JPH06316485A - Liquid phase epitaxial growth method - Google Patents
Liquid phase epitaxial growth methodInfo
- Publication number
- JPH06316485A JPH06316485A JP13132393A JP13132393A JPH06316485A JP H06316485 A JPH06316485 A JP H06316485A JP 13132393 A JP13132393 A JP 13132393A JP 13132393 A JP13132393 A JP 13132393A JP H06316485 A JPH06316485 A JP H06316485A
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- melt
- epitaxial growth
- crystal film
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は下地基板の表面に単結晶
膜を育成する液相エピタキシャル成長法に関するもので
ある。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid phase epitaxial growth method for growing a single crystal film on the surface of a base substrate.
【0002】[0002]
【従来の技術】従来、遅延線フィルター,発振器,非線
形デバイスなどの静磁波(MSW)デバイス、およびフ
ァラデー回転効果を利用した光アイソレータ,サーキュ
レータまたはスイッチなどの磁気光学素子等に磁性ガー
ネット単結晶が広く用いられている。この磁性ガーネッ
ト単結晶の主な製造方法として、液相エピタキシャル成
長法(LPE法)が知られている。2. Description of the Related Art Conventionally, magnetic garnet single crystals have been widely used for magnetostatic wave (MSW) devices such as delay line filters, oscillators, non-linear devices, and magneto-optical elements such as optical isolators, circulators or switches utilizing the Faraday rotation effect. It is used. A liquid phase epitaxial growth method (LPE method) is known as a main method for producing the magnetic garnet single crystal.
【0003】従来の液相エピタキシャル成長法による磁
性ガーネット単結晶の育成方法は、縦型加熱炉内に所定
条件に保持された白金製坩堝に、ガーネットを構成する
元素の酸化物および溶剤としてPbOとB2 O3 とを充
填し、約1200℃で均質化を行い溶融化する。次に、
この融液を過冷却状態、即ち液相線(Liquidus) の下方
近傍温度(約900℃前後)に保持した後、この融液中
に下地基板であるGd3 Ga5 O12(GGG)基板を浸
漬し、一定位置で反転または回転させながら所定時間エ
ピタキシャル成長を行うことによって、下地基板の表面
に磁性ガーネット単結晶膜を育成するものである。A conventional method for growing a magnetic garnet single crystal by a liquid phase epitaxial growth method is a platinum crucible held in a vertical heating furnace under predetermined conditions, in which PbO and B are used as oxides and solvents of elements constituting garnet. Fill with 2 O 3 and homogenize at about 1200 ° C. to melt. next,
After maintaining this melt in a supercooled state, that is, at a temperature near the liquidus line (about 900 ° C.), a Gd 3 Ga 5 O 12 (GGG) substrate as a base substrate is placed in the melt. The magnetic garnet single crystal film is grown on the surface of the underlying substrate by immersing and performing epitaxial growth for a predetermined time while reversing or rotating at a fixed position.
【0004】[0004]
【発明が解決しようとする課題】ところが、上記のよう
な方法でガーネット単結晶膜を育成すると、下地基板を
融液に浸漬した直後と、それ以外の時間とでガーネット
単結晶膜の育成速度が異なる。即ち、融液への浸漬直後
は育成速度が早いが、時間経過と共に育成速度が低下す
る。そのため、育成初期の単結晶膜の結晶性が悪く、単
結晶膜に歪みが多くなるとともに、膜厚が不均一になる
という問題があった。そこで、本発明の目的は、育成さ
れた単結晶膜の結晶性を向上させ、膜厚の不均一を少な
くできる液相エピタキシャル成長法を提供することにあ
る。However, when a garnet single crystal film is grown by the method as described above, the growth rate of the garnet single crystal film is increased immediately after the base substrate is immersed in the melt and at other times. different. That is, the growth rate is high immediately after the immersion in the melt, but the growth rate decreases with the passage of time. Therefore, there is a problem that the crystallinity of the single crystal film at the initial stage of growth is poor, the single crystal film is distorted a lot, and the film thickness becomes nonuniform. Therefore, an object of the present invention is to provide a liquid phase epitaxial growth method capable of improving the crystallinity of a grown single crystal film and reducing the nonuniformity of the film thickness.
【0005】[0005]
【課題を解決するための手段】上記目的を達成するた
め、本発明の液相エピタキシャル成長法は、融液の上部
が液相温度より高くかつ融液の下部が液相温度より低く
なるように温度勾配を与え、下地基板を融液中に浸漬し
た状態で徐々に降下させることにより、下地基板の表面
に単結晶膜を育成するものである。In order to achieve the above object, the liquid phase epitaxial growth method of the present invention employs a temperature so that the upper part of the melt is higher than the liquidus temperature and the lower part of the melt is lower than the liquidus temperature. A single crystal film is grown on the surface of the base substrate by applying a gradient and gradually lowering the base substrate while being immersed in the melt.
【0006】[0006]
【作用】下地基板を融液中に浸漬すると、融液の上部は
液相温度より高いので、下地基板の表面には単結晶膜は
エピタキシャル成長しない。下地基板を徐々に降下させ
ると、やがて下地基板は液相温度以下の部位に到達する
ので、下地基板の表面に単結晶膜が育成される。このよ
うに融液に浸漬した後で単結晶膜の育成が徐々に開始さ
れるので、育成速度がほぼ一定となり、従来のように結
晶性が悪くならず、膜厚の不均一も少なくなる。When the base substrate is immersed in the melt, the upper part of the melt is higher than the liquidus temperature, so that the single crystal film does not grow epitaxially on the surface of the base substrate. When the underlying substrate is gradually lowered, the underlying substrate eventually reaches a portion below the liquidus temperature, so that a single crystal film is grown on the surface of the underlying substrate. Since the growth of the single crystal film is gradually started after being immersed in the melt as described above, the growth rate becomes almost constant, the crystallinity does not deteriorate as in the conventional case, and the nonuniformity of the film thickness also decreases.
【0007】[0007]
【実施例】図1は本発明の一例である磁性ガーネット単
結晶膜を育成するための液相エピタキシャル成長装置を
示す。アルミナ製の縦型円筒形炉心管1の内側には、支
持台2によって底面が支持された白金製坩堝3が配置さ
れ、この坩堝3内には磁性ガーネット単結晶膜の原料と
溶剤とが充填されている。炉心管1の外側には上,中,
下の3段の抵抗加熱ヒータ4,5,6が設けられてお
り、坩堝3は中ヒータ5の内側に配置されている。炉心
管1内の坩堝3は上記ヒータ4〜6の輻射熱により加熱
され、ガーネット原料および溶剤が溶解されて融液7化
されるとともに、炉心管1内の雰囲気が所定温度に保持
されている。なお、加熱方法は、抵抗加熱法に限らず、
誘導加熱法を用いてもよい。EXAMPLE FIG. 1 shows a liquid phase epitaxial growth apparatus for growing a magnetic garnet single crystal film which is an example of the present invention. Inside the vertical cylindrical core tube 1 made of alumina, a platinum crucible 3 having a bottom surface supported by a support 2 is arranged, and the crucible 3 is filled with a raw material of a magnetic garnet single crystal film and a solvent. Has been done. On the outside of the core tube 1, upper, middle,
Lower three-stage resistance heaters 4, 5, 6 are provided, and the crucible 3 is arranged inside the middle heater 5. The crucible 3 in the core tube 1 is heated by the radiant heat of the heaters 4 to 6, the garnet raw material and the solvent are dissolved to form a melt 7, and the atmosphere in the core tube 1 is maintained at a predetermined temperature. The heating method is not limited to the resistance heating method,
An induction heating method may be used.
【0008】上記坩堝3内の融液7は、その上部が液相
温度より高くかつ下部が液相温度以下となるように温度
勾配を与えられている。温度勾配を与える方法として
は、例えばヒータ4,5,6の温度設定をヒータ4側が
ヒータ6側より順次高くなるように設定したり、坩堝3
を加熱するヒータ5を上下に分割し、上部の電流を下部
より高くしたり、さらに坩堝3に温度調整部材を設ける
等の方法を用いることができる。The melt 7 in the crucible 3 is provided with a temperature gradient such that its upper portion is higher than its liquidus temperature and its lower portion is lower than its liquidus temperature. As a method of giving a temperature gradient, for example, the temperature of the heaters 4, 5, 6 is set so that the heater 4 side is sequentially higher than the heater 6 side, or the crucible 3 is used.
It is possible to use a method in which the heater 5 for heating the above is divided into upper and lower parts so that the current in the upper part is higher than that in the lower part, and further the temperature adjusting member is provided in the crucible 3.
【0009】円板状の下地基板8は、アルミナ製支持棒
10の下端部に固定された白金製または白金合金製の基
板保持具9によって取り外し自在にかつ水平に保持され
ている。支持棒10の上端部は図示しない駆動装置に連
結され、駆動装置は支持棒10を上下方向に駆動させる
と同時に、正逆に反転させることができる。炉心管1の
上端には、炉内への冷気の侵入を抑制する石英ガラス製
のシャッタ11が載置されており、このシャッタ11の
中心部に上記支持棒10が挿通されている。The disk-shaped base substrate 8 is detachably and horizontally held by a substrate holder 9 made of platinum or platinum alloy fixed to the lower end of an alumina support rod 10. The upper end portion of the support rod 10 is connected to a drive device (not shown), and the drive device can drive the support rod 10 in the vertical direction and at the same time reverse the direction. On the upper end of the furnace core tube 1, a shutter 11 made of quartz glass for suppressing invasion of cold air into the furnace is placed, and the support rod 10 is inserted through the center of the shutter 11.
【0010】次に、本発明における磁性ガーネット単結
晶膜の育成方法を説明する。まず、坩堝3の中でガーネ
ット単結晶膜の原料(Fe2 O3 ,Y2 O3 )と溶剤
(PbO,B2 O3 )とを混合し、1200℃で均質化
を行い加熱溶解した。この融液7を、融液表面で液相温
度より高い940℃に、坩堝3の底部で液相温度以下の
890℃になるように温度勾配を与えた後、この融液7
にGGG基板よりなる下地基板8を浸漬し、下地基板8
を100rpmで反転させながら徐々に降下させ、下地
基板8の表面に磁性ガーネット単結晶膜を育成した。育
成終了後、下地基板8を融液7から高速度で回転させな
がら引き上げ、磁性ガーネット単結晶膜上の付着融液を
遠心力により振り切ることにより、育成を完了した。Next, a method for growing a magnetic garnet single crystal film according to the present invention will be described. First, the raw material (Fe 2 O 3 , Y 2 O 3 ) for the garnet single crystal film and the solvent (PbO, B 2 O 3 ) were mixed in the crucible 3 and homogenized at 1200 ° C. to be melted by heating. A temperature gradient was applied to the melt 7 at 940 ° C. higher than the liquidus temperature on the surface of the melt and 890 ° C. below the liquidus temperature at the bottom of the crucible 3, and then the melt 7
Immerse the base substrate 8 made of a GGG substrate in the
Was gradually lowered while reversing at 100 rpm to grow a magnetic garnet single crystal film on the surface of the base substrate 8. After completion of the growth, the base substrate 8 was pulled up from the melt 7 while being rotated at a high speed, and the adhered melt on the magnetic garnet single crystal film was shaken off by centrifugal force to complete the growth.
【0011】図2は従来方法における単結晶膜の成長速
度の変化と、本発明方法における単結晶膜の育成速度の
変化とを示す。図から明らかなように、従来方法では融
液への浸漬初期には育成速度が非常に高く、育成時間の
経過とともに育成速度が低下するのに対し、本発明方法
では育成速度がほぼ一定であることが分かる。FIG. 2 shows changes in the growth rate of the single crystal film in the conventional method and changes in the growth rate of the single crystal film in the method of the present invention. As is clear from the figure, in the conventional method, the growth rate is very high in the initial stage of immersion in the melt, and the growth rate decreases with the lapse of the growth time, whereas in the method of the present invention, the growth rate is almost constant. I understand.
【0012】表1は、単結晶膜の結晶性の比較として、
従来方法と本発明方法との単結晶膜のX線ロッキングカ
ーブの半値幅を示し、表2は単結晶膜の膜厚の変化を示
す。Table 1 shows a comparison of crystallinity of single crystal films.
The full width at half maximum of the X-ray rocking curve of the single crystal film of the conventional method and the method of the present invention is shown, and Table 2 shows the change in the film thickness of the single crystal film.
【表1】 [Table 1]
【0013】[0013]
【表2】 [Table 2]
【0014】表1,表2から明らかなように、本発明方
法で得られた単結晶膜は、従来に比べて結晶性が良く、
膜厚のばらつきも小さいことが分かる。そのため、この
単結晶膜を静磁波素子に使用した場合、良好な特性が得
られる。As is clear from Tables 1 and 2, the single crystal film obtained by the method of the present invention has better crystallinity than the conventional one,
It can be seen that the variation in film thickness is small. Therefore, when this single crystal film is used in a magnetostatic wave device, good characteristics are obtained.
【0015】なお、上記実施例では磁性ガーネット単結
晶について説明したが、本発明はこれのみに限定される
ものではなく、例えば光学デバイス用単結晶であるニオ
ブ酸リチウムの液相エピタキシャル成長にも適用するこ
とができる。Although the magnetic garnet single crystal has been described in the above embodiments, the present invention is not limited to this, and is also applied to liquid phase epitaxial growth of lithium niobate, which is a single crystal for optical devices, for example. be able to.
【0016】[0016]
【発明の効果】以上の説明で明らかなように、本発明に
よれば、液相エピタキシャル成長させる時に、融液の上
部を液相温度より高く、融液の下部を液相温度以下とな
るように温度勾配を設け、育成中の下地基板を徐々に降
下させながら育成するようにしたので、育成速度がほぼ
一定となり、結晶性がよく、膜厚の均一な単結晶膜を製
造することができる。As is apparent from the above description, according to the present invention, the upper part of the melt is higher than the liquidus temperature and the lower part of the melt is below the liquidus temperature during the liquid phase epitaxial growth. Since a temperature gradient is provided and the underlying substrate being grown is gradually lowered, the growth rate is substantially constant, and a single crystal film having good crystallinity and a uniform film thickness can be manufactured.
【図1】本発明にかかる液相エピタキシャル成長装置の
浸漬中の縦断面図である。FIG. 1 is a vertical sectional view of a liquid phase epitaxial growth apparatus according to the present invention during immersion.
【図2】本発明方法と従来方法との育成速度の時間変化
図である。FIG. 2 is a diagram showing a change in growth rate with time between the method of the present invention and the conventional method.
1 炉心管 3 坩堝 7 融液 8 下地基板 9 基板保持具 10 支持棒 1 core tube 3 crucible 7 melt 8 base substrate 9 substrate holder 10 support rod
Claims (1)
堝内に浸漬し、所定時間エピタキシャル成長を行うこと
により、下地基板の表面に単結晶膜を育成する液相エピ
タキシャル成長法において、 上記融液の上部が液相温度より高くかつ融液の下部が液
相温度より低くなるように温度勾配を与え、下地基板を
融液中に浸漬した状態で徐々に降下させることにより、
下地基板の表面に単結晶膜を育成することを特徴とする
液相エピタキシャル成長法。1. A liquid phase epitaxial growth method for growing a single crystal film on a surface of a base substrate by immersing the base substrate in a crucible in which a single crystal raw material is melted and performing epitaxial growth for a predetermined time. By giving a temperature gradient so that the upper part of the melt is higher than the liquidus temperature and the lower part of the melt is lower than the liquidus temperature, by gradually lowering the underlying substrate while it is immersed in the melt,
A liquid phase epitaxial growth method characterized by growing a single crystal film on the surface of a base substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13132393A JPH06316485A (en) | 1993-05-06 | 1993-05-06 | Liquid phase epitaxial growth method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13132393A JPH06316485A (en) | 1993-05-06 | 1993-05-06 | Liquid phase epitaxial growth method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH06316485A true JPH06316485A (en) | 1994-11-15 |
Family
ID=15055272
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13132393A Pending JPH06316485A (en) | 1993-05-06 | 1993-05-06 | Liquid phase epitaxial growth method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH06316485A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001158621A (en) * | 1999-11-29 | 2001-06-12 | Stanley Electric Co Ltd | Method for forming film in liquid phase |
JP2006290643A (en) * | 2005-04-07 | 2006-10-26 | Granopt Ltd | Method for manufacturing bismuth-substituted magnetic garnet film |
-
1993
- 1993-05-06 JP JP13132393A patent/JPH06316485A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001158621A (en) * | 1999-11-29 | 2001-06-12 | Stanley Electric Co Ltd | Method for forming film in liquid phase |
JP4688115B2 (en) * | 1999-11-29 | 2011-05-25 | スタンレー電気株式会社 | Method for forming film in liquid phase |
JP2006290643A (en) * | 2005-04-07 | 2006-10-26 | Granopt Ltd | Method for manufacturing bismuth-substituted magnetic garnet film |
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