JPH0520695B2 - - Google Patents

Info

Publication number
JPH0520695B2
JPH0520695B2 JP56010038A JP1003881A JPH0520695B2 JP H0520695 B2 JPH0520695 B2 JP H0520695B2 JP 56010038 A JP56010038 A JP 56010038A JP 1003881 A JP1003881 A JP 1003881A JP H0520695 B2 JPH0520695 B2 JP H0520695B2
Authority
JP
Japan
Prior art keywords
slab
illumination
continuous casting
irradiation
imaging device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56010038A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57124244A (en
Inventor
Takeo Yamada
Mitsuaki Uesugi
Shigeki Komori
Haruo Myano
Masato Yoshino
Hajime Yamashita
Yasuteru Tsushima
Isoshiro Ishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Engineering Corp
Original Assignee
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Kokan Ltd filed Critical Nippon Kokan Ltd
Priority to JP1003881A priority Critical patent/JPS57124244A/ja
Publication of JPS57124244A publication Critical patent/JPS57124244A/ja
Publication of JPH0520695B2 publication Critical patent/JPH0520695B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1003881A 1981-01-26 1981-01-26 Detection for surface flaw of steel product Granted JPS57124244A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1003881A JPS57124244A (en) 1981-01-26 1981-01-26 Detection for surface flaw of steel product

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1003881A JPS57124244A (en) 1981-01-26 1981-01-26 Detection for surface flaw of steel product

Publications (2)

Publication Number Publication Date
JPS57124244A JPS57124244A (en) 1982-08-03
JPH0520695B2 true JPH0520695B2 (enExample) 1993-03-22

Family

ID=11739217

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1003881A Granted JPS57124244A (en) 1981-01-26 1981-01-26 Detection for surface flaw of steel product

Country Status (1)

Country Link
JP (1) JPS57124244A (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01237441A (ja) * 1987-11-17 1989-09-21 Hitachi Cable Ltd 長尺体表面の異物検出及び寸法測定方法
JPH07234187A (ja) * 1994-02-24 1995-09-05 G T C:Kk ガラス基板の表面欠点検出方法およびその装置
KR100426864B1 (ko) * 1999-12-13 2004-04-13 주식회사 포스코 자동보정기능을 갖는 피사체의 측정장치 및 그 측정방법
JP4516788B2 (ja) * 2004-07-06 2010-08-04 北海製罐株式会社 不良検査方法及びその装置
JP4857559B2 (ja) * 2004-12-22 2012-01-18 Jfeスチール株式会社 圧延性ロール疵検査装置
JP4797568B2 (ja) * 2005-10-24 2011-10-19 Jfeスチール株式会社 スラブ縦割れ検出方法および装置
CN112444490B (zh) * 2021-02-01 2021-04-16 深圳宜美智科技股份有限公司 基于图像检测的塞孔缺陷检测方法及塞孔缺陷检测设备

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS524887A (en) * 1975-06-30 1977-01-14 Sanyo Kiko Kk Optical surface scar inspector
JPS5265494A (en) * 1975-11-26 1977-05-30 Nippon Steel Corp Method of detecting surface flaw of hot steel material

Also Published As

Publication number Publication date
JPS57124244A (en) 1982-08-03

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