JPH05291469A - Plastic sealed semiconductor device, memory card using this device and manufacture thereof - Google Patents

Plastic sealed semiconductor device, memory card using this device and manufacture thereof

Info

Publication number
JPH05291469A
JPH05291469A JP4090725A JP9072592A JPH05291469A JP H05291469 A JPH05291469 A JP H05291469A JP 4090725 A JP4090725 A JP 4090725A JP 9072592 A JP9072592 A JP 9072592A JP H05291469 A JPH05291469 A JP H05291469A
Authority
JP
Japan
Prior art keywords
downward
semiconductor device
resin
leads
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4090725A
Other languages
Japanese (ja)
Inventor
Nobuhito Oouchi
伸仁 大内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP4090725A priority Critical patent/JPH05291469A/en
Publication of JPH05291469A publication Critical patent/JPH05291469A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • H05K1/181Printed circuits structurally associated with non-printed electric components associated with surface mounted components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3421Leaded components

Abstract

PURPOSE:To make it possible to mount a plastic sealed semiconductor device on a printed board at a high density. CONSTITUTION:A memory card is provided with a plastic sealed semiconductor device 10 with leads turned both upwards and downwards that has a lead 10A turned downwards and a lead 10B turned upwards; a plastic sealed semiconductor device 11 with both leads turned downwards that has a lead 11A turned downwards and a lead 11B turned downwards ; and a plastic sealed semiconductor device 12 with leads both turned upwards and downwards that has a lead 12A turned upwards and a lead 12B turned downwards.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は高密度実装可能な樹脂封
止型半導体装置の構造、この樹脂封止型半導体装置を複
数個用いてカード状に組み込んだメモリカードの構造、
およびそのメモリカードの製造方法に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a structure of a resin-encapsulated semiconductor device capable of high-density mounting, a structure of a memory card in which a plurality of the resin-encapsulated semiconductor devices are incorporated into a card,
And a method of manufacturing the memory card.

【0002】[0002]

【従来の技術】現在、広く用いられているキャッシュカ
ード、クレジットカード等は、プラスチックカードに磁
気ストライプを塗布し、これに記録された情報を読み取
ることで本人であるか否かの確認が行なえるようにした
ものである。このような磁気記録方式のものでは、第3
者によって情報が解読され易く、記録可能な情報量も少
ない。
2. Description of the Related Art Currently, widely used cash cards, credit cards, etc. can be verified as to who they are by applying a magnetic stripe to a plastic card and reading the information recorded on it. It was done like this. In such a magnetic recording system, the third
Information is easily deciphered by a person, and the amount of recordable information is small.

【0003】そこで、近年、メモリ、CPU等の機能を
有するICをカード状基体に実装した、いわゆるICカ
ードが開発され、実用化されている。
Therefore, in recent years, a so-called IC card in which an IC having functions such as a memory and a CPU is mounted on a card-shaped substrate has been developed and put into practical use.

【0004】また、ICのそのものの代わりに、きわめ
て薄い半導体装置を搭載したメモリカードが提案されて
いる。図10は従来のメモリカードを示す一部破断した
斜視図である。図において、1はカバー、2はフレー
ム、3は金属シャッタ、4は複数個の樹脂封止型半導体
装置5および複数個のチップコンデンサ6を搭載したプ
リント基板、7は接続パットである。
Further, a memory card has been proposed in which an extremely thin semiconductor device is mounted instead of the IC itself. FIG. 10 is a partially cutaway perspective view showing a conventional memory card. In the figure, 1 is a cover, 2 is a frame, 3 is a metal shutter, 4 is a printed circuit board on which a plurality of resin-sealed semiconductor devices 5 and a plurality of chip capacitors 6 are mounted, and 7 is a connection pad.

【0005】なお、前記樹脂封止型半導体装置5は、図
11に示すように、そのリード8が半田9によりプリン
ト基板4に固定される。
The lead 8 of the resin-encapsulated semiconductor device 5 is fixed to the printed circuit board 4 by solder 9 as shown in FIG.

【0006】この構成によるメモリカードは、ICカー
ドよりはカード厚が厚くなるが、1つ1つの機能そのも
のが、樹脂封止型半導体装置5を使用していることか
ら、信頼性が高く、機械的強度も強く、また、製造の容
易さから量産性もすぐれ、そして、情報の容量が多いと
いう利点がある。
The memory card having this structure has a thicker card thickness than the IC card, but since each function itself uses the resin-sealed semiconductor device 5, it is highly reliable and mechanical. It has the advantages that it has a high dynamic strength, is excellent in mass productivity because of its ease of manufacturing, and has a large amount of information.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、上記構
成のメモリカードでは、近年に見られる高機能(高情
報)化には更に発展していかなければならない状況にあ
るにもかかわらず、光のカードは、JEIDA規格によ
り、サイズは54.0mm×85.6mm×3.3mm
となっているため、現状のメモリカードのサイズに搭載
されている厚み1.0mm強の樹脂封止型半導体装置は
図11に示すように横方向で3個程度しか実装すること
ができないという問題点があった。
However, in the memory card having the above-mentioned structure, the optical card is in a situation where it is necessary to further develop the high function (high information) seen in recent years. Has a size of 54.0 mm x 85.6 mm x 3.3 mm according to the JEIDA standard.
Therefore, the resin-sealed semiconductor device with a thickness of more than 1.0 mm, which is mounted in the size of the current memory card, can be mounted only in the lateral direction as shown in FIG. There was a point.

【0008】本発明は、以上述べたメモリカードに樹脂
封止型半導体装置を高密度に実装することができないと
いう問題点を除去するため、樹脂封止型半導体装置のリ
ードの形状および樹脂封止部を改良して、樹脂封止型半
導体装置の高密度な実装を可能にした優れた樹脂封止型
半導体装置およびメモリカードを提供することを目的と
する。
According to the present invention, in order to eliminate the above-mentioned problem that the resin-sealed semiconductor device cannot be mounted on the memory card at a high density, the lead shape of the resin-sealed semiconductor device and the resin-sealed semiconductor device are sealed. It is an object of the present invention to provide an excellent resin-encapsulated semiconductor device and a memory card that have improved parts to enable high-density mounting of the resin-encapsulated semiconductor device.

【0009】[0009]

【課題を解決するための手段】本発明に係る樹脂封止型
半導体装置は、一方のリードを下向きあるいは上向きに
形成し、他方のリードを下向きあるいは上向きに形成し
て樹脂封止し、下向・上向リード付き樹脂封止型半導体
装置、下向・下向リード付き樹脂封止型半導体装置、上
向・下向リード付き樹脂封止型半導体装置を備えたもの
である。
In a resin-sealed semiconductor device according to the present invention, one lead is formed downward or upward, and the other lead is formed downward or upward and resin-sealed. A resin-encapsulated semiconductor device with upward leads, a resin-encapsulated semiconductor device with downward / downward leads, and a resin-encapsulated semiconductor device with upward / downward leads.

【0010】また、本発明に係るメモリカードは、下向
・上向リード付き樹脂封止型半導体装置の上向きリード
に、下向・下向リード付き樹脂封止型半導体装置の下向
きリードを接続し、上向・下向リード付き樹脂封止型半
導体装置の上向きリードに、下向・下向リード付き樹脂
封止型半導体装置の下向きリードを接続し、それらのリ
ードを、接続する樹脂封止型半導体装置の樹脂封止部の
リード溝に収納し、一体に接続した複数個の樹脂封止型
半導体装置をプリント基板に固定してケースに収納する
ものである。
In the memory card according to the present invention, the downward leads of the resin-encapsulated semiconductor device with downward / downward leads are connected to the upward leads of the resin-encapsulated semiconductor device with downward / upward leads. , Resin-encapsulated type with downward / downward leads, connecting the downward leads of the resin-encapsulated semiconductor device with downward / downward leads to the upward leads of the resin-encapsulated semiconductor device with upward / downward leads A plurality of resin-sealed semiconductor devices, which are housed in a lead groove of a resin-sealed portion of a semiconductor device and integrally connected, are fixed to a printed circuit board and housed in a case.

【0011】また、本発明に係る樹脂封止型半導体装置
の製造方法は、第1層目の下向・下向リード付き樹脂封
止型半導体装置をプリント基板に半田接合する第1の実
装工程と、第1層目の下向・上向リード付き樹脂封止型
半導体装置の下向きリード、および第1層目の上向・下
向リード付き樹脂封止型半導体装置の下向きリードをプ
リント基板に半田接合する第2の実装工程と、第2層目
の下向・下向リード付き樹脂封止型半導体装置の各下向
リードを対応した上向・下向リード付き樹脂封止型半導
体装置および下向・上向リード付き樹脂封止型半導体装
置のリードに半田接合する第3の実装工程とを有するも
のである。
The method for manufacturing a resin-encapsulated semiconductor device according to the present invention comprises a first mounting step of solder-bonding the first-layer resin-encapsulated semiconductor device with downward / downward leads to a printed circuit board. Soldering the downward leads of the resin-encapsulated semiconductor device with downward / upward leads of the first layer and the downward leads of the resin-encapsulated semiconductor device with upward / downward leads of the first layer to a printed circuit board; The resin mounting type semiconductor device with upward / downward leads and the downward / upward leads corresponding to the mounting process of 2 and the downward leads of the downward / downward resin-sealed semiconductor device with downward leads. And a third mounting step of solder-joining to the leads of the resin-encapsulated semiconductor device with a cover.

【0012】[0012]

【作用】本発明は樹脂封止型半導体装置のリード形状お
よび樹脂封止部により、プリント基板上に高密度に実装
することができる。
The present invention enables high-density mounting on a printed circuit board due to the lead shape and the resin-sealed portion of the resin-sealed semiconductor device.

【0013】[0013]

【実施例】図1は本発明に係る樹脂封止型半導体装置の
一実施例を示す側面図である。図において、10は図1
(A)に示すように、リード10Aが下側に向き、リー
ド10Bが上側に向いて装着し、その樹脂封止部10C
に、図2に示すようにリード形状に合わせたリード溝1
0Dが形成された下向・上向リード付き樹脂封止型半導
体装置(以下単に下向・上向半導体装置と言う)、11
は図1(B)に示すように、リード11Aが下側に向
き、リード11Bが下側に向いて装着し、その樹脂封止
部11Cに、図2に示すようにリード形状に合わせたリ
ード溝11Dが形成された下向・下向リード付き樹脂封
止型半導体装置(以下単に下向・下向半導体装置と言
う)、12は図1(C)に示すように、リード12Aが
上側に向き、リード12Bが下側に向いて装着し、その
樹脂封止部12Cに、図2に示すようにリード形状に合
わせたリード溝12Dが形成された上向・下向リード付
き樹脂封止型半導体装置(以下単に上向・下向半導体装
置と言う)である。
1 is a side view showing an embodiment of a resin-sealed semiconductor device according to the present invention. In the figure, 10 is the same as in FIG.
As shown in (A), the lead 10A is mounted so that the lead 10A faces downward and the lead 10B faces upward.
In addition, as shown in FIG. 2, the lead groove 1 matched to the lead shape
Resin-sealed semiconductor device with downward / upward leads having 0D formed thereon (hereinafter simply referred to as downward / upward semiconductor device), 11
As shown in FIG. 1 (B), the leads 11A are mounted so that the leads 11A face downward and the leads 11B face downward, and the resin-sealed portion 11C has leads conforming to the lead shape as shown in FIG. As shown in FIG. 1C, a resin-sealed semiconductor device with a downward / downward lead in which a groove 11D is formed (hereinafter simply referred to as a downward / downward semiconductor device) 12 has an upper side with a lead 12A. Orientation, the lead 12B is mounted facing downward, and the resin-sealed portion 12C is provided with a lead groove 12D formed to match the lead shape as shown in FIG. A semiconductor device (hereinafter, simply referred to as an upward / downward semiconductor device).

【0014】なお、上記構成による下向・上向半導体装
置10および上向・下向半導体装置12において、リー
ド10Aおよび12Aと、リード10Bおよび12Bと
は図3(A)に示すように交互に設けられており、その
リード配線状態をAパターンリードとする。また、下向
・下向半導体装置11において、リード11Aとリード
11Bとは図3(B)に示すように交互に設けられてお
り、そのリード配線状態をBパターンリードとする。
In the downward / upward semiconductor device 10 and the upward / downward semiconductor device 12 having the above structure, the leads 10A and 12A and the leads 10B and 12B are alternately arranged as shown in FIG. It is provided and its lead wiring state is referred to as A pattern lead. Further, in the downward / downward semiconductor device 11, the leads 11A and the leads 11B are alternately provided as shown in FIG. 3B, and the lead wiring state is referred to as a B pattern lead.

【0015】図4は本発明に係るメモリカードの一実施
例を示す側面図であり、図5は図4の一部破断した平面
図である。図において、13はメモリカードのケース、
14はプリント基板である。一例として、樹脂封止型半
導体装置を7個搭載した場合を示す。そして、この7個
の樹脂封止型半導体装置をプリント基板上に固定する方
法を図6および図7を参照して説明する。まず、位置L
4(図6(A)参照)に、下向・下向半導体装置11
(第1層目)のリード11Aおよび11Bをプリント基
板14に半田15付けする。次に、位置L2(図6
(A)参照)に、下向・上向半導体装置10(第1層
目)のリード10Aをプリント基板14に半田15付け
する。次に、位置L6(図6(A)参照)に、上向・下
向半導体装置12(第1層目)のリード12Bをプリン
ト基板14に半田15付けする。次に、位置L7(図6
(A)参照)に、上向・下向半導体装置12(第1層
目)のリード12Bをプリント基板14に半田15付け
する。次に、位置L5(図6(A)参照)に、下向・下
向半導体装置11(第2層目)のリード11Aと上記の
下向・上向半導体装置10(第1層目)のリード10B
とを半田15付けして、図7に示すように、すでに固定
されている位置L4(図6(A)参照)の下向・下向半
導体装置(第1層目)11のリード溝11Dに接着剤1
6で固定する。同様に、この位置L5(第2層目)のリ
ード11Bと上記の上向・下向半導体装置12(第1層
目)のリード12Aとを半田15付けして、図7に示す
ように、すでに固定されている位置L4(図6(A)参
照)の下向・下向半導体装置(第1層目)のリード溝1
0Dに接着剤16で固定する。次に、位置L1(図6
(A)参照)に、下向・上向半導体装置10(第1層
目)のリード10Aをプリント基板5に半田15付けす
る。次に、位置L3(図6(A)参照)に、下向・下向
半導体装置11(第2層目)のリード11Aと上記の下
向・上向半導体装置10(第1層目)のリード10Bと
を半田15付けして、図7に示すように、すでに固定さ
れている位置L2(図6(A)参照)の下向・上向半導
体装置(第1層目)10のリード溝10Dに接着剤16
で固定する。同様に、この位置L3(図6(A)参照)
の下向・下向半導体装置11(第2層目)のリード11
Bと上記の上向・下向半導体装置12(第1層目)のリ
ード12Aとを半田15付けして、図7に示すように、
すでに固定されている位置L2(図6(A)参照)の下
向・上向半導体装置(第1層目)10のリード溝10D
に接着剤16で固定する。
FIG. 4 is a side view showing an embodiment of the memory card according to the present invention, and FIG. 5 is a partially cutaway plan view of FIG. In the figure, 13 is a memory card case,
14 is a printed circuit board. As an example, a case where seven resin-sealed semiconductor devices are mounted is shown. Then, a method of fixing the seven resin-sealed semiconductor devices on the printed circuit board will be described with reference to FIGS. 6 and 7. First, position L
4 (see FIG. 6A), the downward / downward semiconductor device 11
The leads 11A and 11B (first layer) are soldered 15 to the printed board 14. Next, position L2 (see FIG.
The lead 10A of the downward / upward semiconductor device 10 (first layer) is soldered 15 to the printed board 14 (see (A)). Next, the lead 12B of the upward / downward semiconductor device 12 (first layer) is soldered 15 to the printed board 14 at the position L6 (see FIG. 6A). Next, position L7 (see FIG. 6)
The lead 12B of the upward / downward semiconductor device 12 (first layer) is soldered 15 to the printed board 14 (see (A)). Next, at a position L5 (see FIG. 6A), the leads 11A of the downward / downward semiconductor device 11 (second layer) and the downward / upward semiconductor device 10 (first layer). Lead 10B
7 are soldered to the lead groove 11D of the downward / downward semiconductor device (first layer) 11 at the already fixed position L4 (see FIG. 6A) as shown in FIG. Adhesive 1
Fix at 6. Similarly, the lead 11B at this position L5 (second layer) and the lead 12A of the above-mentioned upward / downward semiconductor device 12 (first layer) are soldered to each other, and as shown in FIG. The lead groove 1 of the downward / downward semiconductor device (first layer) at the position L4 (see FIG. 6A) which is already fixed.
Fix to OD with adhesive 16. Next, position L1 (see FIG.
(A), the leads 10A of the downward / upward semiconductor device 10 (first layer) are soldered 15 to the printed board 5. Next, at the position L3 (see FIG. 6A), the leads 11A of the downward / downward semiconductor device 11 (second layer) and the downward / upward semiconductor device 10 (first layer). As shown in FIG. 7, the lead 10B is soldered to the lead groove of the downward / upward semiconductor device (first layer) 10 at the position L2 (see FIG. 6A) which is already fixed. Adhesive 16 on 10D
Fix with. Similarly, this position L3 (see FIG. 6A)
Downward / downward semiconductor device 11 (second layer) lead 11
B and the leads 12A of the upward / downward semiconductor device 12 (first layer) are soldered to each other, and as shown in FIG.
The lead groove 10D of the downward / upward semiconductor device (first layer) 10 at the position L2 (see FIG. 6A) which is already fixed.
It is fixed with an adhesive 16.

【0016】このようにして、7個の樹脂封止型半導体
装置を2層に積み重ねてプリント基板14上に固定する
ことができる。
In this way, the seven resin-sealed semiconductor devices can be stacked in two layers and fixed on the printed circuit board 14.

【0017】図8は本発明に係る樹脂封止型半導体装置
の他の実施例を示す側面図である。図において、17は
図8(B)に示すように、リード17Aおよび17Bが
共に水平に突出した水平・水平リード付き樹脂封止型半
導体装置(以下単に水平・水平半導体装置と言う)であ
る。
FIG. 8 is a side view showing another embodiment of the resin-sealed semiconductor device according to the present invention. In the figure, as shown in FIG. 8B, reference numeral 17 denotes a resin-sealed semiconductor device with horizontal / horizontal leads (hereinafter simply referred to as horizontal / horizontal semiconductor device) in which leads 17A and 17B both project horizontally.

【0018】そして、前記の下向・下向半導体装置11
(図8(A)参照)とこの水平・水平半導体装置17
(図8(B)参照)により、図9に示すようにプリント
基板14上に実装することができる。
Then, the downward / downward semiconductor device 11 is provided.
(See FIG. 8A) and this horizontal / horizontal semiconductor device 17
(See FIG. 8B), it can be mounted on the printed board 14 as shown in FIG.

【0019】なお、上記の樹脂封止型半導体装置の厚み
は現状2mm程度から1mm、更には0.6〜0.5m
mのものまで作られている。
The thickness of the above resin-encapsulated semiconductor device is currently about 2 mm to 1 mm, and more preferably 0.6 to 0.5 m.
It is made up to m.

【0020】また、以上の実施例では、7個の樹脂封止
型半導体装置を2層に積み重ねた場合について示した
が、これに限定しないことはもちろんである。
Further, in the above embodiments, the case where seven resin-sealed semiconductor devices are stacked in two layers has been shown, but the present invention is not limited to this.

【0021】また、以上の説明では、樹脂封止型半導体
装置をプリント基板に順番に実装しながら組み込んだ場
合を示したが、これに限定せず、予め半田で接続したの
ち、プリント基板に実装してもよいことはもちろんであ
る。
In the above description, the case where the resin-encapsulated semiconductor device is mounted while being sequentially mounted on the printed circuit board is shown. However, the present invention is not limited to this, and after soldering is performed in advance, the semiconductor device is mounted on the printed circuit board. Of course, you can do that.

【0022】[0022]

【発明の効果】以上詳細に説明したように、本発明に係
る樹脂封止型半導体装置、この樹脂封止型半導体装置を
用いたメモリカードおよびその製造方法によれば、樹脂
封止型半導体装置の各種のリード形状と左右交互に引き
出されたリード、およびその樹脂封止部に形成した、リ
ード形状に合わせたリード溝により、プリント基板上に
高密度に実装することができる効果がある。
As described above in detail, according to the resin-encapsulated semiconductor device, the memory card using the resin-encapsulated semiconductor device, and the method for manufacturing the same according to the present invention, the resin-encapsulated semiconductor device is provided. The various lead shapes and the leads drawn out alternately to the left and right, and the lead groove formed in the resin sealing portion in accordance with the lead shapes have the effect of enabling high-density mounting on the printed circuit board.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る樹脂封止型半導体装置の一実施例
を示す側面図である。
FIG. 1 is a side view showing an embodiment of a resin-sealed semiconductor device according to the present invention.

【図2】図1の樹脂封止部の一部詳細な斜視図である。FIG. 2 is a partially detailed perspective view of a resin sealing portion of FIG.

【図3】図1の樹脂封止型半導体装置の平面図である。FIG. 3 is a plan view of the resin-sealed semiconductor device of FIG.

【図4】本発明に係るメモリカードの一実施例を示す断
面側面図である。
FIG. 4 is a sectional side view showing an embodiment of a memory card according to the present invention.

【図5】図4の一部破断した平面図である。FIG. 5 is a partially cutaway plan view of FIG.

【図6】図4および図5の積層状態を分解して示した側
面図および平面図である。
6 is a side view and a plan view showing an exploded state of the stacked state of FIGS. 4 and 5. FIG.

【図7】図4の一部詳細な側面図である。FIG. 7 is a partially detailed side view of FIG.

【図8】本発明に係る樹脂封止型半導体装置の他の実施
例を示す側面図である。
FIG. 8 is a side view showing another embodiment of the resin-sealed semiconductor device according to the present invention.

【図9】本発明のメモリカードの他の実施例を示す断面
側面図である。
FIG. 9 is a sectional side view showing another embodiment of the memory card of the present invention.

【図10】従来のメモリカードを示す一部破断した斜視
図である。
FIG. 10 is a partially cutaway perspective view showing a conventional memory card.

【図11】図10の樹脂封止型半導体装置の実装状態を
示す図である。
11 is a diagram showing a mounted state of the resin-sealed semiconductor device of FIG.

【符号の説明】[Explanation of symbols]

10 下向・上向リード付き樹脂封止型半導体装置 11 下向・下向リード付き樹脂封止型半導体装置 12 上向・下向リード付き樹脂封止型半導体装置 13 ケース 14 プリント基板 17 水平・水平リード付き樹脂封止型半導体装置 10 resin encapsulation type semiconductor device with downward / upward leads 11 resin encapsulation type semiconductor device with downward / downward leads 12 resin encapsulation type semiconductor device with up / down leads 13 case 14 printed circuit board 17 horizontal Resin-sealed semiconductor device with horizontal leads

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 25/10 25/11 25/18 ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 5 Identification code Internal reference number FI technical display area H01L 25/10 25/11 25/18

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 一方のリードを下向きあるいは上向きに
形成し、他方のリードを下向きあるいは上向きに形成し
て樹脂封止して、下向・上向リード付き樹脂封止型半導
体装置、下向・下向リード付き樹脂封止型半導体装置、
上向・下向リード付き樹脂封止型半導体装置を備えたこ
とを特徴とする樹脂封止型半導体装置。
1. A resin-encapsulated semiconductor device with downward / upward leads, wherein one lead is formed downward or upward, and the other lead is formed downward or upward and resin-encapsulated. Resin-sealed semiconductor device with downward lead,
A resin-encapsulated semiconductor device comprising a resin-encapsulated semiconductor device with upward and downward leads.
【請求項2】 一方のリードを水平にあるいは下向きに
形成し、他方のリードを水平にあるいは下向きに形成し
て樹脂封止して、水平・水平リード付き樹脂封止型半導
体装置、下向・下向リード付き樹脂封止型半導体装置を
備えたことを特徴とする樹脂封止型半導体装置。
2. A resin-sealed semiconductor device with a horizontal / horizontal lead, wherein one lead is formed horizontally or downward and the other lead is formed horizontally or downward and resin-encapsulated. A resin-encapsulated semiconductor device comprising a resin-encapsulated semiconductor device with a downward lead.
【請求項3】 前記樹脂封止部表面に、リード形状に合
わせたリード溝を形成したことを特徴とする請求項1又
は2記載の樹脂封止型半導体装置。
3. The resin-encapsulated semiconductor device according to claim 1, wherein a lead groove conforming to the lead shape is formed on the surface of the resin-encapsulated portion.
【請求項4】 下向・上向リード付き樹脂封止型半導体
装置の上向きリードに、下向・下向リード付き樹脂封止
型半導体装置の下向きリードを接続し、上向・下向リー
ド付き樹脂封止型半導体装置の上向きリードに、下向・
下向リード付き樹脂封止型半導体装置の下向きリードを
接続し、これらのリードを、接続する樹脂封止型半導体
装置の樹脂封止部のリード溝に収納し、一体に接続した
複数個の樹脂封止型半導体装置をプリント基板に固定し
て収納したことを特徴とするメモリカード。
4. The downward leads of the resin-encapsulated semiconductor device with downward / upward leads are connected to the downward leads of the resin-encapsulated semiconductor device with downward / downward leads. For the upward lead of resin-sealed semiconductor device,
Connected the downward leads of the resin-encapsulated semiconductor device with downward leads, housed these leads in the lead groove of the resin-encapsulated part of the resin-encapsulated semiconductor device to be connected, and connected them together. A memory card in which a sealed semiconductor device is fixedly housed in a printed circuit board.
【請求項5】 第1層目の下向・下向リード付き樹脂封
止型半導体装置をプリント基板に半田接合する第1の実
装工程と、第1層目の下向・上向リード付き樹脂封止型
半導体装置の下向きリード、および第1層目の上向・下
向リード付き樹脂封止型半導体装置の下向きリードをプ
リント基板に半田接合する第2の実装工程と、第2層目
の下向・下向リード付き樹脂封止型半導体装置の各下向
リードを対応した第1層目の上向・下向リード付き樹脂
封止型半導体装置および下向・上向リード樹脂封止型半
導体装置のリードに半田接合する第3の実装工程とを備
えたことを特徴とするメモリカードの製造方法。
5. A first mounting step of solder-bonding a first-layer downward / downward-lead resin-encapsulated semiconductor device to a printed circuit board, and a first-layer downward / upper-lead resin-encapsulated semiconductor. Second mounting step for solder-bonding the downward leads of the device and the downward leads of the resin-sealed semiconductor device with upward / downward leads of the first layer to the printed circuit board, and downward / downward leads of the second layer Solder to the leads of the resin-encapsulated semiconductor device with downward / upward leads and the downward / upward leads of the first layer corresponding to the downward leads of the resin-encapsulated semiconductor device A method of manufacturing a memory card, comprising a third mounting step of joining.
【請求項6】 下向・下向リード付き樹脂封止型半導体
装置の一方の下向きリードと水平・水平リード付き樹脂
封止型半導体装置の一方の水平リードを接続し、これら
のリードを、接続する樹脂封止型半導体装置の樹脂封止
部のリード溝に収納し、一体に接続した複数個の樹脂封
止型半導体装置をプリント基板に固定して収納したこと
を特徴とするメモリカード。
6. A downside / downside lead-equipped resin-encapsulated semiconductor device with one downward lead connected to one horizontal / horizontal lead-sided resin-encapsulated semiconductor device with a horizontal lead, and these leads are connected. A memory card, wherein a plurality of resin-encapsulated semiconductor devices, which are housed in a lead groove of a resin-encapsulated part of the resin-encapsulated semiconductor device and are integrally connected, are fixedly housed on a printed circuit board.
JP4090725A 1992-04-10 1992-04-10 Plastic sealed semiconductor device, memory card using this device and manufacture thereof Pending JPH05291469A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4090725A JPH05291469A (en) 1992-04-10 1992-04-10 Plastic sealed semiconductor device, memory card using this device and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4090725A JPH05291469A (en) 1992-04-10 1992-04-10 Plastic sealed semiconductor device, memory card using this device and manufacture thereof

Publications (1)

Publication Number Publication Date
JPH05291469A true JPH05291469A (en) 1993-11-05

Family

ID=14006536

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4090725A Pending JPH05291469A (en) 1992-04-10 1992-04-10 Plastic sealed semiconductor device, memory card using this device and manufacture thereof

Country Status (1)

Country Link
JP (1) JPH05291469A (en)

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