JPH0436462Y2 - - Google Patents
Info
- Publication number
- JPH0436462Y2 JPH0436462Y2 JP10117686U JP10117686U JPH0436462Y2 JP H0436462 Y2 JPH0436462 Y2 JP H0436462Y2 JP 10117686 U JP10117686 U JP 10117686U JP 10117686 U JP10117686 U JP 10117686U JP H0436462 Y2 JPH0436462 Y2 JP H0436462Y2
- Authority
- JP
- Japan
- Prior art keywords
- base
- electronic component
- inspection
- support
- hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007689 inspection Methods 0.000 claims description 46
- 239000000523 sample Substances 0.000 claims description 22
- 238000000926 separation method Methods 0.000 claims description 4
- 238000013459 approach Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10117686U JPH0436462Y2 (fr) | 1986-07-01 | 1986-07-01 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10117686U JPH0436462Y2 (fr) | 1986-07-01 | 1986-07-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS637371U JPS637371U (fr) | 1988-01-19 |
JPH0436462Y2 true JPH0436462Y2 (fr) | 1992-08-27 |
Family
ID=30971683
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10117686U Expired JPH0436462Y2 (fr) | 1986-07-01 | 1986-07-01 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0436462Y2 (fr) |
-
1986
- 1986-07-01 JP JP10117686U patent/JPH0436462Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS637371U (fr) | 1988-01-19 |
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