JPH04732Y2 - - Google Patents

Info

Publication number
JPH04732Y2
JPH04732Y2 JP4782586U JP4782586U JPH04732Y2 JP H04732 Y2 JPH04732 Y2 JP H04732Y2 JP 4782586 U JP4782586 U JP 4782586U JP 4782586 U JP4782586 U JP 4782586U JP H04732 Y2 JPH04732 Y2 JP H04732Y2
Authority
JP
Japan
Prior art keywords
desk
rotary plate
plate
office automation
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP4782586U
Other languages
English (en)
Japanese (ja)
Other versions
JPS62159745U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4782586U priority Critical patent/JPH04732Y2/ja
Publication of JPS62159745U publication Critical patent/JPS62159745U/ja
Application granted granted Critical
Publication of JPH04732Y2 publication Critical patent/JPH04732Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Tables And Desks Characterized By Structural Shape (AREA)
JP4782586U 1986-03-31 1986-03-31 Expired JPH04732Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4782586U JPH04732Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1986-03-31 1986-03-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4782586U JPH04732Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1986-03-31 1986-03-31

Publications (2)

Publication Number Publication Date
JPS62159745U JPS62159745U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-10-09
JPH04732Y2 true JPH04732Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-01-10

Family

ID=30868796

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4782586U Expired JPH04732Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1986-03-31 1986-03-31

Country Status (1)

Country Link
JP (1) JPH04732Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7292057B2 (en) 1999-06-30 2007-11-06 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7295025B2 (en) 2002-11-08 2007-11-13 Cascade Microtech, Inc. Probe station with low noise characteristics
US7330023B2 (en) 1992-06-11 2008-02-12 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7468609B2 (en) 2003-05-06 2008-12-23 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7504823B2 (en) 2004-06-07 2009-03-17 Cascade Microtech, Inc. Thermal optical chuck
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7639003B2 (en) 2002-12-13 2009-12-29 Cascade Microtech, Inc. Guarded tub enclosure

Cited By (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7492147B2 (en) 1992-06-11 2009-02-17 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7595632B2 (en) 1992-06-11 2009-09-29 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7589518B2 (en) 1992-06-11 2009-09-15 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7330023B2 (en) 1992-06-11 2008-02-12 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7436170B2 (en) 1997-06-06 2008-10-14 Cascade Microtech, Inc. Probe station having multiple enclosures
US7626379B2 (en) 1997-06-06 2009-12-01 Cascade Microtech, Inc. Probe station having multiple enclosures
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7616017B2 (en) 1999-06-30 2009-11-10 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7292057B2 (en) 1999-06-30 2007-11-06 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7514915B2 (en) 2000-09-05 2009-04-07 Cascade Microtech, Inc. Chuck for holding a device under test
US7518358B2 (en) 2000-09-05 2009-04-14 Cascade Microtech, Inc. Chuck for holding a device under test
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7423419B2 (en) 2000-09-05 2008-09-09 Cascade Microtech, Inc. Chuck for holding a device under test
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7501810B2 (en) 2000-09-05 2009-03-10 Cascade Microtech, Inc. Chuck for holding a device under test
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7295025B2 (en) 2002-11-08 2007-11-13 Cascade Microtech, Inc. Probe station with low noise characteristics
US7498828B2 (en) 2002-11-25 2009-03-03 Cascade Microtech, Inc. Probe station with low inductance path
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7639003B2 (en) 2002-12-13 2009-12-29 Cascade Microtech, Inc. Guarded tub enclosure
US7468609B2 (en) 2003-05-06 2008-12-23 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7876115B2 (en) 2003-05-23 2011-01-25 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7362115B2 (en) 2003-12-24 2008-04-22 Cascade Microtech, Inc. Chuck with integrated wafer support
US7504823B2 (en) 2004-06-07 2009-03-17 Cascade Microtech, Inc. Thermal optical chuck
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors

Also Published As

Publication number Publication date
JPS62159745U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-10-09

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