JPH0437955B2 - - Google Patents

Info

Publication number
JPH0437955B2
JPH0437955B2 JP59225371A JP22537184A JPH0437955B2 JP H0437955 B2 JPH0437955 B2 JP H0437955B2 JP 59225371 A JP59225371 A JP 59225371A JP 22537184 A JP22537184 A JP 22537184A JP H0437955 B2 JPH0437955 B2 JP H0437955B2
Authority
JP
Japan
Prior art keywords
mask sheet
jig
pores
pair
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59225371A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61102542A (ja
Inventor
Takeshi Nishizawa
Riichi Kano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59225371A priority Critical patent/JPS61102542A/ja
Publication of JPS61102542A publication Critical patent/JPS61102542A/ja
Publication of JPH0437955B2 publication Critical patent/JPH0437955B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages

Landscapes

  • Engineering & Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP59225371A 1984-10-25 1984-10-25 基板検査機用マスクシ−トの位置合わせ方法 Granted JPS61102542A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59225371A JPS61102542A (ja) 1984-10-25 1984-10-25 基板検査機用マスクシ−トの位置合わせ方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59225371A JPS61102542A (ja) 1984-10-25 1984-10-25 基板検査機用マスクシ−トの位置合わせ方法

Publications (2)

Publication Number Publication Date
JPS61102542A JPS61102542A (ja) 1986-05-21
JPH0437955B2 true JPH0437955B2 (cs) 1992-06-22

Family

ID=16828299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59225371A Granted JPS61102542A (ja) 1984-10-25 1984-10-25 基板検査機用マスクシ−トの位置合わせ方法

Country Status (1)

Country Link
JP (1) JPS61102542A (cs)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5595447A (en) 1992-10-13 1997-01-21 Seiko Epson Corporation Tape cartridge and printing device having print medium cartridge

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55163468A (en) * 1979-06-06 1980-12-19 Toshiba Corp Inspecting method and device for circuit substrate

Also Published As

Publication number Publication date
JPS61102542A (ja) 1986-05-21

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