JPH0445771B2 - - Google Patents

Info

Publication number
JPH0445771B2
JPH0445771B2 JP57185685A JP18568582A JPH0445771B2 JP H0445771 B2 JPH0445771 B2 JP H0445771B2 JP 57185685 A JP57185685 A JP 57185685A JP 18568582 A JP18568582 A JP 18568582A JP H0445771 B2 JPH0445771 B2 JP H0445771B2
Authority
JP
Japan
Prior art keywords
reflectance
resin
coal
noise
under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57185685A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5973754A (ja
Inventor
Mikiro Kato
Yoshihiko Sunami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP57185685A priority Critical patent/JPS5973754A/ja
Publication of JPS5973754A publication Critical patent/JPS5973754A/ja
Publication of JPH0445771B2 publication Critical patent/JPH0445771B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP57185685A 1982-10-20 1982-10-20 石炭組織の自動分析方法 Granted JPS5973754A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57185685A JPS5973754A (ja) 1982-10-20 1982-10-20 石炭組織の自動分析方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57185685A JPS5973754A (ja) 1982-10-20 1982-10-20 石炭組織の自動分析方法

Publications (2)

Publication Number Publication Date
JPS5973754A JPS5973754A (ja) 1984-04-26
JPH0445771B2 true JPH0445771B2 (enrdf_load_stackoverflow) 1992-07-27

Family

ID=16175069

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57185685A Granted JPS5973754A (ja) 1982-10-20 1982-10-20 石炭組織の自動分析方法

Country Status (1)

Country Link
JP (1) JPS5973754A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0342548A (ja) * 1989-07-11 1991-02-22 Sekiyu Shigen Kaihatsu Kk ビトリナイト反射率自動測定装置
JP6342280B2 (ja) * 2014-09-25 2018-06-13 関西熱化学株式会社 石炭における高輝度成分を識別する方法、装置及びコンピュータプログラム。

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5822940A (ja) * 1981-08-03 1983-02-10 Mitsubishi Chem Ind Ltd 石炭組織分析法及び装置

Also Published As

Publication number Publication date
JPS5973754A (ja) 1984-04-26

Similar Documents

Publication Publication Date Title
Sugimoto et al. Development of an automatic Vickers hardness testing system using image processing technology
US10746702B2 (en) Method of tuning parameter settings for performing acoustic scanning probe microscopy for subsurface imaging, scanning probe microscopy system, and computer program product
JPH01143945A (ja) テープ欠陥検出方法
JPS6411890B2 (enrdf_load_stackoverflow)
WO2018007505A1 (en) Method for automated surface evaluation
DE19935843A1 (de) Vorrichtung zum Untersuchen eines optischen Elementes, Bildverarbeitungsvorrichtung, Bildverarbeitungsverfahren und computerlesbares Medium
US20050259248A1 (en) Nondestructive evaluation of subsurface damage in optical elements
CN108362772A (zh) 一种检测dpf载体内部损伤的超声波无损探伤方法
JPH0445771B2 (enrdf_load_stackoverflow)
JP3414126B2 (ja) ボア内壁面欠陥検査装置
US20070057666A1 (en) Defect inspection system and method for recording media
CN110320283A (zh) 一种双通道探头调节机构及双通道探头水浸高频超声波探伤方法
JPH06221838A (ja) 表面粗さ評価方法
JP2950531B2 (ja) オートフォーカス装置の合焦点捜査方法
JPS6230583B2 (enrdf_load_stackoverflow)
JP2002062123A (ja) 荷電ビーム測長装置及び測長方法
JPH1082766A (ja) 超音波探傷装置及び欠陥識別支援装置
JPH04309804A (ja) 三次元形状測定装置及び測定方法
JPH06213821A (ja) 半導体ウェハの異物検査装置
JPH0462046B2 (enrdf_load_stackoverflow)
KR100212140B1 (ko) 컴팩트디스크 픽업렌즈의 경사도 검사방법
CN117706121A (zh) 一种基于stm隧道电流线的异常区域自动检测及快速定位的系统及其方法
JPH0666512A (ja) 走査型トンネル顕微鏡
JPH0125104B2 (enrdf_load_stackoverflow)
JPH0450528B2 (enrdf_load_stackoverflow)