JPH05330984A - Device for liquid-phase epitaxial growth - Google Patents

Device for liquid-phase epitaxial growth

Info

Publication number
JPH05330984A
JPH05330984A JP4170076A JP17007692A JPH05330984A JP H05330984 A JPH05330984 A JP H05330984A JP 4170076 A JP4170076 A JP 4170076A JP 17007692 A JP17007692 A JP 17007692A JP H05330984 A JPH05330984 A JP H05330984A
Authority
JP
Japan
Prior art keywords
base substrate
substrate
holding frame
spacer
single crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4170076A
Other languages
Japanese (ja)
Other versions
JP3214069B2 (en
Inventor
Mitsuhiro Aota
充弘 青田
Masaru Fujino
優 藤野
Tsugunobu Mizuno
嗣伸 水埜
Masato Kumatoriya
誠人 熊取谷
Takenori Sekijima
雄徳 関島
Hiroshi Takagi
洋 鷹木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP17007692A priority Critical patent/JP3214069B2/en
Publication of JPH05330984A publication Critical patent/JPH05330984A/en
Application granted granted Critical
Publication of JP3214069B2 publication Critical patent/JP3214069B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To provide a device for liquid-phase epitaxial growth capable of producing a high-quality single crystal film in high recovery ratio without applying unnatural stress to substrate bases. CONSTITUTION:A substrate fixture is equipped with a fitting frame 10 fixed to the lower end part of a holding bar, a retaining frame 15 which is detachably attached to the fitting frame and supports the bottom and the outer peripheral face of substrate bases and spacers 18 which are kept in the interior of the retaining frame and arranged between the substrate bases. The fitting frame, the retaining frame and the spacers are made of a heat-resistant noble metal such as platinum. Plural sheets of the substrate bases are horizontally supported while maintaining intervals by the spacers.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は下地基板の表面に単結晶
膜を育成する液相エピタキシャル成長装置に関するもの
である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid phase epitaxial growth apparatus for growing a single crystal film on the surface of a base substrate.

【0002】[0002]

【従来の技術】従来、遅延線フィルター,発振器,非線
形デバイスなどの静磁波(MSW)デバイス、およびフ
ァラデー回転効果を利用した光アイソレータ,サーキュ
レータまたはスイッチなどの磁気光学素子等に磁性ガー
ネット単結晶が広く用いられている。この磁性ガーネッ
ト単結晶の主な製造方法として、液相エピタキシャル成
長法(LPE法)が知られている。
2. Description of the Related Art Conventionally, magnetic garnet single crystals have been widely used in magnetostatic wave (MSW) devices such as delay line filters, oscillators and nonlinear devices, and magneto-optical elements such as optical isolators, circulators and switches utilizing the Faraday rotation effect. It is used. A liquid phase epitaxial growth method (LPE method) is known as a main method for producing the magnetic garnet single crystal.

【0003】この液相エピタキシャル成長法は、縦型加
熱炉内に所定条件に保持された白金製坩堝に、ガーネッ
トを構成する元素の酸化物および溶剤としてPbOとB
2 3 とを充填し、約1200℃で均質化を行い溶液化
する。この溶液を液相線(Liquidus) と固相線 (Solidu
s)の間の温度、即ち約900℃前後の一定温度に保持し
てガーネットを過飽和状態にした後、この溶液中に下地
基板であるGd3 Ga5 12(GGG)基板を浸漬し、
一定位置で回転させながら所定時間成長を行うことによ
り、下地基板の表面に磁性ガーネット単結晶膜を育成す
る。磁性ガーネット単結晶膜の育成が終了した後、下地
基板を溶液から高速度で回転して引き上げ、単結晶膜上
の付着溶液を遠心力により振り切ることにより、育成を
終了する。上記下地基板は、支持棒の下端部に取り付け
られた貴金属製の基板保持具によって水平状態に保持さ
れている。基板保持具に設けられた数本の脚部は内外方
向の弾性を有しており、この脚部の弾性によって下地基
板の外周部を挟み込んで保持している。
According to this liquid phase epitaxial growth method, a platinum crucible held in a vertical heating furnace under predetermined conditions contains an oxide of elements constituting garnet and PbO and B as a solvent.
Fill with 2 O 3 and homogenize at about 1200 ° C. to form a solution. This solution is applied to the liquidus (Liquidus) and solidus (Solidus)
s), that is, after maintaining the garnet in a supersaturated state by maintaining it at a constant temperature of about 900 ° C., immersing the Gd 3 Ga 5 O 12 (GGG) substrate as the base substrate in this solution,
A magnetic garnet single crystal film is grown on the surface of the base substrate by performing growth for a predetermined time while rotating at a fixed position. After the growth of the magnetic garnet single crystal film is completed, the underlying substrate is rotated and pulled up from the solution at a high speed, and the solution deposited on the single crystal film is shaken off by the centrifugal force to complete the growth. The base substrate is held in a horizontal state by a noble metal substrate holder attached to the lower end of the support rod. Several legs provided on the substrate holder have elasticity in the inward and outward directions, and the elasticity of the legs sandwiches and holds the outer peripheral portion of the base substrate.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記の
方法では1回の育成で1枚の単結晶板しか製造できず、
生産性が悪いという欠点がある。そこで、基板保持具の
脚部を下方へ長く延ばし、これら脚部の間に下地基板を
複数枚平行に保持するようにして、量産性を高めた液相
エピタキシャル成長装置もある。
However, according to the above method, only one single crystal plate can be manufactured by one growth,
It has the drawback of poor productivity. Therefore, there is also a liquid phase epitaxial growth apparatus in which the leg portion of the substrate holder is extended downward and a plurality of base substrates are held in parallel between the leg portions to improve mass productivity.

【0005】ところが、この方法の場合、脚部の内側へ
の付勢力が脚部の自由端部(下端部)と基部(上端部)
とで異なり、下地基板の外周部に加わる脚部の応力も下
地基板によって異なるという問題がある。例えば、脚部
の基部付近に保持された下地基板への応力は大きく、そ
のため下地基板に割れや欠けが発生しやすい反面、脚部
の自由端付近に保持された下地基板の応力は小さく、溶
液振り切りのために高速回転させた時、下地基板が基板
保持具から脱落してしまい、育成基板の回収率が低下す
るという欠点がある。そこで、本発明の目的は、下地基
板に無理な応力を与えずに、高い回収率で良質の単結晶
膜を量産できる液相エピタキシャル成長装置を提供する
ことにある。
However, in the case of this method, the urging force to the inside of the leg portion causes the free end portion (lower end portion) and the base portion (upper end portion) of the leg portion.
However, there is a problem that the stress of the leg portion applied to the outer peripheral portion of the base substrate also differs depending on the base substrate. For example, the stress on the base substrate held near the base of the leg is large, so that the base substrate is likely to crack or chip, while the stress on the base substrate held near the free end of the leg is small and the solution When the substrate is rotated at a high speed for shaking off, the underlying substrate comes off from the substrate holder, and the recovery rate of the grown substrate is reduced. Therefore, an object of the present invention is to provide a liquid phase epitaxial growth apparatus capable of mass-producing a high quality single crystal film with a high recovery rate without giving an excessive stress to the underlying substrate.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するた
め、本発明の基板保持具は、支持棒の下端部に固定され
た取付枠と、取付枠に対して着脱可能に取り付けられ、
下地基板の底面および外周面を支える保持枠と、保持枠
の内部に収容され、各下地基板の間に配置されるスペー
サとを備え、複数枚の下地基板を上記スペーサによって
距離を保ちながら水平に保持可能としたものである。
In order to achieve the above object, a substrate holder of the present invention is attached to a mounting frame fixed to a lower end portion of a support rod and detachably mounted to the mounting frame.
A holding frame that supports the bottom surface and outer peripheral surface of the base substrate, and spacers that are housed inside the holding frame and arranged between the base substrates are provided, and a plurality of base substrates are held horizontally by the spacers while maintaining a distance. It was possible.

【0007】[0007]

【作用】複数の下地基板を溶液中に浸漬して単結晶膜を
育成する際、各下地基板はスペーサによって間隔をあけ
て水平に保持されているので、単結晶の成分が下地基板
全体に行き渡り、エピタキシャル成長が促進される。単
結晶膜の育成が終了した後、下地基板を溶液から高速度
で回転して引き上げると、下地基板には遠心力による外
方への力が作用するが、下地基板は保持枠の内部に収容
されているので、下地基板が脱落することがない。基板
保持具から下地基板を取り出す際、保持枠を取付枠から
取り外し、保持枠内に収容されているスペーサを取り出
せば、下地基板も簡単に取り出すことができる。このよ
うに、下地基板に無理な応力を掛けずに簡単に取り外す
ことができる。
[Function] When a plurality of base substrates are soaked in a solution to grow a single crystal film, each base substrate is held horizontally by spacers, so that single crystal components are spread over the entire base substrate. , Epitaxial growth is promoted. After the growth of the single crystal film is completed, when the base substrate is rotated and pulled up from the solution at a high speed, an outward force due to centrifugal force acts on the base substrate, but the base substrate is housed inside the holding frame. Therefore, the base substrate does not fall off. When taking out the base substrate from the substrate holder, the base frame can be easily taken out by removing the holding frame from the mounting frame and taking out the spacers accommodated in the holding frame. In this way, it is possible to easily remove the base substrate without applying undue stress.

【0008】[0008]

【実施例】図1は本発明の一例である磁性ガーネット膜
の育成装置を示す。アルミナ製の縦型円筒形炉心管1の
内側には、支持台2によって底面が支持された白金製坩
堝3が配置され、この坩堝3内には磁性ガーネット膜の
原料と溶剤とが充填されている。炉心管1の外側には
上,中,下の3段のヒータ4,5,6が設けられてお
り、坩堝3は中ヒータ5の内側に配置されている。炉心
管1内の坩堝3は上記ヒータ4〜6の輻射熱により加熱
され、ガーネット原料および溶剤が溶解されて溶液7化
されるとともに、炉心管1内の雰囲気が所定温度に保持
されている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an apparatus for growing a magnetic garnet film which is an example of the present invention. Inside a vertical cylindrical core tube 1 made of alumina, a platinum crucible 3 whose bottom surface is supported by a support 2 is arranged, and the crucible 3 is filled with a raw material for a magnetic garnet film and a solvent. There is. Outside the core tube 1, upper, middle and lower heaters 4, 5 and 6 are provided, and the crucible 3 is arranged inside the middle heater 5. The crucible 3 in the core tube 1 is heated by the radiant heat of the heaters 4 to 6, the garnet raw material and the solvent are dissolved to form a solution 7, and the atmosphere in the core tube 1 is maintained at a predetermined temperature.

【0009】GGG基板よりなる円板状の下地基板8
は、図2,図3に示す白金製または白金合金製の基板保
持具9によって水平に保持されている。基板保持具9
は、取付枠10と、保持枠15と、スペーサ18とで構
成されている。取付枠10は、アルミナ製支持棒20の
下端部に固定されたボス部10aと、ボス部10aと放
射状の連結部11を介して連結された環状の支持部12
と、支持部12の下面に円環板状の押え板13とを備え
ている。上記支持部12の外径は下地基板8の外径とほ
ぼ等しく、その外周部には3箇所に白金製または白金合
金製のネジ14が螺合するねじ穴12aが形成されてい
る。
A disk-shaped base substrate 8 made of a GGG substrate
Are horizontally held by a substrate holder 9 made of platinum or platinum alloy shown in FIGS. Substrate holder 9
Is composed of a mounting frame 10, a holding frame 15, and a spacer 18. The mounting frame 10 includes a boss portion 10a fixed to a lower end portion of an alumina support rod 20, and an annular support portion 12 connected to the boss portion 10a via a radial connecting portion 11.
And a pressing plate 13 having an annular plate shape on the lower surface of the support portion 12. The outer diameter of the support portion 12 is substantially equal to the outer diameter of the base substrate 8, and screw holes 12a into which screws 14 made of platinum or platinum alloy are screwed are formed at three locations on the outer peripheral portion thereof.

【0010】保持枠15は、上記支持部12の外周面に
接する3本の側脚部16と、側脚部16の最下端に連結
された円環板状の底板17とからなり、側脚部16には
一定間隔おきに複数の長孔16aが形成されている。側
脚部16の内接円の直径は、下地基板8の直径にほぼ等
しい。スペーサ18は白金または白金合金製のワイヤで
略3角形状に形成されており、各頂点には、上下方向に
延びる足18aと、放射方向に延びる係合ピン18bと
が設けられている。係合ピン18bを保持枠15の長孔
16aに係合させると、スペーサ18は保持枠15に水
平に取り付けられる。そして、各スペーサ18の間に下
地基板8を配置すれば、複数の下地基板8を距離を保っ
て保持できる。なお、下地基板8の厚みにより上方のス
ペーサ18の高さが変わるので、この変化を長孔16a
によって吸収している。なお、上端の長孔16aはネジ
14を挿通するための挿通穴である。
The holding frame 15 comprises three side leg portions 16 contacting the outer peripheral surface of the support portion 12 and an annular plate-shaped bottom plate 17 connected to the lowermost end of the side leg portion 16. A plurality of long holes 16a are formed in the portion 16 at regular intervals. The diameter of the inscribed circle of the side leg portion 16 is substantially equal to the diameter of the base substrate 8. The spacer 18 is formed of a wire made of platinum or a platinum alloy in a substantially triangular shape, and each vertex has a leg 18a extending in the vertical direction and an engagement pin 18b extending in the radial direction. When the engaging pin 18b is engaged with the elongated hole 16a of the holding frame 15, the spacer 18 is horizontally attached to the holding frame 15. By arranging the base substrate 8 between the spacers 18, a plurality of base substrates 8 can be held at a distance. Since the height of the upper spacer 18 changes depending on the thickness of the base substrate 8, this change is caused by the long hole 16a.
Is absorbed by. The long hole 16a at the upper end is an insertion hole for inserting the screw 14.

【0011】上記基板保持具9に下地基板8を保持する
には、次のように行う。即ち、まず保持枠15に対して
下地基板8を上方から収納すると、下地基板8は外周面
が側脚部16でガイドされ、底板17上に外周部下面が
載置される。次に、スペーサ18を撓めながら保持枠1
5内に収納し、係合ピン18bを最下部の長穴16aに
係合させ、底板17上に載置された下地基板8の外周部
上面の3箇所を足18aで押える。続いて、スペーサ1
8の上に次の下地基板8を載置し、その下地基板8の上
に次のスペーサ18を載せ、スペーサ18の係合ピン1
8bを下から2番目の長孔16aに係合させる。以下、
同様にして下地基板8とスペーサ18を順に保持枠15
へ収容する。そして、最上部のスペーサ18の上に下地
基板8を載置した後、保持枠15の側脚部16を取付枠
10の支持部12へ外嵌し、外側からネジ14で側脚部
16と支持部12とを連結することにより、組付を終了
する。このようにして、下地基板8はその外周面が保持
枠15の側脚部16の内面で位置規制され、外周部上下
面が保持枠15の底板17とスペーサ18の足18aと
の間、または上下のスペーサ18の足18aの間で挟持
され、安定に保持される。そのため、基板保持具9を1
00rpmで30秒おきに正逆に回転させても、下地基
板8の回転方向のずれが起こらなかった。
The base substrate 8 is held by the substrate holder 9 as follows. That is, when the base substrate 8 is first stored from above in the holding frame 15, the outer peripheral surface of the base substrate 8 is guided by the side leg portions 16, and the lower surface of the outer peripheral portion is placed on the bottom plate 17. Next, while bending the spacer 18, the holding frame 1
5, the engaging pin 18b is engaged with the lowermost elongated hole 16a, and the foot 18a presses three places on the upper surface of the outer peripheral portion of the base substrate 8 placed on the bottom plate 17. Then, spacer 1
The next base substrate 8 is placed on the base substrate 8, the next spacer 18 is placed on the base substrate 8, and the engaging pin 1 of the spacer 18 is placed.
8b is engaged with the second long hole 16a from the bottom. Less than,
Similarly, the base substrate 8 and the spacer 18 are sequentially attached to the holding frame 15
To house. Then, after placing the base substrate 8 on the uppermost spacer 18, the side leg portions 16 of the holding frame 15 are externally fitted to the support portions 12 of the mounting frame 10, and the side leg portions 16 are screwed from outside to the side leg portions 16. The assembly is completed by connecting the support portion 12. In this way, the outer peripheral surface of the base substrate 8 is position-regulated by the inner surface of the side leg portion 16 of the holding frame 15, and the outer peripheral upper and lower surfaces are between the bottom plate 17 of the holding frame 15 and the legs 18a of the spacers 18, or It is sandwiched between the legs 18a of the upper and lower spacers 18 and stably held. Therefore, the substrate holder 9
Even when the base substrate 8 was rotated in the reverse direction every 30 seconds at 00 rpm, the base substrate 8 was not displaced in the rotation direction.

【0012】上記支持棒20の上端部は駆動手段(図示
せず)に着脱可能に取り付けられており、回転方向およ
び上下方向に駆動される。なお、支持棒20と駆動手段
との連結部は、支持棒20の偏心を調整可能となってい
る。炉心管1の上端には、炉内への冷気の侵入を抑制す
る石英ガラス製のシャッタ21が載置されており、この
シャッタ21の中心部に上記支持棒20が挿通されてい
る。
An upper end portion of the support rod 20 is detachably attached to a driving means (not shown) and is driven in a rotating direction and a vertical direction. The eccentricity of the support rod 20 can be adjusted at the connecting portion between the support rod 20 and the driving means. At the upper end of the furnace core tube 1, a shutter 21 made of quartz glass for suppressing invasion of cold air into the furnace is placed, and the support rod 20 is inserted at the center of the shutter 21.

【0013】次に、上記構成の液相エピタキシャル成長
装置の動作の一例を説明する。まず、坩堝3の中でガー
ネット原料と溶剤とを混合し、1200℃で加熱溶解し
て2時間保持した後、890℃に降温して過冷却状態と
する。次に、保持枠15に複数の下地基板8をスペーサ
18によって距離を保ちながら水平に保持し、この保持
枠15の上端部をネジ14で取付枠10に固定する。こ
のようにして下端部に下地基板8を保持した支持棒20
を降下させ、下地基板8を溶液7中に浸漬する。そし
て、支持棒20を一方向あるいは正逆に回転させて磁性
ガーネット単結晶膜を育成する。単結晶膜の育成が終了
した後、下地基板8を溶液7から高速度で回転させなが
ら引き上げ、単結晶膜上の付着溶液を遠心力により振り
切る。その際、基板保持具9には高速回転により回転方
向の力が作用するが、下地基板8はその外周部が保持枠
15の側脚部16によって位置規制されているので、下
地基板8が基板保持具9からずれたり、脱落することが
ない。付着溶液の振り切りを終了した後、支持棒20を
さらに引き上げ、所定位置で保持枠15を取付枠10か
ら分離し、これを別の場所へ運び、ここで保持枠15か
ら下地基板8を取り出す。この時も、下地基板8には無
理な力が全く掛からないので、割れや欠けが発生しな
い。
Next, an example of the operation of the liquid phase epitaxial growth apparatus having the above structure will be described. First, a garnet raw material and a solvent are mixed in a crucible 3, heated and melted at 1200 ° C. and held for 2 hours, and then cooled to 890 ° C. to be in a supercooled state. Next, the plurality of base substrates 8 are horizontally held in the holding frame 15 by the spacers 18 while keeping the distance, and the upper end of the holding frame 15 is fixed to the mounting frame 10 with the screw 14. In this way, the support rod 20 holding the base substrate 8 at the lower end portion
And the base substrate 8 is dipped in the solution 7. Then, the support bar 20 is rotated in one direction or in the reverse direction to grow a magnetic garnet single crystal film. After the growth of the single crystal film is completed, the base substrate 8 is pulled up from the solution 7 while being rotated at a high speed, and the adhering solution on the single crystal film is shaken off by the centrifugal force. At this time, a force in the rotational direction acts on the substrate holder 9 due to high-speed rotation, but since the outer peripheral portion of the base substrate 8 is regulated by the side leg portions 16 of the holding frame 15, the base substrate 8 is the substrate. It does not slip off or fall off the holder 9. After the shaking off of the attached solution is completed, the support rod 20 is further pulled up, the holding frame 15 is separated from the mounting frame 10 at a predetermined position, and this is carried to another place, where the base substrate 8 is taken out from the holding frame 15. At this time as well, since no unreasonable force is applied to the base substrate 8, no cracking or chipping occurs.

【0014】図4,図5は本発明にかかる基板保持具3
0の他の実施例を示す。この実施例の基板保持具30
も、アルミナ製支持棒31に固定された取付枠32と、
保持枠40と、スペーサ50とで構成されている。取付
枠32は、ボス部33と、ボス部33と放射状の連結部
34を介して連結された環状の支持部35とを備えてい
る。上記支持部35の外径は下地基板8の外径とほぼ等
しく、その外周部には3箇所に白金製または白金合金製
のネジ37が螺合するネジ穴36が形成されている。
4 and 5 show a substrate holder 3 according to the present invention.
Another embodiment of 0 is shown. The substrate holder 30 of this embodiment
A mounting frame 32 fixed to an alumina support rod 31,
It is composed of a holding frame 40 and a spacer 50. The mounting frame 32 includes a boss portion 33 and an annular support portion 35 connected to the boss portion 33 via a radial connecting portion 34. The outer diameter of the support portion 35 is substantially equal to the outer diameter of the base substrate 8, and screw holes 36 into which screws 37 made of platinum or platinum alloy are screwed are formed at three locations on the outer peripheral portion thereof.

【0015】保持枠40は、上記支持部35の外周面に
ほぼ接する環状の口縁部41と、口縁部41から下方へ
垂設された3本の側脚部42と、側脚部42の最下端に
連結された円環板の底脚部43とからなる。口縁部41
の内径および側脚部42の内接円の直径は下地基板8の
直径とほぼ等しく、底脚部43の内径は下地基板8の外
径よりやや小さい。なお、口縁部41には上記ネジ37
の挿通用長孔44が形成されている。スペーサ50は白
金または白金合金製のワイヤで形成されており、上下の
リング部51と、これらリング部51を連結する縦方向
の連結部52とで構成されている。リング部51の外径
は下地基板8の外径とほぼ等しい。
The holding frame 40 has a ring-shaped lip 41 which is substantially in contact with the outer peripheral surface of the support 35, three side legs 42 which extend downward from the lip 41, and side legs 42. And the bottom leg portion 43 of the annular plate connected to the lowermost end of the. Rim 41
And the diameter of the inscribed circle of the side leg portion 42 are substantially equal to the diameter of the base substrate 8, and the inner diameter of the bottom leg portion 43 is slightly smaller than the outer diameter of the base substrate 8. The screw 37 is attached to the lip 41.
A long hole 44 for insertion is formed. The spacer 50 is formed of a wire made of platinum or a platinum alloy, and is composed of upper and lower ring portions 51 and a vertical connecting portion 52 connecting the ring portions 51. The outer diameter of the ring portion 51 is substantially equal to the outer diameter of the base substrate 8.

【0016】上記基板保持具30に下地基板8を保持す
るには、まず下地基板8を保持枠40の口縁部41から
収納する。下地基板8の外周面は側脚部42でガイドさ
れ、底脚部43上に外周部下面が載置される。次に、ス
ペーサ50を保持枠40内に収納し、続いてスペーサ5
0の上に次の下地基板8を載置し、その下地基板8の上
に次のスペーサ50を載せる。以下、同様にして下地基
板8とスペーサ50を順に保持枠40へ収容する。そし
て、最上部のスペーサ50の上に下地基板8を載置した
後、保持枠40の口縁部41を取付枠32の支持部35
へ外嵌し、外側からネジ37で口縁部41と支持部35
とを連結する。この時、最上部の下地基板8はスペーサ
50と支持部35とで挟持されることになる。このよう
にして組み立てられた基板保持具30において、下地基
板8はその外周面が保持枠40の側脚部42の内面で位
置規制され、外周部上下面が上下のスペーサ50のリン
グ部51によって挟持されるため、安定に保持される。
In order to hold the base substrate 8 in the substrate holder 30, the base substrate 8 is first stored from the edge 41 of the holding frame 40. The outer peripheral surface of the base substrate 8 is guided by the side leg portions 42, and the lower surface of the outer peripheral portion is placed on the bottom leg portions 43. Next, the spacer 50 is housed in the holding frame 40, and then the spacer 5
The next base substrate 8 is placed on the base substrate 0, and the next spacer 50 is placed on the base substrate 8. Thereafter, similarly, the base substrate 8 and the spacer 50 are sequentially housed in the holding frame 40. Then, after placing the base substrate 8 on the uppermost spacer 50, the rim portion 41 of the holding frame 40 is attached to the support portion 35 of the mounting frame 32.
To the rim portion 41 and the support portion 35 with screws 37 from the outside.
And are connected. At this time, the uppermost base substrate 8 is sandwiched between the spacer 50 and the supporting portion 35. In the substrate holder 30 assembled in this way, the outer peripheral surface of the base substrate 8 is regulated by the inner surface of the side leg portion 42 of the holding frame 40, and the outer peripheral upper and lower surfaces are formed by the ring portions 51 of the upper and lower spacers 50. Since it is sandwiched, it is stably held.

【0017】この実施例では、スペーサ50を保持枠4
0の中に単に挿入すればよいだけであるので、保持枠4
0への下地基板8およびスペーサ50の収納・取出は容
易であるという特徴がある。
In this embodiment, the spacer 50 is attached to the holding frame 4.
Since it only has to be inserted into 0, the holding frame 4
There is a feature that it is easy to store and take out the base substrate 8 and the spacer 50 in 0.

【0018】なお、上記説明では磁性ガーネット単結晶
について説明したが、本発明はこれのみに限定されるも
のではなく、例えば光学デバイス用単結晶であるニオブ
酸リチウムの液相エピタキシャル成長にも本発明を適用
することができる。
Although the magnetic garnet single crystal has been described above, the present invention is not limited to this. For example, the present invention is also applicable to liquid phase epitaxial growth of lithium niobate, which is a single crystal for optical devices. Can be applied.

【0019】[0019]

【発明の効果】以上の説明で明らかなように、本発明に
よれば、基板保持方法を従来のような足部による挟み込
み方式から、保持枠およびスペーサを用いて脱着構造に
変更したので、複数の下地基板を無理な応力を与えずに
確実に保持できる。その結果、育成後の高速回転による
下地基板の外れ、下地基板の外周部の欠けや割れといっ
た不具合を解消できる。また、下地基板はスペーサによ
って距離をおいて配置されるので、各下地基板の隙間に
は溶液が容易に入り込み、単結晶の育成を助ける。その
ため、良質の単結晶を効率良く量産できる。
As is apparent from the above description, according to the present invention, the substrate holding method is changed from the conventional sandwiching method using the legs to the detachable structure using the holding frame and the spacer. It is possible to securely hold the underlying substrate without applying excessive stress. As a result, problems such as detachment of the base substrate due to high-speed rotation after growth and chipping or cracking of the outer peripheral portion of the base substrate can be solved. In addition, since the base substrates are arranged with a distance from each other by the spacer, the solution easily enters the gaps between the base substrates to help the growth of the single crystal. Therefore, a good quality single crystal can be efficiently mass-produced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明にかかる液相エピタキシャル成長装置の
浸漬前の縦断面図である。
FIG. 1 is a vertical sectional view of a liquid phase epitaxial growth apparatus according to the present invention before immersion.

【図2】基板保持具の第1実施例の斜視図である。FIG. 2 is a perspective view of a first embodiment of the substrate holder.

【図3】図2に示した基板保持具の分解斜視図である。FIG. 3 is an exploded perspective view of the substrate holder shown in FIG.

【図4】基板保持具の第2実施例の斜視図である。FIG. 4 is a perspective view of a second embodiment of the substrate holder.

【図5】図4に示した基板保持具の分解斜視図である。5 is an exploded perspective view of the substrate holder shown in FIG.

【符号の説明】[Explanation of symbols]

1 炉心管 3 坩堝 7 溶液 8 下地基板 9 基板保持具 10 取付枠 15 保持枠 18 スペーサ 20 支持棒 1 core tube 3 crucible 7 solution 8 base substrate 9 substrate holder 10 mounting frame 15 holding frame 18 spacer 20 support rod

───────────────────────────────────────────────────── フロントページの続き (72)発明者 熊取谷 誠人 京都府長岡京市天神2丁目26番10号 株式 会社村田製作所内 (72)発明者 関島 雄徳 京都府長岡京市天神2丁目26番10号 株式 会社村田製作所内 (72)発明者 鷹木 洋 京都府長岡京市天神2丁目26番10号 株式 会社村田製作所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Masato Kumagorani 2-26-10 Tenjin, Nagaokakyo City, Kyoto Prefecture Murata Manufacturing Co., Ltd. (72) Inventor Yutoku Sekijima 2-26-10 Tenjin, Nagaokakyo City, Kyoto Prefecture Murata Manufacturing Co., Ltd. (72) Inventor Hiroshi Takagi 2-26-10 Tenjin Tenjin, Nagaokakyo City, Kyoto Prefecture Murata Manufacturing Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】支持棒の下端部に基板保持具を取り付け、
この基板保持具に水平に保持された下地基板を単結晶原
料が溶解されている坩堝内に浸漬し、一定位置で回転さ
せながら所定時間成長を行うことにより、下地基板の表
面に単結晶膜を育成する液相エピタキシャル成長装置に
おいて、 上記基板保持具は、支持棒の下端部に固定された取付枠
と、取付枠に対して着脱可能に取り付けられ、下地基板
の底面および外周面を支える保持枠と、保持枠の内部に
収容され、各下地基板の間に配置されるスペーサとを備
え、複数枚の下地基板を上記スペーサによって距離を保
ちながら水平に保持可能としたことを特徴とする液相エ
ピタキシャル成長装置。
1. A substrate holder is attached to a lower end portion of a support rod,
The base substrate horizontally held by this substrate holder is immersed in the crucible in which the single crystal raw material is dissolved, and the single crystal film is formed on the surface of the base substrate by growing for a predetermined time while rotating at a fixed position. In the liquid phase epitaxial growth apparatus for growing, the substrate holder includes a mounting frame fixed to a lower end portion of a support rod, and a holding frame detachably attached to the mounting frame and supporting a bottom surface and an outer peripheral surface of a base substrate. A liquid phase epitaxial growth apparatus comprising: a spacer housed inside a holding frame and arranged between the base substrates, and a plurality of base substrates can be held horizontally by the spacer while keeping a distance. ..
JP17007692A 1992-06-03 1992-06-03 Liquid phase epitaxial growth equipment Expired - Fee Related JP3214069B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17007692A JP3214069B2 (en) 1992-06-03 1992-06-03 Liquid phase epitaxial growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17007692A JP3214069B2 (en) 1992-06-03 1992-06-03 Liquid phase epitaxial growth equipment

Publications (2)

Publication Number Publication Date
JPH05330984A true JPH05330984A (en) 1993-12-14
JP3214069B2 JP3214069B2 (en) 2001-10-02

Family

ID=15898200

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17007692A Expired - Fee Related JP3214069B2 (en) 1992-06-03 1992-06-03 Liquid phase epitaxial growth equipment

Country Status (1)

Country Link
JP (1) JP3214069B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6551908B2 (en) 2000-10-02 2003-04-22 Canon Kabushiki Kaisha Method for producing semiconductor thin films on moving substrates
JP2007254161A (en) * 2006-03-20 2007-10-04 Ngk Insulators Ltd Method of and device for producing group iii nitride crystal

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6551908B2 (en) 2000-10-02 2003-04-22 Canon Kabushiki Kaisha Method for producing semiconductor thin films on moving substrates
US6951584B2 (en) 2000-10-02 2005-10-04 Canon Kabushiki Kaisha Apparatus for producing semiconductor thin films on moving substrates
JP2007254161A (en) * 2006-03-20 2007-10-04 Ngk Insulators Ltd Method of and device for producing group iii nitride crystal
JP4647525B2 (en) * 2006-03-20 2011-03-09 日本碍子株式会社 Method for producing group III nitride crystal

Also Published As

Publication number Publication date
JP3214069B2 (en) 2001-10-02

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