JPH0487282A - Socket for resin seal type integrated circuit element - Google Patents

Socket for resin seal type integrated circuit element

Info

Publication number
JPH0487282A
JPH0487282A JP20264390A JP20264390A JPH0487282A JP H0487282 A JPH0487282 A JP H0487282A JP 20264390 A JP20264390 A JP 20264390A JP 20264390 A JP20264390 A JP 20264390A JP H0487282 A JPH0487282 A JP H0487282A
Authority
JP
Japan
Prior art keywords
resin
base substrate
measured
socket
lead terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20264390A
Other languages
Japanese (ja)
Other versions
JP3029276B2 (en
Inventor
Tomoe Sekii
関井 智衛
Hiroshi Takeda
武田 広志
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP02202643A priority Critical patent/JP3029276B2/en
Publication of JPH0487282A publication Critical patent/JPH0487282A/en
Application granted granted Critical
Publication of JP3029276B2 publication Critical patent/JP3029276B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To shorten the development due date and reduce the development cost by manufacturing five types of socket parts of a two-way flat package and multiple types of base substrate sections, and combining them to form a socket. CONSTITUTION:Groove sections 28 are selectively formed on a splittable base substrate section 21 integrally formed with a support plate 20 so that lead terminals 25 of a resin seal type integrated circuit(IC) element 23 to be measured can be installed, the base substrate section 21 is penetrated by the lead terminals 25, and a support plate 20 is exposed at the bottom section. Projections 29 are formed at the portions of the base substrate section 21 constituting the walls of the groove sections 28 so that the lead terminals 25 of the resin seal type IC element 23 to be measured can be brought into contact with them, and separate sections 30... are formed to secure the respective insulation state. Separate sections 27... are arranged in groove sections 22. The development cost is made minimum, and the development due date can be shortened.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は樹脂封止型集積回路素子の評価に使用するソケ
ット(Socket)に係わり、特に、2方向のフラッ
トパッケイジ(FQatPa−ckage)タイプ(T
ype)の樹脂封止型集積回路素子の特性評価に使用す
るものである。
Detailed Description of the Invention [Objective of the Invention] (Industrial Field of Application) The present invention relates to a socket used for evaluating a resin-sealed integrated circuit device, and particularly relates to a two-way flat package (FQatPa -ckage) type (T
ype) is used to evaluate the characteristics of resin-sealed integrated circuit elements.

(従来の技術) 半導体産業の中で重要な位置を占める集積回路素子は益
々高集積化、機能アップ(Up)更に多様化か早いスピ
ード(S p e e d)で実現されたが、また多く
のニーズ(Needs)に応えるべく改良が加えられて
いるのが現状である。このような集積回路素子の進歩改
良に対応して外囲器についても同じく、−層多様化なら
びに多ビン(P i n)化の方向を辿っているので超
小型化に向かっている。
(Conventional technology) Integrated circuit devices, which occupy an important position in the semiconductor industry, have become increasingly highly integrated, functionally improved (Up), and diversified and realized at a faster speed (Speed). Currently, improvements are being made to meet the needs of people. In response to the progress and improvement of integrated circuit devices, the envelope is also becoming more diverse in layers and has more pins (P in ), so it is becoming more miniaturized.

このような集積回路素子の多くはいわゆるトランスファ
ーモールド(Transefer  M−oQd)法に
より被覆された長方形または正方形の封止樹脂層即ち外
囲器により保護されており、外部に導出したアウターリ
ード(Oute−r  Lead以後リード端子と記載
する)により他の機器との電気的接続を図っている。こ
のような樹脂封止型集積回路素子の特性評価にはダイソ
ータテスト(Die  5orter  Te5t以後
D/Sテストと記載する)と製品テストかあるか、集積
回路素子の封止樹脂層から成る外囲器の形状にマツチ(
Match)したソケットか必要になる。と言うのは、
外囲器から導出したリード端子のピッチ(P it c
 11) 、数、全長、全幅、外囲器の寸法などが一つ
でも違っていると専用のソケットを開発する必要かある
。このようなソケットの構造を説明する前に外囲器の形
状と寸法について第1図a −dにより説明する。現在
多用されているフラットパッケイジとしてはQFP(Q
uad  FQat  Package)やSOP (
SmaQ 1 0ut  Line  Package
)かあるが、sopの上面図が第1図a、側面図が第1
図す、sopを備えた樹脂封止型集積回路素子の断面図
が第1図C1第1図dは第1図すに示したリード端子の
断面を拡大した図である。第1図Cに示すように樹脂封
止型集積回路素子1は封止樹脂層2に埋込まれた集積回
路素子(図示せず)に電気的に接続したリード端子3を
外部に導出しており、しかも面実装形またはリード端子
挿入形用としてリード端子2を第1図dに示すように2
度成型して機器への挿入に備えている。
Many of these integrated circuit devices are protected by a rectangular or square sealing resin layer, or an envelope, coated with a so-called transfer molding method, and outer leads (outer leads) led out to the outside. r Lead (hereinafter referred to as lead terminal) is used to connect electrically with other devices. To evaluate the characteristics of such resin-sealed integrated circuit devices, there are die sorter tests (hereinafter referred to as D/S tests) and product tests. Matches the shape of the vessel (
Match) socket is required. That is,
The pitch of the lead terminals led out from the envelope (P it c
11) If there is even one difference in the number, overall length, overall width, or dimensions of the envelope, it may be necessary to develop a special socket. Before explaining the structure of such a socket, the shape and dimensions of the envelope will be explained with reference to FIGS. 1a-d. QFP (Q
uad FQat Package) and SOP (
SmaQ 1 0ut Line Package
), but the top view of the sop is shown in Figure 1a, and the side view is shown in Figure 1a.
FIG. 1D is an enlarged view of the cross section of the lead terminal shown in FIG. 1C. As shown in FIG. 1C, the resin-sealed integrated circuit device 1 has lead terminals 3 electrically connected to the integrated circuit device (not shown) embedded in the encapsulation resin layer 2 led out. In addition, for surface mount type or lead terminal insertion type, the lead terminal 2 is attached as shown in Fig. 1d.
It is ready to be molded and inserted into equipment.

各図に書かれた照合文字はEIAJ規格を参考にしたも
ので、以下に照合文字と用語及びその内容を表1にまと
めた。
The matching characters written in each figure are based on the EIAJ standard, and the matching characters, terms, and their contents are summarized in Table 1 below.

表−1 (以下余白) 次に第2図乃至第4図によりフラットパッケイジ用ソケ
ットの構造の要部を説明する。即ち、第2図に上面図を
、第3図がソケットの一部を構成する支持体に開閉自在
に取付けた抑え基板を開いた状態の断面図を、そして第
4図には抑え基板を開けて支持体と両方の内部を斜視図
により示している。第2図に明らかなように、支持体4
と抑え基板5の外に両者を一体に固定するストッパー6
によりフラットパッケイジ用ソケットは構成されており
、支持体4には被測定樹脂封止型集積回路素子即ちフラ
ットパッケイジのリード端子(第1図参照)2が挿入接
触する複数の接触子7・・・(図には一個のみ示した)
が設置されている。この接触子7・・の端部は支持体4
の外部まで延ばして測定用リード端子8として機能させ
、しかも隣合ったものの長さを変えて間違いのないよう
に配慮している。また、接触子7・・・には開脚部9.
9を夫々設け、一方の開脚部9には突出部10・・・を
設置してフラットパッケイジ即ち封止樹脂層2から外部
に導出したリード端子3と接触させて測定を行う。この
接触を確実にするために抑え基板5には一対の抑え部1
1.11を接触子7に対応して形成し、更にストッパー
6により一体とする。このために、抑え基板5の厚さよ
り僅かに大きい位置に張出し部12を設け、その端部に
凸部13これに嵌合する抑え基板5端部に凹部14を形
成して抑え基板5と支持体4を一体に固定すると共にリ
ード端子2と接触子7とを確実に接触させる。
Table 1 (blank below) Next, the main parts of the structure of the flat package socket will be explained with reference to FIGS. 2 to 4. That is, Fig. 2 shows a top view, Fig. 3 shows a cross-sectional view of the holding board in an open state, which is attached to a support that forms part of the socket so that it can be opened and closed, and Fig. 4 shows the holding board in an open state. The support body and the inside of both are shown in a perspective view. As shown in FIG. 2, the support 4
and a stopper 6 outside the holding board 5 that fixes both together.
The socket for a flat package is constructed as shown in FIG. (Only one is shown in the figure)
is installed. The end of this contactor 7... is connected to the support 4
The terminals are extended to the outside to function as measurement lead terminals 8, and the lengths of adjacent terminals are changed to avoid mistakes. In addition, the contactor 7... has an open leg portion 9.
A protrusion 10 is installed on one open leg 9 and brought into contact with the lead terminal 3 led out from the flat package, that is, the sealing resin layer 2, for measurement. In order to ensure this contact, the holding board 5 has a pair of holding parts 1.
1.11 is formed corresponding to the contactor 7, and further integrated with the stopper 6. For this purpose, an overhanging part 12 is provided at a position slightly larger than the thickness of the holding board 5, and a concave part 14 is formed at the end of the holding board 5 which fits into the convex part 13 at the end of the projecting part 12 to support the holding board 5. A body 4 is fixed together and a lead terminal 2 and a contact 7 are brought into reliable contact.

更にまた、抑え基板5は支持体4に形成され支点として
動作する棒状部15を介して開閉自在に移動でき、スト
ッパー6も第2の支点として機能する第2の棒状部16
により蓋体5を抑えるようにすることができる。第4図
aには抑え基板5がストッパー6により支持体4にしつ
かり固定された状態が、第4図すには抑え基板5を開け
た状態が夫々斜視図により明らかにされている。
Furthermore, the holding board 5 can be opened and closed via a rod-shaped part 15 formed on the support body 4 and which operates as a fulcrum, and the stopper 6 also has a second rod-shaped part 16 which functions as a second fulcrum.
This allows the lid body 5 to be held down. FIG. 4a shows a state in which the holding board 5 is fixed to the support body 4 by the stopper 6, and FIG. 4 shows a state in which the holding board 5 is opened.

(発明が解決しようとする課題) (1)、第1表に示したSOPフラットパッケイジの寸
法は、■(e)リード端子ピッチ(単位mm)1.27
 (LFP) 、1.0 (MFP)、0.8.0.6
5 (VSOP) 、0.5の5種類、■eアウターリ
ード列間隔225m1Q、300m1Q、375m1Ω
、45QmiQ、■テストビン数、■Eパッケイジ幅、
■Ho 、HE全長、全幅、■Lアウターリードの長さ
の■〜■の寸法が一つでも違っていれば必ず新しいソケ
ットが必要となる。
(Problems to be Solved by the Invention) (1) The dimensions of the SOP flat package shown in Table 1 are: (e) Lead terminal pitch (unit: mm) 1.27
(LFP), 1.0 (MFP), 0.8.0.6
5 (VSOP), 5 types of 0.5, ■e Outer lead row spacing 225m1Q, 300m1Q, 375m1Ω
, 45QmiQ, ■Number of test bins, ■E package width,
■If any of the dimensions of ■Ho, HE total length, total width, and ■L outer lead length are different from ■~■, a new socket will definitely be required.

(2)、Lかも寸法が違うフラットパッケイジ毎に専用
のソケットが要るために開発コスト(Cost)が高く
なる。
(2) Since a dedicated socket is required for each flat package with different dimensions, the development cost increases.

(3)、新規ソケットが絶えず必要になるので開発納期
か長くなる。
(3) Since new sockets are constantly required, the development lead time becomes longer.

(4)、ソケット自体の寸法、接触子から延長した測定
用リードパターン(Pa t t e rn)が全てま
ちまちで測定回路が標準化できない。
(4) The dimensions of the socket itself and the measurement lead patterns extending from the contacts all vary, making it impossible to standardize the measurement circuit.

本発明はこのような事情により成されたもので、特に、
リード端子単位で共用化と標準化を目指して、開発納期
の短縮と開発コストの低減を目的とするものである。
The present invention was made under these circumstances, and in particular,
The aim is to shorten development delivery times and reduce development costs by aiming for common use and standardization of each lead terminal.

[発明の構成」 (課題を解決するための手段) 絶縁物から成り分割可能なベース基板部と。[Structure of the invention] (Means for solving problems) A base board made of an insulating material that can be separated.

前記ベース基板部に対応して設置する支持板と。a support plate installed corresponding to the base board section;

前記ベース基板部に選択的に形成する溝部と、前記溝部
を挟んでベース基板部に設置するセパレート部と、前記
溝部に隣接するベース基板部分に形成する凸部と、前記
凸部に係止する被測定樹脂封止型半導体素子と、前記被
測定樹脂封止型半導体素子のリード端子と、前記リード
端子に接続するようにベース基板部に設置する接触子と
、前記ベース基板部に取付ける棒状の回転可能な棒状部
と。
a groove portion selectively formed in the base substrate portion; a separate portion installed on the base substrate portion across the groove portion; a convex portion formed in the base substrate portion adjacent to the groove portion; and a convex portion fixed to the convex portion. A resin-sealed semiconductor element to be measured, a lead terminal of the resin-sealed semiconductor element to be measured, a contactor installed on the base substrate part so as to be connected to the lead terminal, and a rod-shaped rod-shaped semiconductor element attached to the base substrate part. and a rotatable rod.

前記棒状部と共に開閉しかつ被測定樹脂封止型半導体素
子のリード端子を押える抑え基板と、前記接触子に電気
的に接触して支持板を貫通して外部に導出する測定端子
と、前記リード端子に対応するベース基板部及び支持板
の境界部分に形成しかつ分割可能なベース基板部の双方
にお互いを嵌合可能にする機構とに本発明に係わる樹脂
封止型集積回路素子用ソケットの特徴がある。
a holding board that opens and closes together with the rod-shaped portion and holds down the lead terminals of the resin-sealed semiconductor element to be measured; a measurement terminal that electrically contacts the contacts and extends to the outside through the support plate; and the leads. The socket for a resin-sealed integrated circuit element according to the present invention has a mechanism that is formed at the boundary between the base substrate portion corresponding to the terminal and the support plate and is separable so that the base substrate portion can be fitted to each other. It has characteristics.

また、絶縁物から成り分割可能なベース基板部と、前記
ベース基板部に対応して設置する支持板と、前記ベース
基板部に選択的に形成する溝部と。
Further, a base substrate portion made of an insulating material and divisible, a support plate installed corresponding to the base substrate portion, and a groove portion selectively formed in the base substrate portion.

前記溝部を挟んでベース基板部に設置するセパレート部
と、前記溝部に隣接するベース基板部に形成する凸部と
、前記凸部に係止する被測定樹脂封止型半導体素子と、
前記被測定樹脂封止型半導体素子のリード端子と、前記
リード端子に接続するようにベース基板部に設置する接
触子と、前記ベース基板部に取付ける回転可能な棒状部
と、前記棒状部と共に開閉しかつ被測定樹脂封止型半導
体素子のリード端子を押える抑え基板と、前記接触子に
電気的に接触して支持板を貫通して外部に導出する測定
端子と、前記リード端子に対応するベース基板部及び支
持板の境界部分に形成しかつ分割可能なベース基板部の
双方にお互いを嵌合可能にする機構と、前記接触子端に
形成しリード端子に接続する凸部と、前記突出部に対応
する抑え基板部分に取付ける金属製接触面と、前記突出
部より長大に接触子に設けられ金属製接触面と共にリー
ド端子を挟持する第2突出部にも本発明に係わる樹脂封
止型集積回路素子用ソケットの特徴かある。
a separate part installed on the base substrate part with the groove part in between; a convex part formed on the base substrate part adjacent to the groove part; and a resin-sealed semiconductor element to be measured that is engaged with the convex part;
A lead terminal of the resin-sealed semiconductor element to be measured, a contact installed on the base substrate so as to be connected to the lead terminal, a rotatable rod-shaped part attached to the base substrate, and a rotatable rod-shaped part that opens and closes together with the rod-shaped part. and a holding board that holds down the lead terminals of the resin-sealed semiconductor element to be measured, a measurement terminal that electrically contacts the contact and extends to the outside through the support plate, and a base that corresponds to the lead terminal. A mechanism formed at the boundary between the substrate portion and the support plate and capable of fitting each other to both the divisible base substrate portion, a convex portion formed at the end of the contact and connected to the lead terminal, and the protrusion portion. The resin-sealed integrated circuit according to the present invention also includes a metal contact surface attached to the holding board portion corresponding to the above-mentioned projection, and a second projection provided on the contact longer than the projection and holding the lead terminal together with the metal contact surface. There are some characteristics of sockets for circuit elements.

(作用) 従来のソケットでは■〜■まで全で新しく設計する必要
があったが、本発明ではリードピッチの違う4タイプ(
Type)1.27mm。
(Function) In conventional sockets, it was necessary to design all new sockets from ■ to ■, but with the present invention, four types with different lead pitches (
Type) 1.27mm.

1.0mm、0.8mm、0.65及び0.5mmを基
本として作り、しかもテストビンはピッチ最大のものを
製作する。パッケイジ即ち樹脂封止層の幅はベース基盤
部に形成するお互いを嵌合可能にする機構の位置決め孔
やピンを変更することにより2方向のフラットパッケイ
ジ全品種用ソケットが完成できる。
The pitch is basically 1.0 mm, 0.8 mm, 0.65 and 0.5 mm, and the test bin is manufactured with the largest pitch. By changing the width of the package, that is, the resin sealing layer, by changing the positioning holes and pins of the mechanism formed on the base plate to enable them to fit together, a two-way flat package socket for all types can be completed.

(実施例) 本発明に係わる実施例を第5図a、 b、第6図a、 
b、第7図a、 b、第8図a、 b、第9図a、b、
c、第10図及び第11図を参考に説明するが、理解を
助けるために従来技術と同じ部品にも新しい番号を付け
る。なお、第5図a、b。
(Example) Examples according to the present invention are shown in Fig. 5 a, b, Fig. 6 a,
b, Figure 7 a, b, Figure 8 a, b, Figure 9 a, b,
c. The explanation will be made with reference to FIGS. 10 and 11, and new numbers will be added to parts that are the same as those in the prior art to aid understanding. In addition, Fig. 5 a and b.

第6図aSb、第8図a、b及び第9図a、b。Figure 6 aSb, Figure 8 a, b and Figure 9 a, b.

Cには第1実施例を、第10図及び第11図に第2実施
例を示しており、第7図a、bでは両実施例に共通の部
品を明らかにしている。
The first embodiment is shown in C, and the second embodiment is shown in FIGS. 10 and 11, and parts common to both embodiments are shown in FIGS. 7a and 7b.

本発明に係わる樹脂封止型集積回路素子用ソケットを構
成する両実施例とも、支持板20(第8図a、b参照)
と、これに対応して配置する絶縁物から成るベース基板
部21とで構成され、ベース基板部21には接触子22
(第5.6.8図a及び第10.11図参照)、被測定
樹脂封止型集積回路素子23(第6図す参照)の封止樹
脂層24の外部に導出したリード端子25(第6図す参
照)、抑え基板26更に支持板20とベース基板部21
の境界部分に設置するお互いが嵌合できる機構27で構
成される。第1実施例を示す各図の中、第5.6図a、
bは抑え基板26の動作状態を示しており第8図a、b
は樹脂封止型集積回路素子用ソケット全体を示している
In both embodiments constituting the resin-sealed integrated circuit element socket according to the present invention, the support plate 20 (see FIGS. 8a and 8b)
and a base board part 21 made of an insulator arranged correspondingly, and the base board part 21 has a contactor 22.
(See Figures 5.6.8a and 10.11), lead terminals 25 ( (See Figure 6), holding board 26, support plate 20 and base board part 21
It consists of a mechanism 27 that is installed at the boundary between the two and can be fitted together. Among the figures showing the first embodiment, Figure 5.6a,
b shows the operating state of the holding board 26, and FIGS. 8a and b
1 shows the entire resin-sealed integrated circuit element socket.

次にこれらの各部品の関係や関連部品について説明する
Next, the relationship among these parts and related parts will be explained.

支持板20と一体に形成されかつ分割可能なベース基板
部21には選択的に溝部28を形成して第6図すに明ら
かにした被測定樹脂封止型集積回路素子23のリード端
子25が設置できるようにするか、第6図aにあるよう
にベース基板部21を貫通して設けて底部に支持板20
が露出する状態とする。溝部28の壁を構成するベース
基板部21部分には凸部29を形成して被測定樹脂封止
型集積回路素子23のリード端子25が接触できるよう
にし、更に夫々の絶縁状態を確保するために第5〜9図
すに明らかなようにセパレート部30・・・形成する。
Grooves 28 are selectively formed in the base substrate portion 21, which is formed integrally with the support plate 20 and is separable, so that the lead terminals 25 of the resin-sealed integrated circuit element 23 to be measured shown in FIG. The support plate 20 can be installed at the bottom by penetrating the base board part 21 as shown in FIG. 6a.
is exposed. A convex portion 29 is formed on the base substrate portion 21 portion constituting the wall of the groove portion 28 so that the lead terminal 25 of the resin-sealed integrated circuit element 23 to be measured can come into contact with it, and further to ensure the respective insulation state. As is clear from FIGS. 5 to 9, separate portions 30 are formed.

従って図では溝部22内にセパレート部27・・・か配
置されるようになる。
Therefore, in the figure, the separate parts 27 are arranged within the groove part 22.

ところで、凸部28に係止される被測定樹脂封止型集積
回路素子23のリード端子25は抑え基板22により抑
えるが、これには第5.6.8.9.10及び11図に
示すように支点として機能し開閉自在に動作できる棒状
部31に抑え基板26を取付けることにより第6図aと
第8図aに示すような挙動ができることになる。棒状部
31の詳細な構造は本発明に直接関係がないので省略す
る。
By the way, the lead terminals 25 of the resin-sealed integrated circuit element 23 to be measured, which are held by the convex portions 28, are held down by the holding board 22, which includes a holding board 22 shown in FIGS. By attaching the restraining board 26 to the rod-like part 31 which functions as a fulcrum and can be opened and closed freely, the behavior shown in FIGS. 6a and 8a can be achieved. The detailed structure of the rod-shaped portion 31 is not directly related to the present invention and will therefore be omitted.

更に本願では支持板20とベース基板部21の境界部分
にはお互いが嵌合できる機構27を設置しているが、凸
部28・・・間に係止する被測定樹脂封止型集積回路素
子23の機種毎のリード端子25のピッチに応じた位置
決め孔32と位置決めピン33をベース基板部21と支
持板20に形成することにより構成される。しかも、ベ
ース基板部21は2分割しているので、当然両者に等間
隔に雄雌のピン(Pin)と孔を設置して所定の距離を
維持した位置決め孔32と位置決めピン33が形成され
るので、各ピッチ毎のものをわざわざつくらずにすむの
で投資コストの削減が図られる外に、封止樹脂の幅も代
えられる利点がある。
Furthermore, in the present application, a mechanism 27 is installed at the boundary between the support plate 20 and the base substrate section 21 so that they can fit into each other, but a convex section 28...the resin-sealed integrated circuit element to be measured is fixed between the two. It is constructed by forming positioning holes 32 and positioning pins 33 in the base substrate part 21 and the support plate 20 according to the pitch of the lead terminals 25 for each of the 23 models. Moreover, since the base board part 21 is divided into two parts, male and female pins and holes are naturally installed at equal intervals on both sides, and positioning holes 32 and positioning pins 33 that maintain a predetermined distance are formed. Therefore, there is no need to go to the trouble of making one for each pitch, which not only reduces investment costs, but also has the advantage that the width of the sealing resin can be changed.

具体的には第8図a、第9図a2第10図及び第11図
に示すように支持板20に位置決め孔32を、ベース基
板部21に位置決めピン33を夫々形成して、お互いが
嵌合できる機構27とし、更に、第5図aと第6図aに
明らかなようにベース基板部21を二分割する。お互い
が嵌合できる機構27の形成位置は被測定樹脂封止型集
積回路素子23のリード端子25に対応するベース基板
部21と支持板20に形成される。
Specifically, as shown in FIG. 8a, FIG. 9a, FIG. 10, and FIG. Furthermore, as shown in FIGS. 5a and 6a, the base substrate portion 21 is divided into two parts. The mechanisms 27 that can be fitted into each other are formed on the base substrate portion 21 and the support plate 20 corresponding to the lead terminals 25 of the resin-sealed integrated circuit element 23 to be measured.

また、お互いが嵌合できる機構27の寸法としては被測
定樹脂封止型集積回路素子23のリード列間隔255(
miQ) 、300 (mi Q)、375(miQ)
及び475(miQ)の半分の距離に対応した位置決め
ピン33をベース基板部21に設け、これに対向した支
持板20部分にも位置決め孔32を形成しておき、両者
を嵌合させて一体とする。これにより樹脂封止型集積回
路素子用ソケットではリードピッチ1.27mm。
In addition, the dimensions of the mechanisms 27 that can be fitted together are the lead row spacing 255 (
miQ), 300 (miQ), 375 (miQ)
A positioning pin 33 corresponding to a half distance of 475 (miQ) is provided on the base board part 21, and a positioning hole 32 is also formed in the support plate 20 part opposite to this, and the two are fitted and integrated. do. As a result, the lead pitch for sockets for resin-sealed integrated circuit elements is 1.27 mm.

1.0mm、0.8mm、0.65mm、0.5mmの
ものを製作しておけば良い。
It is sufficient to manufacture 1.0 mm, 0.8 mm, 0.65 mm, and 0.5 mm.

このような構造を備えた樹脂封止型集積回路素子用ソケ
ットでは第5.6図すにあるように被測定樹脂封止型集
積回路素子23のリード端子25が抑え板基板26及び
接触子22により凸部29に固定されて所定の測定か行
われる。この接触子22は各リード端子25に対応して
複数個が形成されており、その中間には前記のようにセ
バレタ30を配置してお互いの絶縁状態を確保している
。接触子22は図示しているように一端を接続した一対
の開脚部34.34で構成されており、その先端は支持
板20の外に導出して他の機器との接続に備えると共に
、長さを変えて測定箇所が間違わないように配慮してい
る。
In a socket for a resin-sealed integrated circuit element having such a structure, the lead terminal 25 of the resin-sealed integrated circuit element 23 to be measured is connected to the holding plate substrate 26 and the contactor 22, as shown in Figure 5.6. It is fixed to the convex portion 29 and a predetermined measurement is performed. A plurality of these contactors 22 are formed corresponding to each lead terminal 25, and the separator 30 is arranged between them as described above to ensure mutual insulation. As shown in the figure, the contactor 22 is composed of a pair of open legs 34 and 34 connected at one end, and the tip thereof is led out of the support plate 20 in preparation for connection with other equipment. Care was taken to ensure that measurements were made by changing the length.

このように電気的測定用の接触子22は当然導電性金属
により形成されると共に、一方の開脚部34端には突出
部35を形成して凸部28に係止したリード端子25と
確実に接続する。リード端子25は従来技術欄に示した
ように二回直角に曲げしかも直線部を平坦に成型されて
いるので、抑え基板26による押圧により確実な接触が
得られる。
In this way, the contact 22 for electrical measurement is naturally made of a conductive metal, and a protrusion 35 is formed at the end of one open leg 34 to ensure that the lead terminal 25 engaged with the protrusion 28 Connect to. As shown in the prior art section, the lead terminals 25 are bent twice at right angles and the straight portions are made flat, so that reliable contact can be achieved by pressing with the holding board 26.

第10図と第11図による実施例では突出部を2個35
と第2突出部用35′を設置すると共に、これに対応す
る抑え基板26部分にも金属製接触面36を設置してリ
ード端子25との接続を点接触から面接触にして接触抵
抗を低くしている。
In the embodiment according to FIGS. 10 and 11, two protrusions 35 are provided.
and the second protruding portion 35', and a metal contact surface 36 is also installed on the corresponding holding board 26 part to change the connection with the lead terminal 25 from a point contact to a surface contact, thereby lowering the contact resistance. are doing.

更に接触子21の一方の開脚部34の端部は第9図Cに
明らかなように、二重構造にして弾性限界を増すことに
よって信頼性を向上しており、両開脚部34が接続した
ものを延長して外部に導き測定用リード37として機能
させる。
Furthermore, as shown in FIG. 9C, the end of one of the open legs 34 of the contactor 21 has a double structure to increase the elastic limit, thereby improving reliability. The connected part is extended and led to the outside to function as a measurement lead 37.

[発明の効果コ 2方向フラツトパツケイジを例にすると、ソケット部品
5タイプとベース基板部複数種類を製作組合わせてソケ
ットにすると、2方向フラットパッケイジ集積回路素子
のほぼ全品種の測定が可能になる。従って、■−品種別
のソケット開発から解放され、■開発コスト(Cost
)が最小限になり、■開発納期の制約がないなどの効果
が得られる。更にまた、被測定樹脂封止型集積回路素子
のリード端子と樹脂封止型集積回路素子用ソケットの接
触ミス(Miss)がなくなりその上接触抵抗が減少す
るために補正が可能になり、ひいては高精度、高信頼性
の測定が行なえる利点がある。
[Effects of the invention] Taking a two-way flat package as an example, if five types of socket parts and multiple types of base board parts are manufactured and combined to form a socket, it is possible to measure almost all types of two-way flat package integrated circuit elements. become. Therefore, ■ - You are freed from socket development for each type, and ■ Development costs (Cost) are reduced.
) is minimized, and ■ there are no restrictions on development delivery time. Furthermore, contact errors between the lead terminal of the resin-sealed integrated circuit element to be measured and the socket for the resin-sealed integrated circuit element are eliminated, and the contact resistance is reduced, making it possible to correct the problem. It has the advantage of being able to perform accurate and highly reliable measurements.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図aは被測定樹脂封止型集積回路素子の上面図、第
1図すは第1図aの側面図、第1図Cは第1図aの断面
図、第1図dは第1図すの一部の拡大図、第2図は従来
の樹脂封止型集積回路素子用ソケットの抑え基板を開い
た状態を示す上面は従来の樹脂封止型集積回路素子用ソ
ケットの抑え基板を開いた状態の斜視図、第5図a、b
及び第6図a、bは本発明に係わる樹脂封止型集積回路
素子用ソケットの一部断面図及び上面図、第7図aXb
は本発明に係わる樹脂封止型集積回路素子用ソケットの
要部を示す断面図と上面図、第8図a、bは本発明に係
わる樹脂封止型集積回路素子用ソケットの断面図及び上
面図、第9図a、b、Cは本発明に係わる樹脂封止型集
積回路素子用ソケットの他の断面図、上面図及び要部の
拡大断面図、第10図と第11図は本発明の他の実施例
の断面図である。 1.23:被測定樹脂封止型集積回路素子、2.24:
封止樹脂層、 3.25:リード端子、 4.21:ベース基板部、 5.26:抑え基板、  6:ストッパー20、支持板
、     7.22:接触子、8.37:測定用リー
ド、9.34.開脚部、10.35.35′:突出部、 11:抑え部、      12:張出し部、13.2
9.凸部、   14:凹部、27:嵌合できる機構 
 28:溝部、30、セパレータ、 15.16.31 棒状部、 32:位置決めピン、  33・位置決め孔、36;金
属製接触面。
FIG. 1a is a top view of the resin-sealed integrated circuit element to be measured, FIG. 1 is a side view of FIG. 1a, FIG. 1C is a cross-sectional view of FIG. 1a, and FIG. Figure 1 is an enlarged view of a portion of Figure 2. Figure 2 shows the open state of the holding board of a conventional resin-sealed integrated circuit element socket. Perspective view in open state, Figures 5a and b
6a and 6b are a partial sectional view and a top view of a socket for a resin-sealed integrated circuit element according to the present invention, and FIG. 7aXb
8A and 8B are cross-sectional views and top views showing essential parts of a resin-sealed integrated circuit device socket according to the present invention, and FIGS. 8a and 8b are cross-sectional views and top views of the resin-sealed integrated circuit device socket according to the present invention. Figures 9a, b, and c are other cross-sectional views, a top view, and an enlarged cross-sectional view of essential parts of a resin-sealed integrated circuit element socket according to the present invention, and Figures 10 and 11 are according to the present invention. FIG. 3 is a sectional view of another embodiment of the invention. 1.23: Resin-encapsulated integrated circuit element to be measured, 2.24:
Sealing resin layer, 3.25: Lead terminal, 4.21: Base board part, 5.26: Suppression board, 6: Stopper 20, support plate, 7.22: Contact, 8.37: Measurement lead, 9.34. Spreading part, 10.35.35': Protruding part, 11: Suppressing part, 12: Overhanging part, 13.2
9. Convex portion, 14: Concave portion, 27: Fitting mechanism
28: Groove portion, 30, Separator, 15.16.31 Rod-shaped portion, 32: Positioning pin, 33. Positioning hole, 36: Metal contact surface.

Claims (2)

【特許請求の範囲】[Claims] (1)絶縁物から成り分割可能なベース基板部と、前記
ベース基板部に対応して設置する支持板と、前記ベース
基板部に選択的に形成する溝部と、前記溝部を挟んだベ
ース基板部に設置するセパレート部と、前記溝部に隣接
するベース基板部に形成する凸部と、前記凸部に係止す
る被測定樹脂封止型半導体素子と、前記被測定樹脂封止
型半導体素子のリード端子と、前記リード端子に接続す
るようにベース基板部分に設置する接触子と、前記ベー
ス基板部に取付ける回転可能な棒状部と、前記棒状部と
共に開閉しかつ被測定樹脂封止型半導体素子のリード端
子を押える抑え基板と、前記接触子に電気的に接触して
支持板を貫通して外部に導出する測定端子と、前記リー
ド端子に対応するベース基板部及び支持板の境界部分に
形成しかつ分割可能なベース基板部の双方に互いを嵌合
可能にする機構を具備することを特徴とする樹脂封止型
集積回路素子用ソケット
(1) A base board part made of an insulating material and divisible, a support plate installed corresponding to the base board part, a groove part selectively formed in the base board part, and a base board part sandwiching the groove part. a separate part installed in the base substrate part adjacent to the groove part, a convex part formed on the base substrate part adjacent to the groove part, a resin-encapsulated semiconductor element to be measured that is engaged with the convex part, and a lead of the resin-encapsulated semiconductor element to be measured. a terminal, a contact element installed on a base substrate portion so as to be connected to the lead terminal, a rotatable rod-shaped portion attached to the base substrate portion, and a rotatable rod-shaped portion that opens and closes together with the rod-shaped portion and is connected to a resin-sealed semiconductor element to be measured. A holding board that holds down the lead terminal, a measurement terminal that electrically contacts the contact and extends to the outside through the support plate, and a boundary portion between the base board portion and the support plate that correspond to the lead terminal. A socket for a resin-sealed integrated circuit element, characterized in that both of the divisible base substrate parts are provided with a mechanism that allows them to be fitted to each other.
(2)絶縁物から成り分割可能なベース基板部と、前記
ベース基板部に対応して設置する支持部と、前記ベース
基板部に選択的に形成する溝部と、前記溝部を挟んでベ
ース基板部に設置するセパレート部と、前記溝部に隣接
するベース基板部に形成する凸部と、前記凸部に係止す
る被測定樹脂封止型半導体素子と、前記被測定樹脂封止
型半導体素子のリード端子と、前記リード端子に接続す
るようにベース基板部に設置する接触子と、前記ベース
基板部に取付ける回転可能な棒状部と、前記棒状部と共
に開閉しかつ被測定樹脂封止型半導体素子のリード端子
を押える抑え基板と、前記接触子に電気的に接触して支
持板を貫通して外部に導出する測定端子と、前記リード
端子に対応するベース基板部及び支持板の境界部分に形
成しかつ分割可能なベース基板部の双方にお互いを嵌合
可能にする機構と、前記接触子端に形成しリード端子に
接続する突出部と、前記突出部に対応する抑え基板部分
に取付ける金属製接触面と、前記突出部より長大に接触
子に設けられ金属製接触面と共にリード端子を挟持する
第2突出部を具備することを特徴とする樹脂封止型集積
回路素子用ソケット
(2) a base board part made of an insulating material and which can be divided; a support part installed corresponding to the base board part; a groove part selectively formed in the base board part; and a base board part sandwiching the groove part. a separate part installed in the base substrate part adjacent to the groove part, a convex part formed on the base substrate part adjacent to the groove part, a resin-encapsulated semiconductor element to be measured that is engaged with the convex part, and a lead of the resin-encapsulated semiconductor element to be measured. a terminal, a contact installed on a base substrate so as to be connected to the lead terminal, a rotatable rod-shaped section attached to the base substrate, and a resin-sealed semiconductor element to be measured that opens and closes together with the rod-shaped section. A holding board that holds down the lead terminal, a measurement terminal that electrically contacts the contact and extends to the outside through the support plate, and a boundary portion between the base board portion and the support plate that correspond to the lead terminal. and a mechanism that makes it possible to fit each other into both sides of the divisible base board, a protrusion formed at the end of the contact and connected to the lead terminal, and a metal contact attached to the holding board part corresponding to the protrusion. A socket for a resin-sealed integrated circuit element, characterized in that the socket has a second protrusion that is provided on the contact and is longer than the protrusion and that holds the lead terminal together with the metal contact surface.
JP02202643A 1990-07-31 1990-07-31 Socket for resin-sealed integrated circuit elements Expired - Fee Related JP3029276B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP02202643A JP3029276B2 (en) 1990-07-31 1990-07-31 Socket for resin-sealed integrated circuit elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP02202643A JP3029276B2 (en) 1990-07-31 1990-07-31 Socket for resin-sealed integrated circuit elements

Publications (2)

Publication Number Publication Date
JPH0487282A true JPH0487282A (en) 1992-03-19
JP3029276B2 JP3029276B2 (en) 2000-04-04

Family

ID=16460742

Family Applications (1)

Application Number Title Priority Date Filing Date
JP02202643A Expired - Fee Related JP3029276B2 (en) 1990-07-31 1990-07-31 Socket for resin-sealed integrated circuit elements

Country Status (1)

Country Link
JP (1) JP3029276B2 (en)

Also Published As

Publication number Publication date
JP3029276B2 (en) 2000-04-04

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