JPH0459516A - Wafer housing transfer device - Google Patents

Wafer housing transfer device

Info

Publication number
JPH0459516A
JPH0459516A JP17106590A JP17106590A JPH0459516A JP H0459516 A JPH0459516 A JP H0459516A JP 17106590 A JP17106590 A JP 17106590A JP 17106590 A JP17106590 A JP 17106590A JP H0459516 A JPH0459516 A JP H0459516A
Authority
JP
Japan
Prior art keywords
boat
port
transfer
heat treatment
transfer device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17106590A
Other languages
Japanese (ja)
Other versions
JP2845580B2 (en
Inventor
Hironobu Nishi
西 寛信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Sagami Ltd
Original Assignee
Tokyo Electron Sagami Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Sagami Ltd filed Critical Tokyo Electron Sagami Ltd
Priority to JP2171065A priority Critical patent/JP2845580B2/en
Priority to KR1019910010737A priority patent/KR0153250B1/en
Priority to US07/723,382 priority patent/US5178639A/en
Publication of JPH0459516A publication Critical patent/JPH0459516A/en
Application granted granted Critical
Publication of JP2845580B2 publication Critical patent/JP2845580B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To enable manufacture of high-quality wafers by providing a means for forming a purifying gas flow in the transfer space of wafer housings, so that when the wafers are transferred, clean transfer without adhesion of dust or particles can be carried out. CONSTITUTION:A port 11 for supporting a semiconductor wafer W is insertedly held by the fitting part 25 of a port turning device 21 which has been moved to the position of the port 11 by a horizontally driving mechanism 22, and further is supported to the driving mechanism 22 vertically from the horizontal position by means of a driving mechanism 24 of the turning device 21 that has been moved in a prescribed position. Then, the turning device 21 is further lowered by a vertically driving mechanism 23 to place the vertically supported port 11 in the port placing position of a port transfer device 6. At that time, fans 31 in the transfer device 6 are operated to positively take in the downdraft from a clean room through an air filter 30, so that a purifying gas flow B can be formed in the space k1. And the transfer device 6 conveys the port 11 along a transfer passage 26 up to the front of a desired heat treatment furnace 7 (not shown), and moves it to the position of a robot arm 33 (not shown) of a heat treatment furnace 5.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はウェハ収納具搬送装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a wafer storage device conveyance device.

[従来の技術] 従来から半導体ウェハや液晶ウェハの製造工程において
、酸化膜、金属膜、単結晶膜等を成膜を行ったり、不純
物拡散等を行う酸化装置、CVD装置、エピタキシャル
装置、拡散装置等の熱処理装置がある。これらの熱処理
装置は、反応管を囲繞してコイルヒータを配設し、50
0〜1250℃に加熱して反応管内に配置される半導体
ウェハ上に成膜を行なったり、不純物を拡散させている
[Prior art] Conventionally, in the manufacturing process of semiconductor wafers and liquid crystal wafers, oxidation equipment, CVD equipment, epitaxial equipment, and diffusion equipment have been used to form oxide films, metal films, single crystal films, etc., and to diffuse impurities. There are heat treatment equipment such as These heat treatment devices are equipped with a coil heater surrounding the reaction tube, and
A film is formed on a semiconductor wafer placed in a reaction tube by heating it to 0 to 1250° C., and impurities are diffused.

熱処理装置内で半導体ウェハのこのような反応を行う際
には、高温に耐え、しかも高温により不純物が生じない
熱に対して安定性の高い半導体ウェハの支持体が必要で
あり、このような条件を満足する石英ボートが用いられ
ている。熱処理を行うためには、半導体ウェハが収納さ
れているキャリアの保管室からキャリアを搬出し、ウェ
ハ移載装置に搬送し、同じく石英ボートの保管室からウ
ェハ移載装置に搬送された石英ボートに半導体ウェハの
移載を行う。その後、半導体ウェハを載置した石英ボー
トは多数設けられた熱処理炉のうちの所望の熱処理炉へ
搬送される。
When carrying out such a reaction of semiconductor wafers in a heat treatment equipment, a support for the semiconductor wafer is required that can withstand high temperatures and has high thermal stability without impurities generated by high temperatures. A quartz boat is used that satisfies the following. To perform heat treatment, the carrier is taken out of the carrier storage room where the semiconductor wafers are stored, transported to the wafer transfer device, and then transferred to the quartz boat that was also transported from the storage room of the quartz boat to the wafer transfer device. Transfers semiconductor wafers. Thereafter, the quartz boat carrying the semiconductor wafers is transported to a desired heat treatment furnace among the many heat treatment furnaces provided.

[発明が解決すべき課題] このような熱処理装置はクリーンルームに配置されるが
、キャリアを収納する保管室は、上面にエアフィルタを
設け、底面に設けたファンにより積極的にクリーンルー
ムのダウンフローを取り入れ、キャリア収納棚を移動さ
せる駆動機構により発生するゴミ、パーティクルをダウ
ンフローにょり除去するようになっていた。しかし、こ
れらの保管室からキャリアや石英ボートを搬出する搬送
系やキャリアから半導体ウェハを移載された石英ボート
の搬送系はクリーンルーム内にあっても駆動機構により
、ゴミ、パーティクルが生じるものであって、ゴミ、パ
ーティクルが半導体ウェハに付着すると半導体素子の歩
留りを低下させるという欠点があった。近年特に、半導
体が高集積化を要求されるに伴い、ゴミ、パーティクル
は重要な問題となって来ており、搬送系における微小な
ゴミ、パーティクルと言えども無視できなくなった。
[Problems to be Solved by the Invention] Such heat treatment equipment is placed in a clean room, but the storage room that stores the carriers is equipped with an air filter on the top and a fan installed on the bottom to actively control the downflow of the clean room. Dust and particles generated by the drive mechanism that moves the carrier storage shelves are removed by downflow. However, even in a clean room, the drive mechanism of the transport system for transporting carriers and quartz boats from these storage rooms and the transport system for the quartz boats on which semiconductor wafers are transferred from the carriers generates dust and particles. However, when dust and particles adhere to semiconductor wafers, there is a drawback that the yield of semiconductor devices decreases. Particularly in recent years, as semiconductors are required to be highly integrated, dust and particles have become an important problem, and even minute dust and particles in the transport system can no longer be ignored.

本発明は上記の欠点を解消するだめさなれたものであっ
て、ウェハの搬送時にゴミ、パーティクルの付着が生じ
ないクリーンな搬送を行なうことができ、そのため高品
質なウェハを製造することができるウェハ収納具搬送装
置を提供することを目的とする。
The present invention has been developed to solve the above-mentioned drawbacks, and it is possible to carry out clean transfer of wafers without the adhesion of dust or particles during wafer transfer, thereby making it possible to manufacture high-quality wafers. An object of the present invention is to provide a wafer storage device conveyance device.

[課題を解決するための手段] 上記の目的を達成するため、本発明のウェハ収納具搬送
装置は、ウェハを支持するウェハ収納具の載置台と、前
記載置台を移動させる搬送手段とを備えたウェハ収納具
搬送装置において、前記ウェハ収納具の搬送される空間
に清浄化気体流を形成する手段を備えたものである。
[Means for Solving the Problems] In order to achieve the above object, a wafer storage device transport device of the present invention includes a wafer storage device mounting table that supports wafers, and a transport means for moving the aforementioned mounting table. The wafer storage device conveying device is provided with means for forming a cleaning gas flow in a space in which the wafer storage device is transported.

[作用コ ウェハを載置したウェハ収納具を処理装置に搬送するウ
ェハ収納具搬送装置は、ウェハ収納具の搬送される空間
に清浄化気流を形成させる。そのためウェハ収納具の搬
送中に、搬送装置からゴミ、パーティクルが発生しても
ウェハに付着するのを防止することができる。
[Working] The wafer storage device transporting device that transports the wafer storage device on which the wafer is placed to the processing device forms a cleaning airflow in the space in which the wafer storage device is transported. Therefore, even if dust and particles are generated from the transport device during transport of the wafer storage device, it is possible to prevent them from adhering to the wafers.

[実施例コ 本発明のウェハ収納具搬送装置を半導体製造の熱処理装
置に適用した一実施例を図面を参照して説明する。
[Example 1] An example in which the wafer storage device conveying apparatus of the present invention is applied to a heat treatment apparatus for semiconductor manufacturing will be described with reference to the drawings.

第1図に示す熱処理装置1は、主に半導体ウェハを収納
したキャリアを多数保管する保管室2と、半導体ウェハ
を支持するウェハ収納具である熱処理用の石英ボートを
多数保管する保管室3と、これらの保管室2及び3に隣
接して設けられ、保管室2から搬送されたキャリアから
石英ボートに半導体ウェハを移載する移載装置4と、半
導体ウェハの熱処理を行う反応装置である複数の例えば
3台の熱処理炉5と、この熱処理炉5へ移載装置4から
未処理の半導体ウェハを支持した石英ボートを搬送した
りあるいは熱処理済の半導体ウェハを熱処理炉5から移
載装置4へ搬送を行うウェハ収納具搬送装置であるボー
ト搬送装置6とから成っている。熱処理装置1を構成す
るキャリアを保管する保管室2は、多段の棚7を備え、
可動機構8に設けられた図示しないキャリア移載機によ
り複数のキャリア例えば6個のキャリアを一度に棚7に
載置されるようになっている。また、ボートを保管する
保管室3は例えば170枚の複数の半導体ウェハを水平
に収納可能なウェハ収納具であるボート11を長手方向
を垂直にして保管し、ボート11を移載装置4に搬送す
る図示しないボート搬送装置と、ボート搬送装置にボー
トを移載する図示しないボート移載装置とを備えている
。これらの保管室2及び3はそれぞれ密閉される外装体
12が設けられ、外装体12の上面には気体清浄化フィ
ルタ13が取着され、図示しないファンによりクリーン
ルームのダウンフローを積極的に取り入れるようになっ
ている。
The heat treatment apparatus 1 shown in FIG. 1 mainly consists of a storage chamber 2 in which a large number of carriers containing semiconductor wafers are stored, and a storage chamber 3 in which a large number of quartz boats for heat treatment, which are wafer storage devices that support semiconductor wafers, are stored. , a transfer device 4 that is provided adjacent to these storage chambers 2 and 3 and that transfers semiconductor wafers from carriers transported from the storage chamber 2 to a quartz boat, and a plurality of reaction devices that perform heat treatment on semiconductor wafers. For example, three heat treatment furnaces 5 and a quartz boat supporting unprocessed semiconductor wafers are transported from the transfer device 4 to the heat treatment furnace 5, or heat-treated semiconductor wafers are transferred from the heat treatment furnace 5 to the transfer device 4. It consists of a boat transport device 6, which is a wafer storage device transport device for transporting the wafers. A storage room 2 for storing carriers constituting the heat treatment apparatus 1 includes multi-stage shelves 7,
A plurality of carriers, for example, six carriers, are placed on the shelf 7 at one time by a carrier transfer device (not shown) provided on the movable mechanism 8. In addition, the storage room 3 for storing boats stores a boat 11, which is a wafer storage device capable of horizontally storing a plurality of semiconductor wafers, for example, 170 sheets, with its longitudinal direction vertical, and transports the boat 11 to the transfer device 4. The present invention includes a boat transfer device (not shown) for transferring the boat to the boat transfer device, and a boat transfer device (not shown) for transferring the boat to the boat transfer device. These storage rooms 2 and 3 are each provided with a sealed exterior body 12, and a gas purifying filter 13 is attached to the upper surface of the exterior body 12, so that the downflow from the clean room is actively taken in by a fan (not shown). It has become.

これらの保管室2及び3に隣接されて設けられる移載装
置4は第2図に示すように、1つのキャリア10に収納
された全半導体ウェハWを上昇して同時に支持する上下
駆動機構14に接続された支持体15が備えられる。支
持体15により上昇支持された半導体ウェハWを左右か
ら挟持する挟持体16が水平及び垂直駆動機構17に接
続されて設けられ、ボート11上に移載するようになっ
ている。これらを備えた移載装置4は外装体18により
密閉され、熱処理装置1が配置されるクリーンルームか
ら移載空間Kを隔離して設けられる。
As shown in FIG. 2, a transfer device 4 provided adjacent to these storage chambers 2 and 3 is connected to a vertical drive mechanism 14 that lifts and simultaneously supports all the semiconductor wafers W stored in one carrier 10. A connected support 15 is provided. A clamping body 16 that clamps the semiconductor wafer W lifted and supported by the support body 15 from the left and right is connected to a horizontal and vertical drive mechanism 17, and is adapted to be transferred onto the boat 11. The transfer device 4 equipped with these is sealed by an exterior body 18, and is provided so as to isolate the transfer space K from the clean room in which the heat treatment device 1 is arranged.

外装体18は塩ビやアクリル板等の滞電防止プラスチッ
ク材で形成され、内部が観察できるように透明になって
いる。外装体18の上面にはエアフィルタ19が設けら
れ、エアフィルタ19は0.1μφの粒子まで除去でき
るものである。外装体18で被われ、上面にエアフィル
タ19を取着した移載装置4は、第3図に示すように側
面及び底面に排気機構例えばファン20を備え、外装体
18に被われた移載装置4内に積極的に清浄空気流Aを
取り込むようになっている。
The exterior body 18 is made of an anti-static plastic material such as PVC or acrylic plate, and is transparent so that the inside can be observed. An air filter 19 is provided on the upper surface of the exterior body 18, and the air filter 19 is capable of removing particles down to 0.1 μφ. The transfer device 4, which is covered with an exterior body 18 and has an air filter 19 attached to its upper surface, is equipped with an exhaust mechanism, such as a fan 20, on the side and bottom surfaces, as shown in FIG. A clean air flow A is actively drawn into the device 4.

このような移載装置4で半導体ウェハWを満載したボー
ト11か水平支持から垂直支持に変換するボート回転装
置21が設けられる。ボート回転装置21は、水平駆動
機構22、垂直駆動機構23及び回転駆動機構24に接
続され、ボート11を支持する嵌合部25を有し、ボー
ト11を固定支持して回転することによりボート11を
水平支持から垂直支持に変換するようになっている。
Such a transfer device 4 is provided with a boat rotation device 21 for converting the boat 11 fully loaded with semiconductor wafers W from horizontal support to vertical support. The boat rotation device 21 is connected to a horizontal drive mechanism 22, a vertical drive mechanism 23, and a rotation drive mechanism 24, and has a fitting part 25 that supports the boat 11, and rotates while fixedly supporting the boat 11. It is designed to convert from horizontal support to vertical support.

さらにボート回転装置21によりボート11の受渡しが
行われるボート搬送装置6は搬送手段である搬送路26
及び搬送路26上を移動するステージ27に載置された
ボート載置台28を備える。
Furthermore, the boat conveyance device 6 through which the boat 11 is transferred by the boat rotation device 21 is connected to a conveyance path 26 which is a conveyance means.
and a boat mounting table 28 placed on a stage 27 that moves on a transport path 26.

ボート搬送装置6は搬送路26上の空間に1全体を密閉
して被う外装体29を備え、上面にはエアフィルタ30
が複数設けられる。この外装体29及びエアフィルタ3
0は移載装置4の材質と同材であり、第4図に示すよう
に外装体29の底面及び側面にファン31を設け、エア
フィルタ30からクリーンリームのダウンフローを積極
的に取り入れる清浄化気体流Bを形成する手段を成して
いる。
The boat transport device 6 includes an exterior body 29 that seals and covers the space above the transport path 26, and an air filter 30 on the top surface.
There are multiple. This exterior body 29 and air filter 3
0 is made of the same material as the transfer device 4, and as shown in FIG. 4, a fan 31 is provided on the bottom and side surfaces of the exterior body 29, and the downflow of clean ream is actively taken in from the air filter 30 for cleaning. It constitutes a means for forming a gas flow B.

熱処理炉5は処理部31及び搬送部32から成り、搬送
部32はボート搬送装置6により搬送されたボート11
をボート載置台28から受取るロボットアーム33と、
ロボットアーム33が回転してボート11を受は渡され
る上下駆動機構34を備えている。上下駆動機構34は
図示しない反応管のヒータ等が装備された処理部31に
ボート11を挿入するようになっている。
The heat treatment furnace 5 consists of a processing section 31 and a conveyance section 32, and the conveyance section 32 includes a boat 11 conveyed by a boat conveyance device 6.
a robot arm 33 that receives from the boat platform 28;
A vertical drive mechanism 34 is provided in which the robot arm 33 rotates to receive and pass the boat 11. The vertical drive mechanism 34 inserts the boat 11 into a processing section 31 equipped with a reaction tube heater (not shown) and the like.

このような構成の熱処理装置1の動作を説明する。The operation of the heat treatment apparatus 1 having such a configuration will be explained.

保管室2に収納された所望の複数のキャリア10を図示
しない搬送装置により移載装M4に搬入する。一方、保
管室3から1つのボート11を搬送系により移載装置4
の移載位置まで搬送する。
A plurality of desired carriers 10 stored in the storage room 2 are carried into the transfer mount M4 by a transport device (not shown). On the other hand, one boat 11 is transferred from the storage room 3 to the transfer device 4 by the transfer system.
Transport it to the transfer position.

この時移載装置4の底面及び側面に設けられたファン2
0を駆動させて上面のエアフィルタ19を介して清浄化
気体流を取り入れる。清浄空気流Aは外装体18により
移載装置4内がクリーンルームから隔離されているため
、効率よく移載空間Kを流れる。この清浄空気流域にお
いて、支持体15が上下駆動機構14により上昇され、
1つのキャリア10内に収納されている全ての半導体ウ
ェハWを一括して上昇させる。上昇された半導体ウェハ
Wを駆動機構17によりその位置まで水平移動された挟
持体16が左右から挟持し支持する。
At this time, fans 2 provided on the bottom and side surfaces of the transfer device 4
0 to take in a flow of clean gas through the air filter 19 on the top surface. The clean air flow A efficiently flows through the transfer space K because the interior of the transfer device 4 is isolated from the clean room by the exterior body 18. In this clean air region, the support 15 is raised by the vertical drive mechanism 14,
All semiconductor wafers W housed in one carrier 10 are raised at once. The raised semiconductor wafer W is held and supported from the left and right by the holding body 16, which is horizontally moved to that position by the drive mechanism 17.

支持体15は上下駆動機構14により下降し、挟持体1
6は駆動機構17によりボート11上に水平移動した後
、下降して半導体ウェハWをボート11に載置させる。
The support body 15 is lowered by the vertical drive mechanism 14, and the support body 15 is lowered by the vertical drive mechanism 14.
6 is horizontally moved onto the boat 11 by the drive mechanism 17, and then lowered to place the semiconductor wafer W on the boat 11.

そして挟持体が開いて半導体ウェハWの挟持を解除し上
昇して次のキャリア2の位置に移動する。以下、順次キ
ャリアについて上記の動作を反復し、半導体ウェハWを
ボート11に移載する。
Then, the holding body opens, releases the holding of the semiconductor wafer W, and rises to move to the next carrier 2 position. Thereafter, the above-mentioned operation is repeated for the carriers one after another, and the semiconductor wafers W are transferred to the boat 11.

半導体ウェハWを支持したボート11は水平駆動機構2
2によりボート11の位置まで移動されたボート回転装
置21の嵌合部25により挟持され、さらに水平駆動機
構22により所定の位置に移動されたボート回転装置2
1の回転駆動機構24により水平支持から垂直支持にさ
れる。ボート回転装置21はさらに垂直駆動機構23に
より下降され、垂直支持したボート11をボート搬送装
置6のボート載置位置に載置する。この時ボート搬送装
置6のファン31を作動させ、エアフィルタ30からク
リーンルームのダウンフローを積極的に取り入れ、空間
に1に清浄化気体流Bを形成する。ボート搬送装置6は
所望の熱処理炉7の前まで搬送路26に沿ってボート1
1を搬送し、ステージ27により熱処理炉5のロボット
アーム33の位置に移動する。そしてロボットアーム3
3に受渡されたボート11は上下駆動機構34により上
昇されて処理部31に挿入される。
The boat 11 supporting the semiconductor wafer W is a horizontal drive mechanism 2
2, the boat rotating device 2 is held by the fitting part 25 of the boat rotating device 21, which is moved to the position of the boat 11 by the boat rotating device 2, and is further moved to a predetermined position by the horizontal drive mechanism 22.
The rotational drive mechanism 24 of 1 changes the horizontal support to vertical support. The boat rotating device 21 is further lowered by the vertical drive mechanism 23 to place the vertically supported boat 11 on the boat loading position of the boat transport device 6. At this time, the fan 31 of the boat transport device 6 is activated to actively take in the downflow of the clean room from the air filter 30, thereby forming a clean gas flow B in the space 1. The boat transport device 6 transports the boat 1 along the transport path 26 to the front of the desired heat treatment furnace 7.
1 is transported and moved by the stage 27 to the position of the robot arm 33 of the heat treatment furnace 5. and robot arm 3
3, the boat 11 is lifted up by the vertical drive mechanism 34 and inserted into the processing section 31.

熱処理終了後は前述の動作を逆進させて、処理済の半導
体ウェハ8を載置したボート11は保管室3内に収納さ
れる。ここで常温になるまで半導体ウェハは冷却される
ため、加熱処理が終了した後熱処理装置内に長時間配置
されることなく直ちに次の処理を行うことができ、効率
的に順次熱処理を済ませる。
After the heat treatment is completed, the aforementioned operation is reversed, and the boat 11 carrying the processed semiconductor wafers 8 is stored in the storage chamber 3. Since the semiconductor wafer is cooled down to room temperature, the next process can be performed immediately after the heat treatment is completed without having to place it in the heat treatment apparatus for a long time, and the heat treatment can be efficiently completed one after another.

本発明は、半導体ウェハに限らず液晶ウェハを収納する
ボート搬送装置にも適用することができる。また、ウェ
ハ収納具は石英ボートに限らずウェハを収納するキャリ
アであってもよい。
The present invention can be applied not only to semiconductor wafers but also to boat transport devices for storing liquid crystal wafers. Further, the wafer storage device is not limited to a quartz boat, but may be a carrier for storing wafers.

[発明の効果] 以上の説明からも明らかなように本発明のウェハ収納具
搬送装置は、外装体を備え、ウェハ収納具の搬送される
空間に清浄化気流を積極的に形成するようにしたため、
搬送系により発生する微小なゴミ、パーティクルを速か
に除去でき、ウェハを常に非常にクリーンな雰囲気に維
持できる。そのためゴミ、パーティクル付着のためウェ
ハの歩留りを低下させることなく、品質の向上を計るこ
とができる。
[Effects of the Invention] As is clear from the above description, the wafer storage device transport device of the present invention includes an exterior body and actively forms a cleaning airflow in the space where the wafer storage device is transported. ,
Microscopic dust and particles generated by the transport system can be quickly removed, and wafers can always be kept in a very clean atmosphere. Therefore, it is possible to improve the quality without reducing the yield of wafers due to the adhesion of dust and particles.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明のウェハ収納具搬送装置を熱処理装置に
適用した一実施例の斜視図、第2図、第3図及び第4図
は第1図に示す一実施例の要部を示す図である。 6・・・・・・・・・ボート搬送装置 (ウェハ収納具搬送装置) 11・・・・・・ボート(ウェハ収納具)26・・・・
・・搬送路(搬送手段) 28・・・・・・載置台 29・・・・・・外装体(気流形成手段)30・・・・
・・エアフィルタ(気流形成手段)31・・・・・・フ
ァン(気流形成手段)W・・・・・・・・・半導体ウェ
ハ B・・・・・・・・・清浄化気体流 に1・・・・・・空間
FIG. 1 is a perspective view of an embodiment in which the wafer storage device transfer device of the present invention is applied to a heat treatment apparatus, and FIGS. 2, 3, and 4 show essential parts of the embodiment shown in FIG. 1. It is a diagram. 6...Boat transfer device (wafer storage device transfer device) 11...Boat (wafer storage device) 26...
...Conveyance path (conveyance means) 28...Placement table 29...Exterior body (airflow forming means) 30...
...Air filter (airflow forming means) 31...Fan (airflow forming means) W...Semiconductor wafer B...1 for cleaning gas flow ······space

Claims (1)

【特許請求の範囲】[Claims]  ウェハを支持するウェハ収納具の載置台と、前記載置
台を移動させる搬送手段とを備えたウェハ収納具搬送装
置において、前記ウェハ収納具の搬送される空間に清浄
化気体流を形成する手段を備えたことを特徴とするウェ
ハ収納具搬送装置。
A wafer storage device conveyance device comprising a wafer storage device mounting table for supporting wafers and a conveying means for moving the wafer storage device, comprising means for forming a cleaning gas flow in a space in which the wafer storage device is conveyed. A wafer storage device conveyance device characterized by comprising:
JP2171065A 1990-06-28 1990-06-28 Heat treatment equipment Expired - Fee Related JP2845580B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2171065A JP2845580B2 (en) 1990-06-28 1990-06-28 Heat treatment equipment
KR1019910010737A KR0153250B1 (en) 1990-06-28 1991-06-26 Vertical heat-treating apparatus
US07/723,382 US5178639A (en) 1990-06-28 1991-06-28 Vertical heat-treating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2171065A JP2845580B2 (en) 1990-06-28 1990-06-28 Heat treatment equipment

Publications (2)

Publication Number Publication Date
JPH0459516A true JPH0459516A (en) 1992-02-26
JP2845580B2 JP2845580B2 (en) 1999-01-13

Family

ID=15916400

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2171065A Expired - Fee Related JP2845580B2 (en) 1990-06-28 1990-06-28 Heat treatment equipment

Country Status (1)

Country Link
JP (1) JP2845580B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001008212A1 (en) * 1999-07-27 2001-02-01 Hitachi, Ltd. Device for opening/closing semiconductor container and method for producing semiconductor device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62116349A (en) * 1985-11-14 1987-05-27 三菱電機株式会社 Conveyor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62116349A (en) * 1985-11-14 1987-05-27 三菱電機株式会社 Conveyor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001008212A1 (en) * 1999-07-27 2001-02-01 Hitachi, Ltd. Device for opening/closing semiconductor container and method for producing semiconductor device

Also Published As

Publication number Publication date
JP2845580B2 (en) 1999-01-13

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