JPH0458171A - Skew adjusting circuit for ic tester - Google Patents

Abstract

PURPOSE:To easily perform skew adjustment by performing the skew adjustment as to plural comparator circuits and plural driver circuits. CONSTITUTION:A three-dimensional movable part 1 which can be probed at an optional point connects a reference driver circuit 3-o to the output pins of an IC 9 to be measured and the skew adjustment of plural comparator circuits 4-l - 4-n is performed. Further, a reference comparator circuit 4 is connected to the input pins of the IC 9 to be measured and the skew adjustment of plural driver circuits 3-l - 3-n is performed.

Description

TECHNICAL FIELD The present invention relates to a skew adjustment circuit for an IC tester, and more particularly to timing adjustment for an IC tester comprising a plurality of comparator circuits and a plurality of driver circuits.

Prior Art Conventionally, in the skew adjustment circuit of an IC tester, the second
As shown in the figure, a reference driver circuit (hereinafter referred to as a reference driver circuit) 3-0 out of a plurality of driver circuits 3-0 to 3-n in an IC tester (not shown) is connected to comparator circuits 4-1 to 4-n. The driver circuit 3 connects one-to-one to the comparator circuit 4-n, or connects the comparator circuit 4-0, which serves as a reference among the multiple comparator circuits 4-0 to 4-n in the IC tester (hereinafter referred to as the reference comparator circuit), to the driver circuit 3. -1~3-n and 1
For pair-to-one connection, a relay matrix circuit 10 consisting of a plurality of relays is provided inside or outside the IC tester.

By switching the relays of this relay matrix circuit 10, the reference driver circuit 3-0 and the comparator circuits 4-1 to 4-n are connected, or the reference comparator circuit 4-0 and the driver circuits 3-1 to 3n are connected. Connect driver circuits 3-1 to 3-n and comparator circuit 4-
1 to 4-n timing adjustments were made.

Incidentally, the timing of the reference driver circuit 3-0 and the reference comparator circuit 4-0 is first adjusted using an oscilloscope or the like.

In the skew adjustment circuit of such a conventional IC tester,
Since the skew at the driver output pin and comparator input bin of the IC tester is automatically adjusted by the relay matrix circuit 10, skew occurs in the measurement system connecting the IC tester and the IC under test (not shown). skew was not taken into consideration.

However, when determining Δ-1 for a high-speed IC with a large number of pins, the skew of the measurement system cannot be ignored.
The skew of the measurement system must be manually adjusted, which increases the number of man-hours required for skew adjustment and has the disadvantage that skew adjustment is difficult.

OBJECTS OF THE INVENTION The present invention has been made to eliminate the above-mentioned drawbacks of the conventional circuits, and an object of the present invention is to provide a skew adjustment circuit for an IC tester that can easily perform skew adjustment.

Structure of the Invention A skew adjustment circuit for an IC tester according to the present invention includes a plurality of comparator circuits and a plurality of driver circuits, and is used when testing a unit of an integrated circuit. A probe connectable to each of the human output terminals of the integrated circuit, and connecting means for connecting one of a reference comparator circuit and a reference driver circuit to the probe are provided, and the probe is connected to the output terminal of the integrated circuit, and the reference The skew adjustment of each of the plurality of comparator circuits is performed by inputting the output signal from the driver circuit to each of the plurality of comparator circuits via the probe, and the skew adjustment of each of the plurality of comparator circuits is performed by connecting the probe to the input terminal of the integrated circuit. The skew adjustment of each of the plurality of driver circuits is performed by inputting an output signal from each of the plurality of driver circuits to the reference comparator circuit via the probe.

Embodiment Next, an embodiment of the present invention will be described with reference to the drawings.

FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention. In the figure, the three-dimensional movable part 1 has a probe 2 for successively contacting the input/output pins of the δ-1 constant IC 9, and includes a reference driver circuit 3-0 and a reference comparator circuit 4-0.
0 are connected through a driver bin 7-0 and a comparator bin 8-0 of the IC tester, respectively.

Reference driver circuit 3-0 and driver circuits 3-1 to 3
Timing adjustment circuits 5-0 to 5-n for adjusting the respective timings are connected to the front stage of -n.

The driver circuits 3-1 to 3-n are connected to the input bin of the IC 9 to be measured via driver pins 7-1 to 7-n of the IC tester, respectively.

Further, timing adjustment circuits 6-0 to 6-n for adjusting the latch timings of the reference comparator circuits 4-0 and the comparator circuits 4-1 to 4-n are connected to the front stages thereof.

The comparator circuits 4-1 to 4-n are connected to the Jl-determined IC 9 via the comparator pins 8-1 to 8-n of the IC tester, respectively.
connected to the output pin of

The skew operation of one embodiment of the present invention will be explained using FIG. 1.

First, the timing adjustment circuit 5-0 sets the rising and falling cross points of the output waveform of the reference driver circuit 3-0.
Adjust by 0.

Thereafter, the reference driver circuit 3-0 and the three-dimensional movable section 1 are connected, and the output signal of the reference driver circuit 3-0 is outputted from the probe 2 of the three-dimensional movable section.

At this time, the probe 2 of the three-dimensional movable part 1 is connected to the IC 9 to be measured.
By sequentially contacting the output bins of the reference driver circuit 3-0, the output signal from the reference driver circuit 3-0 is input to each of the comparator circuits 4-1 to 4-n connected to the output pin of the IC 9 under test, so that the timing adjustment circuit 6-1 to 6-n adjust the latch timing of each comparator circuit 4-1 to 4-port based on the output signal of the reference driver circuit 3-0, and adjust the skew of each comparator circuit 4-1 to 4-port. adjust.

Next, the three-dimensional movable part 1 connects the reference driver circuit 3-0 and the reference comparator circuit 4-0, and the timing adjustment circuit 6-0 adjusts the latch timing of the reference comparator circuit 4-0 to the reference driver circuit 3-0. The skew of the reference comparator circuit 4-0 is adjusted based on the output horn signal from the reference comparator circuit 4-0.

After that, the reference comparator circuit 4-0 and the three-dimensional movable part 1 are connected, and the output signals from each drive circuit 3-1 to 3-n are sent to the three-dimensional movable part 1 to the reference comparator circuit 4-0.
input from probe 2.

At this time, the probe 2 of the three-dimensional movable part 1 is connected to the IC 9 to be measured.
By sequentially contacting the input pins of the IC9 to be measured.
Each driver circuit 3-1 to B-n connected to the input pin of
Since the output signal from the driver circuits 3-1 to 3-n is input to the reference comparator circuit 4-0, the timing adjustment circuits 5-1 to 5-n input the timing of each driver circuit 3-1 to 3-n to the reference comparator circuit 4-0. The skew of each driver circuit 3-1 to 3-n is adjusted based on the signal.

Therefore, the skew that occurs in the measurement system with the IC 9 to be measured,
That is, the skew at the input/output points of the IC 9 to be measured is adjusted.

In this way, the reference driver circuit 3-0 and the fixed IC
A plurality of comparator circuits 4-
1 to 4-n, and connect the reference comparator circuit 4-0 and the input pin of the IC 9 to be measured to adjust the skew of the plurality of driver circuits 3-1 to 3-n. Skew adjustment at the human output point of the IC 9 to be measured can be easily performed.

DETAILED DESCRIPTION OF THE INVENTION According to the present invention, as described in detail, the skew adjustment of a plurality of comparator circuits is performed by connecting the reference driver circuit and the output bin of the IC under test using a three-dimensional movable part that can perform probing at any point. By connecting the reference comparator circuit and the input pin of the IC under test to adjust the skew of a plurality of driver circuits, it is possible to easily adjust the skew.

[Brief explanation of the drawing]

FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention, and FIG. 2 is a block diagram showing the configuration of a conventional example. Explanation of symbols of main parts 1...Three-dimensional movable part 2...Probe 3-0...Reference driver circuit 3-1 to 3-n...Driver Circuit 4-0...
...Reference comparator circuit 4-1 to 4-n...
- Comparator circuits 5-0 to 5-n. 6-0 to 6-n... Timing adjustment circuit 9...
...IC to be measured

Claims (1)

[Claims] (1) A skew adjustment circuit for an IC tester, which has a plurality of comparator circuits and a plurality of driver circuits, and is used during a unit test of an integrated circuit, and includes a probe that can be connected to each of the input and output terminals of the integrated circuit. , connecting means for connecting one of a reference comparator circuit and a reference driver circuit to the probe, and connecting the probe to an output terminal of the integrated circuit to transmit an output signal from the reference driver circuit through the probe. The skew adjustment of each of the plurality of comparator circuits is performed by inputting the signal to each of the plurality of comparator circuits, and the output signal from each of the plurality of driver circuits is input to the probe by connecting the probe to the input terminal of the integrated circuit. The skew adjustment circuit is characterized in that the skew adjustment of each of the plurality of driver circuits is performed by inputting the signal to the reference comparator circuit via the reference comparator circuit.