JPH05109684A - Semiconductor substrate immersion treatment system - Google Patents
Semiconductor substrate immersion treatment systemInfo
- Publication number
- JPH05109684A JPH05109684A JP26950391A JP26950391A JPH05109684A JP H05109684 A JPH05109684 A JP H05109684A JP 26950391 A JP26950391 A JP 26950391A JP 26950391 A JP26950391 A JP 26950391A JP H05109684 A JPH05109684 A JP H05109684A
- Authority
- JP
- Japan
- Prior art keywords
- tank
- semiconductor substrate
- carrier
- water washing
- chemical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体製造工程におけ
る薬液浸漬処理工程に使用される装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus used in a chemical immersion treatment process in a semiconductor manufacturing process.
【0002】[0002]
【従来の技術】従来、この種の半導体基板浸漬処理装置
は、図4に示すように、複数の薬液槽11及び水洗槽1
2と、一つの乾燥部13とを水平に一直線上に配置して
いる。2. Description of the Related Art Conventionally, as shown in FIG. 4, a semiconductor substrate dipping treatment apparatus of this type has a plurality of chemical baths 11 and a washing bath 1.
2 and one drying unit 13 are horizontally arranged on a straight line.
【0003】複数の半導体基板(以下、ウェハーとい
う)を収納したキャリア7をローダー部にセットし、搬
送ロボット10によりキャリア7をチャックし、各モー
ドに従い、順次浸漬処理を行い、乾燥部13を経てアン
ローダー部にキャリア7を搬送し、ウェハーの処理を行
っていた。A carrier 7 accommodating a plurality of semiconductor substrates (hereinafter referred to as wafers) is set in a loader section, the carrier 7 is chucked by a transfer robot 10, and a dipping process is sequentially performed according to each mode. The carrier 7 was transported to the unloader section to process the wafer.
【0004】[0004]
【発明が解決しようとする課題】従来の装置では、薬液
槽と水洗槽及び乾燥部を水平に一直線上に配置している
ため、複数の薬液を必要とする工程の装置は、装置サイ
ズが大きくなり、レイアウト上、問題となっていた。In the conventional apparatus, the chemical solution tank, the washing tank, and the drying section are arranged horizontally in a straight line, so that the apparatus for a process requiring a plurality of chemical solutions has a large apparatus size. It was a problem in layout.
【0005】本発明の目的は、装置サイズをコンパクト
にした半導体基板浸漬装置を提供することにある。An object of the present invention is to provide a semiconductor substrate dipping device having a compact device size.
【0006】[0006]
【課題を解決するための手段】前記目的を達成するた
め、本発明に係る半導体基板浸漬装置においては、最外
槽と、中間槽と、薬液処理槽と、水洗部とを有し、半導
体基板を浸漬処理する装置であって、最外槽は、中間
槽,薬液処理槽,水洗部を一体に収容したものであり、
中間槽は、内部に薬液処理槽を収納し、かつ槽の開口を
開閉する蓋を有するものであり、薬液処理槽は、中間槽
の蓋が開いた状態で半導体基板を受け入れ、該基板の処
理を行うものであり、水洗部は、薬液処理槽から引き上
げられた半導体基板の水洗を行うものである。In order to achieve the above object, a semiconductor substrate dipping apparatus according to the present invention has an outermost tank, an intermediate tank, a chemical treatment tank, and a water washing section. Is an apparatus for dipping treatment, in which the outermost tank integrally houses an intermediate tank, a chemical solution processing tank, and a water washing section,
The intermediate tank has a lid for accommodating the chemical treatment tank therein and for opening and closing the opening of the tank. The chemical treatment tank receives the semiconductor substrate with the lid of the intermediate tank opened and treats the substrate. The water washing section is for washing the semiconductor substrate pulled up from the chemical treatment tank with water.
【0007】また、前記最外槽は、水洗部で水洗された
半導体基板を乾燥する乾燥部を有するものである。Further, the outermost tank has a drying section for drying the semiconductor substrate washed in the water washing section.
【0008】また、前記半導体基板浸漬装置を1ユニッ
トとし、複数の該ユニットを連結し、複数の薬液処理を
1台の設備で行うようにしたものである。Further, the semiconductor substrate dipping device is set as one unit, and a plurality of the units are connected so that a plurality of chemical liquid treatments can be performed by a single facility.
【0009】[0009]
【作用】浸漬処理を行う機構と、水洗を行う機構とを一
体に組み込んだ構造として構成してある。The function of the immersion treatment and the mechanism of washing with water are integrated into one structure.
【0010】[0010]
【実施例】以下、本発明の実施例を図により説明する。Embodiments of the present invention will be described below with reference to the drawings.
【0011】(実施例1)図1は、本発明の実施例1を
示す断面図である。(Embodiment 1) FIG. 1 is a sectional view showing Embodiment 1 of the present invention.
【0012】図1において、最外槽4内に中間層2が設
置され、中間層2内に薬液処理槽1が設置されている。In FIG. 1, the intermediate layer 2 is installed in the outermost tank 4, and the chemical treatment tank 1 is installed in the intermediate layer 2.
【0013】そして、中間層2には、中間層2の上部開
口を開閉する蓋3が取付けられている。A lid 3 for opening and closing the upper opening of the intermediate layer 2 is attached to the intermediate layer 2.
【0014】また、最外槽4の内側壁には、中間層2の
情報に搬入したキャリア7内の半導体基板(ウェハー)
6の水洗を行う複数の水洗ノズル5が設けられている。Further, on the inner side wall of the outermost tank 4, a semiconductor substrate (wafer) in the carrier 7 carried in the information of the intermediate layer 2 is loaded.
A plurality of water washing nozzles 5 for performing water washing 6 are provided.
【0015】次に動作について説明する。Next, the operation will be described.
【0016】まず、蓋3を開き、複数のウェハー6が収
納されたキャリア7をチャック8で保持し、薬液処理槽
1内に移動させる。所定時間、浸漬処理を行い、キャリ
ア7を上方に引き上げる。First, the lid 3 is opened, the carrier 7 accommodating a plurality of wafers 6 is held by the chuck 8 and moved into the chemical liquid processing tank 1. Immersion treatment is performed for a predetermined time, and the carrier 7 is pulled up.
【0017】次に、蓋3を閉じ、水洗ノズル5より純水
をキャリア7に放水し、水洗を行う。その後、図示して
ない乾燥部にキャリア7は搬送される。Next, the lid 3 is closed, and pure water is discharged from the water washing nozzle 5 onto the carrier 7 to wash it with water. After that, the carrier 7 is conveyed to a drying unit (not shown).
【0018】(実施例2)図2は、本発明の実施例2を
示す断面図である。(Embodiment 2) FIG. 2 is a sectional view showing Embodiment 2 of the present invention.
【0019】本実施例では、最外槽4の内側壁に複数の
N2ノズルを追加し、水洗後のウェハー6に加熱された
N2を吹き付け、乾燥させる。In this embodiment, a plurality of N 2 nozzles are added to the inner wall of the outermost tank 4, and the heated N 2 is sprayed onto the wafer 6 after washing with water to dry it.
【0020】本実施例では、乾燥機能を備えたことによ
り、装置サイズをより小さくする効果がある。In this embodiment, since the drying function is provided, the size of the apparatus can be further reduced.
【0021】図3においては、実施例2に示す構造のも
のを1つのユニットUとし、このユニットUを複数個接
続して配列したものである。In FIG. 3, the structure shown in the second embodiment is regarded as one unit U, and a plurality of the units U are connected and arranged.
【0022】本実施例によれば、複数の薬液処理が可能
となり、かつ、装置サイズもコンパクトになるという効
果がある。According to the present embodiment, it is possible to process a plurality of chemicals, and the size of the apparatus becomes compact.
【0023】[0023]
【発明の効果】以上説明したように本発明は、薬液処理
槽を収容した中間槽と、中間槽の上面を開閉する蓋と、
中間槽の上部に水洗,乾燥部とを備えたことにより、装
置サイズをコンパクトにできるという効果を有する。As described above, according to the present invention, an intermediate tank containing a chemical treatment tank, a lid for opening and closing the upper surface of the intermediate tank,
By providing the upper part of the intermediate tank with the water washing and drying part, there is an effect that the device size can be made compact.
【図1】本発明の実施例1を示す断面図である。FIG. 1 is a cross-sectional view showing a first embodiment of the present invention.
【図2】本発明の実施例2を示す断面図である。FIG. 2 is a sectional view showing a second embodiment of the present invention.
【図3】本発明の実施例2のユニットを複数個接続した
装置を示す平面図である。FIG. 3 is a plan view showing an apparatus in which a plurality of units according to the second embodiment of the present invention are connected.
【図4】従来の装置を示す平面図である。FIG. 4 is a plan view showing a conventional device.
1 薬液処理槽 2 中間槽 3 蓋 4 最外槽 5 水洗ノズル 6 半導体基板(ウェハー) 7 キャリア 8 チャック 9 N2ノズル 10 搬送ロボット 11 薬液槽 12 水洗槽 13 乾燥部1 chemical treatment tank 2 intermediate tank 3 lid 4 outermost tank 5 water washing nozzle 6 semiconductor substrate (wafer) 7 carrier 8 chuck 9 N 2 nozzle 10 transfer robot 11 chemical liquid tank 12 water washing tank 13 drying section
Claims (3)
洗部とを有し、半導体基板を浸漬処理する装置であっ
て、 最外槽は、中間槽,薬液処理槽,水洗部を一体に収容し
たものであり、 中間槽は、内部に薬液処理槽を収納し、かつ槽の開口を
開閉する蓋を有するものであり、 薬液処理槽は、中間槽の蓋が開いた状態で半導体基板を
受け入れ、該基板の処理を行うものであり、 水洗部は、薬液処理槽から引き上げられた半導体基板の
水洗を行うものであることを特徴とする半導体基板浸漬
処理装置。1. An apparatus for dipping a semiconductor substrate, comprising an outermost tank, an intermediate tank, a chemical treatment tank, and a water washing section, wherein the outermost tank is an intermediate tank, a chemical treatment tank, and a water washing tank. The intermediate tank contains the chemical solution processing tank inside and has a lid that opens and closes the opening of the tank. The chemical solution processing tank is in a state in which the lid of the intermediate tank is open. The semiconductor substrate dipping treatment apparatus is characterized in that the semiconductor substrate is received by and treated with the semiconductor substrate, and the water washing section is for washing the semiconductor substrate withdrawn from the chemical treatment tank with water.
置であって、 前記最外槽は、水洗部で水洗された半導体基板を乾燥す
る乾燥部を有することを特徴とする半導体基板浸漬処理
装置。2. The semiconductor substrate dipping apparatus according to claim 1, wherein the outermost tank has a drying unit for drying the semiconductor substrate washed with the water washing unit. apparatus.
板浸漬装置を1ユニットとし、 複数の該ユニットを連結し、複数の薬液処理を1台の設
備で行うようにしたことを特徴とする半導体基板浸漬処
理装置。3. The semiconductor substrate dipping device according to claim 1 or 2 is defined as one unit, a plurality of the units are connected, and a plurality of chemical liquid treatments are performed by a single facility. Semiconductor substrate immersion treatment equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3269503A JP3003332B2 (en) | 1991-10-17 | 1991-10-17 | Semiconductor substrate immersion processing equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3269503A JP3003332B2 (en) | 1991-10-17 | 1991-10-17 | Semiconductor substrate immersion processing equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH05109684A true JPH05109684A (en) | 1993-04-30 |
JP3003332B2 JP3003332B2 (en) | 2000-01-24 |
Family
ID=17473334
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3269503A Expired - Lifetime JP3003332B2 (en) | 1991-10-17 | 1991-10-17 | Semiconductor substrate immersion processing equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3003332B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10321580A (en) * | 1997-05-15 | 1998-12-04 | Tokyo Electron Ltd | Substrate cleaning unit and substrate cleaning system |
WO2022009402A1 (en) * | 2020-07-09 | 2022-01-13 | 東邦化成株式会社 | Substrate processing apparatus |
-
1991
- 1991-10-17 JP JP3269503A patent/JP3003332B2/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10321580A (en) * | 1997-05-15 | 1998-12-04 | Tokyo Electron Ltd | Substrate cleaning unit and substrate cleaning system |
WO2022009402A1 (en) * | 2020-07-09 | 2022-01-13 | 東邦化成株式会社 | Substrate processing apparatus |
Also Published As
Publication number | Publication date |
---|---|
JP3003332B2 (en) | 2000-01-24 |
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