JPS6444555U - - Google Patents
Info
- Publication number
- JPS6444555U JPS6444555U JP13954087U JP13954087U JPS6444555U JP S6444555 U JPS6444555 U JP S6444555U JP 13954087 U JP13954087 U JP 13954087U JP 13954087 U JP13954087 U JP 13954087U JP S6444555 U JPS6444555 U JP S6444555U
- Authority
- JP
- Japan
- Prior art keywords
- vacuum chamber
- mounting member
- sample mounting
- joint
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012423 maintenance Methods 0.000 claims 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987139540U JPH0628776Y2 (ja) | 1987-09-11 | 1987-09-11 | 試料ステージ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987139540U JPH0628776Y2 (ja) | 1987-09-11 | 1987-09-11 | 試料ステージ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6444555U true JPS6444555U (enrdf_load_stackoverflow) | 1989-03-16 |
JPH0628776Y2 JPH0628776Y2 (ja) | 1994-08-03 |
Family
ID=31402892
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987139540U Expired - Lifetime JPH0628776Y2 (ja) | 1987-09-11 | 1987-09-11 | 試料ステージ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0628776Y2 (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9159527B2 (en) | 2003-10-16 | 2015-10-13 | Carl Zeiss Microscopy, Llc | Systems and methods for a gas field ionization source |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60227347A (ja) * | 1984-04-25 | 1985-11-12 | Hitachi Ltd | 走査形電子顕微鏡 |
JPS6119042A (ja) * | 1984-07-04 | 1986-01-27 | Hitachi Ltd | 荷電粒子線装置の試料室 |
-
1987
- 1987-09-11 JP JP1987139540U patent/JPH0628776Y2/ja not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60227347A (ja) * | 1984-04-25 | 1985-11-12 | Hitachi Ltd | 走査形電子顕微鏡 |
JPS6119042A (ja) * | 1984-07-04 | 1986-01-27 | Hitachi Ltd | 荷電粒子線装置の試料室 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9159527B2 (en) | 2003-10-16 | 2015-10-13 | Carl Zeiss Microscopy, Llc | Systems and methods for a gas field ionization source |
Also Published As
Publication number | Publication date |
---|---|
JPH0628776Y2 (ja) | 1994-08-03 |