JPH0513887A - Semiconductor laser light emitting device - Google Patents

Semiconductor laser light emitting device

Info

Publication number
JPH0513887A
JPH0513887A JP3192623A JP19262391A JPH0513887A JP H0513887 A JPH0513887 A JP H0513887A JP 3192623 A JP3192623 A JP 3192623A JP 19262391 A JP19262391 A JP 19262391A JP H0513887 A JPH0513887 A JP H0513887A
Authority
JP
Japan
Prior art keywords
semiconductor laser
emitting device
laser light
resin
epoxy resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3192623A
Other languages
Japanese (ja)
Inventor
Hiroyuki Nishimura
浩之 西村
Hiroshi Adachi
廣士 足達
Osamu Hayashi
修 林
Masakazu Murayama
雅一 村山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3192623A priority Critical patent/JPH0513887A/en
Publication of JPH0513887A publication Critical patent/JPH0513887A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item

Abstract

PURPOSE:To obtain a semiconductor laser light emitting device having high productivity, a compact structure, and less double refraction and aging change by providing a sealing member formed of liquid transparent epoxy resin having excellent transparency, less double refraction and less aging change. CONSTITUTION:A semiconductor laser chip 1 is sealed with transparent epoxy resin 10 obtained by controlling compositions of the epoxy resin, acid anhydride curing agent, curing accelerator. Here, when 0.4-0.9 equivalent of acid anhydride curing agent to 100 pts.wt. of resin is used in the composition of the epoxy resin, its moisture resistance is improved, and its toughness is improved. Further, the double refraction is reduced, and its change is small even after it is preserved at a high temperature. When the accelerator is reduced to 0.2-1.0 pts.wt., its double refraction is reduced. Thus, a semiconductor laser light emitting device having high productivity and compact structure can be obtained by providing a sealing material formed of liquid transparent epoxy resin having excellent transparency, less double refraction and less aging change.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は半導体レーザ発光装置
に関し、特にチップの封止構造に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor laser light emitting device, and more particularly to a chip sealing structure.

【0002】[0002]

【従来の技術】従来、半導体レーザをはじめとする光半
導体の封止する方法として、図3に示すようなガラス窓
付きキャップパッケージが用いられている。図に示すよ
うにレーザチップ1を搭載した基台5上にキャプリング
4が設けられ、上記レーザチップ1上方にはガラス窓3
が配置されている。そしてチップ1はワイヤ6により電
極端子リード7と接続されている。また2はレーザチッ
プ1の動作をモニタするモニタフォトダイオードであ
り、8は電極端子リード7を基台5に固定するめのガラ
ス等の溶着材である。しかしながら、この方法ではパッ
ケージコストが高く、また小型化も困難であり、半導体
レーザの生産性の向上,用途拡大に適応できない。
2. Description of the Related Art Conventionally, a cap package with a glass window as shown in FIG. 3 has been used as a method for sealing an optical semiconductor such as a semiconductor laser. As shown in the figure, a coupling 4 is provided on a base 5 on which the laser chip 1 is mounted, and a glass window 3 is provided above the laser chip 1.
Are arranged. The chip 1 is connected to the electrode terminal lead 7 by the wire 6. Further, 2 is a monitor photodiode for monitoring the operation of the laser chip 1, and 8 is a welding material such as glass for fixing the electrode terminal lead 7 to the base 5. However, with this method, the package cost is high and it is difficult to reduce the size, so that it cannot be applied to the improvement of the productivity of the semiconductor laser and the expansion of its application.

【0003】そこで、この封止材料に透明なエポキシ樹
脂を用いることで発光素子を簡単に、生産性よく、コン
パクトに一体成形することが可能となる(図2参照)。
光半導体封止用エポキシ樹脂9の組成物としては、酸無
水物系硬化剤を用いたエポキシ樹脂にアミンなどの硬化
促進剤を添加したものが知られている。しかし、このエ
ポキシ樹脂で封止する際、硬化速度を向上させるため、
硬化促進剤の量を多くしたり、硬化温度を上げたりする
と硬化物が着色し、光半導体素子の封止材料としては不
具合を有するものとなる。そこで例えば、特公平1−2
5487号公報に示されるように、硬化促進剤として含
硫リン化合物を用い、硬化時の着色を防止し、透明性に
優れた硬化物を短時間で得るようにしたものも提案され
ている。
Therefore, by using a transparent epoxy resin as the encapsulating material, it becomes possible to integrally mold the light emitting element compactly with high productivity and compactness (see FIG. 2).
As a composition of the epoxy resin 9 for encapsulating an optical semiconductor, there is known a composition obtained by adding a curing accelerator such as an amine to an epoxy resin using an acid anhydride type curing agent. However, when sealing with this epoxy resin, in order to improve the curing speed,
If the amount of the curing accelerator is increased or the curing temperature is raised, the cured product will be colored, and there will be a problem as a sealing material for the optical semiconductor element. So, for example, Japanese Patent Fair 1-2
As disclosed in Japanese Patent No. 5487, a sulfur-containing phosphorus compound is used as a curing accelerator to prevent coloring during curing and to obtain a cured product excellent in transparency in a short time.

【0004】[0004]

【発明が解決しようとする課題】従来の半導体レーザ発
光装置は以上のように構成されており、封止樹脂の着色
が影響を及ぼす範囲は波長0.3〜0.4ミクロン付近
であり、一方、半導体レーザの場合、光通信用の長波長
半導体レーザで波長1.3〜1.5ミクロン、CDや光
ビデオディスクなどの光ピックアップ用の短波長半導体
レーザで波長0.7〜0.8ミクロンであることから上
記着色による問題はあまり影響はない。
The conventional semiconductor laser light emitting device is constructed as described above, and the range affected by the coloring of the sealing resin is in the wavelength range of 0.3 to 0.4 μm. In the case of semiconductor lasers, the wavelength is 1.3 to 1.5 microns for long wavelength semiconductor lasers for optical communication, and the wavelength is 0.7 to 0.8 microns for short wavelength semiconductor lasers for optical pickups such as CDs and optical video disks. Therefore, the problem due to the above coloring does not have much influence.

【0005】問題となるのは複屈折の影響である。すな
わち半導体レーザはスペクトル幅が非常に狭く波が揃っ
ているため、波長程度まで集光できるという特徴を持っ
ているが、発振光が直線偏光であるため、複屈折の影響
を大きく受ける。しかるに半導体レーザ素子を樹脂封止
するためには、電気的特性や透明性を維持するだけでな
く、光学的異方性の小さい、つまり低複屈折かつ経時変
化の少ない封止樹脂材料を開発する必要があった。
The problem is the effect of birefringence. That is, the semiconductor laser has a feature that it can collect light up to about the wavelength because the spectrum width is very narrow and the waves are aligned. However, since the oscillation light is linearly polarized light, it is greatly affected by birefringence. However, in order to seal the semiconductor laser device with resin, we develop a sealing resin material that not only maintains electrical characteristics and transparency but also has small optical anisotropy, that is, low birefringence and little change over time. There was a need.

【0006】この発明は上記のような問題点を解消する
ためになされたもので、高生産,コンパクトかつ複屈折
及び経時変化の少ない封止樹脂部材を有する半導体レー
ザ発光装置を提供するものである。
The present invention has been made to solve the above problems, and provides a semiconductor laser light emitting device having a high-productivity, compact size, and a sealing resin member with little birefringence and little change over time. .

【0007】[0007]

【課題を解決するための手段】この発明に係る半導体レ
ーザ発光装置は、透明性に優れ、低複屈折で経時変化の
少ない液状透明エポキシ樹脂を用いて形成された封止部
材を備えたものである。
A semiconductor laser light emitting device according to the present invention comprises a sealing member formed of a liquid transparent epoxy resin which is excellent in transparency, has low birefringence and has little change over time. is there.

【0008】[0008]

【作用】この発明においては、エポキシ樹脂,酸無水物
系硬化剤,硬化促進剤等の組成制御によって得られた低
複屈折で経時変化の少ない透明エポキシ樹脂を用いて半
導体レーザ素子を封止したから、高生産性のもとでコン
パクトな半導体レーザ発光装置を得ることができる。
In the present invention, the semiconductor laser device is encapsulated by using the transparent epoxy resin having a low birefringence and little change over time, which is obtained by controlling the composition of the epoxy resin, the acid anhydride type curing agent, the curing accelerator and the like. Thus, a compact semiconductor laser light emitting device can be obtained with high productivity.

【0009】[0009]

【実施例】以下、この発明の実施例について説明する。
図1は以下に述べる実施例により得られた透明エポキシ
樹脂を用いて構成された封止部材10を有する半導体レ
ーザ発光装置を示す図である。
Embodiments of the present invention will be described below.
FIG. 1 is a diagram showing a semiconductor laser light emitting device having a sealing member 10 constituted by using a transparent epoxy resin obtained by the examples described below.

【0010】DER332(ダウ・ケミカル日本〓製の
ビスフェノール型エポキシ樹脂:エポキシ当量が170
〜200で、塩素濃度が700〜1100ppmとイオ
ン性不純物が少なく高純度である。)にHN5500E
(日立化成工業(株)製酸無水物系硬化剤)およびテト
ラエチルアンモニウムブロマイド(以下、TEABと略
す)を配合し、均一に混合して封止用樹脂組成物を得
る。そのときの混合量を表1に示す。次いで、半導体レ
ーザ素子をこの組成物で封止し、表1に示す条件で硬化
を行った。
DER332 (Bisphenol type epoxy resin manufactured by Dow Chemical Nippon 〓: epoxy equivalent is 170)
It has a chlorine concentration of 700 to 1100 ppm and a high purity with little ionic impurities. ) To HN5500E
(Hitachi Chemical Co., Ltd. acid anhydride curing agent) and tetraethylammonium bromide (hereinafter abbreviated as TEAB) are mixed and uniformly mixed to obtain a sealing resin composition. Table 1 shows the mixing amounts at that time. Then, the semiconductor laser device was sealed with this composition and cured under the conditions shown in Table 1.

【0011】[0011]

【表1】 [Table 1]

【0012】このようにして得られた樹脂封止半導体レ
ーザ発光装置は複屈折は小さく、高温保存(125℃×
400hr)変化も少ない。また、ヒートサイクル試験
(条件:−40℃×30min〜125℃×30mi
n,100hr)や高温高湿試験(条件:60℃,95
%RH,100hr)等の環境試験後も発振光の波面歪
に影響を与える面精度の劣化はほとんどなく良好であっ
た。
The resin-sealed semiconductor laser light-emitting device thus obtained has a small birefringence and is stored at high temperature (125 ° C. ×
400 hr) Little change. In addition, heat cycle test (conditions: -40 ° C x 30 min to 125 ° C x 30 mi
n, 100 hr) and high temperature and high humidity test (conditions: 60 ° C, 95
% RH, 100 hr) and other environmental tests, there was almost no deterioration in surface accuracy that affects the wavefront distortion of the oscillated light, which was good.

【0013】なお、上記実施例1〜6の組成で硬化剤の
量を指定範囲以上の1.0当量を用いて半導体レーザ素
子を封止し硬化させ、封止物を上記同様に環境試験等を
行い、複屈折および面精度の評価を行った結果、複屈折
の高温保存変化が大きいことが観察された。
The semiconductor laser device was sealed and cured using the compositions of Examples 1 to 6 and 1.0 equivalent of the curing agent in the specified range or more. As a result of the evaluation of the birefringence and the surface accuracy, it was observed that the birefringence was significantly changed at high temperature.

【0014】次にAK601(日本化薬(株)製のジグ
リシジルエステル型エポキシ樹脂)にHN5500Eお
よびTEABを配合し、均一に混合して封止用樹脂組成
物を得る。その混合量を表2に示す。次いで、半導体レ
ーザ素子をこの組成物で封止し、表2で示す条件で硬化
を行った。
Next, AK601 (a diglycidyl ester type epoxy resin manufactured by Nippon Kayaku Co., Ltd.) is blended with HN5500E and TEAB and uniformly mixed to obtain a sealing resin composition. The mixing amount is shown in Table 2. Then, the semiconductor laser device was sealed with this composition and cured under the conditions shown in Table 2.

【0015】[0015]

【表2】 [Table 2]

【0016】この封止物を実施例1〜6と同様に環境試
験等を行ったが、複屈折および面精度に問題はなかっ
た。
An environmental test and the like were performed on this sealed product in the same manner as in Examples 1 to 6, but there was no problem in birefringence and surface accuracy.

【0017】次にCY179(長瀬チバ(株)製の環状
脂肪族エポキシ樹脂)にHN5500EおよびTEAB
(もしくはオクチル酸鉛)を配合し、均一に混合して封
止用樹脂組成物を得る。その混合量を表3に示す。次い
で、半導体レーザ素子をこの組成物で封止し、表3で示
す条件で硬化を行った。
Next, CY179 (a cycloaliphatic epoxy resin manufactured by Nagase Ciba Co., Ltd.) was mixed with HN5500E and TEAB.
(Or lead octylate) is mixed and uniformly mixed to obtain a sealing resin composition. The mixing amount is shown in Table 3. Next, the semiconductor laser device was sealed with this composition and cured under the conditions shown in Table 3.

【0018】[0018]

【表3】 [Table 3]

【0019】この封止物を上記実施例1〜6と同様に環
境試験等を行ったが、複屈折および面精度に問題はなか
った。
Environmental tests and the like were performed on this sealed product in the same manner as in Examples 1 to 6, but there was no problem in birefringence and surface accuracy.

【0020】さらにAK601とCY179の混合エポ
キシ樹脂にHN5500EおよびTEABを配合し、均
一に混合して封止用樹脂組成物を得る。その混合量を表
4に示す。次いで、半導体レーザ素子をこの組成物で封
止し、表4で示す条件で硬化を行った。
Further, HN5500E and TEAB are blended with a mixed epoxy resin of AK601 and CY179 and uniformly mixed to obtain a sealing resin composition. The mixing amount is shown in Table 4. Next, the semiconductor laser device was sealed with this composition and cured under the conditions shown in Table 4.

【0021】[0021]

【表4】 [Table 4]

【0022】この封止物を実施例1〜6と同様に環境試
験等を行ったが、複屈折および面精度に問題はなかっ
た。
Environmental tests and the like were performed on this sealed product in the same manner as in Examples 1 to 6, but there was no problem in birefringence and surface accuracy.

【0023】このように本実施例によれば、エポキシ樹
脂組成を、樹脂100重量部に対して、酸無水物系硬化
剤は通常より少ない0.4〜0.9当量を使用し、硬化
物の使用量を少なくすると、エーテル結合が増加するこ
とにより、耐湿性が良くなり、また、可撓化によって靭
性も向上する。さらに複屈折も小さくなり、高温保存後
もその変化も少ない。硬化促進剤は4級アミン塩やオク
チル酸塩を用い、その使用量は0.2〜1.0重量部と
少なくする。反応速度を遅くして硬化させることによっ
ても複屈折を低下させるのに効果がある。しかし、促進
剤が少なすぎると硬化促進効果は劣るようになる。
As described above, according to this example, the epoxy resin composition was used in an amount of 0.4 to 0.9 equivalents, which is less than the usual amount, of the acid anhydride-based curing agent based on 100 parts by weight of the resin. When the used amount of is decreased, the ether bond is increased, so that the moisture resistance is improved, and the toughness is improved due to the flexibility. Further, the birefringence becomes small, and the change is small even after storage at high temperature. As the curing accelerator, a quaternary amine salt or an octyl acid salt is used, and the amount used is as small as 0.2 to 1.0 part by weight. Curing by slowing the reaction rate is also effective in reducing birefringence. However, if the amount of the accelerating agent is too small, the curing acceleration effect becomes poor.

【0024】また使用される樹脂としては、ビスフェノ
ール型,グリシジルエステル型,環状脂肪族の3種のエ
ポキシ樹脂が透明性に優れているため好ましい。また、
これらの樹脂の混合系,もしくは他のエポキシ樹脂との
混合系も可能である。
As the resin to be used, three kinds of epoxy resins of bisphenol type, glycidyl ester type and cycloaliphatic are preferable because they have excellent transparency. Also,
A mixed system of these resins or a mixed system with another epoxy resin is also possible.

【0025】さらに上記樹脂の硬化条件については、1
20℃以下の低温で硬化させると、複屈折の低下に効果
がある。しかし、低温だけで行うと硬化に長時間かかる
だけでなく硬化不十分となりやすいため、ステップキュ
アを行うことが好ましい。すなわち第1段階では100
〜150℃で1〜5時間、第2段階では150〜180
℃で1〜4時間行うのが好ましい。高温で長時間硬化を
行うと着色を生じる。
Regarding the curing conditions of the above resin, 1
Curing at a low temperature of 20 ° C. or lower is effective in reducing birefringence. However, if the curing is carried out only at a low temperature, the curing takes a long time and the curing tends to be insufficient. Therefore, it is preferable to carry out the step curing. That is, 100 in the first stage
~ 150 ° C for 1-5 hours, 2nd stage 150-180
It is preferable to carry out at 1 to 4 hours. Coloring occurs when cured at high temperature for a long time.

【0026】なお半導体レーザ素子封止用樹脂では、上
記のエポキシ樹脂,酸無水物系硬化剤,及び硬化促進剤
の他に必要に応じて希釈剤,可撓化剤,着色剤,変性
剤,離型剤,変色防止剤,劣化防止剤など従来公知の添
加剤を加えることが可能である。
In the semiconductor laser device encapsulating resin, in addition to the above epoxy resin, acid anhydride-based curing agent, and curing accelerator, a diluent, a flexibilizer, a coloring agent, a modifier, and a It is possible to add conventionally known additives such as a release agent, a discoloration preventing agent and a deterioration preventing agent.

【0027】また上記封止樹脂組成物は、室温もしくは
加熱下で混合することができ、得られた均一混合物を用
いて注型あるいはトランスファ型などにより半導体レー
ザ素子を封止して半導体レーザ発光装置を得ることがで
きる。
The above-mentioned encapsulating resin composition can be mixed at room temperature or under heating, and the obtained homogeneous mixture is used for encapsulating a semiconductor laser element by casting or transfer type to form a semiconductor laser light-emitting device. Can be obtained.

【0028】[0028]

【発明の効果】以上のように、この発明に係る半導体レ
ーザ発光装置によれば、透明性に優れ、低複屈折で経時
変化の少ない液状透明エポキシ樹脂を用いて形成された
封止部材を備えたから、高生産性のもとでコンパクトな
半導体レーザ発光装置を得ることができるという効果が
ある。
As described above, according to the semiconductor laser light emitting device of the present invention, it is provided with the sealing member formed of the liquid transparent epoxy resin which is excellent in transparency, has low birefringence and has little change with time. Therefore, there is an effect that a compact semiconductor laser light emitting device can be obtained with high productivity.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の樹脂封止した半導体レーザ発光素子の
断面図である。
FIG. 1 is a cross-sectional view of a resin-sealed semiconductor laser light emitting device of the present invention.

【図2】従来の樹脂封止した半導体レーザ発光素子の断
面図である。
FIG. 2 is a sectional view of a conventional resin-sealed semiconductor laser light emitting element.

【図3】従来のガラス窓付きキャップパッケージで封止
した半導体レーザ発光装置の断面図である。
FIG. 3 is a cross-sectional view of a semiconductor laser light emitting device sealed with a conventional cap package with a glass window.

【符号の説明】 1 レーザチップ 3 ガラス窓 4 キャップリング 5,5′基台 6 ワイヤ 7 電極端子リード 8 溶着材 10 封止部材(透明エポキシ樹脂)[Explanation of symbols] 1 laser chip 3 glass windows 4 cap ring 5,5 'base 6 wires 7 electrode terminal lead 8 Welding material 10 Sealing member (transparent epoxy resin)

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 33/00 N 8934−4M H01S 3/025 7630−4M H01S 3/02 S (72)発明者 村山 雅一 兵庫県尼崎市塚口本町8丁目1番1号 三 菱電機株式会社生産技術研究所内─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 5 Identification code Internal reference number FI Technical indication location H01L 33/00 N 8934-4M H01S 3/025 7630-4M H01S 3/02 S (72) Inventor Masakazu Murayama 8-1-1 Tsukaguchihonmachi, Amagasaki-shi, Hyogo Sanryo Electric Co., Ltd.

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 基台上に搭載された半導体レーザ素子
を、樹脂で構成された封止部材を用いて封止するように
した半導体レーザ発光装置において、 上記封止部材として、 透明性に優れ、低複屈折かつ経時変化の少ない液状透明
エポキシ樹脂を用いたことを特徴とする半導体レーザ発
光装置。
1. A semiconductor laser light-emitting device in which a semiconductor laser element mounted on a base is sealed by using a sealing member made of resin, wherein the sealing member is excellent in transparency. A semiconductor laser light emitting device characterized by using a liquid transparent epoxy resin having low birefringence and little change over time.
【請求項2】 請求項1記載の半導体レーザ発光装置に
おいて、 上記封止部材は、 樹脂として高純度ビスフェノール型エポキシ樹脂を用
い、これに酸無水物系硬化剤と硬化促進剤を含有させて
なる樹脂組成物から得られたものであることを特徴とす
る半導体レーザ発光装置。
2. The semiconductor laser light emitting device according to claim 1, wherein the sealing member uses a high-purity bisphenol type epoxy resin as a resin, and contains an acid anhydride-based curing agent and a curing accelerator. A semiconductor laser light-emitting device characterized by being obtained from a resin composition.
【請求項3】 請求項1記載の半導体レーザ発光装置に
おいて、 上記封止部材は、 樹脂としてヘキサヒドロ無水フタル酸のジグリシジルエ
ステル型エポキシ樹脂を用い、これに酸無水物系硬化剤
と硬化促進剤を含有させてなる樹脂組成物から得られた
ものであることを特徴とする半導体レーザ発光装置。
3. The semiconductor laser light emitting device according to claim 1, wherein the sealing member uses a diglycidyl ester type epoxy resin of hexahydrophthalic anhydride as a resin, in which an acid anhydride curing agent and a curing accelerator are used. A semiconductor laser light-emitting device, which is obtained from a resin composition containing:
【請求項4】 請求項1記載の半導体レーザ発光装置に
おいて、 上記封止部材は、 樹脂として環状脂肪族エポキシ樹脂を用い、これに酸無
水物系硬化剤と硬化促進剤を含有させてなる樹脂組成物
から得られたものであることを特徴とする半導体レーザ
発光装置。
4. The semiconductor laser light emitting device according to claim 1, wherein the sealing member uses a cyclic aliphatic epoxy resin as a resin, and contains an acid anhydride curing agent and a curing accelerator. A semiconductor laser light-emitting device, which is obtained from the composition.
【請求項5】 請求項1記載の半導体レーザ発光装置に
おいて、 上記封止部材は、 樹脂としてジグリシジルエステル型エポキシ樹脂及び環
状脂肪族エポキシ樹脂の混合系樹脂を用い、これに酸無
水物系硬化剤と硬化促進剤を含有させてなる樹脂組成物
から得られたものであることを特徴とする半導体レーザ
発光装置。
5. The semiconductor laser light emitting device according to claim 1, wherein the sealing member uses a mixed resin of a diglycidyl ester type epoxy resin and a cycloaliphatic epoxy resin as a resin, and an acid anhydride curing A semiconductor laser light-emitting device characterized by being obtained from a resin composition containing an agent and a curing accelerator.
【請求項6】 請求項2ないし5のいずれかに記載の半
導体レーザ発光装置において、 上記樹脂組成物は、 樹脂100重量部に対し、0.4〜0.9当量の酸無水
物系硬化剤と、0.2〜1.0重量部の硬化促進剤を含
有させて得られたものであることを特徴とする半導体レ
ーザ発光装置。
6. The semiconductor laser light emitting device according to claim 2, wherein the resin composition comprises 0.4 to 0.9 equivalents of an acid anhydride curing agent with respect to 100 parts by weight of the resin. And 0.2 to 1.0 part by weight of a curing accelerator are contained in the semiconductor laser light emitting device.
JP3192623A 1991-07-05 1991-07-05 Semiconductor laser light emitting device Pending JPH0513887A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3192623A JPH0513887A (en) 1991-07-05 1991-07-05 Semiconductor laser light emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3192623A JPH0513887A (en) 1991-07-05 1991-07-05 Semiconductor laser light emitting device

Publications (1)

Publication Number Publication Date
JPH0513887A true JPH0513887A (en) 1993-01-22

Family

ID=16294336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3192623A Pending JPH0513887A (en) 1991-07-05 1991-07-05 Semiconductor laser light emitting device

Country Status (1)

Country Link
JP (1) JPH0513887A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000060711A1 (en) * 1999-04-05 2000-10-12 Sharp Kabushiki Kaisha Semiconductor laser device and its manufacturing method, and optical communication system and optical sensor system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000060711A1 (en) * 1999-04-05 2000-10-12 Sharp Kabushiki Kaisha Semiconductor laser device and its manufacturing method, and optical communication system and optical sensor system
US6778574B1 (en) 1999-04-05 2004-08-17 Sharp Kabushiki Kaisha Semiconductor laser device and its manufacturing method, and optical communication system and optical sensor system

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