JPH0479250U - - Google Patents

Info

Publication number
JPH0479250U
JPH0479250U JP12291490U JP12291490U JPH0479250U JP H0479250 U JPH0479250 U JP H0479250U JP 12291490 U JP12291490 U JP 12291490U JP 12291490 U JP12291490 U JP 12291490U JP H0479250 U JPH0479250 U JP H0479250U
Authority
JP
Japan
Prior art keywords
flaw
candidate
difference
defect
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12291490U
Other languages
English (en)
Japanese (ja)
Other versions
JP2508662Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990122914U priority Critical patent/JP2508662Y2/ja
Publication of JPH0479250U publication Critical patent/JPH0479250U/ja
Application granted granted Critical
Publication of JP2508662Y2 publication Critical patent/JP2508662Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1990122914U 1990-11-22 1990-11-22 疵検出装置 Expired - Lifetime JP2508662Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990122914U JP2508662Y2 (ja) 1990-11-22 1990-11-22 疵検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990122914U JP2508662Y2 (ja) 1990-11-22 1990-11-22 疵検出装置

Publications (2)

Publication Number Publication Date
JPH0479250U true JPH0479250U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-07-10
JP2508662Y2 JP2508662Y2 (ja) 1996-08-28

Family

ID=31870649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990122914U Expired - Lifetime JP2508662Y2 (ja) 1990-11-22 1990-11-22 疵検出装置

Country Status (1)

Country Link
JP (1) JP2508662Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010091410A (ja) * 2008-10-08 2010-04-22 Aisin Seiki Co Ltd 欠陥検査装置

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917088A (ja) * 1982-07-21 1984-01-28 株式会社日立製作所 減圧オリフイス
JPS59224546A (ja) * 1983-06-03 1984-12-17 Matsushita Electric Works Ltd 欠陥検出装置
JPS59225338A (ja) * 1983-06-06 1984-12-18 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS59226853A (ja) * 1983-06-07 1984-12-20 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS6089734A (ja) * 1983-10-24 1985-05-20 Nok Corp 表面欠陥検査方法
JPS617406A (ja) * 1984-06-21 1986-01-14 Mitsubishi Electric Corp 物体形状の欠陥検出方法
JPS6252454A (ja) * 1985-08-30 1987-03-07 Daido Steel Co Ltd 螢光磁粉探傷における疵判定方法および装置
JPS62231069A (ja) * 1986-03-28 1987-10-09 株式会社日立製作所 検反機の欠点検出方法
JPS6344281A (ja) * 1986-08-08 1988-02-25 Sanyo Electric Co Ltd 画像処理装置
JPS63175976A (ja) * 1987-01-16 1988-07-20 Toshiba Corp 探傷検査装置

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917088A (ja) * 1982-07-21 1984-01-28 株式会社日立製作所 減圧オリフイス
JPS59224546A (ja) * 1983-06-03 1984-12-17 Matsushita Electric Works Ltd 欠陥検出装置
JPS59225338A (ja) * 1983-06-06 1984-12-18 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS59226853A (ja) * 1983-06-07 1984-12-20 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS6089734A (ja) * 1983-10-24 1985-05-20 Nok Corp 表面欠陥検査方法
JPS617406A (ja) * 1984-06-21 1986-01-14 Mitsubishi Electric Corp 物体形状の欠陥検出方法
JPS6252454A (ja) * 1985-08-30 1987-03-07 Daido Steel Co Ltd 螢光磁粉探傷における疵判定方法および装置
JPS62231069A (ja) * 1986-03-28 1987-10-09 株式会社日立製作所 検反機の欠点検出方法
JPS6344281A (ja) * 1986-08-08 1988-02-25 Sanyo Electric Co Ltd 画像処理装置
JPS63175976A (ja) * 1987-01-16 1988-07-20 Toshiba Corp 探傷検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010091410A (ja) * 2008-10-08 2010-04-22 Aisin Seiki Co Ltd 欠陥検査装置

Also Published As

Publication number Publication date
JP2508662Y2 (ja) 1996-08-28

Similar Documents

Publication Publication Date Title
KR940019155A (ko) 디지탈 영상 데이타의 보간 방법 및 회로
JPH0479250U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH04198741A (ja) 形状欠陥検出装置
JPH10105689A (ja) 移動体挙動検知装置
JPH0434653U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP3251716B2 (ja) 画像処理装置
JP2590999B2 (ja) 画像信号の動ベクトル検出装置
JPH0793894A (ja) デジタル磁気記録再生装置
JP2716276B2 (ja) 内部部品配置決定処理方式
JPH01142068U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
KR100213027B1 (ko) 영상신호 잡음제거기
JPH0719292B2 (ja) 画像特徴点検出方法
Yuen et al. A coarse-to-fine approach for circle detection
JPH01142069U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH02132965A (ja) 画像処理装置
KR100644571B1 (ko) 임펄스 노이즈 제거장치
JPS6214874U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
Chapelle et al. Automation in Photogrammetric Compilation
JPH09138220A (ja) ２次元信号フィルタリング装置
JPS60250487A (ja) 差分統計量測定装置
JPS6066176U (ja) クランプレベル制御回路
JPH02143664U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPS59114679U (ja) ビデオ環境監視装置
JPS62121638U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH0322420U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term