JPH05311485A - Hole sealing treatment of noble metal plate material - Google Patents

Hole sealing treatment of noble metal plate material

Info

Publication number
JPH05311485A
JPH05311485A JP34315991A JP34315991A JPH05311485A JP H05311485 A JPH05311485 A JP H05311485A JP 34315991 A JP34315991 A JP 34315991A JP 34315991 A JP34315991 A JP 34315991A JP H05311485 A JPH05311485 A JP H05311485A
Authority
JP
Japan
Prior art keywords
sealing treatment
metal
plating
acid
noble metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP34315991A
Other languages
Japanese (ja)
Inventor
Kazuhiko Fukamachi
一彦 深町
Yasuhiro Shirokabe
靖裕 白壁
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikko Kinzoku KK
Original Assignee
Nikko Kinzoku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikko Kinzoku KK filed Critical Nikko Kinzoku KK
Priority to JP34315991A priority Critical patent/JPH05311485A/en
Publication of JPH05311485A publication Critical patent/JPH05311485A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To allow an eluted metal in the inside of pinholes to react with an organic component to seal by using a noble metal plating material as an anode and electrolyzing by PR method, A.C. method or the like in an aq. solution containing an organic compound having corrosion preventing effect on a base metal or the like. CONSTITUTION:The organic compound (e.g. nitrogen contained cyclic compound, imino acid derivative ethylenediamine or the like) having corrosion preventing effect on the base metal (e.g. copper (alloy), iron, stainless steel or the like) is prepared. Next, a plated material plating the noble metal (gold, silver, rhodium, palladium, ruthenium and these alloy) on the base metal is dipped into the solution containing the organic compound. And electrolysis is executed by the use of the plated material as the anode by PR method, A.C. method, A.C./D.C superimposed method or method using A.C. jointly while irradiating with ultrasonic wave. As a result, a rigid coated film is formed to seal by allowing the base metal eluted from the inside of the plating pinholes to react with the organic component.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は貴金属めっき電気接点の
封孔処理液、封孔処理方法及び封孔処理されたコネクタ
接触子に関する。特に潤滑、防錆及び電気的接続性が長
期的に安定して優れる封孔処理液、封孔処理方法及び封
孔処理されたコネクタ接触子に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sealing treatment liquid for noble metal plated electrical contacts, a sealing treatment method, and a sealed connector contact. In particular, the present invention relates to a sealing treatment liquid, a sealing treatment method, and a connector contact having a sealing treatment, which are excellent in lubricity, rust prevention, and electrical connectivity and are stable for a long period of time.

【0002】[0002]

【従来の技術】電子機器用接続部品としてコネクタは最
も代表的なものであり、多種多様のコネクタが実用化さ
れている。電算機や電信用機器等高度の信頼性が要求さ
れるいわゆる産業用電子機器に使用されるコネクタは、
りん青銅、ベリリウム銅等のバネ用銅合金を母材とし、
貴金属めっきをしたものが一般に利用されている。しか
し、貴金属は高価であるため、コネクタ製造コストを下
げる目的で様々な方法が採られてきた。その代表的な方
法が貴金属めっきの厚みを薄くする方法であるが、貴金
属めっきの厚みを薄くするとともに被膜のピンホールが
指数関数的に増え、耐食性が著しく低下するという問題
を抱えている。この問題を解決する方法のひとつに封孔
処理がある。すなわち、各種の無機性あるいは有機性の
薬品で貴金属めっき表面を処理し、ピンホールを塞ぎ、
耐食性を向上させようとするものである。封孔処理には
水系と有機系がある。水系はクロメート法が代表的であ
り、効果はあるが接触抵抗が上昇する場合があり、ま
た、環境汚染の問題がある。有機系は、一般的にはハロ
ゲン系有機溶剤が溶媒が使われているが環境汚染の問題
がある。環境汚染性において水系の方が有利であるが、
クロメート法以外では効果が低い。
2. Description of the Related Art A connector is the most typical one as a connecting part for electronic equipment, and various types of connectors have been put to practical use. Connectors used for so-called industrial electronic devices that require a high degree of reliability, such as computers and electronic credit devices,
Base material is a spring copper alloy such as phosphor bronze or beryllium copper,
Those plated with noble metal are generally used. However, since precious metals are expensive, various methods have been adopted in order to reduce the manufacturing cost of connectors. A typical method therefor is to reduce the thickness of the noble metal plating. However, there is a problem that the thickness of the noble metal plating is reduced and the number of pinholes in the coating increases exponentially, resulting in a significant decrease in corrosion resistance. One of the methods for solving this problem is a sealing treatment. That is, the precious metal plating surface is treated with various inorganic or organic chemicals to block the pinholes,
It is intended to improve the corrosion resistance. There are water-based and organic-based sealing treatments. The chromate method is typically used for the water system, and although it is effective, the contact resistance may increase and there is a problem of environmental pollution. As the organic type, a halogen type organic solvent is generally used, but there is a problem of environmental pollution. Water is more advantageous in terms of environmental pollution,
The effect is low except for the chromate method.

【0003】[0003]

【発明が解決しようとする課題】封孔処理、特に有機性
薬品による封孔処理は、貴金属めっき被膜の厚みの低減
に対し、耐食性を維持する効果が優れている。しかし、
上記のように有機性封孔処理液は、一般的に溶媒がハロ
ゲン系有機溶剤であるため、環境汚染性に問題がある。
環境汚染性においては有機系よりも溶媒が水である水系
の方が有利であるが、クロメート法以外では効果が低
く、封孔効果が不十分である。そこで、環境汚染性に問
題が無く、かつ従来と同等もしくはそれ以上の封孔効果
を有する封孔処理液及び封孔処理方法が必要となってい
る。
The sealing treatment, particularly the sealing treatment with an organic chemical, has an excellent effect of maintaining the corrosion resistance against the reduction of the thickness of the noble metal plating film. But,
As described above, since the organic sealing treatment liquid is generally a halogen-based organic solvent, it has a problem in environmental pollution.
In terms of environmental pollution, an aqueous system in which the solvent is water is more advantageous than an organic system, but other than the chromate method, the effect is low and the sealing effect is insufficient. Therefore, there is a need for a sealing treatment liquid and a sealing treatment method which have no problem of environmental pollution and have a sealing effect equal to or higher than conventional ones.

【0004】本発明は、このような要求を満たすことの
できる改善された封孔処理液及びそれを用いる封孔処理
方法を提供することを目的とし、あわせてそれによって
処理されたコネクタを提供することを目的とするもので
ある。
An object of the present invention is to provide an improved sealing treatment liquid and a sealing treatment method using the same which can meet such requirements, and also to provide a connector treated therewith. The purpose is that.

【0005】[0005]

【課題を解決するための手段】かかる状況に鑑み、本発
明者等は鋭意研究を行った結果、以下に示す封孔処理方
法及び封孔処理されためっき材及びコネクタを発明する
に至った。すなわち、本発明は、(1)金、銀、ロジウ
ム、パラジウム、ルテニウム及びこれらの合金めっき材
を、その下地金属または下地金属成分の1種もしくは2
種以上について腐食抑制効果を有する有機化合物を含有
する水溶液中で、該めっき材をPR法、交流法、交直重
畳法、又は交流併用法で電解することを特徴とする貴金
属めっき材の封孔処理方法、(2)前記封孔処理方法に
より封孔処理されためっき材、及び(3)前記処理方法
により封孔処理された接触子である。
In view of the above situation, the inventors of the present invention have made earnest studies and, as a result, have invented a sealing treatment method, and a plated material and a connector subjected to the sealing treatment described below. That is, the present invention provides (1) gold, silver, rhodium, palladium, ruthenium, or an alloy plating material thereof, as a base metal or a base metal component thereof, or 2
Sealing treatment of a noble metal plating material, characterized in that the plating material is electrolyzed by a PR method, an alternating current method, an alternating direct superposition method, or an alternating current combined method in an aqueous solution containing an organic compound having a corrosion inhibiting effect for more than one species. A method, (2) a plated material that has been subjected to a sealing treatment by the sealing treatment method, and (3) a contact that has been subjected to a sealing treatment by the treatment method.

【0006】本発明における下地金属とは、貴金属めっ
きの下地めっき及び素材金属までも包含するものであ
る。本発明は、被処理材を陽極として直流電解すること
で貴金属めっきピンホール内部の被処理材の下地金属を
溶出し、下地金属及び溶出した金属と有機成分が反応
し、強固な被膜を作成し、封孔処理をもたせる処理方法
である。封孔処理水溶液のpHは、7.0より大とする
ことが好ましい。これは封孔処理の際、電解によって被
処理材表面のpHは液中のpHより低くなり、封孔処理
液のpHが7.0以下の低い場合、被処理材表面のpH
が低くなり過ぎて下地金属の溶出量が多く、また、有機
成分の配位力が弱くなるため好ましくないからである。
pH調整は、公知の緩衝溶液を用いて行ない、その緩衝
溶液については何等制限されない。
The base metal in the present invention includes a base metal of noble metal plating and a raw material metal. The present invention elutes the base metal of the material to be treated inside the noble metal plated pinhole by subjecting the material to be treated as an anode to direct current electrolysis, and the base metal and the eluted metal react with the organic component to form a strong coating. This is a treatment method that has a sealing treatment. The pH of the sealing treatment aqueous solution is preferably higher than 7.0. This is because during the sealing treatment, the pH of the surface of the material to be treated becomes lower than the pH in the liquid due to electrolysis.
Is too low, the amount of base metal eluted is large, and the coordinating force of the organic component is weakened, which is not preferable.
The pH adjustment is performed using a known buffer solution, and the buffer solution is not limited at all.

【0007】交直重畳法とは、交流と直流を同時に使用
する通電方法であり、交流併用法とは、交流と直流を単
独かつ交互に使用する方法である。直流電解では、被処
理材表面の電流密度に差が生じ易く、封孔処理被膜が不
均一となり好ましくなく、被処理材の形状が複雑である
ほどこの傾向が強くなる。本発明封孔処理方法において
は、PR法、交流法、交直重畳法または交流併用法の電
解方法で電解処理を行なうことで、被処理材表面の電流
密度に差が生じ難くなり、封孔処理被膜がほぼ均一とな
る。
The AC / DC superposition method is an energization method in which AC and DC are simultaneously used, and the AC combined method is a method in which AC and DC are used individually and alternately. In direct current electrolysis, a difference is likely to occur in the current density on the surface of the material to be treated, the sealing treatment coating becomes non-uniform, which is not preferable, and this tendency becomes stronger as the shape of the material to be treated becomes complicated. In the sealing treatment method of the present invention, the electrolytic treatment is carried out by the electrolytic method such as the PR method, the alternating current method, the alternating direct superposition method or the alternating current combined method, so that the difference in the current density on the surface of the material to be treated hardly occurs and the sealing treatment The coating becomes almost uniform.

【0008】被処理材を本発明封孔処理液に浸漬し電解
処理を行なう際、貴金属めっきのピンホール内部にまで
本発明封孔処理液が浸入していない場合、下地金属と本
発明封孔処理液が接しないため、錯化合物を生成しない
ため充分な封孔処理効果が得られない。そこで、超音波
を照射しながら封孔処理を行なうことでキャビテーショ
ン効果が得られ、貴金属めっきのピンホール内部にまで
本発明封孔処理液が浸入し、下地金属と本発明封孔処理
液が接し、錯化合物を生成することが可能となる。超音
波振動子の設置位置は処理槽内の床面でも側面でも良
く、何等制限されない。
When the material to be treated is electrolytically treated by immersing it in the sealing treatment solution of the present invention, if the sealing treatment solution of the present invention does not penetrate into the pinholes of the noble metal plating, the underlying metal and the sealing hole of the present invention are used. Since the treatment liquid does not come into contact with the treatment liquid, a complex compound is not formed, and thus a sufficient sealing treatment effect cannot be obtained. Therefore, the cavitation effect can be obtained by performing the sealing treatment while irradiating ultrasonic waves, and the sealing treatment liquid of the present invention penetrates into the pinholes of the noble metal plating, and the base metal and the sealing treatment liquid of the present invention contact each other. It becomes possible to generate a complex compound. The installation position of the ultrasonic transducer may be on the floor surface or the side surface in the processing tank, and is not limited in any way.

【0009】封孔処理の処理温度は何等制限されない
が、高温の方が乾燥が容易であるため60〜80℃程度
が望ましい。
The treatment temperature of the pore-sealing treatment is not limited in any way, but it is desirable to set the temperature to about 60 to 80 ° C. because the higher temperature allows easier drying.

【0010】本発明において使用する腐食抑制効果を有
する有機化合物としては、以下に示す有機化合物が好ま
しい。
The following organic compounds are preferable as the organic compound having a corrosion inhibiting effect used in the present invention.

【0011】すなわち、含窒素環式化合物、イミノ酸誘
導体、エチレンジアミン、エチレンジアミン四酢酸、グ
ルコン酸、ニトロトリ酢酸、ヒドロオキシエチル、エチ
レンジアミン三酢酸、ジエチレントリアミン五酢酸、炭
素数6〜30を有し、かつα位にOH基を有するモノカ
ルボン酸、及びその誘導体、炭素数6〜30を有する高
級脂肪酸の金属塩、アルキル置換ナフタレンスルフォン
酸塩、炭素数6〜30を有するアミンの1種もしくは2
種以上である。
That is, it has a nitrogen-containing cyclic compound, an imino acid derivative, ethylenediamine, ethylenediaminetetraacetic acid, gluconic acid, nitrotriacetic acid, hydroxyethyl, ethylenediaminetriacetic acid, diethylenetriaminepentaacetic acid, a carbon number of 6 to 30, and α One or two of monocarboxylic acid having OH group at the position and its derivative, metal salt of higher fatty acid having 6 to 30 carbon atoms, alkyl-substituted naphthalene sulfonate, amine having 6 to 30 carbon atoms
It is more than a seed.

【0012】含窒素環式化合物としては、As the nitrogen-containing cyclic compound,

【0013】[0013]

【化1】 [Chemical 1]

【0014】(上記各式中、R1は水素、アルキル、置
換アルキルを表し、R2はアルカリ金属、水素、アルキ
ル、置換アルカリを表す)等を挙げることができる。
(In the above formulas, R 1 represents hydrogen, alkyl or substituted alkyl, and R 2 represents alkali metal, hydrogen, alkyl or substituted alkali) and the like.

【0015】ベンゾトリアゾール系としては、ベンゾト
リアゾール(R1、R2ともに水素)、1−メチルベンゾ
トリアゾール(R1が水素、R2がメチル)、1−(N,
N−ジオクチルアミノメチル)ベンゾトリアゾール(R
1が水素、R2がN,N−ジオクチルアミノメチル)、ト
リルトリアゾール(R1がメチル、R2が水素)、ソディ
ウムトリルトリアゾール(R1がメチル、R2がナトリウ
ム)等が望ましい。
The benzotriazole type compounds include benzotriazole (both R 1 and R 2 are hydrogen), 1-methylbenzotriazole (R 1 is hydrogen, R 2 is methyl), 1- (N,
N-dioctylaminomethyl) benzotriazole (R
1 is hydrogen, R 2 is N, N-dioctylaminomethyl), tolyltriazole (R 1 is methyl, R 2 is hydrogen), sodium tolyltriazole (R 1 is methyl, R 2 is sodium) and the like are preferable.

【0016】インダゾール系としては、例えばインダゾ
ール(R1、R2ともに水素)、2−メチルインダゾール
(R1が水素、R2がメチル)、2−ベンジルインダゾー
ル(R1が水素、R2がC65CH2)、1−アセチルイ
ンダゾール(R1が水素、R2がCOCH3)等が好まし
い。
Examples of the indazole system include indazole (both R 1 and R 2 are hydrogen), 2-methylindazole (R 1 is hydrogen, R 2 is methyl), 2-benzylindazole (R 1 is hydrogen, R 2 is C). 6 H 5 CH 2 ), 1-acetylindazole (R 1 is hydrogen, R 2 is COCH 3 ) and the like are preferable.

【0017】ベンズイミダゾール系としては、例えばベ
ンズイミダゾール(R1、R2ともに水素)、N−アセチ
ルベンズイミダゾール(R1が水素、R2がCOC
3)、N−ベンゾイルベンズイミダゾール(R1が水
素、R2がCOC65)等が好ましい。
Examples of the benzimidazole type compounds include benzimidazole (both R 1 and R 2 are hydrogen), N-acetylbenzimidazole (R 1 is hydrogen, R 2 is COC).
H 3), N-benzoyl benzimidazole (R 1 is hydrogen, R 2 is COC 6 H 5) are preferred.

【0018】インドール系としては、例えばインドール
(R1、R2ともに水素)、インドール−1−カルボン酸
(R1が水素、R2がCOOH)、1−メチルインドール
(R1が水素、R2がCH3)等が好ましい。
Examples of the indole system include indole (both R 1 and R 2 are hydrogen), indole-1-carboxylic acid (R 1 is hydrogen, R 2 is COOH), 1-methylindole (R 1 is hydrogen, R 2 Is preferably CH 3 ).

【0019】また、1,3,5−トリアジン系化合物と
しては、例えば6−置換−1,3,5−トリアジンチオ
ール−ナトリウム塩
As the 1,3,5-triazine compound, for example, 6-substituted-1,3,5-triazinethiol-sodium salt

【0020】[0020]

【化2】 [Chemical 2]

【0021】(Rは−SH、またはアルキル基又はアリ
ール基で置換されたアミノ基で、たとえば−NHC
3、−NHC25、−N(CH32、−N(C
252、−NHC65、−N(C492、−N(C8
172、−N(C12242、−N(CH2CH=C
22、−NHC816CH=CHC817等が好まし
い。)シアヌル酸(2,4,6−トリオキシ−1,3,
5−トリアジン)、
(R is --SH, or an amino group substituted with an alkyl group or an aryl group, for example --NHC.
H 3, -NHC 2 H 5, -N (CH 3) 2, -N (C
2 H 5) 2, -NHC 6 H 5, -N (C 4 H 9) 2, -N (C 8
H 17) 2, -N (C 12 H 24) 2, -N (CH 2 CH = C
H 2) 2, etc. -NHC 8 H 16 CH = CHC 8 H 17 are preferable. ) Cyanuric acid (2,4,6-trioxy-1,3,3
5-triazine),

【0022】[0022]

【化3】 [Chemical 3]

【0023】メラミン系化合物(2置換−4,6ジアミ
ノ−1,3,5−トリアジン)
Melamine compound (2-substituted-4,6 diamino-1,3,5-triazine)

【0024】[0024]

【化4】 [Chemical 4]

【0025】{Rは−NH2{R is --NH 2 ,

【0026】[0026]

【化5】 [Chemical 5]

【0027】(R’はCH3、C25、C1123等のア
ルキル基)}を挙げることができる。
(R 'is an alkyl group such as CH 3 , C 2 H 5 , C 11 H 23 )}.

【0028】イミノ酸誘導体としては、イミノジアセト
ニトリル{NH−(CH2CN)2}、イミノジカルボン
酸{NH−(COOH)2}、イミノジ酢酸{NH−
(CH2COOH)2}等が好ましい。
Examples of the imino acid derivative include imino diacetonitrile {NH- (CH 2 CN) 2 }, imino dicarboxylic acid {NH- (COOH) 2 } and imino diacetic acid {NH-.
(CH 2 COOH) 2 } and the like are preferable.

【0029】又、エチレンジアミン、エチレンジアミン
四酢酸(EDTA)、グルコン酸、ニトロトリ酢酸(N
TA)、ヒドロキシエチルエチレンジアミン三酢酸(H
EDTA)、ジエチレントリアミン五酢酸(DTPA)
等も本発明に使用する封孔処理液成分として有効であ
る。
Further, ethylenediamine, ethylenediaminetetraacetic acid (EDTA), gluconic acid, nitrotriacetic acid (N
TA), hydroxyethyl ethylenediamine triacetic acid (H
EDTA), diethylenetriaminepentaacetic acid (DTPA)
Etc. are also effective as a component of the sealing treatment liquid used in the present invention.

【0030】本発明封孔処理液の成分として有効である
炭素数6〜30を有し、かつα位にOHを有するモノカ
ルボン酸の一般式は、
The general formula of the monocarboxylic acid having 6 to 30 carbon atoms and having OH at the α-position, which is effective as a component of the sealing treatment liquid of the present invention, is as follows:

【0031】[0031]

【化6】 [Chemical 6]

【0032】で示される。例えばマレイン酸、オレイン
酸、ナフテン酸等を挙げることができる。C6〜C30
つα位にOHを有するモノカルボン酸の誘導体として
は、ヌカ油マレイン化物、ナフテン酸ナトリウム等を挙
げることができる。
It is shown by. Examples thereof include maleic acid, oleic acid, naphthenic acid and the like. Examples of the monocarboxylic acid derivative having C 6 to C 30 and OH in the α-position include maleic oil of nuka oil and sodium naphthenate.

【0033】炭素数6〜30を有する高級脂肪酸の金属
塩としては、例えばステアリン酸金属塩、ラウリン酸金
属塩、リシノレン酸金属塩、ミリスチン酸金属塩、オレ
イン酸金属塩、ナフテン酸金属塩及びナフテン酸金属塩
等を挙げることができ、また、その金属塩としては制限
はないが、カルシウム、アルミニウム、バリウム、鉛塩
等が好ましい。
Examples of the metal salt of higher fatty acid having 6 to 30 carbon atoms include metal stearate, metal laurate, metal ricinolenate, metal myristicate, metal oleate, metal naphthenate and naphthene. Examples thereof include acid metal salts, and the metal salts are not particularly limited, but calcium, aluminum, barium, lead salts and the like are preferable.

【0034】アルキル置換ナフタレンスルフォン酸塩と
しては、ジノリルナフタレンスルフォン酸バリウム塩、
ジノリルナフタレンスルフォン酸カルシウム塩、ジノリ
ルナフタレンスルフォン酸亜鉛塩、ジノリルナフレンス
ルフォン酸バリウム塩基性塩、ジノリルナフタレンスル
フォン酸エチレンジアミン塩、ジノリルナフタレンスル
フォン酸ナトリウム塩、ジノリルナフタレンスルフォン
酸リチウム塩、ジノリルナフタレンスルフォン酸鉛塩、
ジノリルナフタレンスルフォン酸アンモニウム塩、ジノ
リルナフタレンスルフォン酸トリエタノールアミン塩等
を挙げることができる。
Alkyl-substituted naphthalene sulfonates include barium dinolyl naphthalene sulfonates,
Calcium salt of dinolylnaphthalene sulfonic acid, zinc salt of dinolyl naphthalene sulfonic acid, basic salt of dinolyl naphthalene sulfonic acid barium salt, dinolyl naphthalene sulfonic acid ethylenediamine salt, dinolyl naphthalene sulfonic acid sodium salt, dinolyl naphthalene sulfonic acid lithium salt, Dinolyl naphthalene sulfonic acid lead salt,
Examples thereof include ammonium dinolylnaphthalene sulfonic acid, triethanolamine dinolyl naphthalene sulfonic acid, and the like.

【0035】炭素数6〜30を有するアミンとしては、
オクタデシルアミン、ドデシルアミン、デシルアミン、
オクチルアミン及びシクロヘキシルアミン等を挙げるこ
とができる。
As the amine having 6 to 30 carbon atoms,
Octadecylamine, dodecylamine, decylamine,
Examples thereof include octylamine and cyclohexylamine.

【0036】本発明封孔処理液の成分として界面活性剤
を添加することは、本発明封孔処理液と被処理材との湿
潤性を向上させることに有効であり、何等制限されな
い。また、本発明封孔処理液の成分として潤滑剤を添加
することは、本発明封孔処理材の摩擦軽減に有効であ
り、何等制限されない。
The addition of a surfactant as a component of the sealing treatment liquid of the present invention is effective in improving the wettability between the sealing treatment liquid of the present invention and the material to be treated, and is not limited in any way. Further, addition of a lubricant as a component of the sealing treatment liquid of the present invention is effective in reducing the friction of the sealing treatment material of the present invention and is not limited in any way.

【0037】めっき品をプレス加工後に本発明の封孔処
理液及び封孔処理方法で封孔処理することも有効であ
る。めっき後封孔処理した金属材料であっても、その後
のプレス加工で付着したプレス油を洗浄する工程におい
て、封孔処理の効果が低下する。そこで再度の封孔処理
が有効となる。
It is also effective to perform a sealing treatment on the plated product after pressing with the sealing treatment liquid and the sealing treatment method of the present invention. Even with a metal material that has been subjected to a pore-sealing treatment after plating, the effect of the pore-sealing treatment decreases in the step of washing the press oil that has adhered in the subsequent press working. Therefore, the sealing treatment again becomes effective.

【0038】その後のコネクタの加工工程においても、
最終の電子機器組立まで、めっき品の洗浄工程があれば
同様に封孔処理効果は低下するため、適宜本発明により
封孔処理することが有効である。さらには電子機器に組
み込まれた後、使用量に伴い封孔処理効果が低下する場
合、適宜本発明方法によって処理することができる。従
って、本発明は本発明封孔処理方法によって処理された
コネクタも包含するものである。
Also in the subsequent connector processing steps,
If there is a step of washing the plated product until the final electronic device is assembled, the effect of the sealing treatment is similarly reduced. Therefore, it is effective to appropriately perform the sealing treatment according to the present invention. Furthermore, when the sealing treatment effect decreases with the amount used after being incorporated in an electronic device, it can be appropriately treated by the method of the present invention. Therefore, the present invention also includes a connector processed by the sealing method of the present invention.

【0039】なお、本発明におけるめっき母材となる金
属材料は、銅、黄銅、りん青銅、チタン銅、ベリリウム
銅等の各種銅合金、鉄、ステンレス鋼、高ニッケル合金
等のコネクタ等のめっき材の要求特性に従い、適宜選択
でき、何等制限されない。又、下地めっきについては、
ニッケル、ニッケル−コバルト、パラジウム−ニッケ
ル、錫−ニッケル、銀等が用いられ、特にニッケルが好
ましい、めっき材のめっき方法については、電気メッ
キ、無電解めっき、あるいはCVD、PVD等の乾式め
っき等の公知のものを適用でき、制限されない。
The metal material used as the plating base material in the present invention is copper, brass, phosphor bronze, titanium copper, beryllium copper, or other various copper alloys, iron, stainless steel, high nickel alloys, or other plating materials such as connectors. Can be appropriately selected according to the required characteristics of, and is not limited in any way. Also, regarding the base plating,
Nickel, nickel-cobalt, palladium-nickel, tin-nickel, silver and the like are used, and nickel is particularly preferable. The plating material can be plated by electroplating, electroless plating, or dry plating such as CVD or PVD. Known ones can be applied and are not limited.

【0040】[0040]

【実施例】以下に実施例を挙げて本発明を更に詳細に説
明する。
EXAMPLES The present invention will be described in more detail with reference to the following examples.

【0041】バネ用りん青銅(C5210−H)の厚み
0.2mmの冷間圧延材を用い、雄及び雌の連続端子を
それぞれプレス成形した。これらをリール・ツウ・リー
ルの連続電気めっきラインを通して電気めっきを施し
た。めっきラインにおいては、脱脂、酸洗後、ワット浴
により1μmのニッケルめっきを行ない、その上に金を
0.1μmの厚みで接点部に部分めっきした。また、連
続めっきラインでは、金めっき後に封孔処理工程を設
け、連続端子を通入することにより70℃で封孔処理を
施した。封孔処理液のpHは、緩衝溶液を用いて調整し
た。
Male and female continuous terminals were each press-molded using a 0.2 mm-thick cold-rolled material of spring phosphor bronze (C5210-H). These were electroplated through a reel-to-reel continuous electroplating line. In the plating line, after degreasing and pickling, 1 μm nickel plating was performed in a Watts bath, and gold was partially plated on the contact portion with a thickness of 0.1 μm. Further, in the continuous plating line, a sealing treatment step was provided after gold plating, and the continuous terminal was inserted to perform the sealing treatment at 70 ° C. The pH of the sealing treatment liquid was adjusted using a buffer solution.

【0042】こうして表面処理をした雄と雌の端子をキ
ャリアー部から切断しリード線を圧着した後、それぞれ
を嵌合し評価試験に供した。
After the surface-treated male and female terminals were cut from the carrier and the lead wires were crimped, the terminals were fitted and subjected to an evaluation test.

【0043】接触抵抗は直流10mmA、開放電圧50
mmVで測定した。腐食条件は次の条件で行った。
Contact resistance is DC 10 mmA, open voltage 50
It was measured in mmV. The corrosion conditions were as follows.

【0044】ガス組成:H2S 3ppm SO2 10ppm 温 度 :40±2℃ 湿 度 :80±5%RH 時 間 :240時間 結果を表1〜4に示す。Gas composition: H 2 S 3 ppm SO 2 10 ppm Temperature: 40 ± 2 ° C. Humidity: 80 ± 5% RH time: 240 hours The results are shown in Tables 1 to 4.

【0045】[0045]

【表1】 [Table 1]

【0046】[0046]

【表2】 [Table 2]

【0047】[0047]

【表3】 [Table 3]

【0048】[0048]

【表4】 [Table 4]

【0049】注1)ただし、表中封孔処理液の略号は以
下の通りである。
Note 1) However, the abbreviations for the sealing treatment liquid in the table are as follows.

【0050】A−1:ベンゾトリアゾール A−2:1−メチルベンゾトリアゾール A−3:トリルトリアゾール A−4:インダゾール A−5:ベンズイミダゾール A−6:インドール A−7:1,3,5−トリアジン−2,4,6−トリチ
オールモノナトリウム A−8:6−ジメチルアミノ−1,3,5−トリアジン
−2,4−ジチオールモノナトリウム A−9:シアヌル酸 A−10:メラミン A−11:イミノジアセトニトリル A−12:イミノジカルボン酸 A−13:イミノジ酢酸 A−14:エチレンジアミン A−15:エチレンジアミン四酢酸 A−16:ニトロトリ酢酸 A−17:ヒドロオキシエチル、エチレンジアミン三酢
酸 A−18:ジエチレントリアミン五酢酸 B−1:マレイン酸 B−2:オレイン酸 B−3:ナフテン酸 B−4:ステアリン酸バリウム B−5:ラウリル酸バリウム B−6:オレイン酸カルシウム B−7:ナフテン酸カルシウム B−8:ジノリルナフタレンスルフォン酸バリウム B−9:ジノリルナフタレンスルフォン酸リチウム B−10:ジノリルナフタレンスルフォン酸トリエタノ
ールアミン B−11:オクタデシルアミン B−12:ドデシルアミン B−13:デシルアミン 注2)試験の判定基準は次のとおりである。
A-1: benzotriazole A-2: 1-methylbenzotriazole A-3: tolyltriazole A-4: indazole A-5: benzimidazole A-6: indole A-7: 1,3,5- Triazine-2,4,6-trithiol monosodium A-8: 6-Dimethylamino-1,3,5-triazine-2,4-dithiol monosodium A-9: Cyanuric acid A-10: Melamine A-11 : Iminodiacetonitrile A-12: iminodicarboxylic acid A-13: iminodiacetic acid A-14: ethylenediamine A-15: ethylenediaminetetraacetic acid A-16: nitrotriacetic acid A-17: hydroxyethyl, ethylenediaminetriacetate A-18: Diethylenetriamine pentaacetic acid B-1: Maleic acid B-2: Oleic acid B-3: Na Tenic acid B-4: Barium stearate B-5: Barium laurate B-6: Calcium oleate B-7: Calcium naphthenate B-8: Barium dinolylnaphthalene sulfonate B-9: Lithium dinolynaphthalene sulfonate B-10: Triethanolamine dinolylnaphthalene sulfonic acid B-11: Octadecylamine B-12: Dodecylamine B-13: Decylamine Note 2) The criteria for the test are as follows.

【0051】 初期接触抵抗、腐食試験後の接触抵抗
(n=5の平均値) A :10mmΩ以下 B :10〜20mmΩ C :20〜50mmΩ D :50〜100mmΩ E :100mmΩ以上 腐食試験後の外観 A :腐食生成物なし B :腐食生成物点在 C :腐食点が全面に認められる
Initial contact resistance, contact resistance after corrosion test (average value of n = 5) A: 10 mmΩ or less B: 10 to 20 mmΩ C: 20 to 50 mmΩ D: 50 to 100 mmΩ E: 100 mmΩ or more Appearance after corrosion test A : No corrosion products B: Corrosion products scattered C: Corrosion points are observed on the entire surface

【0052】[0052]

【発明の効果】以上述べたように、本発明により封孔処
理された貴金属めっき材は、封孔処理直後の接触抵抗が
低く、過酷な腐食環境においても優れた耐食性を示し、
接触抵抗が上昇せず、接触性能が安定しているという利
点を有する。
As described above, the noble metal plating material which has been subjected to the sealing treatment according to the present invention has a low contact resistance immediately after the sealing treatment and exhibits excellent corrosion resistance even in a severe corrosive environment.
It has advantages that the contact resistance does not increase and the contact performance is stable.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 C25D 5/18 5/20 ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 5 Identification code Internal reference number FI technical display location C25D 5/18 5/20

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 金、銀、ロジウム、パラジウム、ルテニ
ウム及びこれらの合金めっき材を、その下地金属または
下地金属成分の1種もしくは2種以上について腐食抑制
効果を有する有機化合物を含有する水溶液中で、該めっ
き材を陽極とPR法、交流法、交直重畳法、又は交流併
用法で電解することを特徴とする貴金属めっき材の封孔
処理方法。
1. An aqueous solution containing gold, silver, rhodium, palladium, ruthenium, or an alloy plating material of these, containing an organic compound having a corrosion-inhibiting effect on the underlying metal or one or more of the underlying metal components. A method for sealing a noble metal plated material, which comprises electrolyzing the plated material with an anode by a PR method, an alternating current method, an alternating direct superposition method, or an alternating current combined method.
【請求項2】 超音波を照射しながら封孔処理を行なう
ことを特徴とする請求項1記載の封孔処理方法。
2. The sealing treatment method according to claim 1, wherein the sealing treatment is performed while irradiating ultrasonic waves.
【請求項3】 請求項1又は2記載の封孔処理方法によ
り封孔処理されためっき材。
3. A plated material which has been subjected to a sealing treatment by the sealing treatment method according to claim 1.
【請求項4】 請求項1又は2記載の封孔処理方法によ
り封孔処理されたコネクタ接触子。
4. A connector contact that has been subjected to a sealing treatment by the sealing treatment method according to claim 1.
JP34315991A 1991-12-25 1991-12-25 Hole sealing treatment of noble metal plate material Pending JPH05311485A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34315991A JPH05311485A (en) 1991-12-25 1991-12-25 Hole sealing treatment of noble metal plate material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34315991A JPH05311485A (en) 1991-12-25 1991-12-25 Hole sealing treatment of noble metal plate material

Publications (1)

Publication Number Publication Date
JPH05311485A true JPH05311485A (en) 1993-11-22

Family

ID=18359373

Family Applications (1)

Application Number Title Priority Date Filing Date
JP34315991A Pending JPH05311485A (en) 1991-12-25 1991-12-25 Hole sealing treatment of noble metal plate material

Country Status (1)

Country Link
JP (1) JPH05311485A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2301599A (en) * 1995-05-31 1996-12-11 Japan Energy Corp Electrolytic desilvering agents
US5863611A (en) * 1997-05-27 1999-01-26 Lilly Industries (Usa), Inc. Iminodiacetonitrile mirror back coating corrosion inhibitor
GB2333780A (en) * 1995-05-31 1999-08-04 Japan Energy Corp Electrolytic desilvering agent
JP2012162791A (en) * 2011-02-09 2012-08-30 Jx Nippon Mining & Metals Corp Plated material for terminal or connector and manufacturing method therefor
CN110528031A (en) * 2019-08-06 2019-12-03 国网山东省电力公司电力科学研究院 Based on the more first coordination systems of EDTA without cyanogen brush plating liquor and preparation method thereof

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2301599A (en) * 1995-05-31 1996-12-11 Japan Energy Corp Electrolytic desilvering agents
GB2333780A (en) * 1995-05-31 1999-08-04 Japan Energy Corp Electrolytic desilvering agent
GB2301599B (en) * 1995-05-31 1999-11-10 Japan Energy Corp Electrolytic desilvering agents and electrolytic desilvering method
US5863611A (en) * 1997-05-27 1999-01-26 Lilly Industries (Usa), Inc. Iminodiacetonitrile mirror back coating corrosion inhibitor
JP2012162791A (en) * 2011-02-09 2012-08-30 Jx Nippon Mining & Metals Corp Plated material for terminal or connector and manufacturing method therefor
CN110528031A (en) * 2019-08-06 2019-12-03 国网山东省电力公司电力科学研究院 Based on the more first coordination systems of EDTA without cyanogen brush plating liquor and preparation method thereof

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