JPH0453549U - - Google Patents

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Publication number
JPH0453549U
JPH0453549U JP9598490U JP9598490U JPH0453549U JP H0453549 U JPH0453549 U JP H0453549U JP 9598490 U JP9598490 U JP 9598490U JP 9598490 U JP9598490 U JP 9598490U JP H0453549 U JPH0453549 U JP H0453549U
Authority
JP
Japan
Prior art keywords
sample
various
stands
identifying
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9598490U
Other languages
English (en)
Other versions
JP2507934Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990095984U priority Critical patent/JP2507934Y2/ja
Publication of JPH0453549U publication Critical patent/JPH0453549U/ja
Application granted granted Critical
Publication of JP2507934Y2 publication Critical patent/JP2507934Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【図面の簡単な説明】
第１図は本考案による微小試料用試料台の側断
面図、第２図は本考案によるサンプルカツプ用試
料台の側断面図、第３図は本考案による蛍光Ｘ線
分析装置の測定部付近の側断面図である。 １……試料台、１ａ……Ｘ線照射孔、２……マ
イラーフイルム、３……ピン、４……試料台、４
ａ……Ｘ線照射孔、４ｂ……サンプルカツプガイ
ド、５……サンプルカツプ、５ａ……マイラーフ
イルム、６……ピン、７……試料テーブル、７ａ
……Ｘ線照射孔、７ｂ……凹部、７ｃ……穴、８
，９……フオトセンサ、１０……Ｘ線発生器、１
１……１次Ｘ線ビーム、１２……２次Ｘ線、１３
……Ｘ線検出器、１４……固体試料用試料台、１
４ａ……Ｘ線照射孔。

Claims (1)

    【実用新案登録請求の範囲】
  1. 各種試料を置くための各種専用試料台と、その
    一部を分割して前記各種試料台を交換可能な構造
    とした試料テーブルと、前記各種試料台の種類を
    識別するセンサーと、このセンサーからの信号に
    よつて各種測定条件を設定するためのＣＰＵ部と
    を備え、試料台の種類によつて自動的に測定条件
    を設定することが可能な構造としたことを特徴と
    する蛍光Ｘ線分析装置。
JP1990095984U 1990-09-12 1990-09-12 蛍光ｘ線分析装置 Expired - Lifetime JP2507934Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990095984U JP2507934Y2 (ja) 1990-09-12 1990-09-12 蛍光ｘ線分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990095984U JP2507934Y2 (ja) 1990-09-12 1990-09-12 蛍光ｘ線分析装置

Publications (2)

Publication Number Publication Date
JPH0453549U true JPH0453549U (ja) 1992-05-07
JP2507934Y2 JP2507934Y2 (ja) 1996-08-21

Family

ID=31835159

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990095984U Expired - Lifetime JP2507934Y2 (ja) 1990-09-12 1990-09-12 蛍光ｘ線分析装置

Country Status (1)

Country Link
JP (1) JP2507934Y2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009145062A (ja) * 2007-12-11 2009-07-02 Shimadzu Corp Ｘ線検査装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5523805B2 (ja) * 2009-12-03 2014-06-18 株式会社堀場製作所 試料セル組立具

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5429828U (ja) * 1977-07-29 1979-02-27

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5429828U (ja) * 1977-07-29 1979-02-27

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009145062A (ja) * 2007-12-11 2009-07-02 Shimadzu Corp Ｘ線検査装置

Also Published As

Publication number Publication date
JP2507934Y2 (ja) 1996-08-21

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