JPH05201791A - Liquid phase epitaxial growth method - Google Patents

Liquid phase epitaxial growth method

Info

Publication number
JPH05201791A
JPH05201791A JP1145292A JP1145292A JPH05201791A JP H05201791 A JPH05201791 A JP H05201791A JP 1145292 A JP1145292 A JP 1145292A JP 1145292 A JP1145292 A JP 1145292A JP H05201791 A JPH05201791 A JP H05201791A
Authority
JP
Japan
Prior art keywords
single crystal
epitaxial growth
liquid phase
crystal substrate
phase epitaxial
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1145292A
Other languages
Japanese (ja)
Inventor
Yoshiaki Haneki
良明 羽木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP1145292A priority Critical patent/JPH05201791A/en
Publication of JPH05201791A publication Critical patent/JPH05201791A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To improve the yield by reusing a rest part of a growing thin film, separated from a single crystal substrate and the other part being made a product after liquid phase epitaxial growing with the single crystal substrate having a specific thickness, for the epitaxial growth. CONSTITUTION:A raw solution is prepared by adding a specific quantity of poly crystalline GaAs and Al into a compound semiconductor component of Ga or the like. The liquid phase epitaxial growth is executed by using the raw solution and a single crystal material having >=600mum thickness by the slide method with a boat for epitaxial growth. Next, the substrate part with the epitaxial growth layer thin film having about 300mum thickness is cut off from the single crystal substrate with a slicer or the like. The residual single crystal substrate is repeatedly reused for the liquid phase epitaxial growth. Thus, the yield of the compound semiconductor crystal thin film per an unit quantity of the raw single crystal is drastically increased.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、GaAs等の化合物半
導体の液相エピタキシャル成長方法に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid phase epitaxial growth method for compound semiconductors such as GaAs.

【0002】[0002]

【従来の技術】従来、スライド法による液相エピタキシ
ャル成長方法は、図4に断面を示すようなボートを用い
て行われている。(例えば、特開平2−28920号公
報)溶液溜1の開口部2に成長の原料となる溶液3が収
容されており、ボート全体を徐冷しながら単結晶基板5
を載せたスライダ7をスライドさせて順次基板を各溶液
に接触させ多層構造のエピタキシャル層を成長する。こ
のとき、単結晶基板は、図2に示すように単結晶原料か
ら切り出され作製されたものである。
2. Description of the Related Art Conventionally, a liquid phase epitaxial growth method by a slide method has been carried out by using a boat whose cross section is shown in FIG. (For example, Japanese Laid-Open Patent Publication No. 2-28920) A solution 3 as a raw material for growth is contained in an opening 2 of a solution reservoir 1, and a single crystal substrate 5 is provided while gradually cooling the entire boat.
The slider 7 on which is mounted is slid to sequentially bring the substrate into contact with each solution to grow an epitaxial layer having a multilayer structure. At this time, the single crystal substrate was produced by cutting out the single crystal raw material as shown in FIG.

【0003】[0003]

【発明が解決しようとする課題】従来のこの種の成長方
法では、厚み300μm程度の単結晶基板を使用してお
り、使用した基板はそのまま成長薄膜と一体で製品とし
て扱われ、後処理時にエッチングにより薄くするか、除
去されていた。(図2)このように単結晶基板の厚み
は、製品の構造上は300μmも必要ないのであるが、
成長時の操作性の点で余分に厚みを取る必要があり、一
定単結晶原料からとれる単結晶基板の量及びそれを用い
て製造したエピタキシャルウェハの量を低下させる原因
となっていた。
In the conventional growth method of this kind, a single crystal substrate having a thickness of about 300 μm is used, and the used substrate is treated as a product together with the grown thin film as it is, and is etched at the time of post-treatment. It was either thinner or removed. (FIG. 2) As described above, the thickness of the single crystal substrate does not need to be 300 μm due to the structure of the product.
In terms of operability during growth, it is necessary to have an extra thickness, which causes a decrease in the amount of a single crystal substrate obtained from a constant single crystal raw material and the amount of an epitaxial wafer manufactured using the single crystal substrate.

【0004】[0004]

【課題を解決するための手段】本発明は前記の問題点を
解決するために、厚みの厚い単結晶基板を用いて液相エ
ピタキシャル成長を行い、製品部分を分離した後、基板
を再度成長に利用することを特徴とする液相エピタキシ
ャル成長方法である。
In order to solve the above-mentioned problems, the present invention performs liquid phase epitaxial growth using a thick single crystal substrate, separates product parts, and then uses the substrate again for growth. The liquid phase epitaxial growth method is characterized in that

【0005】[0005]

【作用】厚み600μm以上の単結晶基板を用いて液相
エピタキシャル成長するので、成長後に容易に成長薄膜
を単結晶基板部分から分離して製品とすることができ
る。残った単結晶基板は十分な厚みを有しているので再
びエピタキシャル成長に使用することができる。したが
って、1枚の基板を複数回の成長に使用することがで
き、一定量の単結晶原料からとれるエピタキシャルウェ
ハを従来に比べて飛躍的に増加することができる。
Since liquid phase epitaxial growth is performed using a single crystal substrate having a thickness of 600 μm or more, the grown thin film can be easily separated from the single crystal substrate portion after growth to obtain a product. Since the remaining single crystal substrate has a sufficient thickness, it can be used again for epitaxial growth. Therefore, one substrate can be used for growth a plurality of times, and the number of epitaxial wafers that can be obtained from a certain amount of single crystal raw material can be dramatically increased as compared with the conventional case.

【0006】[0006]

【実施例】本発明の一実施例を図面を用いて説明する。
図3は液相エピタキシャル成長用ボートの断面を示す。
溶液溜1の開口部2の中には、成長の原料となる溶液3
を収容する。単結晶基板収容部4に基板の高さ調整用の
カーボン板6を置きその上に単結晶基板5を収容した。
高さ調整用のカーボン板6は必要により複数枚使用して
もよい。
An embodiment of the present invention will be described with reference to the drawings.
FIG. 3 shows a cross section of a boat for liquid phase epitaxial growth.
In the opening 2 of the solution reservoir 1, a solution 3 as a raw material for growth is
To house. A carbon plate 6 for adjusting the height of the substrate was placed in the single crystal substrate housing portion 4 and the single crystal substrate 5 was housed thereon.
If necessary, a plurality of carbon plates 6 for height adjustment may be used.

【0007】このボートを用いてAlGaAsのエピタ
キシャル成長を行った。具体的な条件は、以下の通りで
ある。溶液溜開口部2の上面の寸法は33mm×33m
m、溶液溜1の厚みは、10mmとした。溶液3はGa
からなり、Ga1gにつき多結晶GaAs80mgとA
l2.5mgとを添加した。単結晶基板5としてはGa
Asを使用し初期の厚みを30mmとした。Ga溶液の
量を40gとし、成長開始温度は900℃、冷却速度を
毎分0.5℃とし500℃まで降温した。
Epitaxial growth of AlGaAs was performed using this boat. The specific conditions are as follows. The size of the upper surface of the solution reservoir opening 2 is 33 mm x 33 m
m, and the thickness of the solution reservoir 1 was 10 mm. Solution 3 is Ga
Consisting of 80 mg of polycrystalline GaAs and 1 g of Ga
l2.5 mg was added. Ga as the single crystal substrate 5
The initial thickness was 30 mm using As. The amount of Ga solution was 40 g, the growth start temperature was 900 ° C., the cooling rate was 0.5 ° C./min, and the temperature was lowered to 500 ° C.

【0008】できあがった製品については基板部分は不
必要であるため、厚み約300μmのエピ層部分を残し
て単結晶基板部分から切り離した。切り離しにはワイヤ
ソ−を用いたが、スライサで切断してもよいしまたくさ
び等を使用してエピ層と基板とを分離してもよい。この
単結晶基板を再びエピ成長用に投入し繰り返し成長を行
った。結果として、96枚のエピ製品を製造することが
できた。本発明に基づく、単結晶原料からエピ製品まで
の製造工程を模式的に示すと図1のとおりである。
Since the finished product does not require a substrate portion, it was separated from the single crystal substrate portion leaving an epilayer portion having a thickness of about 300 μm. Although a wire saw was used for the separation, it may be cut with a slicer or the epi layer and the substrate may be separated by using a wedge or the like. This single crystal substrate was put again for epi growth and repeated growth was performed. As a result, 96 epi products could be manufactured. The manufacturing process from a single crystal raw material to an epi product based on the present invention is schematically shown in FIG.

【0009】実施例では初期の厚み30mmの単結晶基
板を使用したが、再使用するのに十分な厚みを有するも
のであれば、これよりも厚くても薄くてもよい。しかし
600μmよりも薄いと1回ないし2回程度しか再使用
できないので、600μm以上が適当である。1回ない
し2回程度の再使用で十分である場合には、400μm
または500μmでもよい。
In the embodiment, a single crystal substrate having an initial thickness of 30 mm is used, but it may be thicker or thinner than this as long as it has a thickness sufficient for reuse. However, if it is thinner than 600 μm, it can be reused only once or twice, so 600 μm or more is suitable. 400 μm if reuse once or twice is sufficient
Alternatively, it may be 500 μm.

【0010】比較のため、従来の方法を用いて、厚み3
0mmの単結晶原料から先に基板をつくり、それを用い
て液相エピタキシャル成長を行い、後に基板部分をエッ
チングにて除去したところ、45枚のエピ製品が得られ
た。従来の方法によるエピ製品の製造工程を図2に示
す。
For comparison, using conventional methods, a thickness of 3
When a substrate was first made from a 0 mm single crystal raw material, liquid phase epitaxial growth was performed using the substrate, and the substrate portion was removed by etching later, 45 epi products were obtained. FIG. 2 shows a manufacturing process of an epi product by a conventional method.

【0011】[0011]

【発明の効果】本発明によれば、一定量の単結晶原料を
用いてエピタキシャルウェハを製造しようとしたとき
に、製品の構造上不必要な厚み分の単結晶基板を使用し
なくても製品を製造することができ、従来に比べて、多
量の製品を少ない単結晶原料で製造できるので、液相エ
ピタキシャル成長方法として利用すると非常に効果的で
ある。
According to the present invention, when an epitaxial wafer is manufactured using a certain amount of a single crystal raw material, the product can be manufactured without using a single crystal substrate having a thickness unnecessary for the structure of the product. Can be manufactured, and a large amount of products can be manufactured with a smaller amount of single-crystal raw material than in the past, and therefore it is very effective when used as a liquid phase epitaxial growth method.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の液相エピタキシャル成長方法による成
長工程を示す模式図である。
FIG. 1 is a schematic diagram showing a growth step by a liquid phase epitaxial growth method of the present invention.

【図2】従来の液相エピタキシャル成長方法による成長
工程を示す模式図である。
FIG. 2 is a schematic view showing a growth step by a conventional liquid phase epitaxial growth method.

【図3】本発明の実施例を説明する液相エピタキシャル
成長用ボートの断面図である。
FIG. 3 is a cross-sectional view of a liquid phase epitaxial growth boat for explaining an example of the present invention.

【符号の説明】 1:溶液溜 2:開口部 3:溶液 4:単結晶基板収容部 5:単結晶基板 6:高さ調整用のカーボン板 7:スライダ[Explanation of Codes] 1: Solution Reservoir 2: Opening 3: Solution 4: Single Crystal Substrate Housing 5: Single Crystal Substrate 6: Carbon Plate for Height Adjustment 7: Slider

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 スライド法による化合物半導体結晶の液
相エピタキシャル成長方法において、厚み600μm以
上の単結晶基板を用いることを特徴とする液相エピタキ
シャル成長方法。
1. A liquid phase epitaxial growth method for a compound semiconductor crystal by a slide method, which comprises using a single crystal substrate having a thickness of 600 μm or more.
【請求項2】 スライド法による化合物半導体結晶の液
相エピタキシャル成長方法において、厚み600μm以
上の単結晶基板を用いて液相エピタキシャル成長した
後、成長薄膜を単結晶基板部分から分離して製品とし、
かつ残った単結晶基板をエピタキシャル成長に再使用す
ることを特徴とする液相エピタキシャル成長方法。
2. A liquid phase epitaxial growth method for a compound semiconductor crystal by a slide method, wherein liquid phase epitaxial growth is performed using a single crystal substrate having a thickness of 600 μm or more, and then the grown thin film is separated from the single crystal substrate portion to obtain a product,
A liquid phase epitaxial growth method, characterized in that the remaining single crystal substrate is reused for epitaxial growth.
JP1145292A 1992-01-27 1992-01-27 Liquid phase epitaxial growth method Pending JPH05201791A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1145292A JPH05201791A (en) 1992-01-27 1992-01-27 Liquid phase epitaxial growth method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1145292A JPH05201791A (en) 1992-01-27 1992-01-27 Liquid phase epitaxial growth method

Publications (1)

Publication Number Publication Date
JPH05201791A true JPH05201791A (en) 1993-08-10

Family

ID=11778494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1145292A Pending JPH05201791A (en) 1992-01-27 1992-01-27 Liquid phase epitaxial growth method

Country Status (1)

Country Link
JP (1) JPH05201791A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102677161A (en) * 2012-05-09 2012-09-19 中国科学院上海技术物理研究所 Removing method for residual liquid on back of tellurium-cadmium-mercury liquid phase epitaxial thin film

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102677161A (en) * 2012-05-09 2012-09-19 中国科学院上海技术物理研究所 Removing method for residual liquid on back of tellurium-cadmium-mercury liquid phase epitaxial thin film

Similar Documents

Publication Publication Date Title
US7235462B2 (en) Methods for fabricating a substrate
JP5371430B2 (en) Semiconductor substrate, method for manufacturing a self-supporting semiconductor substrate by hydride vapor phase epitaxy, and mask layer used therefor
EP0194495B1 (en) Method of producing sheets of crystalline material
US5362683A (en) Method of making epitaxial wafers
KR100746179B1 (en) A method of preparation of an epitaxial substrate
JPH06105797B2 (en) Semiconductor substrate and manufacturing method thereof
EP0858101A2 (en) Manufacturing of an Si/SiGe super lattice structure by epitaxial growth
JPH10294281A (en) Dislocation reducing method
US5279687A (en) Preparing substrates by annealing epitaxial layers in the form of nesas and substrates so prepared
JP3441415B2 (en) Manufacturing method of semiconductor crystal
US5653803A (en) Method of manufacturing a substrate for manufacturing silicon semiconductor elements
US4512825A (en) Recovery of fragile layers produced on substrates by chemical vapor deposition
US7112243B2 (en) Method for producing Group III nitride compound semiconductor
JPH05201791A (en) Liquid phase epitaxial growth method
JP4749584B2 (en) Manufacturing method of semiconductor substrate
JP2001274093A (en) Semiconductor base and its manufacturing method
US5223079A (en) Forming thin liquid phase epitaxial layers
JPH03191549A (en) Manufacture of compound semiconductor device on si substrate
JP2003171200A (en) Crystal growth method for compound semiconductor and compound semiconductor device
JPS60145625A (en) Manufacture of semiconductor device
JP4126452B2 (en) Manufacturing method of semiconductor substrate
KR101094409B1 (en) Preparation of single crystalline gallium nitride thick film
JPH05221797A (en) Epitaxial growth method
JP2002151409A (en) Semiconductor device, and method of manufacturing the same
JPS61198789A (en) Continuous manufacture of optical semiconductor element