JPH0464426B2 - - Google Patents

Info

Publication number
JPH0464426B2
JPH0464426B2 JP59082698A JP8269884A JPH0464426B2 JP H0464426 B2 JPH0464426 B2 JP H0464426B2 JP 59082698 A JP59082698 A JP 59082698A JP 8269884 A JP8269884 A JP 8269884A JP H0464426 B2 JPH0464426 B2 JP H0464426B2
Authority
JP
Japan
Prior art keywords
temperature
signal
ion
vsoo
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59082698A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60225056A (ja
Inventor
Hidenori Gion
Kenji Kubota
Michihiro Nakamura
Makoto Yano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kuraray Co Ltd
Original Assignee
Kuraray Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kuraray Co Ltd filed Critical Kuraray Co Ltd
Priority to JP59082698A priority Critical patent/JPS60225056A/ja
Priority to US06/622,250 priority patent/US4641249A/en
Priority to DE8484107120T priority patent/DE3485624D1/de
Priority to EP84107120A priority patent/EP0129852B1/en
Publication of JPS60225056A publication Critical patent/JPS60225056A/ja
Publication of JPH0464426B2 publication Critical patent/JPH0464426B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/403Cells and electrode assemblies
    • G01N27/414Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
    • G01N27/4148Integrated circuits therefor, e.g. fabricated by CMOS processing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electrochemistry (AREA)
  • Molecular Biology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP59082698A 1983-06-22 1984-04-24 イオンモニタ装置 Granted JPS60225056A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP59082698A JPS60225056A (ja) 1984-04-24 1984-04-24 イオンモニタ装置
US06/622,250 US4641249A (en) 1983-06-22 1984-06-19 Method and device for compensating temperature-dependent characteristic changes in ion-sensitive FET transducer
DE8484107120T DE3485624D1 (de) 1983-06-22 1984-06-20 Verfahren und einrichtung zur kompensation von temperaturabhaengigen eigenschaftsaenderungen in ionenempfindlichen feldeffekttransistor-sensoren.
EP84107120A EP0129852B1 (en) 1983-06-22 1984-06-20 Method and device for compensating temperature-dependent characteristic changes in ion-sensitive fet transducer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59082698A JPS60225056A (ja) 1984-04-24 1984-04-24 イオンモニタ装置

Publications (2)

Publication Number Publication Date
JPS60225056A JPS60225056A (ja) 1985-11-09
JPH0464426B2 true JPH0464426B2 (enExample) 1992-10-14

Family

ID=13781625

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59082698A Granted JPS60225056A (ja) 1983-06-22 1984-04-24 イオンモニタ装置

Country Status (1)

Country Link
JP (1) JPS60225056A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7088541B2 (ja) * 2018-05-24 2022-06-21 ラピスセミコンダクタ株式会社 測定装置及び測定方法
WO2020116410A1 (ja) * 2018-12-06 2020-06-11 株式会社日立ハイテク 自動分析装置
EP4386369A1 (en) * 2022-12-16 2024-06-19 Imec VZW An automated calibration loop for a bio-fet

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS604851A (ja) * 1983-06-22 1985-01-11 Kuraray Co Ltd イオン感応性電界効果トランジスタの使用方法およびイオンモニタ装置

Also Published As

Publication number Publication date
JPS60225056A (ja) 1985-11-09

Similar Documents

Publication Publication Date Title
EP0129852B1 (en) Method and device for compensating temperature-dependent characteristic changes in ion-sensitive fet transducer
CA1228398A (en) Apparatus for determining the activity of an ion (pion) in a liquid
US4218746A (en) Method and apparatus for calibrating ion concentration measurement
US4490678A (en) Method of and an apparatus for measuring ion concentrations in solutions
EP0352537B1 (en) Temperature compensation for potentiometrically operated isfets
US10900929B2 (en) PH value measuring device comprising in situ calibration means
HK1008715B (en) Temperature compensation for potentiometrically operated isfets
US7981264B2 (en) Drift calibration method and device for the potentiometric sensor
EP2972265B1 (en) Low slope ph electrode with charge transfer component
CN107607144B (zh) 一种传感器基线漂移校正方法及检测设备
JPH0464426B2 (enExample)
US20070000778A1 (en) Multi-parameter sensor with readout circuit
CN107607143B (zh) 一种传感器基线漂移校正的方法以及检测设备
JPH0682115B2 (ja) イオンモニタ装置
KR910006276B1 (ko) 감이온 전계효과 트랜지스터를 이용한 이온농도 측정 회로
US3095535A (en) Digital ph meter
JPH05322843A (ja) イオン電極を用いた電解質分析装置
JPH0422220B2 (enExample)
Jamasb et al. Correction of instability in ion-selective field effect transistors (ISFETs) for accurate continuous monitoring of pH
KR0151940B1 (ko) 휴대용 용존산소 계측장치
JPS607355A (ja) イオン活量測定装置
JP3358683B2 (ja) 温湿度測定方法及び装置
TW201202692A (en) Measurement device and measurement method utilizing the same
JPH11174011A (ja) アンモニア濃度計
JPH05133927A (ja) pH測定装置及びその校正方法

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term