JPH05275272A - Method for forming terminal electrode of electronic ceramic component - Google Patents

Method for forming terminal electrode of electronic ceramic component

Info

Publication number
JPH05275272A
JPH05275272A JP5492691A JP5492691A JPH05275272A JP H05275272 A JPH05275272 A JP H05275272A JP 5492691 A JP5492691 A JP 5492691A JP 5492691 A JP5492691 A JP 5492691A JP H05275272 A JPH05275272 A JP H05275272A
Authority
JP
Japan
Prior art keywords
component
terminal electrode
ceramic
alloy
terminal electrodes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP5492691A
Other languages
Japanese (ja)
Inventor
Kunio Hachisuga
邦夫 蜂須賀
Hisashi Nakamura
壽志 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP5492691A priority Critical patent/JPH05275272A/en
Publication of JPH05275272A publication Critical patent/JPH05275272A/en
Withdrawn legal-status Critical Current

Links

Abstract

PURPOSE:To achieve a method for forming terminal electrodes requiring no plating process, by coating both terminal ends of a component with an alloy paste containing specific Cu-Ni as the principal constituent before baking the component, and thereafter simultaneously carrying out the baking of the component and the terminal electrodes. CONSTITUTION:On the end faces of the element assembly of a BaTiO3-CaZrO3 multilayer ceramic capacitor (a chip-like component made by printing an internal electrode 5 on ceramic green sheets 1 and laminating them, which is already degreased), a borosilicate glass frit is mixed into and kneaded with fine powder of a 40 to 60wt% Cu-60 to 40wt% Ni alloy to prepare a paste as terminal electrodes 2 for capacity extraction. Then, the Cu-Ni alloy paste is applied. Thereafter, the component is baked with a heat pattern in a H2/N2 atmosphere. By this, an electronic component such as a ceramic capacitor can be manufactured which allows the Ni-Sn plating process to be omitted, and in addition, which is excellent in electrical characteristics and solder leach resistance.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、特にチップ型セラミッ
クコンデンサのような、基盤に実装される端子電極を有
するセラミック電子部品の端子電極の形成方法に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of forming a terminal electrode of a ceramic electronic component having a terminal electrode mounted on a substrate, such as a chip type ceramic capacitor.

【0002】[0002]

【従来の技術】セラミック電子部品は、各種の酸化物よ
りなるセラミックを主要構成物としている。セラミック
は大気中で焼成されるため、酸化されないように電極に
はPd,Ag等の貴金属が使用される。一方セラミック
電子部品特にチップ型では、基盤の電極に接続するため
にハンダ付けされる。そのために、端子電極(Ag電極
が主)を施された上にNi,Snメッキ処理されて電子
部品となる。すなわち従来方法は図5(a)の外面図及
び(b)の断面図に示すように、セラミック素体1を焼
成し、その両端にPt,Ag等の金属よりなる端子電極
2を塗布し、該電極2を焼き付けた後、Niメッキ3及
びSnメッキ4をその表面に施して仕上げる工程になっ
ている。図中5は内部電極である。
2. Description of the Related Art Ceramic electronic parts mainly consist of ceramics composed of various oxides. Since ceramics are fired in the air, noble metals such as Pd and Ag are used for the electrodes so that they are not oxidized. On the other hand, a ceramic electronic component, especially a chip type, is soldered to connect to a substrate electrode. For this reason, a terminal electrode (mainly an Ag electrode) is applied, and then Ni and Sn plating is applied to form an electronic component. That is, in the conventional method, as shown in the outer view of FIG. 5A and the sectional view of FIG. 5B, the ceramic body 1 is fired, and the terminal electrodes 2 made of a metal such as Pt and Ag are applied to both ends of the ceramic body 1. After the electrode 2 is baked, Ni plating 3 and Sn plating 4 are applied to the surface of the electrode 2 for finishing. In the figure, 5 is an internal electrode.

【0003】近年電子部品業界のコスト競争の激しさか
ら電極材料の卑金属化が内部電極及び、一部端子電極に
使用されつつある。この、卑金属を電極に使用した場合
に電極材料選択、セラミック焼成雰囲気制御、耐還元性
が付与された誘電体材料開発及び内外電極接合強化等に
ついて対応することが必要であり、それなりの対策が報
告されている。しかし、前記したように製造工程自体が
複雑でかつ、多いという問題があるため省工程化が要望
されており、特にメッキによるコンデンサ特性の劣化現
象が起るため、メッキ工程の不要な製造プロセス実現へ
の期待が大きい。
In recent years, due to the fierce cost competition in the electronic component industry, base metalization of electrode materials is being used for internal electrodes and some terminal electrodes. It is necessary to deal with the selection of electrode materials, control of ceramic firing atmosphere, development of reduction resistant dielectric materials, and strengthening of internal / external electrode bonding when base metals are used for electrodes, and appropriate measures are reported. Has been done. However, as mentioned above, there is a problem that the manufacturing process itself is complicated and there are many, so there is a demand for a reduction in the number of processes. In particular, since the phenomenon of deterioration of capacitor characteristics due to plating occurs, a manufacturing process that does not require a plating process is realized. Have great expectations.

【0004】[0004]

【発明が解決しようとする課題】このように、製造工程
の複雑さやメッキに伴うコンデンサ特性劣化を回避する
端子電極形成方法を提供することが現状の課題である。
即ち、製造工程において、セラミック焼成を実施した
後、端子電極を焼き付けると言った熱履歴の重層・不経
済さを解決し一度の熱処理でセラミック焼成・端子電極
の焼き付けを実施できること、一方、メッキ工程では、
焼成緻密化されたセラミックと言えどメッキ液の極微量
の残存は避けがたく、これが耐湿劣化・絶縁劣化の原因
となり、そのためにメッキ工程を経ない端子電極の形成
法が望まれている。本発明は上記課題を同時に満足すべ
くなされたもので、端子電極としてCu−Ni合金ペー
ストを用い、セラミック素材に該ペーストを塗布後セラ
ミック焼成・端子電極の焼き付けを同時に実施し、メッ
キ工程不要の端子電極の形成を行なう方法を提供するこ
とを目的とするものである。
Thus, it is a current problem to provide a method of forming a terminal electrode that avoids the deterioration of capacitor characteristics due to the complexity of the manufacturing process and plating.
That is, in the manufacturing process, it is possible to solve the multilayering and uneconomical heat history of firing the terminal electrode after firing the ceramic, and to perform the ceramic firing and the terminal electrode firing in one heat treatment, while the plating process Then
Even with a fired and densified ceramic, it is unavoidable that a trace amount of the plating solution remains, which causes moisture resistance deterioration and insulation deterioration. Therefore, there is a demand for a method of forming a terminal electrode that does not undergo a plating process. The present invention has been made to satisfy the above-mentioned problems at the same time. A Cu-Ni alloy paste is used as a terminal electrode, and after the paste is applied to a ceramic material, ceramic firing and terminal electrode baking are simultaneously performed, and a plating step is not required. It is an object of the present invention to provide a method for forming a terminal electrode.

【0005】[0005]

【課題を解決するための手段】本発明は上記の目的を達
成するために以下の構成を要旨とする。すなわち、卑金
属を内部電極とし、その両極を配置される電子セラミッ
ク部品を製造するに際し、該部品の焼成前に40〜60
wt%Cu−60〜40wt%Niを主成分とする合金ペー
ストを該部品の端子両端に塗布し、その後、該部品の焼
成及び端子電極焼き付けを同時に行なうことを特徴とす
る、端子電極形成方法である。
SUMMARY OF THE INVENTION In order to achieve the above object, the present invention has the following structures. That is, in manufacturing an electronic ceramic component in which a base metal is used as an internal electrode and both electrodes thereof are arranged, 40 to 60 before firing the component.
A method of forming a terminal electrode, characterized in that an alloy paste containing wt% Cu-60 to 40 wt% Ni as a main component is applied to both ends of a terminal of the component, and then the component is baked and the terminal electrode is baked at the same time. is there.

【0006】本発明の端子電極の断面概要を図1に示
す。本発明は図に示す如く、セラミック素体1に端子電
子2を塗布後、セラミックの焼成と焼き付けを同時に実
施する方法であり、これにより先に述べた、製造工程の
複雑さ・残存メッキ液による耐湿劣化・絶縁劣化が解消
される。
FIG. 1 shows a schematic cross section of the terminal electrode of the present invention. As shown in the figure, the present invention is a method in which the terminal electrons 2 are applied to the ceramic body 1 and then firing and baking of the ceramic are simultaneously performed. Humidity resistance and insulation deterioration are eliminated.

【0007】更に詳しく説明すると、以下の如くであ
る。半だの相性、即ちSh−Pb合金への固溶性から該
端子電極の材料に限定が加えられる、他方、半だ食われ
の面から耐熱性の良好な材料が望まれる。このような観
点から種々研究を加えた結果、本発明ではCu−Niを
主成分とする合金を用い、とりわけ図2に示すように4
0〜60wt%Cu−60〜40wt%Ni合金ペーストが
本目的に最適であることが判明した。何となればCuが
多いと半だ時の耐熱性に問題があり、Niが多いと半だ
への固溶性に問題があり、40〜60wt%Cu−60〜
40wt%Niの範囲が両成分のかね合いで最適であるか
らである。しかも、セラミック素体に該ペーストを塗布
すると図3(b)の拡大図に見る如く、セラミック素体
に存在する開気孔6に該ペーストが浸透し、これを焼成
すると、いわゆるアンカー効果として働き電極の接着強
度を高める。
A more detailed description is as follows. The material of the terminal electrode is limited due to its semi-compatibility, that is, its solid solubility in the Sh-Pb alloy. On the other hand, a material having good heat resistance is desired from the standpoint of half-eating. As a result of various studies from such a viewpoint, in the present invention, an alloy containing Cu—Ni as a main component is used, and as shown in FIG.
It has been found that 0-60 wt% Cu-60-40 wt% Ni alloy paste is optimal for this purpose. If there is a large amount of Cu, there is a problem with the heat resistance at half, and if there is a large amount of Ni, there is a problem with the solid solubility in the half, and 40-60 wt% Cu-60-
This is because the range of 40 wt% Ni is optimal for the balance of both components. Moreover, when the paste is applied to the ceramic body, as shown in the enlarged view of FIG. 3B, the paste penetrates into the open pores 6 existing in the ceramic body, and when this paste is fired, it works as a so-called anchor effect. Increase the adhesive strength of.

【0008】尚、内部電極5には、Cu,Niの如きC
u,Ni合金と相互拡散し易い材料が望ましい。焼成は
Cu,Ni合金が酸化されないPO2囲気でなされるが、
その際セラミックも還元され性能劣化を来すので、一般
に記述されている(Journal of Mater
ial Science 10(’75)633参照)
如き手法で還元防止がなされる。
The internal electrode 5 contains C such as Cu and Ni.
A material that easily interdiffuses with the u and Ni alloys is desirable. The firing is performed in a P O2 atmosphere in which the Cu and Ni alloys are not oxidized,
At that time, the ceramic is also reduced and the performance is deteriorated. Therefore, it is generally described (Journal of Material).
ial Science 10 ('75) 633)
The reduction is prevented by such a method.

【0009】[0009]

【実施例】内部電極にCuを配置し、還元防止材として
MnO2 5 mol%添加されたBaTiO3 −CaZrO
3 系セラミック積層コンデンサの素体(セラミックグリ
ーンシート上に内部電極が印刷され、積層化されたチッ
プ状の部品で脱脂処理済み)の端面に容量取だし用の端
子電極として、50%Ni−50%Cu合金の微粉末
(平均粒径2.4μm)に市販の硼珪酸鉛ガラスフリッ
トを7%レジン54%を重量比で混合・混練しペースト
化したCu−Ni合金ペーストを塗布する。その後、図
4に示すヒートパターンでH2 /N2 =1/100雰囲
気で焼成した。
[Examples] BaTiO 3 -CaZrO in which Cu was placed in the internal electrode and 5 mol% of MnO 2 was added as a reduction inhibitor.
50% Ni-50 as a terminal electrode for capacity extraction on the end face of the element body of the 3 series ceramic multilayer capacitor (internal electrodes are printed on the ceramic green sheet and degreasing is performed on the laminated chip parts). % Cu alloy fine powder (average particle diameter 2.4 μm) is mixed with a commercially available lead borosilicate glass frit in a weight ratio of 54% 7% resin and kneaded to form a Cu-Ni alloy paste. Then, it was fired in a H 2 / N 2 = 1/100 atmosphere in the heat pattern shown in FIG.

【0010】作製したセラミック積層コンデンサの電気
的性質を表1に示す。表1には従来法も併記したが何れ
も上記本発明法で製造したコンデンサが優れている。尚
表2に製造時間、電気的性能、半だ食われ性を示した
が、本発明法は、従来法より極めて良好であることがわ
かる。
Table 1 shows the electrical properties of the produced ceramic multilayer capacitor. The conventional method is also shown in Table 1, but the capacitors manufactured by the method of the present invention are excellent. Although Table 2 shows the production time, electrical performance, and half-erodibility, it can be seen that the method of the present invention is much better than the conventional method.

【0011】[0011]

【表1】 [Table 1]

【0012】[0012]

【表2】 [Table 2]

【0013】[0013]

【発明の効果】以上のように本発明によれば、Ni−S
nメッキ工程が省略できること、製造工程を簡略化でき
ることなどから、生産性が極めて向上し、しかも、電気
的性能・半だ食われ性が従来法より一層優れていて、長
寿命のセラミックコンデンサ等の電子部品を製造でき
る。
As described above, according to the present invention, Ni-S
Since the n-plating process can be omitted and the manufacturing process can be simplified, the productivity is extremely improved, and the electrical performance and semi-depletion property are superior to those of the conventional method. Electronic parts can be manufactured.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の電子セラミック部品の一例を示す断面
図である。
FIG. 1 is a sectional view showing an example of an electronic ceramic component of the present invention.

【図2】Ni−Cu成分と耐熱性、半だとの接合性との
関係を示す図である。
FIG. 2 is a diagram showing a relationship between a Ni—Cu component, heat resistance, and a bondability of a half.

【図3】(a)は本発明の電子セラミック部品であり、
(b)はその一部拡大図である。
FIG. 3 (a) is an electronic ceramic component of the present invention,
(B) is a partially enlarged view thereof.

【図4】本発明実施例における焼成ヒートパターンを示
す図である。
FIG. 4 is a diagram showing a firing heat pattern in an example of the present invention.

【図5】(a)は従来の電子セラミック部品の外観図、
(b)はその断面図である。
FIG. 5A is an external view of a conventional electronic ceramic component,
(B) is the sectional drawing.

【符号の説明】[Explanation of symbols]

1 セラミック体 2 端子電極 3 Niメッキ 4 Snメッキ 5 内部電極 6 開気孔 1 Ceramic Body 2 Terminal Electrode 3 Ni Plating 4 Sn Plating 5 Internal Electrode 6 Open Pore

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 卑金属を内部電極とし、その両極を配置
される電子セラミック部品を製造するに際し、該部品の
焼成前に40〜60wt%Cu−60〜40wt%Niを主
成分とする合金ペーストを該部品の端子両端に塗布し、
その後、該部品の焼成及び端子電極焼き付けを同時に行
なうことを特徴とする、端子電極形成方法。
1. When manufacturing an electronic ceramic component in which a base metal is used as an internal electrode and both electrodes thereof are arranged, an alloy paste containing 40 to 60 wt% Cu-60 to 40 wt% Ni as a main component before firing the component is used. Apply to both ends of the part,
After that, baking of the component and baking of the terminal electrodes are performed at the same time.
JP5492691A 1991-03-19 1991-03-19 Method for forming terminal electrode of electronic ceramic component Withdrawn JPH05275272A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5492691A JPH05275272A (en) 1991-03-19 1991-03-19 Method for forming terminal electrode of electronic ceramic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5492691A JPH05275272A (en) 1991-03-19 1991-03-19 Method for forming terminal electrode of electronic ceramic component

Publications (1)

Publication Number Publication Date
JPH05275272A true JPH05275272A (en) 1993-10-22

Family

ID=12984224

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5492691A Withdrawn JPH05275272A (en) 1991-03-19 1991-03-19 Method for forming terminal electrode of electronic ceramic component

Country Status (1)

Country Link
JP (1) JPH05275272A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100425919B1 (en) * 2001-01-18 2004-04-01 가부시키가이샤 무라타 세이사쿠쇼 Ceramic electronic component
KR100866478B1 (en) * 2003-10-08 2008-11-03 티디케이가부시기가이샤 Electrode paste, ceramic electronic component and method for producing same
JP5099609B2 (en) * 2009-01-28 2012-12-19 株式会社村田製作所 Multilayer electronic components

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100425919B1 (en) * 2001-01-18 2004-04-01 가부시키가이샤 무라타 세이사쿠쇼 Ceramic electronic component
US6911893B2 (en) 2001-01-18 2005-06-28 Murata Manufacturing Co., Ltd. Ceramic electronic component
KR100866478B1 (en) * 2003-10-08 2008-11-03 티디케이가부시기가이샤 Electrode paste, ceramic electronic component and method for producing same
JP5099609B2 (en) * 2009-01-28 2012-12-19 株式会社村田製作所 Multilayer electronic components

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Effective date: 19980514