JPH05126529A - Position detection method - Google Patents
Position detection methodInfo
- Publication number
- JPH05126529A JPH05126529A JP3289700A JP28970091A JPH05126529A JP H05126529 A JPH05126529 A JP H05126529A JP 3289700 A JP3289700 A JP 3289700A JP 28970091 A JP28970091 A JP 28970091A JP H05126529 A JPH05126529 A JP H05126529A
- Authority
- JP
- Japan
- Prior art keywords
- recognition mark
- wiring board
- mark
- semiconductor element
- camera
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Abstract
Description
【産業上の利用分野】本発明は、半導体素子を配線基板
上に実装する際等に用いられる位置検出方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a position detecting method used when a semiconductor element is mounted on a wiring board.
【従来の技術】従来、配線基板上に半導体素子などを位
置決めし、実装する場合、配線基板を認識するアンダー
カメラと半導体素子を認識するトップカメラを用いる。
また、配線基板,半導体素子を認識する場合、配線基
板、半導体素子には、必ず認識マークを付与する必要が
ある。従来の認識マークは、図6aに示す三角形ように
主として対称図形を用いており、その図形をテレビカメ
ラで撮影して画像を取り込み、あらかじめコンピュータ
内に入れておいた同一図形とのパターンマッチングをお
こなっている。2. Description of the Related Art Conventionally, when a semiconductor element or the like is positioned and mounted on a wiring board, an under camera for recognizing the wiring board and a top camera for recognizing the semiconductor element are used.
Further, when recognizing the wiring board and the semiconductor element, it is necessary to give the recognition mark to the wiring board and the semiconductor element without fail. The conventional recognition mark mainly uses a symmetrical figure like a triangle shown in FIG. 6a. The figure is photographed by a TV camera to capture an image, and pattern matching is performed with the same figure previously stored in the computer. ing.
【発明が解決しようとする課題】パターンマッチングと
いっても、様々なものがあるが、上記従来の技術におい
ては、認識マークの重心を求めたり、認識マークのエッ
ジを検出したりしているが、現状のようにサブμmのオ
ーダで精度が必要になってきた場合、どうしても正確な
位置決めができなくなる。また、図6bに示すようにパ
ターンマッチングの一手法である相関においても、マッ
チング度合を示すピーク値はどうしても低いものとな
る。さらに、従来の技術においては、照度や光の照明形
態にも影響を受け、ノイズに弱いという課題を有してい
た。そこで本発明は、テレビカメラから取り込んだ認識
マーク、画像データをコンピュータ内部に記憶された基
準となる認識マークとのパターンマッチング(相関)を
とることにより、高精度の位置決めができる位置検出方
法を提供するものである。There are various kinds of pattern matching, but in the above-mentioned conventional technique, the center of gravity of the recognition mark is obtained and the edge of the recognition mark is detected. However, when accuracy is required on the order of sub-μm as in the current situation, accurate positioning cannot be achieved. Further, as shown in FIG. 6b, even in the case of correlation, which is one method of pattern matching, the peak value indicating the matching degree is inevitably low. Further, the conventional technique has a problem that it is susceptible to noise due to the influence of illuminance and illumination form of light. Therefore, the present invention provides a position detection method capable of highly accurate positioning by performing pattern matching (correlation) between a recognition mark captured from a television camera and image data and a recognition mark serving as a reference stored in a computer. To do.
【課題を解決するための手段】本発明は上記目的を達成
するため、対象物の意置の箇所に、信号であるM系列を
2次元に配置した認識マークを設け、この認識マークを
テレビカメラで撮影し認識した画像と、あらかじめ記憶
された前記認識マークと同一基準のマークとをマッチン
グ手法を用いて相関をとり、その結果に基づいて前記対
象物の位置を検出するものである。In order to achieve the above-mentioned object, the present invention provides a recognition mark in which an M-sequence, which is a signal, is two-dimensionally arranged at an intended position of an object, and the recognition mark is provided by a television camera. The image photographed and recognized in (1) and the previously stored recognition mark and the same reference mark are correlated using a matching method, and the position of the target object is detected based on the result.
【作用】上記位置検出方法において、M系列という信号
を使った新しい認識ワークを用いることにより、パター
ンマッチング(相関)を行った場合に最も位置が合った
場所で鋭いピークを示すという特徴を生かして、サブμ
mオーダの位置決めが行える。In the above-mentioned position detecting method, by utilizing a new recognition work using a signal of M series, the characteristic that a sharp peak is shown at the most aligned position when pattern matching (correlation) is performed is utilized. , Sub μ
Positioning on the order of m is possible.
【実施例】以下本発明の一実施例について図面を参照し
ながら説明する。図1aはM系列で(01011110
0010011)を2次元配列に直したものであり、実
際に使用する場合には1を黒,0を白に置き換える。ま
た図1bは図1aに示した信号M系列を2次元に配列し
たもの、図1cは実際に使用する認識マークである。図
2a,bは配線基板及び半導体素子に図1cに示す認識
マークを付与した例であり、図2aにおいて、21は配
線基板,22は配線,23は電極,24は認識マーク、
また図2bにおいて25は半導体素子,26は電極,2
7は認識マークである。図3は本発明の位置検出方法を
適用した設備の外観図を示す。図において、31はXY
ロボット,32は半導体素子を吸着するノズルヘッド,
33は配線基板を認識するためのテレビカメラ(トップ
カメラ),34は半導体素子を認識するためのテレビカ
メラ(アンダーカメラ),35は搬送系,36は配線基
板,37は半導体素子,38はパーツカセットである。
次に、上記設備の動作を説明する。パーツカセット38
に入った半導体素子37を吸着ノズルヘッド32が取り
に行き、その後、アンダーカメラ34で認識マークが付
与された半導体素子37の認識マークを撮影する。撮影
されたマークの認識画像を取り込んだ後あらかじめコン
ピュータ内に記憶された正規の認識マークとパターンマ
ッチング(相関)を行い、図4に示す様な最も高いピー
ク値を求める。一方搬送系35により、認識マークが付
与された配線基板36がメカ的に規正される。その後、
トップカメラ3で配線基板を撮影する。撮影されたマー
クの認識画像を取り込んだ後、あらかじめコンピュータ
内に記憶された正規の認識マークとのバターンマッチン
グ(相関)を行い、図4に示す最も高いピーク値を求め
る。次に、上記方法により検出した半導体素子37と配
線基板38の位置情報に基づき、図5に示すようにコン
ピュータ51より配線基板36を載置した搬送系35
(X−Yテーブル)に補正値を伝送して位置補正を行な
い、その後、半導体素子37と配線基板36との接合を
行う。なお、図5において52はカメラ33で撮像した
画像及びコンピュータで認識した画像データを表示する
テレビモニターである。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1a shows the M sequence (0101110
0010011) is converted into a two-dimensional array. When actually used, 1 is replaced with black and 0 is replaced with white. Further, FIG. 1b is a two-dimensional array of the signal M series shown in FIG. 1a, and FIG. 1c is an actually used recognition mark. 2a and 2b are examples in which the recognition mark shown in FIG. 1c is added to the wiring board and the semiconductor element. In FIG. 2a, 21 is a wiring board, 22 is wiring, 23 is an electrode, 24 is a recognition mark,
In FIG. 2b, 25 is a semiconductor element, 26 is an electrode, 2
Reference numeral 7 is a recognition mark. FIG. 3 shows an external view of equipment to which the position detecting method of the present invention is applied. In the figure, 31 is XY
A robot, 32 is a nozzle head for adsorbing semiconductor elements,
33 is a TV camera (top camera) for recognizing the wiring board, 34 is a TV camera (under camera) for recognizing the semiconductor element, 35 is a transport system, 36 is a wiring board, 37 is a semiconductor element, and 38 is parts It is a cassette.
Next, the operation of the above equipment will be described. Parts cassette 38
The suction nozzle head 32 picks up the semiconductor element 37 that has entered, and then the under camera 34 photographs the recognition mark of the semiconductor element 37 to which the recognition mark is given. After capturing the recognized image of the photographed mark, pattern matching (correlation) is performed with the regular recognition mark stored in advance in the computer to obtain the highest peak value as shown in FIG. On the other hand, the transport system 35 mechanically regulates the wiring substrate 36 having the recognition mark. afterwards,
The wiring board is photographed by the top camera 3. After capturing the recognized image of the photographed mark, pattern matching (correlation) with the regular recognition mark stored in advance in the computer is performed to obtain the highest peak value shown in FIG. Next, based on the positional information of the semiconductor element 37 and the wiring board 38 detected by the above method, as shown in FIG.
The correction value is transmitted to the (XY table) to correct the position, and then the semiconductor element 37 and the wiring board 36 are joined. In FIG. 5, reference numeral 52 is a television monitor that displays the image captured by the camera 33 and the image data recognized by the computer.
【発明の効果】以上のように本発明では、M系列という
信号を使った新しい認識マークを使うことにより、従来
の問題であった光の照度や光の認識マークへの入射角に
よる影響を除き、またパターンマッチング(相関)を行
った場合に最も位置が合った場所で鋭いピークを示すと
いった特徴を活かし、従来まで不可能であったサブμm
オーダーの位置決めが実現できる。As described above, according to the present invention, by using a new recognition mark using a signal of M series, the influence of the illuminance of light and the incident angle of the light on the recognition mark, which have been problems in the past, can be eliminated. Moreover, by utilizing the feature that a sharp peak appears at the most aligned position when pattern matching (correlation) is performed, it has been impossible to achieve sub-μm until now.
Order positioning can be realized.
【図1】本発明の位置検出方法に用いる認識マークの説
明図FIG. 1 is an explanatory diagram of a recognition mark used in a position detection method of the present invention.
【図2】認識マークを付与した配線基板及び半導体素子
の一例を示す図FIG. 2 is a diagram showing an example of a wiring board and a semiconductor element provided with a recognition mark.
【図3】本発明の位置検出方法を適用した設備の外観図FIG. 3 is an external view of equipment to which the position detection method of the present invention is applied.
【図4】パターンマッチングにおける相関のピークの説
明図FIG. 4 is an explanatory diagram of correlation peaks in pattern matching.
【図5】配線基板の位置補正の説明図FIG. 5 is an explanatory diagram of the position correction of the wiring board.
【図6】従来の位置検出方法の説明図FIG. 6 is an explanatory diagram of a conventional position detection method.
32 ノズルヘッド 33,34 テレビカメラ 36 配線基板 37 半導体素子 32 Nozzle head 33, 34 TV camera 36 Wiring board 37 Semiconductor element
Claims (1)
列を2次元に配置した認識マークを設け、この認識マー
クをテレビカメラで撮影し認識した画像と、あらかじめ
記憶された前記認識マークと同一基準のマークとをマッ
チング手法を用いて相関をとり、その結果に基づいて前
記対象物の位置を検出する位置検出方法。1. A recognition mark in which an M-sequence which is a signal is two-dimensionally arranged is provided at a position of an object, an image obtained by photographing the recognition mark with a television camera and the recognition mark and the recognition mark stored in advance. And a mark of the same reference are correlated using a matching method, and the position of the object is detected based on the correlation.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3289700A JPH05126529A (en) | 1991-11-06 | 1991-11-06 | Position detection method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3289700A JPH05126529A (en) | 1991-11-06 | 1991-11-06 | Position detection method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05126529A true JPH05126529A (en) | 1993-05-21 |
Family
ID=17746619
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3289700A Pending JPH05126529A (en) | 1991-11-06 | 1991-11-06 | Position detection method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05126529A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109945779A (en) * | 2017-12-21 | 2019-06-28 | 汉辰科技股份有限公司 | Correction system and correlation method with an at least video camera |
-
1991
- 1991-11-06 JP JP3289700A patent/JPH05126529A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109945779A (en) * | 2017-12-21 | 2019-06-28 | 汉辰科技股份有限公司 | Correction system and correlation method with an at least video camera |
CN109945779B (en) * | 2017-12-21 | 2023-09-05 | 汉辰科技股份有限公司 | Correction system with at least one camera and corresponding method |
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