JPS6085529A - Treater for chemical for semiconductor wafer - Google Patents
Treater for chemical for semiconductor waferInfo
- Publication number
- JPS6085529A JPS6085529A JP19553383A JP19553383A JPS6085529A JP S6085529 A JPS6085529 A JP S6085529A JP 19553383 A JP19553383 A JP 19553383A JP 19553383 A JP19553383 A JP 19553383A JP S6085529 A JPS6085529 A JP S6085529A
- Authority
- JP
- Japan
- Prior art keywords
- chemical
- tank
- wafer
- wafers
- robot arm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
- H01L21/3046—Mechanical treatment, e.g. grinding, polishing, cutting using blasting, e.g. sand-blasting
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
この発明は半導体ウェーッへのエツチング処理などの薬
液処理後に水洗処理を行う半導体ウェーッ1薬品処理装
置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a semiconductor wafer chemical treatment apparatus that performs water washing treatment after chemical treatment such as etching treatment on a semiconductor wafer.
第1図は従来の半導体ウェー71薬品処理装置の一例の
主要構成要素を示す斜視図である。FIG. 1 is a perspective view showing the main components of an example of a conventional semiconductor wafer 71 chemical processing apparatus.
図において、(1)はエツチング処理力どの薬液処理が
施される半導体ウェーッ・(以下「被処理ウェーハ」と
呼ぶ)(至)を内部釦収容するカセツ)、(2)はカセ
ット(1)を保持して前後・左右・上下に搬送可能な2
本のロボットアーム、(3)は内部に被処理ウェーハ(
至)を処理するエツチング液などの薬液(4)かたくわ
えられた薬液処理槽、(5)は薬液処理槽(3)に併設
され薬液処理後の被処理ウェーッ・−を水洗する水(6
)かたくわえられた水洗処理槽である。In the figure, (1) is a cassette that accommodates semiconductor wafers (hereinafter referred to as "wafers to be processed") to be subjected to chemical processing of etching processing power, and (2) is a cassette that houses cassettes (1). Can be held and transported back and forth, left and right, and up and down 2
The robot arm (3) has a wafer to be processed (
A chemical treatment tank (4) containing a chemical solution such as an etching solution (5) is attached to the chemical treatment tank (3) and is a water tank (6) for washing the wafer to be processed after the chemical treatment.
) It is a fixed water washing treatment tank.
次に、この従来例の作用について、被処理ウエ−ハ(至
)にエツチング処理を施す場合につbて説明する。Next, the operation of this conventional example will be explained in the case where the etching process is performed on a wafer to be processed.
この場合には、まず、薬液処理槽(3)内にエツチング
液を入れる。そして、被処理ウェーハ■が収容されたカ
セット(1)を、ロボットアーム(2)の搬送によって
、薬液処理槽(3)内のエツチング液に所定時間浸して
被処理ウェーハ句のエツチング処理を行う。しかるのち
、再度ロボットアーム(2)の搬送によって、このエツ
チング処理が施された被処理ウェーハ(ホ)が収容され
たカセット(1)を薬液処理槽(3)内から空気中に取
り出して水洗処理槽(5)内へ移し、被処理ウェーハ(
至)の水洗処理を行う。In this case, first, an etching solution is put into the chemical treatment tank (3). Then, the cassette (1) containing the wafers to be processed (1) is immersed in the etching solution in the chemical treatment tank (3) for a predetermined period of time by being transported by the robot arm (2), thereby etching the wafers to be processed. Thereafter, the cassette (1) containing the etched wafer (E) is taken out into the air from the chemical treatment tank (3) by the robot arm (2) again and washed with water. Transfer to the tank (5) and place the wafer to be processed (
(to)).
ところが、この従来例の装置では、ロボットアーム(2
)がエツチング処理が施された被処理ウェーハ(至)を
収容したカセット(1)を薬液処理槽(3)内から空気
中に敗り出して水洗処理槽(5)内へ移し終えるまでに
、ロボットアーム(2)の制御上、士数秒かかるので、
エツチング処理が施された被処理ウェーハ(至)が、こ
の被処理ウェーハ(至)の表面に残留したエツチング液
によって更に十数秒間エツチングされる。従って、被処
理ウェーッ・(至)がオーバーエツチングの状態になり
やすく、不良品となり、製造歩留りが低下する七いう欠
点があった。However, in this conventional device, the robot arm (2
) starts transferring the cassette (1) containing the etched wafers (to) into the air from the chemical treatment tank (3) and into the water washing tank (5). It takes several seconds to control the robot arm (2), so
The wafer to be processed which has been subjected to the etching process is further etched for about ten seconds by the etching liquid remaining on the surface of the wafer to be processed. Therefore, the wafer to be processed is likely to be over-etched, resulting in defective products and a lower manufacturing yield.
この発明は、75≧かる欠点を除去する目的でなされた
もので、薬液処理槽内において薬液処理された被処理ウ
ェーハを薬液処理槽内から敗り出した直後に、薬液処理
槽の開口部を自動開閉蓋で覆い、被処理ウェーハの表面
に残留する薬液を水洗用シャワー装置の噴射する水で水
洗してすみやかに除去するようにすることによって、被
処理ウェーハがその表面に残留する薬液による悪影響を
受けて不良品となることがほとんどない半導体ウェーハ
薬品処理装置を提供するものである。This invention was made for the purpose of eliminating the drawback that 75≧. By covering the wafer with an automatic opening/closing lid and quickly removing the chemical remaining on the surface of the wafer by washing it with water sprayed from a washing shower device, the wafer to be processed can be protected from the harmful effects of the chemical remaining on the surface. The purpose of the present invention is to provide a semiconductor wafer chemical processing apparatus that is almost never defective due to a chemical reaction.
@2図および第3図はそれぞれこの発明の一実施例の半
導体ウェーハ薬液処理槽内の主要#を数要素を示す斜視
図および側面図で、第2図は被処理ウェーハの薬液処理
前の状態を示し、第3図は薬液処理後の状態を示す。@ Figures 2 and 3 are a perspective view and a side view, respectively, showing several main elements in a semiconductor wafer chemical processing tank according to an embodiment of the present invention, and Figure 2 shows the state of a wafer to be processed before chemical processing. FIG. 3 shows the state after chemical treatment.
図におりで、第1図に示した従来例の符号と同一符号は
同等部分を示す。(7)および(8)はそれぞれ薬液処
理m(3)の両側に設けられそれぞれの一方の側端面が
エアシリンダ(9)およびエアシリンダαOのピストン
に固着されエアシリンダ(9)、αOの作用によって薬
液処理槽(3)の上方に互いに直角に交わるように押し
出され薬液処理槽(3)の開口部を自動的に完全に覆う
自動開閉蓋で、自動開閉蓋(8)の他方の側端面側の一
部が直角に下表面側に折り曲げられて自動開閉蓋(7)
の他方の側端面側の一部上にかぶさるようになって因る
。(ロ)はロボットアーム(2)の上方に設けられ薬液
処理後に被処理ウェーハ(至)の表面に残留する薬液を
水洗除去する水を噴射する水洗用シャワー装置である。In the figure, the same reference numerals as those of the conventional example shown in FIG. 1 indicate equivalent parts. (7) and (8) are respectively provided on both sides of the chemical treatment m(3), and one side end surface of each is fixed to the air cylinder (9) and the piston of the air cylinder αO, so that the action of the air cylinder (9) and αO is The automatic opening/closing lid is pushed out above the chemical processing tank (3) at right angles to each other and automatically completely covers the opening of the chemical processing tank (3), and the other side end surface of the automatic opening/closing lid (8) A part of the side is bent at a right angle to the bottom surface to automatically open and close the lid (7)
It overlaps a part of the other side end surface side. (B) is a rinsing shower device that is installed above the robot arm (2) and sprays water to wash away the chemical solution remaining on the surface of the wafer to be processed after the chemical solution treatment.
次に、この実施例の作用について、被処理ウェーハωに
エツチング処理を施す場合を例にとり説明する。Next, the operation of this embodiment will be explained by taking as an example a case where a wafer ω to be processed is subjected to an etching process.
この場合には、まず、薬液処理槽(3)内にエツチング
液を入れる。そして、被処理ウェーハ(イ)が収容され
たカセット(1)を、ロボットアーム(2)の搬送によ
って、薬液処理槽(3)内のエツチング液に所定時間浸
して被処理ウェーッS(至)のエツチング処理を行う。In this case, first, an etching solution is put into the chemical treatment tank (3). Then, the cassette (1) containing the wafer to be processed (A) is immersed in the etching solution in the chemical treatment tank (3) for a predetermined period of time by the robot arm (2), and the wafer to be processed (S) is etched. Perform etching process.
次めで、再度ロボットアーム(2)の搬送によって、こ
のエツチング処理が施された被処理ウェーハ(至)を収
容したカセット(1)を薬液処理槽(3)内から空気中
に敗り出し、その直後に、エアシリンダ(9) 、 Q
f)の作動によって薬液処理槽(3)の開口部を自動開
閉蓋(7) 、 (8)で覆うと同時に、水洗用シャワ
ー装置(11)を作動させ、水洗用シャワー装置(lυ
から噴射される水によって被処理ウェーッ1(至)の表
面に残留するエツチング液を水洗除去する。このとき、
薬液処理槽(3)の開口部が自動開閉蓋(7) 、 +
8)で完全に覆われているので、水洗用シャワー装置0
ηから噴射される水は、薬液処理槽(3)内に入らない
。Next, the robot arm (2) transports the cassette (1) containing the etched wafer (to) from the chemical treatment tank (3) into the air. Immediately after, air cylinder (9), Q
f), the opening of the chemical treatment tank (3) is covered with the automatic opening/closing lids (7) and (8), and at the same time, the flushing shower device (11) is activated, and the flushing shower device (lυ
The etching solution remaining on the surface of the wafer 1 to be processed is washed away by water sprayed from the wafer 1. At this time,
The opening of the chemical treatment tank (3) automatically opens and closes the lid (7), +
8), so the flushing shower device 0
The water injected from η does not enter the chemical treatment tank (3).
このように、この実施例の装置では、エツチング処理が
施された被処理ウェーハ(至)を薬液処理槽(3)内か
ら空気中に取り出した直後に、被処理ウェーハ(至)の
表面に残留するエツチング液を水洗用シャワー装置(1
1)の噴射する水ですみやかに除去するので、被処理ウ
ェーハ(至)がその表面に残留する工ツチング液によっ
てエツチングされてオーバーエツチングの状態になって
不良品となることがほとんどなく、製造歩留りの向上を
図ることができる。In this way, in the apparatus of this embodiment, immediately after the etched wafer (to) is taken out into the air from the chemical treatment tank (3), there is no residual material left on the surface of the to-be-processed wafer (to). A shower device (1
1) Since the water is quickly removed by the jet of water, there is almost no chance that the wafer to be processed will be etched by the etching solution remaining on the surface, resulting in over-etching and resulting in defective products, and the manufacturing yield can be improved. It is possible to improve the
この実施例では、2個の自動開閉蓋(7) 、 (s)
を用いて薬液処理m (3)の開口部を自動的に覆う場
合について述べたが、この発明はこれに限らず、1個ま
たは3個以上の自動開閉蓋を用いて薬液処理槽(3)の
開口部を自動的に覆う場合にも適用することができる。In this embodiment, two automatic opening/closing lids (7), (s)
Although the case has been described in which the opening of the chemical liquid processing tank (3) is automatically covered using a chemical liquid processing tank (3), the present invention is not limited to this. It can also be applied to automatically cover openings in
以上、説明したように、この発明の半導体薬液処理装置
では、薬液処理槽内において薬液処理された被処理ウェ
ーハを薬液処理槽内から$9出した直後に、薬液処理槽
の開口部を自動開閉蓋で覆い、被処理ウェーハの表面に
残留する薬液を水洗用シャワー装置の噴射する水で水洗
してすみやかに除去するよってしたので、被処理ウェー
ハがその表面に残留する薬液による悪影響を受けて不良
品となることがほとんどなく、製造歩留りの向上を図る
ことができる。As described above, in the semiconductor chemical processing apparatus of the present invention, the opening of the chemical processing tank is automatically opened and closed immediately after the wafer to be processed is removed from the chemical processing tank by $9. Since the wafer to be processed is covered with a lid and the chemical solution remaining on the surface of the wafer to be processed is quickly removed by washing with water sprayed from a washing shower device, there is no chance that the wafer to be processed will be adversely affected by the chemical solution remaining on the surface. There are almost no non-defective products, and the manufacturing yield can be improved.
第1図は従来の半導体薬品処理装置の一例の主要構成要
素を示す斜視図、第2図および第3図はそれぞれこの発
明の一実施例の半導体薬品処理装置の主要槽e、要素な
示す斜視図および側面図である。
図において、(1)はカセット、(2)iltロボット
アーム、(3)は薬液処理槽、(4)は薬液、(7)お
よび(8)は自動開閉蓋、0υは水洗用シャワー装置、
(至)は薬液処理が施される半導体ウェーハである。
なお、図中同一符号はそれぞれ同−tたは相当部分を示
す。
代理人 大岩増雄
第1図
第2図FIG. 1 is a perspective view showing the main components of an example of a conventional semiconductor chemical processing device, and FIGS. 2 and 3 are perspective views showing the main tank e and elements of a semiconductor chemical processing device according to an embodiment of the present invention FIG. 3 is a diagram and a side view. In the figure, (1) is a cassette, (2) ILT robot arm, (3) is a chemical treatment tank, (4) is a chemical solution, (7) and (8) are automatic opening/closing lids, 0υ is a flushing shower device,
(to) is a semiconductor wafer to which chemical treatment is applied. It should be noted that the same reference numerals in the figures indicate the same -t or corresponding parts, respectively. Agent Masuo Oiwa Figure 1 Figure 2
Claims (1)
容するカセットを搬送するロボットアーム、このロボッ
トアームによって搬送されてきた上記半導体ウェーハを
処理する薬液が内部にたくわ見られた薬液処理槽、この
薬液処理槽の開口部を自動的に覆うことができる自動開
閉蓋、および薬液処理後に上記ロボットアームによって
上記薬液処理槽から引き上げられた上記カセット内に収
容された上記半導体ウェーハの表面を水洗する水を噴射
する水洗用シャワー装置を備え、上記ロボットアームに
よって搬送されてきた上記半導体ウェーハを上記薬液処
理槽内の薬液で処理した後に上記薬液処理槽内から取り
出した直後に、上記薬液処理槽の開口部を上記自動開閉
蓋で覆い上記薬液処理槽内で処理された半導体ウェーハ
の表面に残留する薬液を上記水洗用シャワー装置の噴射
する水で水洗してすみやかに除去するようにしたことを
特徴とする半導体薬液処理装置。(1) A robot arm that transports a cassette containing semiconductor wafers to be subjected to chemical processing; a chemical processing tank in which a chemical solution for processing the semiconductor wafers transported by the robot arm is stored; An automatic opening/closing lid that can automatically cover the opening of the chemical treatment tank, and a surface of the semiconductor wafer housed in the cassette lifted from the chemical treatment tank by the robot arm after the chemical treatment are washed with water. A washing shower device that sprays water is provided, and the semiconductor wafer carried by the robot arm is treated with a chemical solution in the chemical solution processing tank and immediately after being taken out from the chemical solution processing tank. The opening is covered with the automatic opening/closing lid, and the chemical solution remaining on the surface of the semiconductor wafer processed in the chemical solution processing tank is quickly removed by washing with water sprayed from the washing shower device. Semiconductor chemical processing equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19553383A JPS6085529A (en) | 1983-10-17 | 1983-10-17 | Treater for chemical for semiconductor wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19553383A JPS6085529A (en) | 1983-10-17 | 1983-10-17 | Treater for chemical for semiconductor wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6085529A true JPS6085529A (en) | 1985-05-15 |
Family
ID=16342670
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19553383A Pending JPS6085529A (en) | 1983-10-17 | 1983-10-17 | Treater for chemical for semiconductor wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6085529A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6350024A (en) * | 1986-08-19 | 1988-03-02 | Texas Instr Japan Ltd | Treatment device by liquid |
JPS6437016A (en) * | 1987-07-31 | 1989-02-07 | Hitachi Ltd | Wet processor and substrate holding jig used for same |
JPH0492633U (en) * | 1990-12-28 | 1992-08-12 | ||
JPH06181194A (en) * | 1992-12-11 | 1994-06-28 | Nec Corp | Chemical processing system |
KR100408451B1 (en) * | 2001-04-18 | 2003-12-06 | (주)케이.씨.텍 | Device for driving doors of bath for cleaning a substrate |
-
1983
- 1983-10-17 JP JP19553383A patent/JPS6085529A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6350024A (en) * | 1986-08-19 | 1988-03-02 | Texas Instr Japan Ltd | Treatment device by liquid |
JPS6437016A (en) * | 1987-07-31 | 1989-02-07 | Hitachi Ltd | Wet processor and substrate holding jig used for same |
JPH0492633U (en) * | 1990-12-28 | 1992-08-12 | ||
JPH06181194A (en) * | 1992-12-11 | 1994-06-28 | Nec Corp | Chemical processing system |
KR100408451B1 (en) * | 2001-04-18 | 2003-12-06 | (주)케이.씨.텍 | Device for driving doors of bath for cleaning a substrate |
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