JPH0460553B2 - - Google Patents
Info
- Publication number
- JPH0460553B2 JPH0460553B2 JP61005516A JP551686A JPH0460553B2 JP H0460553 B2 JPH0460553 B2 JP H0460553B2 JP 61005516 A JP61005516 A JP 61005516A JP 551686 A JP551686 A JP 551686A JP H0460553 B2 JPH0460553 B2 JP H0460553B2
- Authority
- JP
- Japan
- Prior art keywords
- type
- pin
- rotary table
- probe
- lead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 19
- 238000007689 inspection Methods 0.000 claims description 18
- 239000002184 metal Substances 0.000 claims description 17
- 230000000630 rising effect Effects 0.000 claims description 3
- 238000012360 testing method Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 5
- 230000002950 deficient Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 239000011295 pitch Substances 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61005516A JPS62167486A (ja) | 1986-01-13 | 1986-01-13 | Can型ic用自動検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61005516A JPS62167486A (ja) | 1986-01-13 | 1986-01-13 | Can型ic用自動検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62167486A JPS62167486A (ja) | 1987-07-23 |
| JPH0460553B2 true JPH0460553B2 (enExample) | 1992-09-28 |
Family
ID=11613355
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61005516A Granted JPS62167486A (ja) | 1986-01-13 | 1986-01-13 | Can型ic用自動検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62167486A (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2546611Y2 (ja) * | 1990-10-22 | 1997-09-03 | 株式会社アドバンテスト | Ic試験装置 |
| US8798305B2 (en) | 2004-07-06 | 2014-08-05 | Kaddan Entertainment, Inc. | System and method for securing headphone transducers |
| JP4008445B2 (ja) * | 2004-11-01 | 2007-11-14 | アンリツ株式会社 | テストフィクスチャ |
| WO2015191724A2 (en) | 2014-06-12 | 2015-12-17 | Kaddan Entertainment | System and method for managing headphone wires |
-
1986
- 1986-01-13 JP JP61005516A patent/JPS62167486A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62167486A (ja) | 1987-07-23 |
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