JPH045029Y2 - - Google Patents

Info

Publication number
JPH045029Y2
JPH045029Y2 JP334286U JP334286U JPH045029Y2 JP H045029 Y2 JPH045029 Y2 JP H045029Y2 JP 334286 U JP334286 U JP 334286U JP 334286 U JP334286 U JP 334286U JP H045029 Y2 JPH045029 Y2 JP H045029Y2
Authority
JP
Japan
Prior art keywords
fet
channel power
power mos
terminal
mos
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP334286U
Other languages
English (en)
Japanese (ja)
Other versions
JPS62115678U (US20100223739A1-20100909-C00025.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP334286U priority Critical patent/JPH045029Y2/ja
Publication of JPS62115678U publication Critical patent/JPS62115678U/ja
Application granted granted Critical
Publication of JPH045029Y2 publication Critical patent/JPH045029Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP334286U 1986-01-14 1986-01-14 Expired JPH045029Y2 (US20100223739A1-20100909-C00025.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP334286U JPH045029Y2 (US20100223739A1-20100909-C00025.png) 1986-01-14 1986-01-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP334286U JPH045029Y2 (US20100223739A1-20100909-C00025.png) 1986-01-14 1986-01-14

Publications (2)

Publication Number Publication Date
JPS62115678U JPS62115678U (US20100223739A1-20100909-C00025.png) 1987-07-23
JPH045029Y2 true JPH045029Y2 (US20100223739A1-20100909-C00025.png) 1992-02-13

Family

ID=30783010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP334286U Expired JPH045029Y2 (US20100223739A1-20100909-C00025.png) 1986-01-14 1986-01-14

Country Status (1)

Country Link
JP (1) JPH045029Y2 (US20100223739A1-20100909-C00025.png)

Also Published As

Publication number Publication date
JPS62115678U (US20100223739A1-20100909-C00025.png) 1987-07-23

Similar Documents

Publication Publication Date Title
ATE56280T1 (de) Verfahren und vorrichtung zum elektrischen pruefen von leiterplatten.
JPH045029Y2 (US20100223739A1-20100909-C00025.png)
JPH045028Y2 (US20100223739A1-20100909-C00025.png)
JP2922733B2 (ja) 混成集積回路装置
JPS62159060A (ja) プリント基板の試験用ブリツジ回路
JP3227207B2 (ja) 半導体装置およびその測定方法
JP2002277517A (ja) 電源ノイズ耐性評価方法およびそれに用いるプローブ並びに半導体素子
JPH10288651A (ja) 半導体集積回路
JPH0645423A (ja) 半導体装置の試験方法
JPH07202183A (ja) 半導体集積回路装置
KR20020056291A (ko) 반도체소자의 테스트패턴
JPS61161735A (ja) 半導体集積回路装置
JPH04115173A (ja) 電子部品の接続状態の試験方法およびその装置
JP2552753Y2 (ja) 回路基板検査装置のガーディング回路
JPH0590257A (ja) 集積回路装置
WO2020073625A1 (zh) 一种测试pdfn封装mos管电应力装置及开关电源
JPH04102079A (ja) 回路基板の試験装置及びその試験方法
JPH09307210A (ja) チップオンボード型半導体装置
JPH0521556A (ja) 半導体装置およびその測定方法
JPS61219162A (ja) 半導体装置の配線パタ−ン
JPH0353603A (ja) 入力バッファ回路
JPH06258375A (ja) プリント配線基板の検査方法
JP2001168157A (ja) 半導体装置およびその検査方法および半導体チップ
JPS5966142A (ja) 識別用回路
JPH01157545A (ja) 半導体集積回路装置