JPH0473259B2 - - Google Patents
Info
- Publication number
- JPH0473259B2 JPH0473259B2 JP60127251A JP12725185A JPH0473259B2 JP H0473259 B2 JPH0473259 B2 JP H0473259B2 JP 60127251 A JP60127251 A JP 60127251A JP 12725185 A JP12725185 A JP 12725185A JP H0473259 B2 JPH0473259 B2 JP H0473259B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- laser
- vacuum chamber
- laser beam
- nozzle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60127251A JPS61285649A (ja) | 1985-06-13 | 1985-06-13 | レ−ザ−質量分析装置 |
| US06/873,376 US4740692A (en) | 1985-06-13 | 1986-06-12 | Laser mass spectroscopic analyzer and method |
| GB08614362A GB2177507B (en) | 1985-06-13 | 1986-06-12 | Laser mass spectroscopic analyzer |
| DE19863619886 DE3619886A1 (de) | 1985-06-13 | 1986-06-13 | Vorrichtung zur massenspektrometrischen analyse |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60127251A JPS61285649A (ja) | 1985-06-13 | 1985-06-13 | レ−ザ−質量分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61285649A JPS61285649A (ja) | 1986-12-16 |
| JPH0473259B2 true JPH0473259B2 (en:Method) | 1992-11-20 |
Family
ID=14955426
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60127251A Granted JPS61285649A (ja) | 1985-06-13 | 1985-06-13 | レ−ザ−質量分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61285649A (en:Method) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008146333A1 (ja) * | 2007-05-30 | 2008-12-04 | Shimadzu Corporation | 質量分析装置 |
-
1985
- 1985-06-13 JP JP60127251A patent/JPS61285649A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61285649A (ja) | 1986-12-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4740692A (en) | Laser mass spectroscopic analyzer and method | |
| US4733073A (en) | Method and apparatus for surface diagnostics | |
| Murray et al. | High resolution laser mass spectrometry bioimaging | |
| US20050230615A1 (en) | MALDI-IM-ortho-TOF mass spectrometry with simultaneous positive and negative mode detection | |
| CA2333721A1 (en) | Pulsed ion source for ion trap mass spectrometer | |
| GB2029634A (en) | Ionising organic substances for mass spectroscopy | |
| CN107731653B (zh) | 利用电子碰撞电离的分析设备 | |
| EP0418785B1 (en) | Method and apparatus for mass spectrometric analysis | |
| WO2009013481A2 (en) | Method and apparatus for the analysis of samples | |
| JPH0473259B2 (en:Method) | ||
| WO2004109742A3 (en) | Rod assembly in ion source | |
| CN209843661U (zh) | 基质辅助激光解吸电离飞行时间质谱仪 | |
| US5256874A (en) | Gridded electron reversal ionizer | |
| Van Vaeck et al. | Microscopical speciation analysis with laser microprobe mass spectrometry and static secondary ion mass spectrometry | |
| JPS6355846A (ja) | 二次中性粒子質量分析装置 | |
| EP0167561B1 (en) | Method and apparatus for surface diagnostics | |
| JPH0830695B2 (ja) | 液体クロマトグラフ・質量分析装置 | |
| JPH0542105B2 (en:Method) | ||
| JP2001216933A (ja) | アトムプローブ電界イオン顕微鏡 | |
| JP2574792B2 (ja) | 深さ方向の元素分布分析法 | |
| Chutjian | Gridded electron reversal ionizer | |
| JPS645745B2 (en:Method) | ||
| JPH075129A (ja) | イオン散乱表面分析方法及び装置 | |
| Li | Development of Membrane Funnel-based Spray Ionization Mass Spectrometry | |
| JPH02100298A (ja) | 高速原子源 |