JPH05138383A - Method for adjusting optical axis of laser beam machine - Google Patents

Method for adjusting optical axis of laser beam machine

Info

Publication number
JPH05138383A
JPH05138383A JP3299120A JP29912091A JPH05138383A JP H05138383 A JPH05138383 A JP H05138383A JP 3299120 A JP3299120 A JP 3299120A JP 29912091 A JP29912091 A JP 29912091A JP H05138383 A JPH05138383 A JP H05138383A
Authority
JP
Japan
Prior art keywords
optical axis
diffracted light
light
slit
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3299120A
Other languages
Japanese (ja)
Other versions
JP3003731B2 (en
Inventor
Shingo Murakami
進午 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP3299120A priority Critical patent/JP3003731B2/en
Publication of JPH05138383A publication Critical patent/JPH05138383A/en
Application granted granted Critical
Publication of JP3003731B2 publication Critical patent/JP3003731B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Laser Beam Processing (AREA)

Abstract

PURPOSE:To improve the accuracy of optical axis adjustment by receiving the diffracted light past a slit with divided detectors, outputting this light as an electric signal group and making the optical axis adjustment by judging a mis-alignment direction from the breaking of the balance. CONSTITUTION:A laser beam 5 is passed through the rectangular slit 1 and is made into the diffracted light 6. This diffracted light 6 is received by the quadrisected detectors 2. The deviation in the optical axis is judged by using the difference signals of the detection signals from the right, left, upper, and lower light receiving elements of the detectors 2. This measuring means has a large change with the mis-alignment of the optical axis and the optical axis adjustment is executed with good accuracy.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はレーザ加工装置に関し、
特にそのレーザ光軸の調整方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a laser processing apparatus,
Particularly, it relates to a method of adjusting the laser optical axis.

【0002】[0002]

【従来の技術】従来レーザ加工装置における光軸調整の
代表的な手法は、光軸の位置をケガキ線などで印した金
属板の様にレーザ光に不透過な物体を光軸上に置き、そ
の上に生じる散乱光や螢光によるスポットを目視で確認
しながらミラー類を調整し、光軸位置を表示するケガキ
線の中心に合せて行くというものである。
2. Description of the Related Art A typical method of adjusting the optical axis in a conventional laser processing apparatus is to place an object impermeable to laser light on the optical axis, such as a metal plate whose optical axis position is marked with marking lines. The mirrors are adjusted while visually observing the spots due to scattered light and fluorescent light generated on it, and they are aligned with the center of the marking line that displays the optical axis position.

【0003】また、レーザ光の光軸位置にレーザ光のビ
ーム径程度の円形の穴を明けたものを置き、この穴から
の透過光をモニタして、その値が最大になる様に調整を
行うという方法も考案されている。
Further, a circular hole having a diameter about the beam diameter of the laser light is placed at the position of the optical axis of the laser light, and the transmitted light from this hole is monitored to make an adjustment so that the value becomes maximum. The method of doing is also devised.

【0004】[0004]

【発明が解決しようとする課題】従来の光軸調整方法の
うち、前者の場合は人間が目視で判断する為の分解能不
足や可視域ではないレーザ光に対する場合の螢光発色の
不明瞭さなどのために、厳密な光軸調整を必要とする場
合には適切な方法とは言えない。
Among the conventional optical axis adjusting methods, in the former case, the resolution is insufficient for a human to visually judge, and the indistinctness of the fluorescent coloring in the case of a laser beam which is not in the visible range, etc. Therefore, it is not an appropriate method when strict optical axis adjustment is required.

【0005】また後者の場合には、円形の穴を透過する
レーザ光による信号の光軸をずらしていった場合の変化
率が小さく、光軸中心位置に合致したことの判断が難し
いという問題点を有していた。
In the latter case, the rate of change is small when the optical axis of the signal due to the laser light passing through the circular hole is shifted, and it is difficult to determine that the optical axis center position is met. Had.

【0006】そこで、本発明の技術的課題は、上記欠点
に鑑み、容易なレーザ加工装置の光軸調整方法を提供す
ることである。
In view of the above-mentioned drawbacks, a technical object of the present invention is to provide an easy optical axis adjusting method for a laser processing apparatus.

【0007】[0007]

【課題を解決するための手段】本発明によれば光軸を確
認すべき目標として配されるスリットと、該スリット通
過後に発生する回折光を受光し、前記スリット通過後の
回折光の左右及び上下のバランスのくずれに対応した電
気信号群を出力する2以上に分割されたディテクター
と、該ディテクターから出力された電気信号群の差に基
づいて、レーザ光軸の偏芯方向を判断し、回折光の左右
及び上下のバランスが保たれる様に光軸調整を行う調整
手段とを有することを特徴とするレーザー加工装置の光
軸調整方法が得られる。
According to the present invention, a slit arranged as a target whose optical axis is to be confirmed, and diffracted light generated after passing through the slit are received, and right and left of the diffracted light after passing through the slit and The eccentric direction of the laser optical axis is determined based on the difference between the detector divided into two or more that outputs an electric signal group corresponding to the up-and-down balance and the electric signal group output from the detector, and the diffraction is performed. An optical axis adjusting method for a laser processing apparatus is provided, which has an adjusting means for adjusting the optical axis so that the left and right and up and down balance of light is maintained.

【0008】即ち、本発明の光軸調整方法は、光軸を確
認すべき目標として矩形のスリット板を使用し、この矩
形スリットによって生じる回折光を2分割又は4分割の
受光素子でモニタし、左右又は上下方向の光量のバラン
スにより光軸ずれとその合致を判断するもので、光軸ず
れに対して変化率の大きい測定手段であり精度良く光軸
調整を行うことができる。
That is, in the optical axis adjusting method of the present invention, a rectangular slit plate is used as a target for confirming the optical axis, and the diffracted light generated by the rectangular slit is monitored by a two-division or four-division light receiving element, The optical axis deviation and its matching are determined by the balance of the light quantity in the left-right direction or the vertical direction. The measuring means has a large change rate with respect to the optical axis deviation, and the optical axis can be adjusted with high accuracy.

【0009】[0009]

【実施例】次に本発明の実施例について図面を参照して
説明する。
Embodiments of the present invention will now be described with reference to the drawings.

【0010】図1は本発明の一実施例の構成を示す俯瞰
図である。レーザ光5の光軸7上に置かれた矩形スリッ
ト1の開口の大きさは、レーザ光のビーム径の半分程度
とする。矩形スリットの通過後に発生する回折光6は、
4分割ディテクタ2で受光され、左右及び上下の受光素
子からの検出信号の差信号を使用して、左右方向及び上
下方向の光軸の偏差を判断する。
FIG. 1 is a bird's eye view showing the configuration of an embodiment of the present invention. The size of the opening of the rectangular slit 1 placed on the optical axis 7 of the laser light 5 is about half the beam diameter of the laser light. The diffracted light 6 generated after passing through the rectangular slit is
The 4-divided detector 2 receives light, and the difference between the detection signals from the left and right light receiving elements is used to determine the deviation of the optical axis in the left and right direction and the up and down direction.

【0011】図中には左右方向の信号処理系しか示して
いないが上下方向についても同様の処理を行う。レーザ
光は光軸に対して軸対称なので、レーザ光軸が矩形スリ
ットの中心に一致した場合のみ差信号はゼロとなり、ど
ちらかに偏りのある場合そちら側に発生する回折光の強
度が強くなりバランスがくずれ差信号が発生する。4分
割ディテクタ中心に当る0次光は遮光板を置きカットす
る。
Although only the signal processing system in the horizontal direction is shown in the figure, the same processing is performed in the vertical direction. Since the laser light is axisymmetric with respect to the optical axis, the difference signal becomes zero only when the laser optical axis coincides with the center of the rectangular slit, and when there is a deviation in either direction, the intensity of the diffracted light generated on that side becomes stronger. An out-of-balance difference signal is generated. The 0th-order light that hits the center of the 4-split detector is cut by placing a light shield plate.

【0012】レーザの波長を0.53μm 、矩形スリッ
トの開口部の幅を0.5mmとすると、回折光の発生する
方向は光軸に対して、1次の場合約0.09°、2次の
場合約0.15°傾いた方向である。矩形スリットから
30cm離れた場所にディテクタを置くと左右・上下の1
次回折光間のディテクタ受光面での距離は約0.94mm
となり、これは十分に分離して検出することができる。
If the wavelength of the laser is 0.53 μm and the width of the opening of the rectangular slit is 0.5 mm, the direction in which the diffracted light is generated is about 0.09 ° in the case of the first order and the second order. In the case of, the direction is inclined by about 0.15 °. If the detector is placed 30 cm away from the rectangular slit, it will be 1
The distance between the second-order diffracted light and the detector light-receiving surface is about 0.94 mm.
, Which can be detected with sufficient separation.

【0013】図2は、本発明の他の実施例にて使用する
ディテクタの様式図である。第一の実施例では4分割デ
ィテクタの各受光素子は単一の受光面で構成されていた
が,本実施例ではディテクタ・アレイを使用する。適当
な信号強度を閾値として設け、この閾値のレベルに達し
ている単位受光素子21の数を比較することで、光軸の
ずれを判断する。
FIG. 2 is a stylized diagram of a detector used in another embodiment of the present invention. In the first embodiment, each light receiving element of the four-divided detector is composed of a single light receiving surface, but in this embodiment, a detector array is used. The deviation of the optical axis is determined by providing an appropriate signal intensity as a threshold value and comparing the number of unit light receiving elements 21 that have reached the level of this threshold value.

【0014】[0014]

【発明の効果】以上説明した様に本発明は、光軸を確認
する目標としての矩形スリットとこれによって生じる回
折光を2分割又は4分割のディテクタで検出し、回折光
の光量バランスを利用して光軸の偏差を測定する方法を
とるため、従来の光軸調整方法に比べて精度良くこれを
行うことができるという効果を有している。
As described above, according to the present invention, the rectangular slit as a target for confirming the optical axis and the diffracted light generated by the rectangular slit are detected by the two-division or four-division detector, and the light quantity balance of the diffracted light is utilized. Since the method of measuring the deviation of the optical axis is adopted, there is an effect that this can be performed more accurately than the conventional optical axis adjusting method.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1実施例の構成を示す俯瞰図であ
る。
FIG. 1 is an overhead view showing a configuration of a first embodiment of the present invention.

【図2】第2実施例にて使用するディテクタの模式図で
ある。
FIG. 2 is a schematic diagram of a detector used in the second embodiment.

【符号の説明】[Explanation of symbols]

1 矩形スリット 2 4分割ディテクタ 6 回折光 1 rectangular slit 2 4 split detector 6 diffracted light

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 光軸を確認すべき目標として配されるス
リットと、該スリット通過後に発生する回折光を受光
し、前記スリット通過後の回折光の左右及び上下のバラ
ンスのくずれに対応した電気信号群を出力する2以上に
分割されたディテクターと、 該ディテクターから出力された電気信号群の差に基づい
て、レーザ光軸の偏芯方向を判断し、回折光の左右及び
上下のバランスが保たれる様に光軸調整を行う調整手段
とを有することを特徴とするレーザ加工装置の光軸調整
方法。
1. A slit arranged as a target whose optical axis is to be confirmed, and a diffracted light generated after passing through the slit are received, and an electric power corresponding to a lateral or vertical imbalance of the diffracted light after passing through the slit is received. The eccentric direction of the laser optical axis is determined based on the difference between the detector that outputs the signal group and the electric signal group that is output from the detector, and the left, right, up, and down balance of the diffracted light is maintained. An optical axis adjusting method for a laser processing apparatus, comprising: an adjusting unit that adjusts the optical axis so as to sag.
JP3299120A 1991-11-14 1991-11-14 Optical axis adjustment method for laser processing equipment Expired - Fee Related JP3003731B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3299120A JP3003731B2 (en) 1991-11-14 1991-11-14 Optical axis adjustment method for laser processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3299120A JP3003731B2 (en) 1991-11-14 1991-11-14 Optical axis adjustment method for laser processing equipment

Publications (2)

Publication Number Publication Date
JPH05138383A true JPH05138383A (en) 1993-06-01
JP3003731B2 JP3003731B2 (en) 2000-01-31

Family

ID=17868380

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3299120A Expired - Fee Related JP3003731B2 (en) 1991-11-14 1991-11-14 Optical axis adjustment method for laser processing equipment

Country Status (1)

Country Link
JP (1) JP3003731B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006289443A (en) * 2005-04-11 2006-10-26 Hikari Physics Kenkyusho:Kk Laser beam machining device
JP2007175744A (en) * 2005-12-28 2007-07-12 Yamazaki Mazak Corp Apparatus for adjusting axis of optical path in laser machine

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006289443A (en) * 2005-04-11 2006-10-26 Hikari Physics Kenkyusho:Kk Laser beam machining device
JP2007175744A (en) * 2005-12-28 2007-07-12 Yamazaki Mazak Corp Apparatus for adjusting axis of optical path in laser machine

Also Published As

Publication number Publication date
JP3003731B2 (en) 2000-01-31

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