JPH05148655A - Thin film forming apparatus - Google Patents

Thin film forming apparatus

Info

Publication number
JPH05148655A
JPH05148655A JP33785791A JP33785791A JPH05148655A JP H05148655 A JPH05148655 A JP H05148655A JP 33785791 A JP33785791 A JP 33785791A JP 33785791 A JP33785791 A JP 33785791A JP H05148655 A JPH05148655 A JP H05148655A
Authority
JP
Japan
Prior art keywords
substrate
thin film
substrate holder
forming apparatus
film forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP33785791A
Other languages
Japanese (ja)
Inventor
Shigeki Hoshino
茂樹 星野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP33785791A priority Critical patent/JPH05148655A/en
Publication of JPH05148655A publication Critical patent/JPH05148655A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To form a thin film of good quality at a relatively low temp. by impressing voltage on a substrate holder, feeding a reactive gas to the surface of a substrate and irradiating the surface of the substrate with a free radical. CONSTITUTION:A substrate 3 is held in a vacuum tank 1 by a substrate holder 2. An electrode 4 is arranged in the vicinity of the substrate holder 2. DC voltage is applied through the substrate holder 2 by the electrode 4. A reactive gas is fed to the surface of the substrate 3 from gas introducing tubes 15 and 16. The surface of the substrate 3 is irradiated with one or >= two kinds of free radicals by at least one of free radical beam generators 6 and 8. In this way, the objective thin film forming apparatus applicable also to a semiconductor film or the like can be provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は良質な薄膜を形成する薄
膜形成装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thin film forming apparatus for forming a good quality thin film.

【0002】[0002]

【従来の技術】従来、DCプラズマによってガスを分解
して膜を蒸着するプラズマCVD法はすでに良く知られ
ている。
2. Description of the Related Art Conventionally, a plasma CVD method for decomposing a gas by DC plasma to deposit a film is already well known.

【0003】[0003]

【発明が解決しようとする課題】一般に、DCプラズマ
CVD装置によって成膜を行う場合には、電極と基板間
に直流電圧を印加してガスを分解することによって膜を
合成する。しかしながら、前記方法ではガスの分解率や
活性化率やイオン化率が割合低く、反応物の生成率があ
まり高くないために組成の制御などが難しい。本発明の
目的は、DCプラズマCVD装置による薄膜形成におい
て、上方からラジカルを基板上に照射することによって
ガスや反応物の活性化を促進させ、高速で成膜できると
共に、良質な薄膜を形成できる装置を提供することにあ
る。
Generally, when a film is formed by a DC plasma CVD apparatus, a DC voltage is applied between the electrode and the substrate to decompose the gas to synthesize the film. However, in the above method, it is difficult to control the composition because the decomposition rate, the activation rate and the ionization rate of the gas are relatively low and the production rate of the reaction product is not so high. An object of the present invention is to accelerate activation of a gas or a reactant by irradiating a substrate with a radical from above in a thin film formation by a DC plasma CVD apparatus, and to form a high-speed thin film while forming a high quality thin film To provide a device.

【0004】[0004]

【課題を解決するための手段】本発明は以上の目的を達
成するため、真空槽内にあって基板を保持する基板ホル
ダと、該基板ホルダの近傍に配置されて基板ホルダ間に
DC電圧を印加する電極と、前記基板上に反応ガスを供
給するガス導入管と、前記基板上に1種もしくは2種以
上のラジカルを照射する少なくとも1個のラジカルビ―
ム発生器とを備える薄膜形成装置を構成するものであ
る。
In order to achieve the above object, the present invention provides a substrate holder for holding a substrate in a vacuum chamber, and a DC voltage between the substrate holders arranged in the vicinity of the substrate holder. An electrode to be applied, a gas introduction tube for supplying a reaction gas onto the substrate, and at least one radical beam for irradiating the substrate with one or more radicals.
And a film generator to form a thin film forming apparatus.

【0005】[0005]

【作用】DCプラズマによる反応生成物に、基板上方に
配置された1個または複数のラジカルビ―ム発生器から
発生させたラジカルを基板上に照射することによって該
反応生成物をさらに活性化させることができ、良質かつ
高速で薄膜を形成することができる。
The reaction product by the DC plasma is further activated by irradiating the substrate with radicals generated from one or more radical beam generators arranged above the substrate. Therefore, a thin film can be formed with good quality and at high speed.

【0006】[0006]

【実施例】以下、本発明の実施例について説明する。図
1は本発明の一実施例の全体構造を示す断面図である。
装置の真空槽1には内部に加熱ヒ―タ付き基板ホルダ2
が設けられ、基板3が支持されている。なお、前記加熱
ヒ―タはヒ―タ用電源12に連結する。基板ホルダ2の
近傍にはガス導入管14が接続される電極4が設けら
れ、基板3と電極4間はDC電源13によって連結され
る。さらに基板3の上方には、ラジカルビ―ム発生器
(A)6とラジカルビ―ム発生器(B)8が設置されて
いる。なお、5,7はシャッタ、9,10,11はバル
ブ、15,16はガス導入管である。
EXAMPLES Examples of the present invention will be described below. FIG. 1 is a sectional view showing the overall structure of an embodiment of the present invention.
Substrate holder 2 with heating heater inside vacuum chamber 1
Is provided and the substrate 3 is supported. The heating heater is connected to the heater power source 12. An electrode 4 to which a gas introduction pipe 14 is connected is provided near the substrate holder 2, and the substrate 3 and the electrode 4 are connected by a DC power supply 13. Further, a radical beam generator (A) 6 and a radical beam generator (B) 8 are installed above the substrate 3. Reference numerals 5 and 7 are shutters, 9 and 10 and 11 are valves, and 15 and 16 are gas introduction pipes.

【0007】次に、この装置によるダイヤモンド薄膜形
成につき具体的に説明する。まず、拡散ポンプあるいは
タ―ボポンプと油回転ポンプ(いずれも図示せず。)を
用いて真空槽1内を1×10-7Torr以下まで排気す
る。基板3を約500℃に加熱し、次にガスを導入する
ためにバルブ9,10を開き、それぞれ水素と酸素を導
入する。更に、バルブ11を開いてメタノ―ル(あるい
はメタン)+水素ガス(キャリヤガス)を真空槽1内に
導入する。この状態で電極4と基板ホルダ2(基板3)
間に直流電圧を印加してプラズマを発生させる。更に、
同時にラジカルビ―ム発生器(A)、(B)の電源を所
定の条件に設定して、水素ラジカルと酸素ラジカルを基
板の直上に照射しながら膜を成長させる。
Next, the formation of a diamond thin film by this apparatus will be specifically described. First, the inside of the vacuum chamber 1 is evacuated to 1 × 10 −7 Torr or less using a diffusion pump or a turbo pump and an oil rotary pump (neither is shown). The substrate 3 is heated to about 500 ° C., then valves 9 and 10 are opened to introduce gas, and hydrogen and oxygen are introduced respectively. Further, the valve 11 is opened to introduce methanol (or methane) + hydrogen gas (carrier gas) into the vacuum chamber 1. In this state, the electrode 4 and the substrate holder 2 (substrate 3)
A DC voltage is applied between them to generate plasma. Furthermore,
At the same time, the power sources of the radical beam generators (A) and (B) are set to predetermined conditions to grow a film while irradiating hydrogen radicals and oxygen radicals directly on the substrate.

【0008】本実施例ではこの状態でシリコン基板上に
約10分間膜形成を行った。このようにして形成された
ダイヤモンド膜の膜厚は約1μmであった。形成された
膜をRaman分光法で測定したところ、1330cm
-1だけに鋭いピ―クが得られた。また、この膜のビッカ
―ス硬度を測定したところ、約12000という値が得
られた。この値は天然のダイヤモンドと同じである。ま
た、膜の熱伝導率を測定したところ、約200W/K・
cmという値が得られた。これは高圧合成されたダイヤ
モンドと同じ値である。このように、本実施例によって
比較的低温で良質のダイヤモンド薄膜が得られることが
わかる。なお、本実施例ではラジカルビーム発生器を2
個用いたが、その数は特に限定されず、形成しようとす
る薄膜に応じて1個または複数個を適宜選択使用すれば
よい。
In this embodiment, in this state, a film was formed on the silicon substrate for about 10 minutes. The diamond film thus formed had a thickness of about 1 μm. The formed film was measured by Raman spectroscopy, which was 1330 cm.
Only -1 gave a sharp peak. When the Vickers hardness of this film was measured, a value of about 12000 was obtained. This value is the same as natural diamond. Also, when the thermal conductivity of the film was measured, it was about 200 W / K.
A value of cm was obtained. This is the same value as high-pressure synthesized diamond. As described above, it is understood that the present embodiment can obtain a good quality diamond thin film at a relatively low temperature. In this embodiment, the radical beam generator is 2
Although one piece is used, the number is not particularly limited, and one piece or a plurality of pieces may be appropriately selected and used according to the thin film to be formed.

【0009】[0009]

【発明の効果】以上説明したとおり、本発明によればD
Cプラズマによる反応生成物とその上方から基板上にラ
ジカルビ―ムを照射することの組み合わせにより反応生
成物の活性化を高め、比較的低温で良質な薄膜を形成で
き、半導体膜などへの応用も可能な薄膜形成装置を提供
することができる。
As described above, according to the present invention, D
The combination of the reaction product of C plasma and the irradiation of the radical beam from above onto the substrate enhances the activation of the reaction product and can form a good quality thin film at a relatively low temperature. It is also applicable to semiconductor films. A possible thin film forming apparatus can be provided.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の薄膜形成装置の全体構造を
示す断面図である。
FIG. 1 is a cross-sectional view showing an overall structure of a thin film forming apparatus according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 真空槽 2 基板ホルダ 3 基板 4 電極 5,7 シャッタ 6,8 ラジカ
ルビ―ム発生器 9,10,11 バルブ 12 ヒ―タ用
電源 13 DC電源 14,15,1
6 ガス導入管
1 Vacuum Tank 2 Substrate Holder 3 Substrate 4 Electrodes 5,7 Shutter 6,8 Radical Beam Generator 9,10,11 Valve 12 Heater Power Supply 13 DC Power Supply 14,15,1
6 gas introduction pipes

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 真空槽内にあって基板を保持する基板ホ
ルダと、該基板ホルダの近傍に配置されて基板ホルダ間
にDC電圧を印加する電極と、前記基板上に反応ガスを
供給するガス導入管と、前記基板上に1種もしくは2種
以上のラジカルを照射する少なくとも1個のラジカルビ
―ム発生器とを備えることを特徴とする薄膜形成装置。
1. A substrate holder for holding a substrate in a vacuum chamber, an electrode arranged near the substrate holder for applying a DC voltage between the substrate holders, and a gas for supplying a reaction gas onto the substrate. A thin film forming apparatus comprising: an introduction tube; and at least one radical beam generator for irradiating the substrate with one or more radicals.
JP33785791A 1991-11-28 1991-11-28 Thin film forming apparatus Pending JPH05148655A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33785791A JPH05148655A (en) 1991-11-28 1991-11-28 Thin film forming apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33785791A JPH05148655A (en) 1991-11-28 1991-11-28 Thin film forming apparatus

Publications (1)

Publication Number Publication Date
JPH05148655A true JPH05148655A (en) 1993-06-15

Family

ID=18312639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33785791A Pending JPH05148655A (en) 1991-11-28 1991-11-28 Thin film forming apparatus

Country Status (1)

Country Link
JP (1) JPH05148655A (en)

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