JPH05259700A - Circuit board inspecting apparatus - Google Patents
Circuit board inspecting apparatusInfo
- Publication number
- JPH05259700A JPH05259700A JP4053764A JP5376492A JPH05259700A JP H05259700 A JPH05259700 A JP H05259700A JP 4053764 A JP4053764 A JP 4053764A JP 5376492 A JP5376492 A JP 5376492A JP H05259700 A JPH05259700 A JP H05259700A
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- circuit board
- data
- mounting
- field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Image Analysis (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、回路基板上に装着され
た電子部品の実装状態を検査する回路基板検査装置に関
するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit board inspection device for inspecting the mounting state of electronic components mounted on a circuit board.
【0002】[0002]
【従来の技術】図3には、回路基板上への電子部品の装
着及び実装状態の検査を自動的に行なう従来の部品実装
システムを示してある。2. Description of the Related Art FIG. 3 shows a conventional component mounting system for automatically mounting electronic components on a circuit board and inspecting the mounting state.
【0003】同図において、21は回路基板、22はX
−Yテ−ブル等から成る移動テ−ブル、23はマ−ク検
出用の第1カメラ、24は実装状態検査用の第2カメ
ラ、25はキ−ボ−ド、26はモニタ−、27は回路基
板1の位置決め及び実装検査等を行なう検査装置、28
はテ−ブル駆動回路である。In the figure, 21 is a circuit board and 22 is X.
-A movement table composed of a Y-table, 23 a first camera for mark detection, 24 a second camera for mounting state inspection, 25 a keyboard, 26 a monitor, 27 Is an inspection device for performing positioning and mounting inspection of the circuit board 1, 28
Is a table drive circuit.
【0004】検査装置27は、各カメラ23,24を通
じて得られる画像デ−タを記憶する画像メモリと、検査
基準となるデ−タを記憶する基準デ−タメモリと、一連
の検査をプログラム処理するマイクロコンピュ−タ等を
備えている。The inspection device 27 program-processes a series of inspections with an image memory for storing image data obtained through the cameras 23 and 24, a reference data memory for storing inspection reference data. It is equipped with a micro computer and the like.
【0005】ここで上記実装システムにおける検査の手
順を図4を参照して説明する。The inspection procedure in the mounting system will be described with reference to FIG.
【0006】まず、実装及び検査に先立ち検査の基礎,
基準となるティ−チングデ−タを入力する(S1)。こ
こでは、回路基板21に対し第2カメラ24で撮像する
複数の検査視野の位置と、各検査視野における検査基準
デ−タ、即ち同検査視野内に実装された部品の種別,位
置及び装着角度等を検査する際に基準となるデ−タと、
判定許容値と、回路基板21の位置基準デ−タ等をキ−
ボ−ド25を通じて夫々入力する。First, the basics of inspection prior to mounting and inspection,
A reference teaching data is input (S1). Here, the positions of a plurality of inspection fields of view imaged by the second camera 24 on the circuit board 21, and the inspection reference data in each inspection field, that is, the types, positions and mounting angles of the components mounted in the inspection fields of view. With the reference data when inspecting etc.,
Key the judgment allowable value and the position reference data etc. of the circuit board 21.
Input each through the board 25.
【0007】ティ−チングデ−タ入力後は、未実装の回
路基板21を認識ステ−ションNSにある移動テ−ブル
22上に搬入して、該回路基板21の位置決めを行なう
(S2,S3)。具体的には、移動テ−ブル22上の回
路基板21を第1カメラ23で撮像し、該回路基板21
に設けられたマ−ク21aが上記位置基準デ−タと合致
するように移動テ−ブル22を駆動する。After inputting the teaching data, the unmounted circuit board 21 is carried onto the movable table 22 in the recognition station NS and the circuit board 21 is positioned (S2, S3). .. Specifically, the circuit board 21 on the moving table 22 is imaged by the first camera 23,
The moving table 22 is driven so that the mark 21a provided on the above-mentioned position coincides with the position reference data.
【0008】位置決め完了後は、移動テ−ブル22を実
装ステ−ションSSに移動させて、図示省略の部品装着
機構によって回路基板21に各種部品を装着する(S
4,S5)。After the completion of positioning, the moving table 22 is moved to the mounting station SS, and various components are mounted on the circuit board 21 by a component mounting mechanism (not shown) (S).
4, S5).
【0009】実装完了後は、移動テ−ブル22を認識ス
テ−ションNSに戻し、回路基板21を第2カメラ24
で撮像して上記と同様に回路基板21の位置決めを行な
う(S6,S7)。After the mounting is completed, the movable table 22 is returned to the recognition station NS, and the circuit board 21 is fixed to the second camera 24.
Then, the circuit board 21 is positioned in the same manner as above (S6, S7).
【0010】位置決め完了後は、検査視野の1つを選定
して同検査視野を第2カメラ24で撮像し、ここで得ら
れる画像デ−タを上記検査基準デ−タと比較して実装状
態の良否を判定する(S8,S9)。良否判定について
は周知であるのでその詳細説明を省略するが、実装部品
に誤装がある場合や実装位置に許容範囲を越えるずれが
ある場合にはここで実装不良として判定される。After the completion of positioning, one of the inspection fields of view is selected, the same inspection field of view is picked up by the second camera 24, and the image data obtained here is compared with the above-mentioned inspection reference data to determine the mounting state. The quality of is determined (S8, S9). Since the quality judgment is well known, a detailed description thereof will be omitted. However, if the mounted component is erroneously mounted or if the mounting position has a deviation exceeding an allowable range, it is determined to be defective mounting.
【0011】上記の実装状態の検査は検査視野全てに対
して行なわれ、検査終了後は検査結果を出力して移動テ
−ブル22から回路基板21を搬出する(S10,S1
1,S12)。搬出された実装不良の回路基板21は上
記の出力結果に基づき後の工程でラインから除去され
る。The above-mentioned inspection of the mounting state is performed on the entire inspection visual field, and after the inspection is completed, the inspection result is outputted and the circuit board 21 is carried out from the moving table 22 (S10, S1).
1, S12). The carried-out defective circuit board 21 is removed from the line in a later step based on the above output result.
【0012】[0012]
【発明が解決しようとする課題】しかしながら上記従来
のものでは、検査対象となる回路基板毎に、検査視野の
位置と各検査視野毎の検査基準デ−タを手作業にて入力
する必要があり、特に実装部品の種別,位置及び装着角
度等に係わる検査基準デ−タの入力にかなりの時間と労
力がかかる難点がある。また、検査視野位置を変更する
場合にも全ての検査基準デ−タを再作成しなければなら
ずその作業が極めて面倒なものとなる。However, in the above-mentioned prior art, it is necessary to manually input the position of the inspection visual field and the inspection reference data for each inspection visual field for each circuit board to be inspected. In particular, there is a problem that it takes a considerable amount of time and labor to input the inspection standard data relating to the type, position and mounting angle of the mounted parts. Further, even when the inspection visual field position is changed, all the inspection reference data must be recreated, which makes the work extremely troublesome.
【0013】本発明は上記事情に鑑みてなされたもの
で、その目的とするところは、検査基準デ−タの作成を
容易に行なえる回路基板検査装置を提供することにあ
る。The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a circuit board inspecting apparatus which can easily produce inspection reference data.
【0014】[0014]
【課題を解決するための手段】上記目的を達成するた
め、請求項1では、部品実装後の回路基板を複数の検査
視野別に撮像可能なカメラと、カメラを通じ各検査視野
毎に得られる撮像デ−タを各検査視野夫々で予め規定さ
れた実装部品の種別,位置及び装着角度等に係る検査基
準デ−タと比較し、部品実装状態の良否を判定する画像
判定手段とを具備した回路基板検査装置において、回路
基板及び実装部品の設計デ−タを記憶する記憶手段と、
各検査視野の位置を入力するための入力手段と、各検査
視野における実装部品の種別,位置及び装着角度等のデ
−タを記憶手段から読出して上記検査基準デ−タを作成
する検査基準デ−タ作成手段とを設けている。In order to achieve the above object, according to a first aspect of the present invention, a camera capable of picking up an image of a circuit board after component mounting for each of a plurality of inspection visual fields, and an imaging device obtained for each inspection visual field through the camera. A circuit board provided with image judging means for judging whether the mounting state of the component is good or bad by comparing the data with inspection standard data concerning the type, position, mounting angle, etc. of the mounted component which are defined in advance in each inspection visual field. In the inspection device, storage means for storing the design data of the circuit board and the mounted components,
Input means for inputting the position of each inspection visual field, and inspection standard data for reading the data of the type, position, mounting angle, etc. of the mounted component in each inspection visual field from the storage means to create the inspection standard data. -Providing means for creating data.
【0015】また、請求項2では、部品実装後の回路基
板を複数の検査視野別に撮像可能なカメラと、カメラを
通じ各検査視野毎に得られる撮像デ−タを各検査視野夫
々で予め規定された実装部品の種別,位置及び装着角度
等に係る検査基準デ−タと比較し、部品実装状態の良否
を判定する画像判定手段とを具備した回路基板検査装置
において、回路基板及び実装部品の設計デ−タを記憶す
る記憶手段と、カメラの視野サイズから回路基板に対す
る検査視野の位置を設定する検査視野位置設定手段と、
各検査視野における実装部品の種別,位置及び装着角度
等のデ−タを記憶手段から読出して上記検査基準デ−タ
を作成する検査基準デ−タ作成手段とを設けている。According to the second aspect of the present invention, a camera capable of picking up images of the circuit board after component mounting for each of a plurality of inspection fields of view and imaging data obtained through the camera for each inspection field of view are defined in advance for each of the inspection fields of view. In the circuit board inspection device, which is equipped with an image determination means for determining whether the mounted state of the component is good or bad by comparing it with the inspection reference data relating to the type, position and mounting angle of the mounted component, the design of the circuit board and the mounted component. Storage means for storing data, inspection visual field position setting means for setting the position of the inspection visual field with respect to the circuit board from the visual field size of the camera,
There is provided inspection reference data creating means for reading the data of the type, position, mounting angle, etc. of the mounted component in each inspection visual field from the storage means to create the inspection reference data.
【0016】[0016]
【作用】請求項1記載の回路基板検査装置では、入力手
段を通じて入力された検査視野の位置に基づいて該各検
査視野に対応する実装部品の種別,位置及び装着角度等
のデ−タが記憶手段から読出されて検査基準デ−タが作
成される。つまり、本装置では検査視野の位置を入力す
るだけで検査基準デ−タの作成を自動的に行なえる。In the circuit board inspection apparatus according to the first aspect of the present invention, based on the position of the inspection visual field input through the input means, the data such as the type, position and mounting angle of the mounted component corresponding to each inspection visual field is stored. The inspection standard data is created by reading out from the means. That is, in this apparatus, the inspection reference data can be automatically created only by inputting the position of the inspection visual field.
【0017】また、請求項2記載の回路基板検査装置で
は、カメラの視野サイズから回路基板に対する検査視野
の位置が設定され、この設定された検査視野の位置に基
づいて該各検査視野に対応する実装部品の種別,位置及
び装着角度等等のデ−タが記憶手段から読出されて検査
基準デ−タが作成される。つまり、本装置では検査視野
位置の設定と検査基準デ−タの作成を自動的に行なえ
る。Further, in the circuit board inspection apparatus according to the present invention, the position of the inspection field of view with respect to the circuit board is set from the size of the field of view of the camera, and the inspection field of view is made to correspond to each of the set inspection field of view. Data such as the type, position, and mounting angle of the mounted component is read from the storage means to create inspection reference data. In other words, this apparatus can automatically set the inspection visual field position and create the inspection reference data.
【0018】[0018]
【実施例】図1及び図2は本発明の一実施例を示すもの
で、図1は部品実装システムの要部構成図、図2はティ
−チングデ−タ作成に係るフロ−チャ−トである。1 and 2 show an embodiment of the present invention. FIG. 1 is a block diagram of the essential parts of a component mounting system, and FIG. 2 is a flow chart relating to the creation of teaching data. is there.
【0019】図1において、1は回路基板、2はX−Y
テ−ブル等から成る移動テ−ブル、3はマ−ク検出用の
第1カメラ、4は実装状態検査用の第2カメラ、5はキ
−ボ−ド、6はモニタ−、7は検査装置、8はテ−ブル
駆動回路、9は記憶装置である。検査装置7及び記憶装
置9を除く構成は図3に示した従来例と同じであるため
その説明を省略する。In FIG. 1, 1 is a circuit board, and 2 is XY.
A moving table composed of a table or the like, 3 a first camera for mark detection, 4 a second camera for mounting state inspection, 5 a keyboard, 6 a monitor, 7 an inspection A device, 8 is a table drive circuit, and 9 is a memory device. The configuration excluding the inspection device 7 and the storage device 9 is the same as that of the conventional example shown in FIG.
【0020】記憶装置9は、検査対象となる回路基板及
び実装部品の設計デ−タを記憶するためのもので、磁気
テ−プや磁気ディスク等を利用した記憶装置が用いられ
る。この記憶装置9にはCADによって回路基板及び実
装部品の設計を行なった際のデ−タが記憶されている。The storage device 9 is for storing the design data of the circuit board and the mounting parts to be inspected, and a storage device using a magnetic tape, a magnetic disk or the like is used. The storage device 9 stores data when the circuit board and the mounted components are designed by CAD.
【0021】検査装置7は、各カメラ3,4を通じて得
られる画像デ−タを記憶する画像メモリと、検査基準と
なるデ−タを記憶する基準デ−タメモリと、一連の検査
をプログラム処理するマイクロコンピュ−タ等を備えて
おり、回路基板1の位置決め及び実装検査等の機能以外
にティ−チングデ−タの作成機能を有している。The inspection device 7 program-processes a series of inspections, and an image memory for storing image data obtained through the cameras 3 and 4, a reference data memory for storing inspection reference data. It has a microcomputer and the like, and has a function of creating teaching data in addition to the functions of positioning and mounting inspection of the circuit board 1.
【0022】以下に図2を参照して、このティ−チング
デ−タの作成手順について詳細に説明する。The procedure for creating this teaching data will be described in detail below with reference to FIG.
【0023】まず、基板1のマ−ク1aを基点とした回
路基板1全体における実装部品の形状,サイズ及び位置
等のデ−タを記憶手段9から読込む(ST1)。First, the data such as the shape, size and position of the mounted components in the entire circuit board 1 based on the mark 1a of the board 1 is read from the storage means 9 (ST1).
【0024】読込みを完了したところで検査視野の位置
設定を促す(ST2)。ここでは、回路基板1に対し第
2カメラ4で撮像する複数の検査視野の位置(座標)を
キ−ボ−ド5を通じて入力する。When the reading is completed, the position setting of the inspection visual field is prompted (ST2). Here, the positions (coordinates) of a plurality of inspection fields to be imaged by the second camera 4 are input to the circuit board 1 through the keyboard 5.
【0025】検査視野位置の入力が完了したところで、
ST1で読込んだデ−タから該検査視野における検査基
準デ−タ、即ち同検査視野内に実装された部品の種別,
位置及び装着角度等を検査する際に基準となるデ−タを
作成する(ST3)。When the input of the inspection visual field position is completed,
From the data read in ST1, the inspection reference data in the inspection visual field, that is, the type of parts mounted in the inspection visual field,
Data to be a reference when inspecting the position, the mounting angle, etc. is created (ST3).
【0026】次に、実装不良のない実際の回路基板(以
下、ティ−チング基板と言う)を用いて検査基準デ−タ
の補正を行なう(ST4)。具体的には、ティ−チング
基板の上記検査視野を第2カメラ4で撮像し、該画像デ
−タにおける部品位置と検査基準デ−タにおける部品位
置とを比較して、両者に位置ずれがある場合には検査デ
−タをずれ分だけ補正してこれを正規の検査基準デ−タ
として記憶する。Next, the inspection reference data is corrected using an actual circuit board having no mounting defect (hereinafter referred to as a teaching board) (ST4). Specifically, the inspection field of view of the teaching board is imaged by the second camera 4, and the position of the component in the image data and the position of the component in the inspection reference data are compared to find a positional deviation between them. In some cases, the inspection data is corrected by the amount of deviation and stored as normal inspection reference data.
【0027】ST2からST4までの処理は検査視野全
てに対して行なわれ、以上でティ−チングデ−タの作成
を完了する(ST5)。ティ−チングデ−タ作成後は、
図4に示したS2以降の手順で部品の装着と実装状態の
検査が行なわれる。The processing from ST2 to ST4 is performed for the entire inspection visual field, and the preparation of the teaching data is completed (ST5). After creating the teaching data,
The mounting of components and the inspection of the mounting state are performed by the procedure from S2 shown in FIG.
【0028】このように本実施例によれば、検査視野の
位置をキ−ボ−ド5を通じて入力するだけで、該各検査
視野に対応する実装部品の種別,位置及び装着角度等の
デ−タを記憶装置9から読出して検査基準デ−タを自動
的に作成することができ、該検査基準デ−タを手作業に
て入力していた従来のものに比べてその作成作業を短時
間で簡単に行なうことができる。As described above, according to this embodiment, only by inputting the position of the inspection visual field through the keyboard 5, the data such as the type, position and mounting angle of the mounted component corresponding to each inspection visual field can be obtained. The inspection reference data can be automatically created by reading the data from the storage device 9, and the creation work can be completed in a shorter time than the conventional method in which the inspection reference data is manually input. Can be done easily.
【0029】また、検査視野を変更する場合にも検査視
野の位置を設定し直すだけで上記と同様に検査基準デ−
タを作成できて極めて便利である。Further, when the inspection visual field is changed, the inspection reference data is set in the same manner as above by merely resetting the position of the inspection visual field.
It is extremely convenient to create data.
【0030】しかも、記憶装置9に記憶される設計デ−
タとしてCADによって回路基板及び実装部品の設計し
た際のデ−タを利用できるので、設計デ−タを別途作成
する手間もない。Moreover, the design data stored in the storage device 9 is stored.
Since the data used when the circuit board and the mounted components are designed by CAD can be used as the data, there is no need to separately prepare the design data.
【0031】尚、上記実施例では、回路基板に対する検
査視野の位置を手作業にて入力するようにしたものを示
したが、第2カメラの視野サイズに基づいて回路基板全
体が網羅されるように検査視野の位置を決めれば、検査
視野の位置設定に係る作業を自動化することもできる。In the above embodiment, the position of the inspection visual field with respect to the circuit board is manually input, but the entire circuit board is covered based on the visual field size of the second camera. If the position of the inspection visual field is determined, it is possible to automate the work for setting the position of the inspection visual field.
【0032】また、検査基準デ−タの内容は回路基板に
実装される電子部品の数や形態に応じて変更可能であ
り、部品サイズや判定許容値等の他のデ−タを該検査基
準デ−タに含ませるようにしてもよい。The contents of the inspection standard data can be changed according to the number and form of electronic components mounted on the circuit board, and other data such as the component size and the judgment allowable value can be used as the inspection standard. It may be included in the data.
【0033】[0033]
【発明の効果】以上詳述したように、請求項1記載の回
路基板検査装置によれば、検査視野の位置を入力手段を
通じて入力するだけで、該各検査視野に対応する実装部
品の種別,位置及び装着角度等のデ−タを記憶装置から
読出して検査基準デ−タを自動的に作成することがで
き、該検査基準デ−タを手作業にて入力していた従来の
ものに比べてその作成作業を短時間で容易に行なうこと
ができる。また、検査視野を変更する場合にも検査視野
の位置を設定し直すだけで上記と同様に検査基準デ−タ
を作成できて極めて便利である。As described in detail above, according to the circuit board inspection apparatus of the first aspect, it is possible to input the position of the inspection visual field through the input means, and to sort the type of mounted component corresponding to each inspection visual field. The inspection reference data can be automatically created by reading the data such as the position and the mounting angle from the storage device, and the inspection reference data can be manually input as compared with the conventional one. The creation work can be easily performed in a short time. Further, even when the inspection visual field is changed, the inspection reference data can be created in the same manner as described above simply by resetting the position of the inspection visual field, which is extremely convenient.
【0034】また、請求項2記載の回路基板検査装置に
よれば、カメラの視野サイズから回路基板に対する検査
視野の位置を自動的に設定することができ、該検査視野
位置の入力作業を不要にして一連の作業をより一層簡潔
に行なうことができる。According to the circuit board inspection apparatus of the second aspect, the position of the inspection field of view with respect to the circuit board can be automatically set from the size of the field of view of the camera, thus eliminating the work of inputting the inspection field of view. Therefore, a series of operations can be performed more simply.
【図1】本発明の一実施例を示す部品実装システムの構
成図FIG. 1 is a configuration diagram of a component mounting system showing an embodiment of the present invention.
【図2】ティ−チングデ−タ作成に係るフロ−チャ−トFIG. 2 is a flow chart for creating teaching data.
【図3】従来例を示す部品実装システムの構成図FIG. 3 is a block diagram of a component mounting system showing a conventional example.
【図4】検査手順を示すフロ−チャ−トFIG. 4 is a flowchart showing an inspection procedure.
1…回路基板、4…第2カメラ、5…キ−ボ−ド、7…
コンピュ−タ、9…記憶装置。1 ... Circuit board, 4 ... Second camera, 5 ... Keyboard, 7 ...
Computer, 9 ... Storage device.
Claims (2)
別に撮像可能なカメラと、カメラを通じ各検査視野毎に
得られる撮像デ−タを各検査視野夫々で予め規定された
実装部品の種別,位置及び装着角度等に係る検査基準デ
−タと比較し、部品実装状態の良否を判定する画像判定
手段とを具備した回路基板検査装置において、 回路基板及び実装部品の設計デ−タを記憶する記憶手段
と、 各検査視野の位置を入力するための入力手段と、 各検査視野における実装部品の種別,位置及び装着角度
等のデ−タを記憶手段から読出して上記検査基準デ−タ
を作成する検査基準デ−タ作成手段とを設けた、 ことを特徴とする回路基板検査装置。1. A type of mounting component, in which a camera capable of capturing an image of a circuit board after mounting components in a plurality of inspection fields and imaging data obtained through the camera for each inspection field are defined in advance in each inspection field. , A circuit board inspecting device equipped with an image judging means for judging the quality of the component mounting state by comparing with inspection standard data relating to position and mounting angle etc., and storing design data of the circuit board and mounting components. Storage means, input means for inputting the position of each inspection field of view, and data of the type, position, mounting angle, etc. of the mounted component in each inspection field of view are read out from the storage means and the inspection reference data is obtained. A circuit board inspection device, comprising: an inspection standard data creating means to be created.
別に撮像可能なカメラと、カメラを通じ各検査視野毎に
得られる撮像デ−タを各検査視野夫々で予め規定された
実装部品の種別,位置及び装着角度等に係る検査基準デ
−タと比較し、部品実装状態の良否を判定する画像判定
手段とを具備した回路基板検査装置において、 回路基板及び実装部品の設計デ−タを記憶する記憶手段
と、 カメラの視野サイズから回路基板に対する検査視野の位
置を設定する検査視野位置設定手段と、 各検査視野における実装部品の種別,位置及び装着角度
等のデ−タを記憶手段から読出して上記検査基準デ−タ
を作成する検査基準デ−タ作成手段とを設けた、 ことを特徴とする回路基板検査装置。2. A type of mounting component preliminarily defined in each inspection field of view, and a camera capable of capturing an image of the circuit board after mounting the component for each of the inspection fields of view and imaging data obtained for each inspection field of view through the camera. , A circuit board inspecting device equipped with an image judging means for judging the quality of the component mounting state by comparing with inspection standard data relating to position and mounting angle etc., and storing design data of the circuit board and mounting components. Storage means, an inspection visual field position setting means for setting the position of the inspection visual field with respect to the circuit board from the visual field size of the camera, and data such as the type, position and mounting angle of the mounted component in each inspection visual field are read from the storage means. And an inspection reference data creating means for creating the inspection reference data described above.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4053764A JPH05259700A (en) | 1992-03-12 | 1992-03-12 | Circuit board inspecting apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4053764A JPH05259700A (en) | 1992-03-12 | 1992-03-12 | Circuit board inspecting apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05259700A true JPH05259700A (en) | 1993-10-08 |
Family
ID=12951888
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4053764A Withdrawn JPH05259700A (en) | 1992-03-12 | 1992-03-12 | Circuit board inspecting apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05259700A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100597833B1 (en) * | 2004-02-16 | 2006-07-06 | 테크노스 가부시키가이샤 | Base testing device and method |
US7274812B2 (en) | 2002-08-28 | 2007-09-25 | Keyence Corporation | Image processing device and method |
KR100772626B1 (en) * | 2006-06-23 | 2007-11-02 | 동해전장 주식회사 | Fuse arrangement checking device of junction box |
-
1992
- 1992-03-12 JP JP4053764A patent/JPH05259700A/en not_active Withdrawn
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7274812B2 (en) | 2002-08-28 | 2007-09-25 | Keyence Corporation | Image processing device and method |
KR100597833B1 (en) * | 2004-02-16 | 2006-07-06 | 테크노스 가부시키가이샤 | Base testing device and method |
KR100772626B1 (en) * | 2006-06-23 | 2007-11-02 | 동해전장 주식회사 | Fuse arrangement checking device of junction box |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 19990518 |