JPH0479150B2 - - Google Patents
Info
- Publication number
- JPH0479150B2 JPH0479150B2 JP57143702A JP14370282A JPH0479150B2 JP H0479150 B2 JPH0479150 B2 JP H0479150B2 JP 57143702 A JP57143702 A JP 57143702A JP 14370282 A JP14370282 A JP 14370282A JP H0479150 B2 JPH0479150 B2 JP H0479150B2
- Authority
- JP
- Japan
- Prior art keywords
- gate electrode
- film
- mosix
- semiconductor device
- mos
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
Landscapes
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57143702A JPS5933875A (ja) | 1982-08-19 | 1982-08-19 | Mos型半導体装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57143702A JPS5933875A (ja) | 1982-08-19 | 1982-08-19 | Mos型半導体装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5933875A JPS5933875A (ja) | 1984-02-23 |
| JPH0479150B2 true JPH0479150B2 (enrdf_load_stackoverflow) | 1992-12-15 |
Family
ID=15344978
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57143702A Granted JPS5933875A (ja) | 1982-08-19 | 1982-08-19 | Mos型半導体装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5933875A (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002073700A1 (en) * | 2001-03-02 | 2002-09-19 | National Institute For Materials Science | Gate and cmos structure and mos structure |
| US6991948B2 (en) | 2003-11-05 | 2006-01-31 | Solid State Measurements, Inc. | Method of electrical characterization of a silicon-on-insulator (SOI) wafer |
| US7327155B2 (en) | 2005-11-17 | 2008-02-05 | Solid State Measurements, Inc. | Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55121667A (en) * | 1979-03-13 | 1980-09-18 | Seiko Epson Corp | Integrated circuit |
-
1982
- 1982-08-19 JP JP57143702A patent/JPS5933875A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5933875A (ja) | 1984-02-23 |
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