JPH0518053B2 - - Google Patents
Info
- Publication number
- JPH0518053B2 JPH0518053B2 JP18615984A JP18615984A JPH0518053B2 JP H0518053 B2 JPH0518053 B2 JP H0518053B2 JP 18615984 A JP18615984 A JP 18615984A JP 18615984 A JP18615984 A JP 18615984A JP H0518053 B2 JPH0518053 B2 JP H0518053B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- measured
- sample
- incident
- reflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000003595 spectral effect Effects 0.000 claims description 22
- 239000000463 material Substances 0.000 claims description 10
- 239000000758 substrate Substances 0.000 claims description 3
- 238000004611 spectroscopical analysis Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 11
- 239000010408 film Substances 0.000 description 9
- 230000010287 polarization Effects 0.000 description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000005357 flat glass Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 206010041662 Splinter Diseases 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59186159A JPS6162841A (ja) | 1984-09-04 | 1984-09-04 | 分光反射率測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59186159A JPS6162841A (ja) | 1984-09-04 | 1984-09-04 | 分光反射率測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6162841A JPS6162841A (ja) | 1986-03-31 |
JPH0518053B2 true JPH0518053B2 (fi) | 1993-03-10 |
Family
ID=16183412
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59186159A Granted JPS6162841A (ja) | 1984-09-04 | 1984-09-04 | 分光反射率測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6162841A (fi) |
-
1984
- 1984-09-04 JP JP59186159A patent/JPS6162841A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6162841A (ja) | 1986-03-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4332476A (en) | Method and apparatus for studying surface properties | |
US5255075A (en) | Optical sensor | |
US5963327A (en) | Total internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systems | |
US6856384B1 (en) | Optical metrology system with combined interferometer and ellipsometer | |
JPH10507833A (ja) | 分光偏光解析装置 | |
US6181421B1 (en) | Ellipsometer and polarimeter with zero-order plate compensator | |
US5526117A (en) | Method for the determination of characteristic values of transparent layers with the aid of ellipsometry | |
JPH06103252B2 (ja) | 高分解能エリプソメータ装置と方法 | |
JP4399126B2 (ja) | 分光エリプソメータ | |
JPH0640071B2 (ja) | 水蒸気光吸収線の2次微分曲線を利用した高精度湿度測定方法 | |
JPH0815130A (ja) | フーリエ変換分光位相変調偏光解析法 | |
JP3520379B2 (ja) | 光学定数測定方法およびその装置 | |
US4932780A (en) | Interferometer | |
US10168138B1 (en) | Inspecting a slab of material | |
JPH08271337A (ja) | 分光器 | |
JP4032511B2 (ja) | 薄膜の光学定数測定方法 | |
Smith | An automated scanning ellipsometer | |
JPH031615B2 (fi) | ||
JPH0518053B2 (fi) | ||
JPS61200407A (ja) | フーリェ変換方式赤外線膜厚測定方法 | |
JPH05264440A (ja) | 偏光解析装置 | |
US10563975B1 (en) | Dual-sensor arrangment for inspecting slab of material | |
JPS6179109A (ja) | 反射型ガラス歪検査装置 | |
JPS6244215B2 (fi) | ||
JPS62289749A (ja) | 反射率測定装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |