JPH0459515A - Wafer transfer device - Google Patents

Wafer transfer device

Info

Publication number
JPH0459515A
JPH0459515A JP2171064A JP17106490A JPH0459515A JP H0459515 A JPH0459515 A JP H0459515A JP 2171064 A JP2171064 A JP 2171064A JP 17106490 A JP17106490 A JP 17106490A JP H0459515 A JPH0459515 A JP H0459515A
Authority
JP
Japan
Prior art keywords
boat
transfer device
transfer
wafer
wafers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2171064A
Other languages
Japanese (ja)
Inventor
Hironobu Nishi
西 寛信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Sagami Ltd
Original Assignee
Tokyo Electron Sagami Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Sagami Ltd filed Critical Tokyo Electron Sagami Ltd
Priority to JP2171064A priority Critical patent/JPH0459515A/en
Priority to KR1019910010737A priority patent/KR0153250B1/en
Priority to US07/723,382 priority patent/US5178639A/en
Publication of JPH0459515A publication Critical patent/JPH0459515A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To maintain wafers in a clear condition even if a transfer device produces dust or particles, when the wafers are transferred between a carrier and a quartz port, by carrying out the transfer in such a condition that clean air flow has been taken into a closed exterior body. CONSTITUTION:A desired number of carriers 10 inside a storage chamber 2 are transferred into a transfer device 4 by a conveying device, and a port 11 is transferred to the transfer device of the device 4 from another storage chamber 3. At that time, fans 20 at the bottom and side of the device 4 are driven to take in a purifying air flow A through an air filter 19 at the upper surface thereof. Since the inside of the device 4 is isolated from a clean room by an exterior body 18, the air flow A is efficiently circulated in the transfer space K. In this purifying air flow region, a supporting body 15 is lifted by a vertically driving mechanism 14, and all the semiconductor wafers W inside a carrier 10 are collectively lifted, and are sandwichedly supported from right and left by an insertedly holding body 16 that has been horizontally moved to that position by a driving mechanism 17. Then, the supporting body 15 is lowered, and the insertedly holding body 16 is horizontally moved on the port 11, and then it is lowered and the wafer W is placed on the port 11.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はウェハ移載装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a wafer transfer device.

[従来の技術及び発明が解決しようとする課題〕従来か
ら半導体ウェハや液晶ウェハの製造工程において、酸化
膜、金属膜、単結晶膜等を形成したり、不純物拡散等を
行う酸化装置、CVD装置、エピタキシャル装置、拡散
装置等の熱処理装置がある。これらの熱処理装置内で半
導体ウェハの反応を行う際には、高温に耐え、しかも高
温により不純物か生じない耐熱性材料例えば石英製のボ
ートて半導体ウェハを支持している。そのため、熱処理
装置で反応を行う前と反応後等に例えば25枚の半導体
ウェハを収納して工程間で搬送するキャリアと石英ボー
ト間で半導体ウェハの移載を行なうための移載装置があ
る。
[Prior art and problems to be solved by the invention] Conventionally, in the manufacturing process of semiconductor wafers and liquid crystal wafers, oxidation equipment and CVD equipment have been used to form oxide films, metal films, single crystal films, etc., and to diffuse impurities. There are heat treatment devices such as , epitaxial devices, and diffusion devices. When a semiconductor wafer is subjected to a reaction in these heat treatment apparatuses, the semiconductor wafer is supported by a boat made of a heat-resistant material, such as quartz, that can withstand high temperatures and does not generate impurities due to high temperatures. For this reason, there is a transfer device for transferring semiconductor wafers between a carrier and a quartz boat that accommodates, for example, 25 semiconductor wafers before and after a reaction in a heat treatment apparatus and transports them between processes.

半導体ウェハ移載装置は、半導体ウェハを垂直に互いに
平行に複数枚収納したキャリアをクリーンな保管室から
搬出し、キャリアの下方から支持体を上昇させて半導体
ウェハを一括して上方に支持し、上方に支持された半導
体ウェハを挟持体により一括して挟持して隣地に水平に
配置された石英ボート上に水平移動し、さらに挟持体が
下降して石英ボートに半導体ウェハを移動すると、挟持
を解除して移載を行なうものである。また、上記の半導
体ウェハ移載装置は石英ボートから処理済の半導体ウェ
ハをキャリアに収納する場合は、上記の操作を逆に行う
ものである。このような半導体ウェハ移載装置は半導体
ウェハを収納したキャリアがクリーンな保管室に保管さ
れてはいても、半導体ウェハの移載時には特に頻繁に駆
動機構が動作されるため、ゴミ、パーティクルが発生し
て汚染源を生しやすく、ゴミ、パーティクルが半導体ウ
ェハに付着するのを防止することはできなかった。
The semiconductor wafer transfer device carries out a carrier in which a plurality of semiconductor wafers are stored vertically and parallel to each other from a clean storage room, raises a support from below the carrier, and supports the semiconductor wafers upward all at once. The semiconductor wafers supported above are held together by a holding body and moved horizontally onto a quartz boat placed horizontally on an adjacent site, and when the holding body is further lowered and the semiconductor wafers are transferred to the quartz boat, the holding is stopped. It is to be released and transferred. Further, in the above semiconductor wafer transfer device, when storing processed semiconductor wafers from a quartz boat into a carrier, the above operation is performed in reverse. Even though carriers containing semiconductor wafers are stored in a clean storage room, the drive mechanism of such semiconductor wafer transfer equipment is operated frequently when transferring semiconductor wafers, which generates dust and particles. However, it was not possible to prevent dust and particles from adhering to semiconductor wafers.

本発明は上記の欠点を解消するためさなれたものであっ
て、半導体ウェハの移載時であってもゴミ、パーティク
ルが半導体ウエノ1に付着するのを防止したウェハ移載
装置を提供することを目的とする。
The present invention has been developed to eliminate the above-mentioned drawbacks, and provides a wafer transfer device that prevents dust and particles from adhering to the semiconductor wafer 1 even when transferring the semiconductor wafer. With the goal.

[課題を解決するための手段] 上記の目的を達成するため本発明のウェハ移載装置は、
ウェハを収納するキャリアと、前記ウェハを支持するボ
ートとの間で前記ウェハの移載を行なうウェハ移載装置
において、前記ウェハの移載空間に清浄化気体流を形成
する手段を設けたものである。
[Means for Solving the Problems] In order to achieve the above object, the wafer transfer device of the present invention has the following features:
A wafer transfer device that transfers the wafer between a carrier that stores the wafer and a boat that supports the wafer, which is provided with means for forming a cleaning gas flow in the wafer transfer space. be.

[作用] ウェハを収納するキャリアと、熱処理装置等の処理装置
内で処理時にウェハを支持する石英ボートとの間でウェ
ハの移載を行うウェハ移載装置は、ウェハ移載空間にク
リーンエアを取り入れる。そのため、ウェハの移載中で
あっても清浄空気内に配置され、移載時にゴミ、パーテ
ィクルか付着することがない。
[Operation] A wafer transfer device that transfers wafers between a carrier that stores the wafers and a quartz boat that supports the wafers during processing in a processing device such as a heat treatment device supplies clean air to the wafer transfer space. Incorporate. Therefore, even while the wafer is being transferred, it is placed in clean air, and no dust or particles will adhere to it during the transfer.

[実施例] 本発明のウェハの移載装置を半導体製造の熱処理装置に
適用した一実施例を図面を参照して説明する。
[Embodiment] An embodiment in which a wafer transfer apparatus of the present invention is applied to a heat treatment apparatus for semiconductor manufacturing will be described with reference to the drawings.

第1図に示す熱処理装置1は、主に半導体ウェハを収納
したキャリアを多数保管する保管室2と、半導体ウェハ
を支持する熱処理用の石英ボートを多数保管する保管室
3と、これらの保管室2及び3に隣接して設けられ、保
管室2から搬送されたキャリアから石英ボートに半導体
ウェハを移載する移載装M4と、半導体ウェハの熱処理
を行う反応装置である複数の例えば3台の熱処理炉5と
、この熱処理炉5へ移載装置4から未処理の半導体ウェ
ハを支持した石英ボートを搬送したりあるいは熱処理済
の半導体ウェハを熱処理炉5から移載装置4へ搬送を行
うボート搬送装置6とから成りている。熱処理装置1を
構成するキャリアを保管する保管室2は、多段の棚7を
備え、可動機構8に設けられた図示しないキャリア移載
機により複数のキャリア例えば6個のキャリアを一度に
棚7に載置されるようになっている。また、ボートを保
管する保管室3は例えば170枚の複数の半導体ウェハ
を水平に収納可能な石英ボート11を長平方向を垂直に
して保管し、石英ボート11を移載装置4に搬送する図
示しないボート搬送装置と、ボート搬送装置にボートを
移載する図示しないボート移載装置とを備えている。こ
れらの保管室2及び3はそれぞれ密閉される外装体12
が設けられ、外装体12の上面にはエアフィルタ13が
取着され、図示しないファンによりクリーンルームのダ
ウンフローを積極的に取り入れるようになっている。
The heat treatment apparatus 1 shown in FIG. 1 mainly includes a storage room 2 in which a large number of carriers containing semiconductor wafers are stored, a storage room 3 in which a large number of quartz boats for heat treatment that support semiconductor wafers are stored, and these storage rooms. 2 and 3, a transfer device M4 that transfers semiconductor wafers from a carrier transported from storage room 2 to a quartz boat, and a plurality of, for example, three reaction devices that perform heat treatment on semiconductor wafers. A heat treatment furnace 5 and a boat transport device that transports a quartz boat supporting unprocessed semiconductor wafers from the transfer device 4 to the heat treatment furnace 5 or transfers heat-treated semiconductor wafers from the heat treatment furnace 5 to the transfer device 4. It consists of a device 6. A storage room 2 for storing carriers constituting the heat treatment apparatus 1 is equipped with multi-stage shelves 7, and a plurality of carriers, for example, six carriers, are placed on the shelves 7 at once by a carrier transfer machine (not shown) provided in a movable mechanism 8. It is about to be placed. Further, the storage room 3 for storing boats stores a quartz boat 11 capable of horizontally storing a plurality of semiconductor wafers, for example, 170 sheets, with its elongated direction vertical, and transports the quartz boat 11 to a transfer device 4 (not shown). It includes a boat transfer device and a boat transfer device (not shown) that transfers the boat to the boat transfer device. These storage chambers 2 and 3 each have a sealed exterior body 12.
An air filter 13 is attached to the upper surface of the exterior body 12, and a down flow from the clean room is actively taken in by a fan (not shown).

これらの保管室2及び3に隣接されて設けられる移載装
置4は第2図に示すように、1つのキャリア10に収納
された全半導体ウェハWを上昇して同時に支持する上下
駆動機構14に接続された支持体15が備えられる。支
持体15により上昇支持された半導体ウェハWを左右か
ら挟持する挟持体16が水平及び垂直駆動機構17に接
続されて設けられ、ボート11上に移載するようになっ
ている。これらを備えた移載装置4は外装体18により
密閉され、熱処理装置1が配置されるクリーンルームか
ら移載空間Kを隔離して設けられる。
As shown in FIG. 2, a transfer device 4 provided adjacent to these storage chambers 2 and 3 is connected to a vertical drive mechanism 14 that lifts and simultaneously supports all the semiconductor wafers W stored in one carrier 10. A connected support 15 is provided. A clamping body 16 that clamps the semiconductor wafer W lifted and supported by the support body 15 from the left and right is connected to a horizontal and vertical drive mechanism 17, and is adapted to be transferred onto the boat 11. The transfer device 4 equipped with these is sealed by an exterior body 18, and is provided so as to isolate the transfer space K from the clean room in which the heat treatment device 1 is arranged.

外装体18は塩ビやアクリル板等の滞電防止プラスチッ
ク材で形成され、内部が観察できるように透明になって
いる。外装体18の上面にはエアフィルタ19が設けら
れ、エアフィルタ19は01μφの粒子まで除去できる
ものである。外装体18で被われ、上面にエアフィルタ
19を取着した移載装置4は、第3図に示すように側面
及び底面に排気機構例えばファン20を備え、清浄化気
体流を形成する手段を構成し、外装体18に被われた移
載空間に内に積極的にクリーンルームのダウンフローを
取入れ、清浄化気体流人を形成するようになっている。
The exterior body 18 is made of an anti-static plastic material such as PVC or acrylic plate, and is transparent so that the inside can be observed. An air filter 19 is provided on the upper surface of the exterior body 18, and the air filter 19 is capable of removing particles down to 01 μφ. The transfer device 4, which is covered with an exterior body 18 and has an air filter 19 attached to its upper surface, is equipped with an exhaust mechanism, such as a fan 20, on the side and bottom surfaces, as shown in FIG. The downflow of the clean room is actively introduced into the transfer space covered by the exterior body 18 to form a clean gas stream.

このような移載装置4で半導体ウェハWを満載したボー
ト11か水平支持から垂直支持に変換するボート回転装
置2】が設けられる。ボート回転装置21は、水平駆動
機構22、垂直駆動機構23及び回転駆動機構24に接
続され、ボート11を支持する嵌合部25を有し、ボー
I・11を固定支持して回転することによりボー ト1
1を水平支持から垂直支持に変換するようになっている
The transfer device 4 is equipped with a boat rotation device 2 for converting the boat 11 fully loaded with semiconductor wafers W from horizontal support to vertical support. The boat rotation device 21 is connected to a horizontal drive mechanism 22, a vertical drive mechanism 23, and a rotation drive mechanism 24, and has a fitting part 25 that supports the boat 11, and rotates while fixedly supporting the boat 11. Boat 1
1 from horizontal support to vertical support.

さらにボート回転装置2】によりボート11の受渡しが
行われるボート搬送装置6は搬送路26及び搬送路26
上を移動するステージ27に載置されたボート載置台2
8を備える。ボート搬送装置6は搬送路26全体を密閉
して被う外装体29を倫え、上面にはエアフィルタ30
が複数設けられる。この外装体29及びエアフィルタ3
0は移載装置4の材質と同様であり、第4図に示すよう
に外装体29の底面及び側面にファン31を設け、エア
フィルタ30から空間K〕−にクリーンリームのダウン
フローを積極的に取り入れ清浄空気流Bを形成する構造
となっている。
Furthermore, the boat conveyance device 6 through which the boat 11 is transferred by the boat rotation device 2 is connected to a conveyance path 26 and a conveyance path 26.
Boat platform 2 placed on a stage 27 that moves above
8. The boat transport device 6 has an exterior body 29 that seals and covers the entire transport path 26, and has an air filter 30 on the top surface.
There are multiple. This exterior body 29 and air filter 3
0 is the same as the material of the transfer device 4, and as shown in FIG. The structure is such that clean air is taken in to form a clean air flow B.

熱処理炉5は処理部31及び搬送部32から成り、搬送
部32はボート搬送装置6により搬送されたボート11
をボート載置台28から受取るロボットアーム33と、
ロボットアーム33が回転し、てボート11を受は渡さ
れる上下駆動機構34を備えている。上下駆動機構34
は図示しない反応管のヒータ等が装備された処理部31
にボート11を挿入するようになっている。
The heat treatment furnace 5 consists of a processing section 31 and a conveyance section 32, and the conveyance section 32 includes a boat 11 conveyed by a boat conveyance device 6.
a robot arm 33 that receives from the boat platform 28;
The robot arm 33 rotates and is provided with a vertical drive mechanism 34 that allows the boat 11 to be carried over. Vertical drive mechanism 34
is a processing section 31 equipped with a reaction tube heater (not shown), etc.
The boat 11 is inserted into the holder.

このような構成の熱処理装置1の動作を説明する。The operation of the heat treatment apparatus 1 having such a configuration will be explained.

保管室2に収納された所望の複数のキャリア10を図示
しない搬送装置により移載装置4に搬入する。一方、保
管室3から1つのボート11を搬送系により移載装置4
の移載位置まで搬送する。
A plurality of desired carriers 10 stored in the storage room 2 are carried into the transfer device 4 by a transport device (not shown). On the other hand, one boat 11 is transferred from the storage room 3 to the transfer device 4 by the transfer system.
transport to the transfer position.

この時移載装置t4の底面及び側面に設けられたファン
20を駆動させて上面のエアフィルタ19を介(7て清
浄空気流域を取り入れる。清浄化気体流Δは外装体18
により移載装置4内がクリーンルームから隔離されてい
るため、効率よく移載空間Kを流れる。この清浄空気流
域において、支持体15が上下駆動機構14により上昇
され、1つのキャリア10内に収納されている全ての半
導体ウェハWを一括して上昇させる。上昇された半導体
ウェハWを駆動機構17によりその位置まで水平移動さ
れた挟持体16が左右から挟持し支持する。支持体15
は上下駆動機構14により下降し、挟持体16は駆動機
構17によりボート11上に水平移動した後、下降して
半導体ウェハWをボート11に載置させる。そして挟持
体が開いて半導体ウェハWの挟持を解除し上昇して次の
キャリア2の位置に移動する。以下、順次キャリアにつ
いて上記の動作を反復し、半導体ウェハWをボート11
に移載する。
At this time, the fans 20 provided on the bottom and side surfaces of the transfer device t4 are driven to take in clean air through the air filter 19 on the top (7).
Since the inside of the transfer device 4 is isolated from the clean room, the flow efficiently flows through the transfer space K. In this clean air region, the support body 15 is raised by the vertical drive mechanism 14, and all the semiconductor wafers W housed in one carrier 10 are raised at once. The raised semiconductor wafer W is held and supported by the holding body 16 which has been horizontally moved to that position by the drive mechanism 17 from the left and right sides. Support body 15
is lowered by the vertical drive mechanism 14, and the holding body 16 is moved horizontally onto the boat 11 by the drive mechanism 17, and then lowered to place the semiconductor wafer W on the boat 11. Then, the holding body opens, releases the holding of the semiconductor wafer W, and rises to move to the next carrier 2 position. Thereafter, the above operations are repeated for the carriers one after another, and the semiconductor wafers W are transferred to the boat 11.
Transferred to.

半導体ウェハWを支持したボート11は水平駆動機構2
2によりボート11の位置まで移動されたボート回転装
置21の嵌合部25により挟持され、さらに水平駆動機
構22により所定の位置に移動されたボート回転装置2
1の回転駆動機構24により水平支持から垂直支持にさ
れる。ボート回転装置21はさらに垂直駆動機構23に
より下降され、垂直支持したボート11をボート搬送装
置6のボート載置位置に載置する。この時ボート搬送装
置6のファン31を作動させ、エアフィルタ30からク
リーンルームのダウンフローを積極的に取り入れ空間に
1に清浄空気流Bを形成させる。ボート搬送装置6は所
望の熱処理炉7の前まで搬送路26に沿ってボート11
を搬送し、ステージ27により熱処理炉5のロボットア
ーム33の位置に移動する。そしてロボットアーム33
に受渡されたボート11は上下駆動機構34により上昇
されて処理部3]に挿入される。
The boat 11 supporting the semiconductor wafer W is a horizontal drive mechanism 2
2, the boat rotating device 2 is held by the fitting part 25 of the boat rotating device 21, which is moved to the position of the boat 11 by the boat rotating device 2, and is further moved to a predetermined position by the horizontal drive mechanism 22.
The rotational drive mechanism 24 of 1 changes the horizontal support to vertical support. The boat rotating device 21 is further lowered by the vertical drive mechanism 23 to place the vertically supported boat 11 on the boat loading position of the boat transport device 6. At this time, the fan 31 of the boat transport device 6 is activated to actively take in the downflow of the clean room from the air filter 30 and form a clean air flow B in the space 1. The boat transport device 6 transports the boat 11 along the transport path 26 to the front of the desired heat treatment furnace 7.
is transported and moved by the stage 27 to the position of the robot arm 33 of the heat treatment furnace 5. And robot arm 33
The boat 11 delivered to the processing section 3 is lifted up by the vertical drive mechanism 34 and inserted into the processing section 3].

熱処理終了後は前述の動作を逆進させて、処理済の半導
体ウェハ8を載置したボート11は保管室3内に収納さ
れる。ここで常温になるまで半導体ウェハは冷却される
ため、加熱処理が終了した後熱処理装置内に長時間配置
されることなく直ちに次の処理を行うことができ、効率
的に順次熱処理を済ませる。
After the heat treatment is completed, the aforementioned operation is reversed, and the boat 11 carrying the processed semiconductor wafers 8 is stored in the storage chamber 3. Since the semiconductor wafer is cooled down to room temperature, the next process can be performed immediately after the heat treatment is completed without having to place it in the heat treatment apparatus for a long time, and the heat treatment can be efficiently completed one after another.

本発明は熱処理装置に限らずバッチ式プラズマ処理装置
にも適用することができる。また、半導体ウェハに限ら
ず液晶ウェハであってもよい。
The present invention is applicable not only to heat treatment apparatuses but also to batch-type plasma processing apparatuses. Further, the wafer is not limited to a semiconductor wafer, and may be a liquid crystal wafer.

[発明の効果コ 以上の説明からも明らかなように、本発明のウェハ移載
装置によれば、ウェハをキャリアと石英ボート間で移載
時においても、密閉された外装体内に清浄空気流を積極
的に取り入れた状態で行うため、移載装置がゴミ、パー
ティクルを発生してもウェハをクリーンな状態に維持す
ることができる。従って、ゴミ、パーティクル付着のた
めの不良品等が発生せず高品質な製品を得ることができ
、しかも不良品も少ないため経済的である。
[Effects of the Invention] As is clear from the above explanation, the wafer transfer device of the present invention allows clean air to flow inside the sealed exterior body even when transferring wafers between a carrier and a quartz boat. Since the wafers are actively taken in, the wafers can be maintained in a clean state even if the transfer equipment generates dust or particles. Therefore, high-quality products can be obtained without producing defective products due to adhesion of dust and particles, and moreover, it is economical because there are fewer defective products.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明のウェハ移載装置を熱処理装置に適用し
た一実施例の斜視図、第2図、第3図及び第4図は第1
図に示す一実施例の要部を示す図である。 19・・・・エアフィルタ(気流形成手段)20・・・
・ファン(気流形成手段) W・・・・・・半導体ウェハ K・・・・・・移載空間
FIG. 1 is a perspective view of an embodiment in which the wafer transfer device of the present invention is applied to a heat treatment device, and FIGS.
FIG. 3 is a diagram illustrating a main part of the embodiment shown in the figure. 19... Air filter (airflow forming means) 20...
・Fan (airflow forming means) W...Semiconductor wafer K...Transfer space

Claims (1)

【特許請求の範囲】[Claims]  ウェハを収納するキャリアと、前記ウェハを支持する
ボートとの間で前記ウェハの移載を行なうウェハ移載装
置において、前記ウェハの移載空間に清浄化気体流を形
成する手段を設けたことを特徴とするウェハ移載装置。
A wafer transfer device that transfers the wafer between a carrier that stores the wafer and a boat that supports the wafer is provided with means for forming a cleaning gas flow in the wafer transfer space. Characteristic wafer transfer equipment.
JP2171064A 1990-06-28 1990-06-28 Wafer transfer device Pending JPH0459515A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2171064A JPH0459515A (en) 1990-06-28 1990-06-28 Wafer transfer device
KR1019910010737A KR0153250B1 (en) 1990-06-28 1991-06-26 Vertical heat-treating apparatus
US07/723,382 US5178639A (en) 1990-06-28 1991-06-28 Vertical heat-treating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2171064A JPH0459515A (en) 1990-06-28 1990-06-28 Wafer transfer device

Publications (1)

Publication Number Publication Date
JPH0459515A true JPH0459515A (en) 1992-02-26

Family

ID=15916385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2171064A Pending JPH0459515A (en) 1990-06-28 1990-06-28 Wafer transfer device

Country Status (1)

Country Link
JP (1) JPH0459515A (en)

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