JPH0464716U - - Google Patents
Info
- Publication number
- JPH0464716U JPH0464716U JP10807090U JP10807090U JPH0464716U JP H0464716 U JPH0464716 U JP H0464716U JP 10807090 U JP10807090 U JP 10807090U JP 10807090 U JP10807090 U JP 10807090U JP H0464716 U JPH0464716 U JP H0464716U
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- adhesion amount
- filter
- sample
- radiation source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005855 radiation Effects 0.000 claims description 13
- 238000011088 calibration curve Methods 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims 2
- 239000010410 layer Substances 0.000 claims 2
- 230000003287 optical effect Effects 0.000 claims 2
- 239000012790 adhesive layer Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 239000011888 foil Substances 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10807090U JPH0464716U (enExample) | 1990-10-15 | 1990-10-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10807090U JPH0464716U (enExample) | 1990-10-15 | 1990-10-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0464716U true JPH0464716U (enExample) | 1992-06-03 |
Family
ID=31854864
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10807090U Pending JPH0464716U (enExample) | 1990-10-15 | 1990-10-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0464716U (enExample) |
-
1990
- 1990-10-15 JP JP10807090U patent/JPH0464716U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2753517B2 (ja) | １つまたは複数の円形偏心ファントムを用いたｘ線スキャナの較正方法とシステム | |
| SE8702244D0 (sv) | Method and apparatus for noncontacting tension measurement in a flat foil and especially in a paper web | |
| CA2251838A1 (en) | Remote position sensing apparatus and method | |
| JPH0271207U (enExample) | ||
| JP2000171390A5 (enExample) | ||
| JPH0464716U (enExample) | ||
| JPH0220159U (enExample) | ||
| GB2098320A (en) | Measuring the thickness of a film on a member | |
| JPS58112909U (ja) | Ｘ線膜厚装置 | |
| JP4613613B2 (ja) | 物理量測定方法 | |
| JPS54100281A (en) | Tomograph | |
| JPH0562709B2 (enExample) | ||
| JPS60193699U (ja) | Ｘ線自動露出制御器 | |
| JPS6270785A (ja) | Ｘ線ｃｔ用ｘ線検出器 | |
| JPS6292486U (enExample) | ||
| JPS58112908U (ja) | Ｘ線膜厚装置 | |
| JPH0333355U (enExample) | ||
| JPS56162837A (en) | Electron beam exposure device | |
| JPS59154602U (ja) | 膜厚測定装置 | |
| JPS59103260U (ja) | 放射線応用測定装置 | |
| JPS61155758U (enExample) | ||
| JPH0318171U (enExample) | ||
| JP2549435Y2 (ja) | 放射線測定装置 | |
| JPH0299342U (enExample) | ||
| JPS6095312A (ja) | 押出しコ−テイング膜厚測定方法および測定装置 |