JPH05288799A - Environment testing device with normal temperature chamber for installing driver - Google Patents

Environment testing device with normal temperature chamber for installing driver

Info

Publication number
JPH05288799A
JPH05288799A JP4090968A JP9096892A JPH05288799A JP H05288799 A JPH05288799 A JP H05288799A JP 4090968 A JP4090968 A JP 4090968A JP 9096892 A JP9096892 A JP 9096892A JP H05288799 A JPH05288799 A JP H05288799A
Authority
JP
Japan
Prior art keywords
driver
test
panel
room temperature
temperature chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4090968A
Other languages
Japanese (ja)
Inventor
Yoshihiro Fujita
義洋 藤田
Shiyunzou Yano
舜三 矢埜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tabai Espec Co Ltd
Original Assignee
Tabai Espec Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tabai Espec Co Ltd filed Critical Tabai Espec Co Ltd
Priority to JP4090968A priority Critical patent/JPH05288799A/en
Publication of JPH05288799A publication Critical patent/JPH05288799A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To install a driver under specified normal temperatures and then execute an accurate test by installing an object to be tested in a test bath and an electrical driver within a normal temperature chamber and then forming the object to be tested and the drive so that they can be connected by a short wire. CONSTITUTION:A driver 3 of an LCD panel 4 is provided within a normal temperature chamber 2 and is connected to a power supply outside a test bath 1 by wiring L the driver 3. The panel 4 is provided at the front of a door 21 of the normal temperature chamber 2 and is wired L to the driver 3 within the corresponding normal temperature chamber 2 through a cable hole 21a of the door 21. Therefore, the panel 4 within the test bath 1 is maintained to be at a specified temperature and humidity, at the same time temperature within the normal temperature chamber 2 where the driver 3 is located is maintained at normal temperatures, current and signal are fed to the panel 4 from the driver 3, and then it is operated and environmental resistance of the panel 4 is tested. Since toe driver 3 is installed under specified normal temperatures, a test can be made accurately.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、電気、電子機器、それ
らの部品等の被試験物を所定の温度又は温湿度に曝して
耐環境性を試験する環境試験装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an environment test device for testing environment resistance by exposing an object to be tested such as electric and electronic devices and parts thereof to a predetermined temperature or temperature and humidity.

【0002】[0002]

【従来の技術】電気、電子機器、それらの部品等の被試
験物についての環境試験は、被試験物を単に所定の温度
又は温湿度に曝すだけでなく、それに通電、信号付与等
して動作させつつ行うのが一般的である。液晶表示パネ
ル(以下「LCDパネル」という。)を例にとると、図
5に例示するように、所定の温度又は温湿度に維持可能
の試験槽91内にLCDパネル92を収容設置し、各パ
ネル92に、槽91外に配置した電気的ドライバ93及
び電源94を接続し、それによって各パネル92に画像
を表示させつつ耐環境性の試験を行う。
2. Description of the Related Art Environmental tests for DUTs such as electric and electronic devices and their parts are performed not only by exposing the DUTs to a predetermined temperature or temperature and humidity, but also by energizing them or applying signals to them. It is common to do so. Taking a liquid crystal display panel (hereinafter referred to as “LCD panel”) as an example, as shown in FIG. 5, an LCD panel 92 is housed and installed in a test tank 91 that can be maintained at a predetermined temperature or temperature and humidity. An electric driver 93 and a power source 94 arranged outside the tank 91 are connected to the panel 92, whereby an environment resistance test is performed while displaying an image on each panel 92.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、かかる
従来装置によると次のような問題がある。 LCDパネル92はそれに対応するドライバ93に
試験槽91壁のケーブル孔91aを介して配線される
が、パネル92の数が多くなると、パネル92とドライ
バ93との配線が長くなる部分が生じ、このように配線
が長くなると、配線にノイズが乗ってパネルを正常に動
作させ難くなったり、LCDパネルの駆動周波数が高い
ためパネルに誤動作が生じ易くなる。 ドライバ93は、試験の正確を期すためには本来所
定の常温に置かれていることが望ましいが、前記従来装
置では試験槽外周囲環境下に置かれ、その温度の影響を
受ける。
However, such a conventional device has the following problems. The LCD panel 92 is wired to the driver 93 corresponding thereto via the cable hole 91a in the wall of the test tank 91. However, when the number of the panels 92 increases, a portion where the wiring between the panel 92 and the driver 93 becomes long occurs. When the wiring is long, noise is added to the wiring to make it difficult for the panel to operate normally, or the LCD panel has a high driving frequency, so that the panel is likely to malfunction. Although it is desirable that the driver 93 is originally placed at a predetermined room temperature in order to ensure the accuracy of the test, the driver 93 is placed in the environment outside the test tank and is affected by the temperature in the conventional device.

【0004】そこで本発明は、電気、電子機器、その部
品等のように、それに電気的ドライバを接続して動作さ
せつつ耐環境性の試験を行うべき被試験物を対象とする
環境試験装置であって、被試験物とドライバ間の配線を
該被試験物の正常な動作を妨げない程度に短く行うこと
ができるとともにドライバを所定の常温下に設置するこ
とができ、それだけ正確に試験を実施できるドライバ設
置用常温室付き環境試験装置を提供することを目的とす
る。
Therefore, the present invention is an environmental test apparatus for an object to be tested, such as electric and electronic equipment, parts thereof, etc., to which an electric driver is connected and operated to perform an environmental resistance test. Therefore, the wiring between the device under test and the driver can be made short enough not to interfere with the normal operation of the device under test, and the driver can be installed at a specified room temperature, and the test can be performed accurately. It is an object of the present invention to provide an environment test device with a room temperature room for driver installation that can be performed.

【0005】[0005]

【課題を解決するための手段】本発明は前記目的に従
い、恒温又は恒温恒湿に維持可能に構成した試験槽と、
所定の常温に維持可能に構成したドライバ設置用常温室
とを有し、前記試験槽及び常温室は、該試験槽内に被試
験物を、該常温室内に該被試験物に配線接続される電気
的ドライバを、該被試験物とそれに対応する該電気的ド
ライバとを被試験物の正常動作を妨げない短い配線にて
接続可能に収容設置できるように形成してあるドライバ
設置用常温室付き環境試験装置を提供するものである。
According to the above-mentioned object, the present invention provides a test tank which can be maintained at a constant temperature or a constant temperature and humidity,
A normal temperature chamber for installing a driver which can be maintained at a predetermined normal temperature, and the test tank and the normal temperature chamber are connected to the test object in the test tank and to the test object in the normal temperature chamber by wiring. With a room temperature room for driver installation, formed so that the electric driver and the corresponding electric driver can be connected and housed so that they can be connected with a short wiring that does not interfere with the normal operation of the object. An environmental test device is provided.

【0006】[0006]

【作用】本発明環境試験装置によると、被試験物は試験
槽内に収容設置される。被試験物のドライバは常温室内
に設置される。ドライバには適宜電源が接続される。各
被試験物は対応するドライバに、該被試験物が正常に動
作できる短い配線にて接続される。
According to the environment testing apparatus of the present invention, the DUT is housed and installed in the test tank. The driver of the DUT is installed in the room at room temperature. A power source is appropriately connected to the driver. Each DUT is connected to a corresponding driver by a short wiring which enables the DUT to operate normally.

【0007】かくして、各被試験物はドライバにより駆
動されつつ、所定の温度又は温湿度に曝され、耐環境性
の試験を受ける。
Thus, each DUT is exposed to a predetermined temperature or temperature and humidity while being driven by the driver, and undergoes an environmental resistance test.

【0008】[0008]

【実施例】以下、本発明の実施例を図面を参照して説明
する。図1及び図2は一実施例を示しており、図1はそ
の正面側から見た断面図であり、図2はその側面側から
見た断面図である。この環境試験装置は恒温恒湿試験装
置であり、試験槽1とその内部に設けたドライバ設置用
常温室2を含んでいる。
Embodiments of the present invention will be described below with reference to the drawings. 1 and 2 show an embodiment, FIG. 1 is a sectional view seen from the front side, and FIG. 2 is a sectional view seen from the side. This environmental test apparatus is a constant temperature and constant humidity test apparatus, and includes a test tank 1 and a room temperature room 2 for installing a driver provided therein.

【0009】試験槽1は断熱壁に囲まれ、その前面側が
断熱扉11によって開閉できるものである。試験槽1内
において常温室2の背後の部分は空調部12とされ、こ
こには下から上へ向かって順次加湿器13、冷却器1
4、加熱ヒータ15及び空気循環用ファン16が配置さ
れている。この空調部12において所定の温度及び湿度
に調整された空気はファン16により吹き出し口17か
ら常温室2の上側を通ってその前面側に吹き出され、再
び常温室2の下側を通って空気吸込み口18から空調部
12に吸い込まれるように循環する。
The test tank 1 is surrounded by a heat insulating wall, and its front side can be opened and closed by a heat insulating door 11. A portion behind the room temperature chamber 2 in the test tank 1 is an air conditioner 12, where a humidifier 13 and a cooler 1 are sequentially arranged from bottom to top.
4, a heater 15 and an air circulation fan 16 are arranged. The air adjusted to a predetermined temperature and humidity in the air conditioner 12 is blown from the outlet 17 through the upper side of the room temperature room 2 to the front side thereof by the fan 16 and again passes through the lower side of the room temperature room 2 to suck air. It circulates so as to be sucked into the air conditioning unit 12 from the mouth 18.

【0010】常温室2は断熱壁により周囲が囲まれてお
り、その前面側が断熱扉21によって開閉されるもので
ある。常温室2はその一側面が試験槽1内壁面に接触し
ており、該接触部に設けた空気吹き出し口22及び空気
吸込み口23を介して試験槽外面に連設した空調部24
に連通している。空調部24内には加熱ヒータ25、冷
却器26及び空気循環用ファン27が上から下へ向け順
次配置してあり、ファン27は空気吹き出し口22に臨
んでいる。また常温室2内には内部を上下に分ける仕切
板28を設けてある。
The room temperature chamber 2 is surrounded by a heat insulating wall, and the front side thereof is opened and closed by a heat insulating door 21. One side of the room temperature chamber 2 is in contact with the inner wall surface of the test tank 1, and the air conditioner 24 is connected to the outer surface of the test tank through an air outlet 22 and an air inlet 23 provided in the contact portion.
Is in communication with. A heater 25, a cooler 26, and an air circulation fan 27 are sequentially arranged in the air conditioning unit 24 from top to bottom, and the fan 27 faces the air outlet 22. Further, a partition plate 28 that divides the inside into upper and lower parts is provided in the room temperature room 2.

【0011】空調部24は所定の常温(本例では25℃
±7℃)の空気を作る部分で、ここで得られた常温空気
はファン27の回転により空気吹き出し口22から常温
室2内に吹き出され、仕切板28の下側からさらにその
板の側方を通って上側へ流れ、空気吸込み口23から空
調部24へ吸い込まれるように循環する。かくして常温
室2内は所定の常温に維持される。
The air conditioner 24 has a predetermined room temperature (25 ° C. in this example).
The room temperature air obtained here is blown out from the air outlet 22 into the room temperature chamber 2 by the rotation of the fan 27, and further below the partition plate 28 to the side of the plate. Through the air suction port 23 and circulates so as to be sucked into the air conditioning unit 24. Thus, the room temperature chamber 2 is maintained at a predetermined room temperature.

【0012】常温室2内には被試験物(本例ではLCD
パネル4)のドライバ3が複数個設置してあり、各ドラ
イバは配線31を介して試験槽1外の電源4に接続され
ている。配線31は常温室2の側壁に設けたケーブル孔
31a及びこれに対応するように試験槽1の側壁に設け
たケーブル孔31bを通っている。また常温室2の扉2
1の前面にはLCDパネル4を複数個取り付けることが
できるようになっており、該扉に複数個のパネル4が設
置される。各パネル4はそれに対応する常温室内のドラ
イバ3に扉21のケーブル孔21aを通して配線Lされ
る。各配線Lの長さはいずれも30cm以下に制限され
ている。
An object to be tested (in this example, an LCD
A plurality of drivers 3 of the panel 4) are installed, and each driver is connected to the power source 4 outside the test tank 1 via the wiring 31. The wiring 31 passes through the cable hole 31a provided on the side wall of the room temperature chamber 2 and the cable hole 31b provided on the side wall of the test tank 1 correspondingly. Also, the door 2 of the room temperature room 2
A plurality of LCD panels 4 can be attached to the front surface of 1, and a plurality of panels 4 are installed on the door. Each panel 4 is wired to the corresponding driver 3 in the room at room temperature through the cable hole 21a of the door 21. The length of each wiring L is limited to 30 cm or less.

【0013】かくして試験槽1内のLCDパネル4を所
定の温度及び湿度に維持するとともに、ドライバ3のあ
る常温室2内を所定の常温に維持しつつ、且つ、各LC
Dパネル4にドライバ3から通電、信号付与等してこれ
を動作させつつ該パネルの耐環境性の試験を実施するこ
とができる。次に図3及び図4に示す実施例について説
明する。図3は該実施例の表面側から見た断面図であ
り、図4は該実施例の側面側から見た断面図である。
Thus, the LCD panel 4 in the test tank 1 is maintained at a predetermined temperature and humidity, and the room temperature room 2 having the driver 3 is maintained at a predetermined room temperature, and each LC
It is possible to conduct an environment resistance test of the D panel 4 while operating the D panel 4 by energizing the D panel 3 or applying a signal thereto. Next, the embodiment shown in FIGS. 3 and 4 will be described. FIG. 3 is a sectional view of the embodiment as seen from the front surface side, and FIG. 4 is a sectional view of the embodiment as seen from the side surface side.

【0014】この環境試験装置も恒温恒湿試験装置であ
り、試験槽5とその背後に連設されたドライバ設置用常
温室6を含んでいる。試験槽5は周囲が断熱壁に囲まれ
ており、その前面側が断熱扉51によって開閉可能とな
っている。試験槽5はその内部の一側に空調部52を有
し、該空調部には下から上へ向け順次加湿器53、冷却
器54、加熱ヒータ55及び空気循環用ファン56を設
置してあり、この空調部において得られた所定の温度及
び湿度の空気は空気吹き出し口57から吹き出され、再
び空気吸込み口58から空調部52へ戻るように循環す
る。そして該試験槽5の被試験物設置区域には、本例で
は被試験物としてLCDパネル4が複数個設置される。
This environmental test apparatus is also a constant temperature and constant humidity test apparatus, and includes a test tank 5 and a driver-installed room temperature chamber 6 connected behind it. The periphery of the test tank 5 is surrounded by a heat insulating wall, and the front side of the test tank 5 can be opened and closed by a heat insulating door 51. The test tank 5 has an air conditioning unit 52 on one side inside thereof, and in the air conditioning unit, a humidifier 53, a cooler 54, a heater 55, and an air circulation fan 56 are sequentially installed from bottom to top. The air having a predetermined temperature and humidity obtained in this air conditioner is blown out from the air outlet 57 and circulates so as to return from the air inlet 58 to the air conditioner 52 again. In the test object installation area of the test tank 5, a plurality of LCD panels 4 are installed as test objects in this example.

【0015】一方、常温室6はその内部に空調部61を
有し、該空調部には下から上へ向け順次冷却器62、加
熱ヒータ63、空気循環用ファン64が設置されてお
り、この空調部61において所定の常温(本例では25
℃±7℃)の空気を得ることができ、ここで得られた常
温空気は空気吹き出し口65から吹き出され、再び空気
吸込み口66から空調部61内へ戻るように循環する。
空調部61の前領域にはLCDパネル4のドライバ3が
複数個設置される。各ドライバ3は常温室6外に設けた
図示しない電源から給電される。
On the other hand, the room temperature room 6 has an air conditioner 61 inside, and in the air conditioner, a cooler 62, a heater 63, and an air circulation fan 64 are sequentially installed from bottom to top. A predetermined room temperature (25 in this example) in the air-conditioning unit 61
Air of (° C. ± 7 ° C.) can be obtained, and the room temperature air obtained here is blown out from the air blowing port 65, and circulates so as to return from the air suction port 66 back into the air conditioning unit 61.
A plurality of drivers 3 for the LCD panel 4 are installed in the front area of the air conditioner 61. Each driver 3 is supplied with power from a power source (not shown) provided outside the room temperature room 6.

【0016】試験槽51内に設置したLCDパネル4は
それに対応するドライバ3に試験槽51の背面壁のケー
ブル孔51aを介して配線Lにて接続される。各配線L
は何れも30cm以下の長さである。以上説明した装置
によると、試験槽51内は所定の温度及び湿度に制御さ
れ、それによって各LCDパネル4がその温度及び湿度
雰囲気に曝される。一方、常温室6内は所定の常温に維
持され、ドライバ3は該常温雰囲気に曝される。かくし
て各LCDパネル4がそれに対応するドライバ3から通
電、信号付与等されつつ動作せしめられ、その状態で耐
環境性の試験を実施される。
The LCD panel 4 installed in the test tank 51 is connected to the driver 3 corresponding to the LCD panel 4 by the wiring L through the cable hole 51a in the rear wall of the test tank 51. Each wiring L
Has a length of 30 cm or less. According to the apparatus described above, the inside of the test tank 51 is controlled to have a predetermined temperature and humidity, whereby each LCD panel 4 is exposed to the temperature and humidity atmosphere. On the other hand, the inside of the room temperature chamber 6 is maintained at a predetermined room temperature, and the driver 3 is exposed to the room temperature atmosphere. Thus, each LCD panel 4 is operated while being energized and given a signal from the corresponding driver 3, and the environment resistance test is performed in that state.

【0017】以上説明した何れの実施例においても被試
験物であるLCDパネル4は短い配線Lによって対応す
るドライバ3に接続されているので、該配線Lにノイズ
が乗る恐れがなく、また配線Lが短いのでパネル4の駆
動周波数が高くても各パネル4は正常に動作し得る状態
で試験される。このように各LCDパネル4とドライバ
3を接続する配線Lがパネルの正常な動作を妨げない程
度に短く、且つ、ドライバ3が所定の常温下に置かれて
いるので、全体として正確に試験を実施することができ
る。
In any of the embodiments described above, the LCD panel 4 as the DUT is connected to the corresponding driver 3 by the short wiring L, so that there is no risk of noise on the wiring L and the wiring L Therefore, each panel 4 is tested in a state where it can operate normally even if the driving frequency of the panel 4 is high. In this way, the wiring L connecting each LCD panel 4 and the driver 3 is short enough not to prevent the normal operation of the panel, and the driver 3 is placed at a predetermined normal temperature, so that the test can be accurately performed as a whole. Can be implemented.

【0018】[0018]

【発明の効果】以上説明したように本発明によると、電
気、電子機器、その部品等のように、それに電気的ドラ
イバを接続して動作させつつ耐環境性の試験を行うべき
被試験物を対象とする環境試験装置であって、被試験物
とドライバ間の配線を該被試験物の正常な動作を妨げな
い程度に短く行うことができるとともにドライバを所定
の常温下に設置することができ、それだけ正確に試験を
実施できるドライバ設置用常温室付き環境試験装置を提
供することができる。
As described above, according to the present invention, an object to be tested, such as electric equipment, electronic equipment, parts thereof, etc., for which an environmental resistance test is to be performed while operating by connecting an electric driver thereto. The target environmental testing device, the wiring between the DUT and the driver can be short enough not to interfere with the normal operation of the DUT, and the driver can be installed at a predetermined room temperature. Thus, it is possible to provide an environment test device with a room temperature room for driver installation, which can perform the test as accurately as that.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の正面側から見た断面図であ
る。
FIG. 1 is a cross-sectional view of one embodiment of the present invention viewed from the front side.

【図2】図1に示す実施例の側面側から見た断面図であ
る。
FIG. 2 is a cross-sectional view of the embodiment shown in FIG. 1 viewed from the side surface side.

【図3】本発明の他の実施例の正面側から見た断面図で
ある。
FIG. 3 is a sectional view of another embodiment of the present invention viewed from the front side.

【図4】図3に示す実施例の側面側から見た断面図であ
る。
4 is a cross-sectional view of the embodiment shown in FIG. 3 viewed from the side surface side.

【図5】従来例の説明図である。FIG. 5 is an explanatory diagram of a conventional example.

【符号の説明】[Explanation of symbols]

1、5 試験槽 2、6 ドライバ設置用常温室 3 ドライバ 4 LCDパネル L 配線 1, 5 Test tank 2, 6 Room temperature room for driver installation 3 Driver 4 LCD panel L wiring

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 恒温又は恒温恒湿に維持可能に構成した
試験槽と、所定の常温に維持可能に構成したドライバ設
置用常温室とを有し、前記試験槽及び常温室は、該試験
槽内に被試験物を、該常温室内に該被試験物に配線接続
される電気的ドライバを、該被試験物とそれに対応する
該電気的ドライバとを被試験物の正常動作を妨げない短
い配線にて接続可能に収容設置できるように形成してあ
るドライバ設置用常温室付き環境試験装置。
1. A test tank which can be maintained at a constant temperature or a constant temperature and a constant temperature, and a driver installation room temperature room which can be maintained at a predetermined room temperature, wherein the test tank and the room temperature room are the test tanks. A test object inside, an electric driver wire-connected to the test object inside the room temperature room, and a short wiring that does not interfere with the normal operation of the test object and the corresponding electric driver. Environmental test equipment with a room temperature room for driver installation that is formed so that it can be housed and installed so that it can be connected.
JP4090968A 1992-04-10 1992-04-10 Environment testing device with normal temperature chamber for installing driver Pending JPH05288799A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4090968A JPH05288799A (en) 1992-04-10 1992-04-10 Environment testing device with normal temperature chamber for installing driver

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4090968A JPH05288799A (en) 1992-04-10 1992-04-10 Environment testing device with normal temperature chamber for installing driver

Publications (1)

Publication Number Publication Date
JPH05288799A true JPH05288799A (en) 1993-11-02

Family

ID=14013303

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4090968A Pending JPH05288799A (en) 1992-04-10 1992-04-10 Environment testing device with normal temperature chamber for installing driver

Country Status (1)

Country Link
JP (1) JPH05288799A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020011817A (en) * 2000-08-04 2002-02-09 김정곤 Test handler for testing semiconductor device
JP2003042959A (en) * 2001-07-31 2003-02-13 Espec Corp Inspection device of display device, driving signal supply device, and inspection system of display device
JP2006184044A (en) * 2004-12-27 2006-07-13 Shikino Hightech:Kk Burn-in apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS613450B2 (en) * 1978-12-28 1986-02-01 Iseki Agricult Mach
JPH0250691B2 (en) * 1982-10-07 1990-11-05 Kansai Denryoku Kk

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS613450B2 (en) * 1978-12-28 1986-02-01 Iseki Agricult Mach
JPH0250691B2 (en) * 1982-10-07 1990-11-05 Kansai Denryoku Kk

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020011817A (en) * 2000-08-04 2002-02-09 김정곤 Test handler for testing semiconductor device
JP2003042959A (en) * 2001-07-31 2003-02-13 Espec Corp Inspection device of display device, driving signal supply device, and inspection system of display device
JP4627936B2 (en) * 2001-07-31 2011-02-09 エスペック株式会社 Display device inspection device and display device inspection system
JP2006184044A (en) * 2004-12-27 2006-07-13 Shikino Hightech:Kk Burn-in apparatus
JP4719460B2 (en) * 2004-12-27 2011-07-06 株式会社シキノハイテック Burn-in equipment

Similar Documents

Publication Publication Date Title
US4356967A (en) Laboratory incubator chamber system
KR960006869B1 (en) Method of testing electrical characteristics of lcd with probe device
TWI753107B (en) Test system and metod
CN107316595B (en) Backlight source device for aging test and aging test method of liquid crystal display panel
JPH05288799A (en) Environment testing device with normal temperature chamber for installing driver
US20060207352A1 (en) Elevated black panel for accelerated weathering test device
CN116736089B (en) High-low temperature reliability test equipment and method for chip
CN210803521U (en) Speed sensor test box
US6384377B1 (en) Aging socket, aging cassette and aging apparatus
JP2003042959A (en) Inspection device of display device, driving signal supply device, and inspection system of display device
JP2003124649A (en) Electrical equipment box and air conditioner
JP3379911B2 (en) High temperature visual inspection equipment
CN117138848A (en) Temperature simulation test box
JPH1071849A (en) Motor-driven compressor driving device for automobile
KR20010064114A (en) Control box for air-conditioner
KR20210039361A (en) heat-shock tester comprising side blower system
KR100326414B1 (en) LCD Aging Tester
KR100412150B1 (en) Air conditioner
JPH03188383A (en) Heating tester for semiconductor element
CN112213587A (en) Multifunctional aging machine test cabinet
KR20010028960A (en) Aging Device for Liquid Crystal Display Element
CN210198428U (en) Environment detector
CN213458998U (en) Online screen circuit detection equipment
JP4149074B2 (en) Air conditioner for vehicles
CN219915897U (en) LED aging testing device

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 19970805