder for thin film processing equipment

Publications (2)

Publication Number Publication Date
JPH0537960U true JPH0537960U (en) 1993-05-21
JPH0745563Y2 JPH0745563Y2 (en) 1995-10-18

Family

ID=14115331

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9462191U Expired - Lifetime JPH0745563Y2 (en) 1991-10-22 1991-10-22 Substrate holder for thin film processing equipment

Country Status (1)

Country Link
JP (1) JPH0745563Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5615454B1 (en) * 2014-02-25 2014-10-29 コバレントマテリアル株式会社 Focus ring

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5615454B1 (en) * 2014-02-25 2014-10-29 コバレントマテリアル株式会社 Focus ring
KR20150100558A (en) * 2014-02-25 2015-09-02 코바렌트 마테리얼 가부시키가이샤 Focus ring

Also Published As

Publication number Publication date
JPH0745563Y2 (en) 1995-10-18

Similar Documents

Publication Publication Date Title
US5897743A (en) Jig for peeling a bonded wafer
US20190189497A1 (en) Workpiece processing method
US9390956B2 (en) Method for the temporary connection of a product substrate to a carrier substrate
US4644639A (en) Method of supporting an article
TW518721B (en) Method of processing a semiconductor wafer
JP4096636B2 (en) Wafer support jig and semiconductor element manufacturing method using the same
US11289361B2 (en) Patterned chuck for double-sided processing
US6974721B2 (en) Method for manufacturing thin semiconductor chip
JPH0745563Y2 (en) Substrate holder for thin film processing equipment
JP4131112B2 (en) Tweezers for sandwiching silicon wafers
US20170076986A1 (en) Non-destructive epitaxial lift-off of large area iii-v thin-film grown by metal organic chemical vapor deposition and substrate reuse
JP5153531B2 (en) Substrate holding jig
JPS6323655B2 (en)
JP2862582B2 (en) Adhesive semiconductor substrate and method of manufacturing the same
JPS62293631A (en) Wafer holding tool
WO2022224814A1 (en) Sheet, thinned wafer handling sheet, thin wafer handling method, and thin device handling method
JPH056932A (en) Wafer conveying apparatus
JPH0639869Y2 (en) Vacuum chuck
JPS609347B2 (en) Method for separating chipped pellets around semiconductor wafers
JPS6116692Y2 (en)
JPH0325903Y2 (en)
JPH0646622B2 (en) Method for manufacturing silicon wafer for semiconductor substrate
WO2022115223A1 (en) Carrier mechanism for cleaning and handling
JPH06321371A (en) Separating method and device for wafer
JPH04107836U (en) Wafer handling tools

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term