JPH05129408A - Wire bonding method and equipment - Google Patents

Wire bonding method and equipment

Info

Publication number
JPH05129408A
JPH05129408A JP3311381A JP31138191A JPH05129408A JP H05129408 A JPH05129408 A JP H05129408A JP 3311381 A JP3311381 A JP 3311381A JP 31138191 A JP31138191 A JP 31138191A JP H05129408 A JPH05129408 A JP H05129408A
Authority
JP
Japan
Prior art keywords
bonding
wire
camera
position coordinates
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3311381A
Other languages
Japanese (ja)
Other versions
JP3404755B2 (en
Inventor
Yuji Komaki
雄二 駒木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Mechatronics Co Ltd
Original Assignee
Toshiba Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Seiki Co Ltd filed Critical Toshiba Seiki Co Ltd
Priority to JP31138191A priority Critical patent/JP3404755B2/en
Publication of JPH05129408A publication Critical patent/JPH05129408A/en
Application granted granted Critical
Publication of JP3404755B2 publication Critical patent/JP3404755B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05554Shape in top view being square
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
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    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
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    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
    • HELECTRICITY
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    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8512Aligning
    • H01L2224/85148Aligning involving movement of a part of the bonding apparatus
    • H01L2224/85169Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
    • H01L2224/8518Translational movements
    • H01L2224/85181Translational movements connecting first on the semiconductor or solid-state body, i.e. on-chip, regular stitch
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    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/859Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector involving monitoring, e.g. feedback loop
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    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909Post-treatment of the connector or wire bonding area
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    • H01L2924/01Chemical elements
    • H01L2924/01019Potassium [K]
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    • H01L2924/01082Lead [Pb]

Abstract

PURPOSE:To inspect at once a true wire loop which is not affected by adverse influence like vibration due to conveyance, by detecting a wire after bonding by using a camera for setting the bonding position coordinates. CONSTITUTION:A picture image wherein a semiconductor chip or leads are sensed is displayed on a monitor surface, and two bonding position coordinates P1, P2 are set. A capillary 4 is moved by controlling an XY driver 22 and a Z driver 24, and a wire 3 is connected between an electrode 1A and a lead 2. After bonding, a control equipment 30 determines the equation y=ax+k of a straight line which passes the two designated coordinate points P1 and P2 by calculation. The amount of curl wherein a wire loop is most bent is obtained by calculation and displayed on the monitor. Since the amount of curl of the wire loop can be inspected by a bonding equipment itself, adverse influence due to vibration during conveyance is eliminated, and true inspection results which are reliable can be obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はワイヤボンディング方法
及び装置に関する。
FIELD OF THE INVENTION The present invention relates to a wire bonding method and apparatus.

【0002】[0002]

【従来の技術】一般に、ワイヤボンディング方法は下記
(1) 〜(4)の如くによりなされる。尚、図4〜6におい
て、1は半導体チップ、1Aは電極、2はリードフレー
ムのリード、3はワイヤ、4はキャピラリである。
2. Description of the Related Art Generally, the wire bonding method is as follows.
This is done as described in (1) to (4). 4 to 6, 1 is a semiconductor chip, 1A is an electrode, 2 is a lead of a lead frame, 3 is a wire, and 4 is a capillary.

【0003】(1) ボンディング装置を用いてワイヤボン
ディングを行なうに当たり、ボンディング装置に対し、
ボンディング位置座標を設定する(覚え込ませる)必要
がある。この設定作業は「ティーチング作業」と呼ば
れ、作業者によってなされる。
(1) When performing wire bonding using a bonding device,
It is necessary to set (remember) the bonding position coordinates. This setting work is called "teaching work" and is performed by the operator.

【0004】ここでボンディング位置座標とは、半導体
チップ1の電極1A上とリードフレームのリード2上と
において、ワイヤ3が接続される点の座標をいう。
Here, the bonding position coordinates mean the coordinates of the point where the wire 3 is connected on the electrode 1A of the semiconductor chip 1 and the lead 2 of the lead frame.

【0005】(2) ボンディング位置座標が設定される
と、ボンディング装置が有する制御部は、電極1Aとそ
れに対応するリード2のボンディング位置座標に基づい
て、それぞれのボンディング位置間におけるキャピラリ
4の移動情報、例えばZストローク(A〜D)、リバー
スレベル(A〜B)、リバース量(B〜C)、下降軌跡
(D〜E)等を、予め設定された演算式等により算出
し、設定する(図4参照)。
(2) When the bonding position coordinates are set, the control unit of the bonding apparatus, based on the bonding position coordinates of the electrode 1A and the lead 2 corresponding thereto, the movement information of the capillary 4 between the respective bonding positions. , For example, the Z stroke (A to D), the reverse level (A to B), the reverse amount (B to C), the descending locus (D to E), etc. are calculated and set by a preset arithmetic expression or the like ( (See FIG. 4).

【0006】(3) 次に、上記のようにして設定されたキ
ャピラリ4の移動情報並びに不図示のカメラにて検出し
た電極1Aやリード2の位置ずれ量に基づいてキャピラ
リ4が移動し、電極1Aとリード2の間にワイヤ3を接
続する(図5参照)。
(3) Next, the capillaries 4 move based on the movement information of the capillaries 4 set as described above and the amount of displacement of the electrodes 1A and the leads 2 detected by a camera (not shown), and the capillaries 4 move. A wire 3 is connected between 1A and the lead 2 (see FIG. 5).

【0007】(4) 上記のようにして設定された条件でキ
ャピラリ4を移動させて実際のボンディングを行なう
と、希望するワイヤループが形成されず、カール現象
(形成されたワイヤループを真上から見たときに、ワイ
ヤループが水平方向に湾曲していること)を生じること
がある。
(4) When the capillary 4 is moved under the conditions set as described above and the actual bonding is performed, a desired wire loop is not formed, and a curl phenomenon (the formed wire loop from directly above is formed). When viewed, the wire loop may be horizontally curved).

【0008】この原因はいろいろ考えられるが、その 1
つとして、例えば図6に示すように、ワイヤ3をリード
2上にボンディングする際、キャピラリ4先端から導出
しているワイヤ3が長すぎる(ワイヤ繰出し量不良)た
めに垂れ下がり、この部分がリード2先端のアール部に
接触し、外方(アール部の接線に対する直交方向)に弾
かれてしまうことがあげられる(ボンディング不良)。
There are various possible causes for this, part 1
As shown in FIG. 6, for example, when the wire 3 is bonded onto the lead 2, the wire 3 led out from the tip of the capillary 4 is too long (a wire feeding amount is defective) and hangs down. It may come in contact with the rounded part at the tip and be flipped outward (a direction orthogonal to the tangent line of the rounded part) (bonding failure).

【0009】そこでワイヤボンディング後に、ワイヤル
ープの形成状態を検査し、ループ形状が不良の場合は、
キャピラリ4のZストローク、下降軌跡等の調整を施
し、ボンディング不良をなくすようにしている。
Therefore, after wire bonding, the formation state of the wire loop is inspected, and if the loop shape is defective,
The Z stroke, the descending locus, etc. of the capillary 4 are adjusted to eliminate defective bonding.

【0010】[0010]

【発明が解決しようとする課題】然るに、従来技術にお
いて、ワイヤループの形成状態を検査するには、ボンデ
ィングの終了したリードフレームを「プロジェクタ」と
呼ばれる検査装置まで搬送し、ここで各ワイヤループの
カール量を測定、検査していた。
However, in the prior art, in order to inspect the formation state of the wire loops, the lead frame after bonding is conveyed to an inspection device called a "projector", and here, each wire loop is inspected. The curl amount was measured and inspected.

【0011】ところが、検査装置まで搬送する間の振動
により、ワイヤループが変形してしまうことがある。そ
のためボンディング時にはワイヤループが正常に形成さ
れたにもかかわらず、検査装置まで搬送後の検査では異
常と判定されてしまい、ボンディング情報の調整に混乱
を来すこととなる(つまり真の判定が行なわれない)。
However, the wire loop may be deformed by the vibration during the transportation to the inspection device. Therefore, even though the wire loop was normally formed during bonding, it is determined to be abnormal in the inspection after the transfer to the inspection device, which causes confusion in the adjustment of the bonding information (that is, true determination is made). Not).

【0012】本発明は、ワイヤループの真の検査をする
ことができるようにすることを目的とする。
The present invention aims at enabling a true inspection of wire loops.

【0013】[0013]

【課題を解決するための手段】請求項1記載の本発明
は、ボンディング作業位置に位置付けられたボンディン
グ対象部品の画像をカメラで取込み、取込んだ画像から
ボンディング位置座標を求め、求めたボンディング位置
座標にワイヤを接続するワイヤボンディング方法におい
て、ワイヤボンディング動作が終了したボンディング対
象部品の画像を前記カメラで再度取込み、この画像から
ボンディングされたワイヤのループ状態を検出するよう
にしたものである。
According to a first aspect of the present invention, an image of a component to be bonded positioned at a bonding work position is captured by a camera, the bonding position coordinates are obtained from the captured image, and the obtained bonding position is obtained. In the wire bonding method of connecting a wire to coordinates, an image of a bonding target component for which the wire bonding operation has been completed is captured again by the camera, and the loop state of the bonded wire is detected from this image.

【0014】請求項2記載の本発明は、ボンディング作
業位置に位置付けられたボンディング対象部品の画像を
カメラで取込み、取り込んだ画像からボンディング位置
座標を求め、求めたボンディング位置座標にワイヤを接
続するワイヤボンディング装置において、前記カメラの
撮像結果から求めた、 2つのボンディング位置座標P1
、P2 を通る直線の式を演算で求める手段と、前記カ
メラの撮像結果から求めた、ボンディングされたワイヤ
のループの最大カール点P3 から上記 2点P1 、P2 を
通る直線に対して下ろした垂線の長さを演算で求める手
段とを有して構成されるようにしたものである。
According to a second aspect of the present invention, an image of a component to be bonded positioned at a bonding work position is captured by a camera, bonding position coordinates are obtained from the captured image, and a wire is connected to the obtained bonding position coordinate. In the bonding device, the two bonding position coordinates P1 obtained from the imaging result of the camera
, A means for obtaining a formula of a straight line passing through P2, and a perpendicular line drawn from the maximum curl point P3 of the loop of the bonded wire obtained from the imaging result of the camera to the straight line passing through the two points P1 and P2. And a means for calculating the length of the.

【0015】[0015]

【作用】ボンディング装置自体によってワイヤのループ
状態を検査できる。即ち、ボンディング装置がボンディ
ング位置座標の設定のために本来的に有しているカメラ
を用い、ボンディングされたワイヤのループ状態を当該
カメラで直ちに取込んで検出できる。従って、ボンディ
ング後の運搬による振動等の悪影響を付与されない真の
ワイヤループを、ボンディング終了後即座に検査でき
る。
The bonding apparatus itself can inspect the loop state of the wire. That is, a camera that the bonding apparatus originally has for setting the bonding position coordinates is used, and the loop state of the bonded wire can be immediately captured and detected by the camera. Therefore, it is possible to inspect a true wire loop which is not adversely affected by vibration after transportation after bonding, immediately after the bonding is completed.

【0016】[0016]

【実施例】図1は本発明の実施に用いられる演算回路の
一例を示すブロック図、図2はカメラのモニタ画面を示
す模式図、図3はワイヤループを示す模式図、図4はキ
ャピラリの移動情報を示す模式図、図5はワイヤボンデ
ィング状態を示す模式図である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a block diagram showing an example of an arithmetic circuit used for implementing the present invention, FIG. 2 is a schematic diagram showing a monitor screen of a camera, FIG. 3 is a schematic diagram showing a wire loop, and FIG. FIG. 5 is a schematic diagram showing movement information, and FIG. 5 is a schematic diagram showing a wire bonding state.

【0017】先ず、本発明が実施されるワイヤボンディ
ング方法の一般的手順について説明する。
First, the general procedure of the wire bonding method for carrying out the present invention will be described.

【0018】(1) ボンディング位置座標のティーチング
(図1、図2参照) ティーチングは、電極1Aとリード2とを画像認識手段
により撮像することにて行なう。即ち撮像手段(カメラ
10)により、半導体チップ1またはリード2を撮像
し、撮像した画像をモニタ11に表示する。このときモ
ニタ11の画面中央には、カメラの中心位置を示し、且
つモニタ画面11Aにおけるポイントを指示するときの
目合わせとなる指示マーク(「レチクル12」と呼ばれ
る)が表示されている(図2参照)。そしてモニタ11
に表示された電極1Aまたはリード2上にレチクル12
を合わせることにて、 2つのボンディング位置座標P1
、P2 の設定を行なう。
(1) Teaching of bonding position coordinates (see FIGS. 1 and 2) Teaching is performed by capturing an image of the electrode 1A and the lead 2 by an image recognition means. That is, the image pickup means (camera 10) images the semiconductor chip 1 or the leads 2 and displays the imaged image on the monitor 11. At this time, in the center of the screen of the monitor 11, an instruction mark (referred to as "reticle 12") is displayed which indicates the center position of the camera and serves as an alignment when pointing a point on the monitor screen 11A (FIG. 2). reference). And monitor 11
On the electrode 1A or the lead 2 displayed on the reticle 12
By aligning the two bonding position coordinates P1
, P2 are set.

【0019】ところで、ボンディング装置が備えるカメ
ラ10は、X−Yテーブル20上に載置されており、そ
して操作盤に設けられたX−Yテーブル手動移動手段
(「チェスマン21」と呼ばれる)を操作することに
て、XYドライバ22を介してX−Y方向に移動させる
ことができるようになっている。
By the way, the camera 10 provided in the bonding apparatus is mounted on the XY table 20, and the XY table manual moving means (called "chessman 21") provided on the operation panel is operated. Therefore, it can be moved in the XY directions via the XY driver 22.

【0020】そこで作業者は、モニタ11に映し出され
た画像を見ながらチェスマン21を操作することにてカ
メラ10を移動させ、レチクル12を電極1A又はリー
ド2上における理想的なボンディング位置に合わせる。
そしてこの位置合わせ後、操作盤のポイント指定ボタン
23を押すことで、ボンディング位置座標が演算制御装
置30のメモリ31に記憶される。
Then, the operator moves the camera 10 by operating the chessman 21 while looking at the image displayed on the monitor 11 to align the reticle 12 with the ideal bonding position on the electrode 1A or the lead 2.
After this alignment, the point designation button 23 on the operation panel is pressed to store the bonding position coordinates in the memory 31 of the arithmetic and control unit 30.

【0021】 (2) キャピラリの移動情報の設定(図4参照) ボンディング位置座標が設定されると、ボンディング装
置が有する制御装置30は、電極1Aとそれに対応する
リード2のボンディング位置座標に基づいて、それぞれ
のボンディング位置間におけるキャピラリ4の移動情
報、例えばZストローク(A〜D)、リバースレベル
(A〜B)、リバース量(B〜C)、下降軌跡(D〜
E)等を、予め設定された演算式等により算出し、設定
する。
(2) Setting of Capillary Movement Information (See FIG. 4) When the bonding position coordinates are set, the control device 30 included in the bonding device determines the bonding position coordinates of the electrode 1A and the lead 2 corresponding thereto. , Movement information of the capillary 4 between the respective bonding positions, for example, Z stroke (A to D), reverse level (A to B), reverse amount (B to C), descending trajectory (D to).
E) and the like are calculated and set by a preset arithmetic expression or the like.

【0022】(3) キャピラリの移動によるワイヤボンデ
ィング(図5参照) 制御装置30は、上記のようにして設定されたキャピラ
リ4の移動情報に基づいて、XYドライバ22、及びZ
ドライバ24を制御することにより、キャピラリ4を移
動し、電極1Aとリード2の間にワイヤ3を接続する。
(3) Wire Bonding by Moving Capillaries (See FIG. 5) The control device 30 controls the XY driver 22 and Z based on the movement information of the capillaries 4 set as described above.
By controlling the driver 24, the capillary 4 is moved to connect the wire 3 between the electrode 1A and the lead 2.

【0023】(4) ワイヤループの検査(図3参照) 制御装置30は、ワイヤボンディング後に、ワイヤルー
プの形成状態を検査し、ループ形状が不良の場合は、キ
ャピラリ4のZストローク、下降軌跡等の調整を施し、
ボンディング不良をなくすようにする。このとき、制御
装置30は、指定された 2つの座標点P1 、P2 ( 1
つの電極上におけるボンディング位置座標P1 と、対応
するリード上のボンディング位置座標P2 )を通る直線
の式を演算で求める手段、指定された第3の座標点P
3 ( 2点P1 、P2 を通る直線に対してワイヤループが
水平方向へ最も湾曲、即ちカールしている点)から、 2
点P1 、P2 を通る直線に対して下ろした垂線の長さ
(カール量)を演算で求める手段とを具備する。
(4) Inspection of wire loop (see FIG. 3) The control device 30 inspects the formation state of the wire loop after wire bonding, and if the loop shape is defective, Z stroke of the capillary 4, descending locus, etc. Adjustment,
Try to eliminate defective bonding. At this time, the controller 30 controls the two designated coordinate points P1, P2 (1
Means for obtaining an equation of a straight line passing through the bonding position coordinate P1 on one electrode and the bonding position coordinate P2 on the corresponding lead, and the designated third coordinate point P
From 3 (the point where the wire loop is most curved in the horizontal direction, that is, the curl with respect to the straight line passing through the two points P1 and P2),
And a means for calculating a length (curl amount) of a perpendicular line drawn from a straight line passing through the points P1 and P2.

【0024】以下、上記制御装置30によるワイヤルー
プの検査手順について、詳述する。先ずワイヤループの
検査を行なうに当たり、対象とするワイヤループのファ
ーストボンディング点である電極1Aの座標P1 を指定
する(尚この座標P1 、及びリード2上の座標P2 は、
予めティーチングされているので、改めて記憶させる必
要はない。)。
The inspection procedure of the wire loop by the control device 30 will be described in detail below. First, when the wire loop is inspected, the coordinate P1 of the electrode 1A which is the first bonding point of the target wire loop is designated (the coordinate P1 and the coordinate P2 on the lead 2 are
Since it is taught in advance, there is no need to store it again. ).

【0025】この指令によりカメラ10が移動し、モニ
タ11上にはその電極1Aが写し出される。このときモ
ニタ画面11Aには、カメラ10によって撮像されたワ
イヤループも写し出されている(実際には画面の面積の
制限からワイヤループの一部が写し出される)。また画
面中央には、レチクル12が表示されている。そこで作
業者は、このモニタ11を見ながらチェスマン21を操
作し、カメラ10を徐々に移動させることにて、ワイヤ
ループを追いかけ、その(水平方向に)最も湾曲してい
る部分、即ちカール量最大部分を探しだす。そして探し
だしたカール量最大部分にカメラ中心、即ちレチクル1
2に合わせ、ポイント指定ボタン23を押す。これに
て、その座標点(P3 )がボンディング装置に記憶され
る。
This command causes the camera 10 to move, and the electrode 1A is projected on the monitor 11. At this time, the wire loop captured by the camera 10 is also displayed on the monitor screen 11A (actually, a part of the wire loop is displayed due to the limitation of the screen area). The reticle 12 is displayed in the center of the screen. Therefore, the operator operates the chessman 21 while looking at the monitor 11 and gradually moves the camera 10 to follow the wire loop, and the most curved portion (in the horizontal direction), that is, the maximum curl amount. Find the part. Then, the center of the camera, that is, the reticle 1 is located in the maximum curl amount that is found.
In accordance with 2, press the point designation button 23. As a result, the coordinate point (P3) is stored in the bonding apparatus.

【0026】この後作業者は、不図示の操作盤の演算指
令ボタンを押すことにより、演算制御装置30はカール
量の演算を開始する。演算は、後述する演算式に従って
行なわれる。そして算出されたカール量は、モニタ11
の所定の領域に表示される。
After this, the operator presses a calculation command button on the operation panel (not shown), and the calculation control device 30 starts calculation of the curl amount. The calculation is performed according to a calculation formula described later. Then, the calculated curl amount is displayed on the monitor 11
Is displayed in a predetermined area.

【0027】作業者は、表示されたカール量を目安にボ
ンディング情報の調整を行なう。ここで、上述のカール
量は、座標点P3 からボンディング位置座標P1 、P2
を通る直線に対して下ろした垂線の長さLであり、下記
(1) 式〜(6) 式により演算される。
The operator adjusts the bonding information based on the curl amount displayed. Here, the above-mentioned curl amount is calculated from the coordinate point P3 to the bonding position coordinates P1 and P2.
It is the length L of the perpendicular drawn from the straight line passing through
It is calculated by equations (1) to (6).

【0028】2つの座標点P1 (a、b)、P2 (c、
d)を通る直線Hの式を
Two coordinate points P1 (a, b), P2 (c,
Formula of straight line H passing through d)

【0029】[0029]

【数1】 とする。このとき、傾きαはP1 、P2 の座標から[Equation 1] And At this time, the inclination α is calculated from the coordinates of P1 and P2.

【0030】[0030]

【数2】 で表わせる。また、x=aのとき、y=bであることか
ら、
[Equation 2] Can be expressed as Also, when x = a, since y = b,

【0031】[0031]

【数3】 従って、(2) 式、(3) 式を(1) 式に代入すると、[Equation 3] Therefore, substituting equations (2) and (3) into equation (1),

【0032】[0032]

【数4】 となり、これは、[Equation 4] And this is

【0033】[0033]

【数5】 と変形できる。そこで座標点P3 (e、f)から直線H
に下ろした垂線の長さLは、次の通りとなる。
[Equation 5] Can be transformed. Then, from the coordinate point P3 (e, f) to the straight line H
The length L of the perpendicular drawn down is as follows.

【0034】[0034]

【数6】 [Equation 6]

【0035】然るに、本実施例によれば、下記〜の
効果がある。 ボンディング装置自体によってワイヤループのカール
量を検査できるようにしたため、従来のように搬送中の
振動が、形成されたワイヤループに悪影響を与えるとい
ったことがなくなり、信頼できる真のワイヤループの検
査結果を得ることができる。
However, according to this embodiment, the following effects (1) to (4) are obtained. Since the curling amount of the wire loop can be inspected by the bonding device itself, the vibration during transportation does not adversely affect the formed wire loop as in the past, and a reliable true wire loop inspection result can be obtained. Obtainable.

【0036】またリードフレームを搬送する必要がな
いので、検査を行なうために従来有した搬送時間を不要
とでき、結果として検査時間を短縮することもできる。
Further, since it is not necessary to carry the lead frame, it is possible to eliminate the carrying time which has been conventionally required for carrying out the inspection, and as a result it is possible to shorten the testing time.

【0037】またボンディング終了後即座に検査を行
なえるため、不良半導体装置の製造を最小限に止めるこ
とができる(1枚のリードフレームには、通常、複数個
単位で半導体チップが載置されているため、ワイヤボン
ディングの際は、1リードフレームあるいは1マガジン
を1単位としてボンディングが行なわれる。このため従
来のように、プロジェクタへ搬送するものにおいては、
1リードフレームあるいは1マガジン分のボンディング
が終了後、1単位ごとにプロジェクタへ搬送されるよう
になっていたため、検査装置にてボンディング状態の不
良が発見されるまでには既に多くの不良半導体装置が製
造されてしまうという欠点があった)。
Further, since the inspection can be carried out immediately after the bonding is completed, the production of defective semiconductor devices can be minimized (in general, a plurality of semiconductor chips are mounted on one lead frame. Therefore, in wire bonding, one lead frame or one magazine is used as one unit for bonding.
After the bonding for one lead frame or one magazine was completed, the units were transported to the projector one by one. Therefore, many defective semiconductor devices have already been detected by the inspection device until a defective bonding state is found. It had the drawback of being manufactured).

【0038】尚、上記実施例においては、第 3の座標点
P3 を作業者の手動操作にて指定したが、画像認識手段
を用いて自動検出するようにしてもよい。この場合カメ
ラによりワイヤループ上の座標点P3 を順に追っていく
とともに、この時同時に座標点P3 から、P1 、P2 を
通る直線に下ろした垂線の長さを算出し、この長さの最
大値をカール量としてモニタに表示するようにすること
もできる。
In the above embodiment, the third coordinate point P3 is designated by the operator's manual operation, but it may be automatically detected by using the image recognition means. In this case, the camera follows the coordinate point P3 on the wire loop in order, and at the same time, the length of the perpendicular line drawn from the coordinate point P3 to the straight line passing through P1 and P2 is calculated, and the maximum value of this length is curled. It can also be displayed on the monitor as a quantity.

【0039】更に上記実施例において、ティーチング作
業時にボンディング位置座標P1 、P2 とともに基準パ
ターンを設定し、ボンディング時にボンディング対象部
品の画像をカメラにて取り込み、取り込んだ画像を基準
パターンと比較することによりボンディング位置座標の
補正を行ない、補正後のボンディング位置座標をP1、
P2 と置き換えても良い。
Further, in the above embodiment, the reference pattern is set together with the bonding position coordinates P1 and P2 during the teaching operation, the image of the bonding target component is captured by the camera at the time of bonding, and the captured image is compared with the reference pattern. Correct the position coordinates, and set the corrected bonding position coordinates to P1,
It may be replaced with P2.

【0040】[0040]

【発明の効果】以上のように本発明によれば、ワイヤル
ープの真の検査をすることができる。
As described above, according to the present invention, the true inspection of the wire loop can be performed.

【図面の簡単な説明】[Brief description of drawings]

【図1】図1は本発明の実施に用いられる演算回路の一
例を示すブロック図である。
FIG. 1 is a block diagram showing an example of an arithmetic circuit used for implementing the present invention.

【図2】図2はカメラのモニタ画面を示す模式図であ
る。
FIG. 2 is a schematic diagram showing a monitor screen of a camera.

【図3】図3はワイヤループを示す模式図である。FIG. 3 is a schematic diagram showing a wire loop.

【図4】図4はキャピラリの移動情報を示す模式図であ
る。
FIG. 4 is a schematic diagram showing capillary movement information.

【図5】図5はワイヤボンディング状態を示す模式図で
ある。
FIG. 5 is a schematic diagram showing a wire bonding state.

【図6】図6はカールの発生原因の一例を示す模式図で
ある。
FIG. 6 is a schematic diagram showing an example of a cause of curl.

【符号の説明】[Explanation of symbols]

1A 電極(ボンディング対象部品) 2 リード(ボンディング対象部品) 3 ワイヤ 10 カメラ 30 演算制御装置 1A electrode (bonding target component) 2 lead (bonding target component) 3 wire 10 camera 30 arithmetic and control unit

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 ボンディング作業位置に位置付けられた
ボンディング対象部品の画像をカメラで取込み、取込ん
だ画像からボンディング位置座標を求め、求めたボンデ
ィング位置座標にワイヤを接続するワイヤボンディング
方法において、ワイヤボンディング動作が終了したボン
ディング対象部品の画像を前記カメラで再度取込み、こ
の画像からボンディングされたワイヤのループ状態を検
出することを特徴とするワイヤボンディング方法。
1. A wire bonding method in which an image of a bonding target component positioned at a bonding work position is captured by a camera, bonding position coordinates are obtained from the captured image, and a wire is connected to the obtained bonding position coordinates. A wire bonding method, wherein an image of a bonding target component whose operation has been completed is captured again by the camera, and the loop state of the bonded wire is detected from this image.
【請求項2】 ボンディング作業位置に位置付けられた
ボンディング対象部品の画像をカメラで取込み、取り込
んだ画像からボンディング位置座標を求め、求めたボン
ディング位置座標にワイヤを接続するワイヤボンディン
グ装置において、前記カメラの撮像結果から求めた、 2
つのボンディング位置座標P1 、P2を通る直線の式を
演算で求める手段と、前記カメラの撮像結果から求め
た、ボンディングされたワイヤのループの最大カール点
P3 から上記 2点P1 、P2 を通る直線に対して下ろし
た垂線の長さを演算で求める手段とを有して構成される
ことを特徴とするワイヤボンディング装置。
2. A wire bonding apparatus for capturing an image of a part to be bonded positioned at a bonding work position with a camera, obtaining bonding position coordinates from the captured image, and connecting a wire to the obtained bonding position coordinates, wherein Obtained from imaging results, 2
A means for calculating a formula of a straight line passing through one bonding position coordinate P1 and P2, and a straight line passing through the above two points P1 and P2 from the maximum curl point P3 of the loop of the bonded wire obtained from the imaging result of the camera. A wire bonding apparatus comprising: a means for calculating the length of a perpendicular line that is lowered by calculation.
JP31138191A 1991-10-31 1991-10-31 Wire bonding equipment Expired - Fee Related JP3404755B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31138191A JP3404755B2 (en) 1991-10-31 1991-10-31 Wire bonding equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31138191A JP3404755B2 (en) 1991-10-31 1991-10-31 Wire bonding equipment

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2002077305A Division JP3476810B2 (en) 2002-02-12 2002-02-12 Wire bonding equipment

Publications (2)

Publication Number Publication Date
JPH05129408A true JPH05129408A (en) 1993-05-25
JP3404755B2 JP3404755B2 (en) 2003-05-12

Family

ID=18016497

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31138191A Expired - Fee Related JP3404755B2 (en) 1991-10-31 1991-10-31 Wire bonding equipment

Country Status (1)

Country Link
JP (1) JP3404755B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19634857C2 (en) * 1995-08-31 2002-01-31 Hitachi Ltd Process and apparatus for the production of synthesis gas and use of the generated gas mixture
KR100625939B1 (en) * 2005-07-28 2006-09-18 앰코 테크놀로지 코리아 주식회사 Method for detecting wire usage

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3476810B2 (en) 2002-02-12 2003-12-10 芝浦メカトロニクス株式会社 Wire bonding equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19634857C2 (en) * 1995-08-31 2002-01-31 Hitachi Ltd Process and apparatus for the production of synthesis gas and use of the generated gas mixture
KR100625939B1 (en) * 2005-07-28 2006-09-18 앰코 테크놀로지 코리아 주식회사 Method for detecting wire usage

Also Published As

Publication number Publication date
JP3404755B2 (en) 2003-05-12

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