JPH0454139U - - Google Patents

Info

Publication number
JPH0454139U
JPH0454139U JP9609490U JP9609490U JPH0454139U JP H0454139 U JPH0454139 U JP H0454139U JP 9609490 U JP9609490 U JP 9609490U JP 9609490 U JP9609490 U JP 9609490U JP H0454139 U JPH0454139 U JP H0454139U
Authority
JP
Japan
Prior art keywords
sample
moving mechanism
vacuum
sample chamber
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9609490U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9609490U priority Critical patent/JPH0454139U/ja
Publication of JPH0454139U publication Critical patent/JPH0454139U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP9609490U 1990-09-14 1990-09-14 Pending JPH0454139U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9609490U JPH0454139U (enrdf_load_stackoverflow) 1990-09-14 1990-09-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9609490U JPH0454139U (enrdf_load_stackoverflow) 1990-09-14 1990-09-14

Publications (1)

Publication Number Publication Date
JPH0454139U true JPH0454139U (enrdf_load_stackoverflow) 1992-05-08

Family

ID=31835357

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9609490U Pending JPH0454139U (enrdf_load_stackoverflow) 1990-09-14 1990-09-14

Country Status (1)

Country Link
JP (1) JPH0454139U (enrdf_load_stackoverflow)

Similar Documents

Publication Publication Date Title
US5412211A (en) Environmental scanning electron microscope
JPH0454139U (enrdf_load_stackoverflow)
WO2022199721A1 (en) Electron microscope
US2673342A (en) Demountable chassis
JPS6421563U (enrdf_load_stackoverflow)
JPS6423865U (enrdf_load_stackoverflow)
JPH0295138U (enrdf_load_stackoverflow)
JPS6230760Y2 (enrdf_load_stackoverflow)
JPS6230761Y2 (enrdf_load_stackoverflow)
JPH0273051U (enrdf_load_stackoverflow)
JPS5895562U (ja) 走査電子顕微鏡用試料装置
JPS614347U (ja) 全周照射形ｘ線管
JPS59128160U (ja) 電子ビ−ム描画装置
JPH0346938U (enrdf_load_stackoverflow)
JPS6444555U (enrdf_load_stackoverflow)
JPS59177164U (ja) 走査型反射電子回折顕微装置
JPH01168949U (enrdf_load_stackoverflow)
JPH0292657U (enrdf_load_stackoverflow)
JPS5891851U (ja) 走査型反射電子回折顕微装置
JPS6391152U (enrdf_load_stackoverflow)
JPS6148645U (enrdf_load_stackoverflow)
JPS6369347U (enrdf_load_stackoverflow)
JPH0324247U (enrdf_load_stackoverflow)
JPS59117049U (ja) 撮像管
JPS6175058U (enrdf_load_stackoverflow)