JPH0479250U - - Google Patents

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Publication number
JPH0479250U
JPH0479250U JP12291490U JP12291490U JPH0479250U JP H0479250 U JPH0479250 U JP H0479250U JP 12291490 U JP12291490 U JP 12291490U JP 12291490 U JP12291490 U JP 12291490U JP H0479250 U JPH0479250 U JP H0479250U
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JP
Japan
Prior art keywords
flaw
candidate
difference
defect
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12291490U
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English (en)
Japanese (ja)
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JP2508662Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990122914U priority Critical patent/JP2508662Y2/ja
Publication of JPH0479250U publication Critical patent/JPH0479250U/ja
Application granted granted Critical
Publication of JP2508662Y2 publication Critical patent/JP2508662Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1990122914U 1990-11-22 1990-11-22 疵検出装置 Expired - Lifetime JP2508662Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990122914U JP2508662Y2 (ja) 1990-11-22 1990-11-22 疵検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990122914U JP2508662Y2 (ja) 1990-11-22 1990-11-22 疵検出装置

Publications (2)

Publication Number Publication Date
JPH0479250U true JPH0479250U (OSRAM) 1992-07-10
JP2508662Y2 JP2508662Y2 (ja) 1996-08-28

Family

ID=31870649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990122914U Expired - Lifetime JP2508662Y2 (ja) 1990-11-22 1990-11-22 疵検出装置

Country Status (1)

Country Link
JP (1) JP2508662Y2 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010091410A (ja) * 2008-10-08 2010-04-22 Aisin Seiki Co Ltd 欠陥検査装置

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917088A (ja) * 1982-07-21 1984-01-28 株式会社日立製作所 減圧オリフイス
JPS59224546A (ja) * 1983-06-03 1984-12-17 Matsushita Electric Works Ltd 欠陥検出装置
JPS59225338A (ja) * 1983-06-06 1984-12-18 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS59226853A (ja) * 1983-06-07 1984-12-20 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS6089734A (ja) * 1983-10-24 1985-05-20 Nok Corp 表面欠陥検査方法
JPS617406A (ja) * 1984-06-21 1986-01-14 Mitsubishi Electric Corp 物体形状の欠陥検出方法
JPS6252454A (ja) * 1985-08-30 1987-03-07 Daido Steel Co Ltd 螢光磁粉探傷における疵判定方法および装置
JPS62231069A (ja) * 1986-03-28 1987-10-09 株式会社日立製作所 検反機の欠点検出方法
JPS6344281A (ja) * 1986-08-08 1988-02-25 Sanyo Electric Co Ltd 画像処理装置
JPS63175976A (ja) * 1987-01-16 1988-07-20 Toshiba Corp 探傷検査装置

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917088A (ja) * 1982-07-21 1984-01-28 株式会社日立製作所 減圧オリフイス
JPS59224546A (ja) * 1983-06-03 1984-12-17 Matsushita Electric Works Ltd 欠陥検出装置
JPS59225338A (ja) * 1983-06-06 1984-12-18 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS59226853A (ja) * 1983-06-07 1984-12-20 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS6089734A (ja) * 1983-10-24 1985-05-20 Nok Corp 表面欠陥検査方法
JPS617406A (ja) * 1984-06-21 1986-01-14 Mitsubishi Electric Corp 物体形状の欠陥検出方法
JPS6252454A (ja) * 1985-08-30 1987-03-07 Daido Steel Co Ltd 螢光磁粉探傷における疵判定方法および装置
JPS62231069A (ja) * 1986-03-28 1987-10-09 株式会社日立製作所 検反機の欠点検出方法
JPS6344281A (ja) * 1986-08-08 1988-02-25 Sanyo Electric Co Ltd 画像処理装置
JPS63175976A (ja) * 1987-01-16 1988-07-20 Toshiba Corp 探傷検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010091410A (ja) * 2008-10-08 2010-04-22 Aisin Seiki Co Ltd 欠陥検査装置

Also Published As

Publication number Publication date
JP2508662Y2 (ja) 1996-08-28

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term