JPH0531940B2 - - Google Patents
Info
- Publication number
- JPH0531940B2 JPH0531940B2 JP60149762A JP14976285A JPH0531940B2 JP H0531940 B2 JPH0531940 B2 JP H0531940B2 JP 60149762 A JP60149762 A JP 60149762A JP 14976285 A JP14976285 A JP 14976285A JP H0531940 B2 JPH0531940 B2 JP H0531940B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- semiconductor thin
- decomposition
- gas
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Formation Of Insulating Films (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14976285A JPS6211129A (ja) | 1985-07-08 | 1985-07-08 | 半導体薄膜の形成・分解装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14976285A JPS6211129A (ja) | 1985-07-08 | 1985-07-08 | 半導体薄膜の形成・分解装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6211129A JPS6211129A (ja) | 1987-01-20 |
| JPH0531940B2 true JPH0531940B2 (cs) | 1993-05-13 |
Family
ID=15482184
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14976285A Granted JPS6211129A (ja) | 1985-07-08 | 1985-07-08 | 半導体薄膜の形成・分解装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6211129A (cs) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1992022084A1 (en) * | 1991-05-21 | 1992-12-10 | Advantage Production Technology, Inc. | Organic preclean for improving vapor phase wafer etch uniformity |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59232413A (ja) * | 1983-06-16 | 1984-12-27 | Toshiba Corp | 半導体装置の製造方法及びその製造装置 |
| JPH0658927B2 (ja) * | 1983-09-26 | 1994-08-03 | 株式会社東芝 | 半導体薄膜の分析方法および分析用試料の回収装置 |
-
1985
- 1985-07-08 JP JP14976285A patent/JPS6211129A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6211129A (ja) | 1987-01-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |