JPH045028Y2 - - Google Patents
Info
- Publication number
- JPH045028Y2 JPH045028Y2 JP1986001472U JP147286U JPH045028Y2 JP H045028 Y2 JPH045028 Y2 JP H045028Y2 JP 1986001472 U JP1986001472 U JP 1986001472U JP 147286 U JP147286 U JP 147286U JP H045028 Y2 JPH045028 Y2 JP H045028Y2
- Authority
- JP
- Japan
- Prior art keywords
- fet
- channel power
- terminal
- power mos
- printed wiring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007689 inspection Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 235000014676 Phragmites communis Nutrition 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000002195 synergetic effect Effects 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986001472U JPH045028Y2 (US20020128544A1-20020912-P00008.png) | 1986-01-09 | 1986-01-09 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986001472U JPH045028Y2 (US20020128544A1-20020912-P00008.png) | 1986-01-09 | 1986-01-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62114374U JPS62114374U (US20020128544A1-20020912-P00008.png) | 1987-07-21 |
JPH045028Y2 true JPH045028Y2 (US20020128544A1-20020912-P00008.png) | 1992-02-13 |
Family
ID=30779413
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1986001472U Expired JPH045028Y2 (US20020128544A1-20020912-P00008.png) | 1986-01-09 | 1986-01-09 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH045028Y2 (US20020128544A1-20020912-P00008.png) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5245214Y2 (US20020128544A1-20020912-P00008.png) * | 1972-10-20 | 1977-10-14 |
-
1986
- 1986-01-09 JP JP1986001472U patent/JPH045028Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS62114374U (US20020128544A1-20020912-P00008.png) | 1987-07-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR860009431A (ko) | Ic평가회로 소자들과 평가회로 소자 검사수단을 갖는 반도체 집적회로 | |
ATE56280T1 (de) | Verfahren und vorrichtung zum elektrischen pruefen von leiterplatten. | |
JPH045028Y2 (US20020128544A1-20020912-P00008.png) | ||
JPH045029Y2 (US20020128544A1-20020912-P00008.png) | ||
JP2922733B2 (ja) | 混成集積回路装置 | |
JPS62159060A (ja) | プリント基板の試験用ブリツジ回路 | |
JP3227207B2 (ja) | 半導体装置およびその測定方法 | |
JP2002277517A (ja) | 電源ノイズ耐性評価方法およびそれに用いるプローブ並びに半導体素子 | |
JPS61272962A (ja) | 半導体集積回路装置 | |
JP2552753Y2 (ja) | 回路基板検査装置のガーディング回路 | |
JPH10288651A (ja) | 半導体集積回路 | |
JPH04115173A (ja) | 電子部品の接続状態の試験方法およびその装置 | |
JPH0429421Y2 (US20020128544A1-20020912-P00008.png) | ||
JPH07202183A (ja) | 半導体集積回路装置 | |
KR20020056291A (ko) | 반도체소자의 테스트패턴 | |
JPH03732B2 (US20020128544A1-20020912-P00008.png) | ||
JPH06258375A (ja) | プリント配線基板の検査方法 | |
JPH0645423A (ja) | 半導体装置の試験方法 | |
JPS5966142A (ja) | 識別用回路 | |
JPS58186473U (ja) | 電気的耐圧試験装置 | |
WO2020073625A1 (zh) | 一种测试pdfn封装mos管电应力装置及开关电源 | |
JPH0353603A (ja) | 入力バッファ回路 | |
JPH09307210A (ja) | チップオンボード型半導体装置 | |
JPS60245310A (ja) | ドライブ回路 | |
JPH10213633A (ja) | 半導体集積回路素子及びその実装確認試験方法 |