JPH05259333A - Manufacture of resin-sealed semiconductor device - Google Patents
Manufacture of resin-sealed semiconductor deviceInfo
- Publication number
- JPH05259333A JPH05259333A JP14699291A JP14699291A JPH05259333A JP H05259333 A JPH05259333 A JP H05259333A JP 14699291 A JP14699291 A JP 14699291A JP 14699291 A JP14699291 A JP 14699291A JP H05259333 A JPH05259333 A JP H05259333A
- Authority
- JP
- Japan
- Prior art keywords
- resin
- semiconductor device
- lead frame
- manufacturing
- sealed semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【発明の属する分野の説明】本発明はリードフレームに
同時に多数の半導体素子を製造するのに好適な樹脂封止
型半導体装置の製造方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a resin-sealed semiconductor device suitable for manufacturing a large number of semiconductor elements on a lead frame at the same time.
【0002】[0002]
【従来技術】図1(A)〜(G)は従来の製造法を示す
製造工程図で、先ず(A)に示すように薄い金属板1を
打ち抜き加工により相対するリードフレーム(1a、
b)を櫛状に設けた電極板を形成する。2. Description of the Related Art FIGS. 1 (A) to 1 (G) are manufacturing process diagrams showing a conventional manufacturing method. First, as shown in FIG. 1 (A), a thin metal plate 1 is punched to face a lead frame (1a,
An electrode plate in which b) is provided in a comb shape is formed.
【0003】次に図1(B)、(C)に示すように相対
するリードフレームの一方1aの先端に半導体素子2の
一方の電極を固着し、又半導体素子2の他方の電極とリ
ードフレーム1bの先端を接続子3により固着する。な
おこの工程は治具を介して電気炉等で同時に形成する。Next, as shown in FIGS. 1B and 1C, one electrode of the semiconductor element 2 is fixed to the tip of one of the opposing lead frames 1a, or the other electrode of the semiconductor element 2 and the lead frame. The tip of 1b is fixed by the connector 3. In addition, this step is simultaneously formed in an electric furnace or the like through a jig.
【0004】次に図1(D)(E)に示すように図示し
ない金型等を用いて半導体素子2接続子3及びリードフ
レーム1a、1bを含めて成型法等により樹脂封止す
る。然る後図1(F)(G)に示すようにリードフレー
ム1a、1bの基部(e)を切断することにより個々の
半導体装置Sを形成する。Next, as shown in FIGS. 1D and 1E, the semiconductor element 2 connector 3 and the lead frames 1a and 1b are resin-sealed by a molding method or the like using a mold or the like not shown. Thereafter, as shown in FIGS. 1F and 1G, the individual semiconductor devices S are formed by cutting the base portions (e) of the lead frames 1a and 1b.
【0005】[0005]
【従来技術の問題点】上記の従来技術は多量生産に好適
な方法であるが、その反面個別装置毎の特性チエックが
必要であり、この量産品の個々の特性チエック作業が生
産性を阻害する一因になっていた。[Problems of Prior Art] Although the above-mentioned prior art is a method suitable for mass production, on the other hand, a characteristic check is required for each individual device, and the individual characteristic check operation of this mass-produced product hinders the productivity. It was a factor.
【0006】[0006]
【発明の目的】本発明は生産性の向上を図った半導体装
置の製造法の提供を目的とする。SUMMARY OF THE INVENTION It is an object of the present invention to provide a method for manufacturing a semiconductor device with improved productivity.
【0007】[0007]
【問題解決手段】本発明は個別製品に分離することなく
特性チエックの可能な方法を提供するものである。The present invention provides a method by which characteristic checks can be made without the need to separate individual products.
【0008】[0008]
【実施例】図2(A)〜(D)は本発明の実施例を説明
する工程図で従来例と同一符号は同等部分を示す。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIGS. 2A to 2D are process diagrams for explaining an embodiment of the present invention, and the same reference numerals as those in the conventional example show the same parts.
【0009】本発明は先ず図2(A)に示すように電極
板を形成する際に金属板1の打ち抜きにより空隙部とな
る部分(C)においてリードフレーム1a、1bの方向
に金属板に爪部(a)、(b)を形成し、次いで図2
(B)に示すように樹脂成型時に該爪部(a)(b)を
同時に封止する。次いで図2(C)に示すようにリード
フレーム1a、1bの基部eを切断する。According to the present invention, first, as shown in FIG. 2 (A), when the electrode plate is formed, the metal plate 1 is punched, and the metal plate 1 is clawed in the direction of the lead frames 1a, 1b at the portion (C) which becomes a void. Forming parts (a), (b) and then FIG.
As shown in (B), the claw portions (a) and (b) are simultaneously sealed during resin molding. Next, as shown in FIG. 2C, the base portions e of the lead frames 1a and 1b are cut.
【0010】上記の方法では図2(C)の状態では半導
体素子Sは個々に分割されず、爪部(a)(b)を介し
て夫々一体に保たれる。しかも個々の素子は互いに絶縁
関係に保たれるため夫々リード端子間で特性チエックが
可能である。In the above method, in the state of FIG. 2 (C), the semiconductor element S is not divided into individual pieces, but is held together through the claw portions (a) and (b). Moreover, since the individual elements are kept in an insulating relationship with each other, characteristic check can be performed between the lead terminals.
【0011】その後全体を通して特性チエックの終了後
プレス機等により樹脂部4を押圧すると、爪部Cが樹脂
中に食い込む部分が僅かなために簡単に個々の装置に分
離することができる。なお図2(D)において(d)は
爪部による樹脂凹部である。After that, when the resin portion 4 is pressed by a press or the like after the characteristic check is completed throughout, the pawl portion C can easily be separated into individual devices because the portion where the nail portion C bites into the resin is small. It should be noted that in FIG. 2D, (d) is a resin concave portion formed by a claw portion.
【0012】[0012]
【発明の効果】本発明によれば量産性に富む樹脂封止型
半導体装置の生産性が向上できる大きな利点がある。According to the present invention, there is a great advantage that the productivity of a resin-encapsulated semiconductor device which is highly producible in mass production can be improved.
【図1】従来の製造方法を示す製造工程図FIG. 1 is a manufacturing process diagram showing a conventional manufacturing method.
【図2】本発明の製造方法を示す製造工程図FIG. 2 is a manufacturing process chart showing the manufacturing method of the present invention.
1 金属板 1a、1b リードフレーム 2 半導体素子 3 接続子 4 樹脂部 a、b 爪部 c 空隙 d 凹部 DESCRIPTION OF SYMBOLS 1 Metal plate 1a, 1b Lead frame 2 Semiconductor element 3 Connector 4 Resin part a, b Claw part c Void d Recessed part
Claims (1)
ドフレーム部を備えた電極板を形成する工程と、前記相
対するリードフレーム間に跨って半導体素子を固着する
工程と、前記半導体素子を樹脂封止する工程と、前記リ
ードフレームの一端を切断して個別の半導体装置を形成
する工程を備えた樹脂封止型半導体装置の製造方法にお
いて、前記電極板の空隙部において前記リードフレーム
の方向に突出する爪部を設け、且つ前記樹脂封止時前記
爪部を含めて樹脂封止するようにしたことを特徴とする
樹脂封止型半導体装置の製造方法。1. A step of punching out a metal plate to form an electrode plate having a comb-shaped lead frame portion facing each other; a step of fixing a semiconductor element across the opposite lead frames; In a method of manufacturing a resin-sealed semiconductor device, which comprises a step of resin-sealing and a step of cutting one end of the lead frame to form an individual semiconductor device, a direction of the lead frame in a void portion of the electrode plate. A method of manufacturing a resin-encapsulated semiconductor device, wherein a protruding claw portion is provided, and the claw portion is resin-sealed at the time of the resin sealing.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14699291A JPH05259333A (en) | 1991-03-14 | 1991-03-14 | Manufacture of resin-sealed semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14699291A JPH05259333A (en) | 1991-03-14 | 1991-03-14 | Manufacture of resin-sealed semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05259333A true JPH05259333A (en) | 1993-10-08 |
Family
ID=15420163
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14699291A Pending JPH05259333A (en) | 1991-03-14 | 1991-03-14 | Manufacture of resin-sealed semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05259333A (en) |
-
1991
- 1991-03-14 JP JP14699291A patent/JPH05259333A/en active Pending
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