JPH0459409U - - Google Patents

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Publication number
JPH0459409U
JPH0459409U JP10137290U JP10137290U JPH0459409U JP H0459409 U JPH0459409 U JP H0459409U JP 10137290 U JP10137290 U JP 10137290U JP 10137290 U JP10137290 U JP 10137290U JP H0459409 U JPH0459409 U JP H0459409U
Authority
JP
Japan
Prior art keywords
light receiving
receiving elements
row
element row
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10137290U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10137290U priority Critical patent/JPH0459409U/ja
Publication of JPH0459409U publication Critical patent/JPH0459409U/ja
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
JP10137290U 1990-09-27 1990-09-27 Pending JPH0459409U (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10137290U JPH0459409U (ko) 1990-09-27 1990-09-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10137290U JPH0459409U (ko) 1990-09-27 1990-09-27

Publications (1)

Publication Number Publication Date
JPH0459409U true JPH0459409U (ko) 1992-05-21

Family

ID=31844763

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10137290U Pending JPH0459409U (ko) 1990-09-27 1990-09-27

Country Status (1)

Country Link
JP (1) JPH0459409U (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0875542A (ja) * 1994-09-05 1996-03-22 Otsuka Denshi Kk 表示画素の光量測定方法並びに表示画面の検査方法及び装置
WO1996028707A1 (fr) * 1995-03-10 1996-09-19 Seft Development Laboratory Co., Ltd. Instrument de mesure de positions

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0875542A (ja) * 1994-09-05 1996-03-22 Otsuka Denshi Kk 表示画素の光量測定方法並びに表示画面の検査方法及び装置
WO1996028707A1 (fr) * 1995-03-10 1996-09-19 Seft Development Laboratory Co., Ltd. Instrument de mesure de positions

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