JPH04364440A - Thermal-shock testing apparatus - Google Patents

Thermal-shock testing apparatus

Info

Publication number
JPH04364440A
JPH04364440A JP13997491A JP13997491A JPH04364440A JP H04364440 A JPH04364440 A JP H04364440A JP 13997491 A JP13997491 A JP 13997491A JP 13997491 A JP13997491 A JP 13997491A JP H04364440 A JPH04364440 A JP H04364440A
Authority
JP
Japan
Prior art keywords
air
temperature
chamber
test
low
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13997491A
Other languages
Japanese (ja)
Inventor
Hidehiro Sonoda
英博 園田
Tatsuo Hayashida
林田 辰雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi Information Systems Ltd
Original Assignee
Hitachi Ltd
Hitachi Information Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Information Systems Ltd filed Critical Hitachi Ltd
Priority to JP13997491A priority Critical patent/JPH04364440A/en
Publication of JPH04364440A publication Critical patent/JPH04364440A/en
Pending legal-status Critical Current

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  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

PURPOSE:To omit the introduction of outer air which is the cause of frosting and to eliminate the interruption time of a test due to frost removal by providing an independent dry-air storing chamber, and circulating the air in a test chamber. CONSTITUTION:The air in a high temperature chamber 2 is returned to heater 3 by way of the heater 3, a blower 4 and a heat accumulator 5. Heating is performed to a specified temperature. The air in a low temperature chamber 10 is also returned to a cooler 11 by way of the cooler 11, a blower 13 and a cool-air accumulator 24. Cooling is performed to a specified temperature. The temperature is kept constant with a heater 12. After the high-temperature air and the low-temperature air are prepared in this way, high-temperature dampers 7 and 9 are opened, and the high- temperature air is made to flow into a test chamber through a hot air diffusing port 6 and circulated in the chamber. The air is returned into the high-temperature chamber through a hot-air sucking port 8. Temperature stress at the high temperature is imparted by the circulation of the hot air. By the same way, temperature stress at the low temperature is imparted with the constitution of low-temperature dampers 15 and 17, a cool-air diffusing port 16 and a cool-air sucking port 16. Frosting is eliminated by omitting the introduction of outer air in this way.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、各種材料,各種機器の
部品等を高温・低温の雰囲気に交互にさらして、上記材
料等の熱ストレス特性,耐久性等を試験するための熱衝
撃試験装置に関する。
[Industrial Application Field] The present invention is a thermal shock test for testing the thermal stress characteristics, durability, etc. of the above-mentioned materials by exposing various materials and parts of various equipment to alternately high and low temperature atmospheres. Regarding equipment.

【0002】0002

【従来の技術】熱衝撃試験装置は特開昭58−4295
2 号公報に記載のように試験室と低温気体供給室と、
高温気体供給室の3つの断熱された室により構成されて
いた。この場合常温試験時では外気を導入するため、外
湿の外気を導入すると、着霜により運転できなくなる。
[Prior art] Thermal shock test equipment is disclosed in Japanese Patent Application Laid-Open No. 58-4295.
As described in Publication No. 2, a test chamber and a low-temperature gas supply chamber,
It consisted of three insulated chambers with a hot gas supply chamber. In this case, since outside air is introduced during the normal temperature test, if outside air with outside humidity is introduced, operation will become impossible due to frost formation.

【0003】このため試験を中断して低温気体供給室の
除霜を行なっていた。
[0003] For this reason, the test was interrupted and the low temperature gas supply chamber was defrosted.

【0004】0004

【発明が解決しようとする課題】上記従来技術は、着霜
による低温室内の冷却能力低下により、一時的に試験を
中断して低温室内を除霜し、再度所定の温度まで低温室
内を冷却する必要があった。この為連続的に熱衝撃試験
を実施できず、試験期間が増大する問題があった。
[Problems to be Solved by the Invention] In the above-mentioned conventional technology, when the cooling capacity in the low-temperature chamber decreases due to frost formation, the test is temporarily interrupted, the inside of the low-temperature chamber is defrosted, and the inside of the low-temperature chamber is cooled down to a predetermined temperature again. There was a need. For this reason, there was a problem in that thermal shock tests could not be carried out continuously and the test period increased.

【0005】本発明の目的は着霜の要因となる外気導入
を廃止し、除霜による試験の中断時間を削除することに
ある。
An object of the present invention is to eliminate the introduction of outside air, which causes frost formation, and to eliminate the interruption time of the test due to defrosting.

【0006】[0006]

【課題を解決するための手段】上記目的は、試験室に対
して、独立した乾燥室気保管室を装備し、常温試験時に
この空気を試験室内に流通させることにより達成される
[Means for Solving the Problems] The above object is achieved by equipping the test chamber with an independent dry air storage chamber and circulating this air into the test chamber during normal temperature tests.

【0007】[0007]

【作用】試験室に対し独立した低温室,高温室,乾燥室
気保管室を有する熱衝撃試験装置に於て、低温試験から
高温試験、あるいは高温試験から低温試験に移行する間
に行なう常温試験の際、乾燥空気保管室の空気を試験室
内に流入させ、試験室内を常温に戻す。これにより試験
室,低温室,高温室に外気侵入が無くなり、低温室内の
冷却装置の着霜を防止することが出来るため、長期間の
熱衝撃試験が可能になる。
[Operation] In a thermal shock test device that has a cold room, a high temperature room, and a dry air storage room independent of the test chamber, room temperature tests are carried out during the transition from a low temperature test to a high temperature test, or from a high temperature test to a low temperature test. At this time, air from the dry air storage room is flowed into the test room to return the test room to room temperature. This prevents outside air from entering the test chamber, low temperature room, and high temperature room, and prevents frost from forming on the cooling equipment in the low temperature room, making it possible to conduct long-term thermal shock tests.

【0008】[0008]

【実施例】以下に本発明の一実施例を図1,図2により
説明する。
[Embodiment] An embodiment of the present invention will be described below with reference to FIGS. 1 and 2.

【0009】図1にて試験室1は断熱された室であり、
本試験室1の上部には同様に断熱された高温室5がある
。高温室2には加熱器3,送風機4,蓄熱材5が配置さ
れ、高温室2と試験室1の相対する断熱部には熱風吹出
口6と該吹出口6を開閉する高温ダンパ7、及び熱風吸
入口8と該吸入口8を開閉する高温ダンパ9が設けられ
ている。
[0009] In FIG. 1, test chamber 1 is an insulated chamber,
In the upper part of the test chamber 1, there is a high temperature chamber 5 which is also insulated. A heater 3, a blower 4, and a heat storage material 5 are arranged in the high temperature chamber 2, and a hot air outlet 6, a high temperature damper 7 that opens and closes the outlet 6, and A hot air inlet 8 and a high temperature damper 9 for opening and closing the inlet 8 are provided.

【0010】また、試験室1の下部には試験室1と同様
に断熱された低温室10がある。低温室10には冷却器
11,加熱器12,送風機13,蓄冷材24が配置され
、低温室10と試験室1の相対する断熱部には冷風吹出
口14と該吹出口14を開閉する低温ダンパ15、及び
冷風吸入口16と該吸入口16を開閉する低温ダンパ1
7が設けられている。
[0010] Also, in the lower part of the test chamber 1, there is a cold room 10 which is insulated similarly to the test chamber 1. A cooler 11, a heater 12, a blower 13, and a cold storage material 24 are arranged in the cold room 10, and in the opposing heat insulating part of the cold room 10 and the test chamber 1, there is a cold air outlet 14 and a cold air outlet 14 that opens and closes the outlet 14. A damper 15, a cold air inlet 16, and a low-temperature damper 1 that opens and closes the inlet 16.
7 is provided.

【0011】また、高温室2の上部には試験室1,高温
室2,低温室10と同様に断熱された乾燥空気保管室1
8がある。乾燥空気保管室18は、試験室1内部を常温
に戻すのに必要な乾燥空気(図示せず)が保管され、乾
燥空気保管室18と試験室1の相対する断熱部には乾燥
空気吹出口19と該吹出口19を開閉する常温ダンパ2
0、及び乾燥空気吸込口21と該吸入口21を開閉する
常温ダンパ22及び送風機23が設けられている。
[0011] Also, in the upper part of the high temperature chamber 2, there is a dry air storage chamber 1 which is insulated similarly to the test chamber 1, the high temperature chamber 2, and the low temperature chamber 10.
There are 8. The dry air storage chamber 18 stores dry air (not shown) necessary to return the inside of the test chamber 1 to room temperature, and a dry air outlet is provided in the insulating section facing the dry air storage chamber 18 and the test chamber 1. 19 and a normal temperature damper 2 that opens and closes the air outlet 19.
0, a dry air suction port 21, a room temperature damper 22 for opening and closing the dry air suction port 21, and a blower 23.

【0012】次に本発明の動作について説明する。Next, the operation of the present invention will be explained.

【0013】まず冷却衝撃試験に先だって高温室2の空
気は加熱器3,送風機4,蓄熱材5を通って加熱器3に
戻る循環路により所定温度まで加熱される。
First, prior to the cooling shock test, the air in the high temperature chamber 2 is heated to a predetermined temperature by a circulation path that passes through the heater 3, the blower 4, the heat storage material 5, and returns to the heater 3.

【0014】一方低温室10の空気も冷却器11,送風
機13,蓄冷材24を通って冷却器11に戻る循環路に
より所定温度まで冷却される。なお所定温度に冷却され
た空気は加熱器12によりこの温度で一定に保持される
。このように高温室2の空気と低温室10の空気の予熱
・予冷が準備されると、初めて高温ダンパ7・9が開と
なり、高温室2の加熱された空気が熱風となって熱風吹
出口6より試験室1に流入し、試験室1内を循環し、熱
風吸込口8から高温室2に戻る。この熱風の循環により
試験室1内に配置された試料(図示せず)に高温の温度
ストレスを与える。そして所定の試験時間が経過した後
、高温ダンパ7・9が閉じて高温試験を完了する。
On the other hand, the air in the cold room 10 is also cooled to a predetermined temperature by a circulation path that passes through the cooler 11, the blower 13, the cold storage material 24, and returns to the cooler 11. Note that the air cooled to a predetermined temperature is kept constant at this temperature by the heater 12. When the air in the high temperature chamber 2 and the air in the low temperature chamber 10 are prepared for preheating and precooling in this way, the high temperature dampers 7 and 9 are opened for the first time, and the heated air in the high temperature chamber 2 becomes hot air and the hot air outlet is opened. Air flows into the test chamber 1 through 6, circulates within the test chamber 1, and returns to the high temperature chamber 2 through the hot air inlet 8. This circulation of hot air applies high temperature stress to a sample (not shown) placed in the test chamber 1. After a predetermined test time has elapsed, the high temperature dampers 7 and 9 are closed to complete the high temperature test.

【0015】また、低温試験では、低温ダンパ15・1
7が開となり、低温室10の冷却された空気が冷風とな
って冷風吸出口14より試験室1に流入し、試験室1内
を循環し、冷風吸込口16から低温室10に戻る。この
冷風の循環により試験室1内に配置された試料(図示せ
ず)に低温の温度ストレスを与える。そして所定の試験
時間が経過した後、低温ダンパ15・17が閉じて低温
試験を完了する。
[0015] Also, in the low temperature test, the low temperature damper 15.1
7 is opened, and the cooled air in the cold room 10 becomes cold air and flows into the test chamber 1 from the cold air suction port 14, circulates within the test chamber 1, and returns to the cold room 10 from the cold air suction port 16. This circulation of cold air applies low-temperature stress to a sample (not shown) placed in the test chamber 1. After a predetermined test time has elapsed, the low temperature dampers 15 and 17 are closed to complete the low temperature test.

【0016】また図2は一般的な熱衝撃試験に於ける、
試験室1内の温度変化を示したものである。
FIG. 2 also shows the results of a general thermal shock test.
It shows the temperature change inside the test chamber 1.

【0017】前述のとおり試験室1に熱風と冷風を交互
に入れて熱衝撃試験が行なわれるが、一般的に定められ
ている試験方法では、図2に示すとおり、低温から高温
、あるいは高温から低温への試験の切換わり時、常温試
験を実施するものとしている。
As mentioned above, a thermal shock test is carried out by alternately introducing hot air and cold air into the test chamber 1, but in the generally established test method, as shown in FIG. When switching to a low temperature test, a room temperature test shall be conducted.

【0018】このため、常温試験では、常温ダンパ20
・22が開となり、乾燥空気保管室18内の密閉・乾燥
された常温空気が乾燥空気吹出口19より試験室1内に
流入し、実線矢印に示すとおり試験室1内を循環し、乾
燥空気吸込口21から乾燥空気保管室18に戻る。この
常温空気の循環により試験室1内を常温に戻す。そして
、所定の試験時間が経過した後、常温ダンパ20・22
が閉じて常温試験を完了する。
Therefore, in the room temperature test, the room temperature damper 20
22 is opened, the sealed and dried normal temperature air in the dry air storage chamber 18 flows into the test chamber 1 from the dry air outlet 19, circulates in the test chamber 1 as shown by the solid arrow, and the dry air The air returns to the dry air storage chamber 18 from the suction port 21. This circulation of room temperature air returns the inside of the test chamber 1 to room temperature. After a predetermined test time has passed, the room temperature dampers 20 and 22
is closed to complete the room temperature test.

【0019】このように、試験室1内にはそれぞれ密閉
された高温室2,低温室10,乾燥空気保管室18より
空気が流入・循環して試験を実施するため、外気の導入
がなくなり、低温室10及び試験室1内の着霜が解消さ
れる。このため、試験を一時的に中断し、低温室10及
び試験室1内の除霜を行う作業が不要となる。
[0019] As described above, since the test is carried out by inflowing and circulating air into the test chamber 1 from the sealed high temperature chamber 2, low temperature chamber 10, and dry air storage chamber 18, the introduction of outside air is eliminated. Frost in the cold room 10 and the test chamber 1 is eliminated. Therefore, there is no need to temporarily suspend the test and defrost the inside of the cold room 10 and the test chamber 1.

【0020】[0020]

【発明の効果】本発明によれば、低温室,高温室及び乾
燥空気保管室を並設しそれぞれの試験において試験室に
多湿の外気が侵入するのを排除したため、低温室,試験
室内の除霜が不要となった。このため長期間に渡り連続
した熱衝撃試験が可能となり、試験期間の短縮、及び試
料の不良箇所の早期発見が可能となった。
Effects of the Invention According to the present invention, a low temperature chamber, a high temperature chamber, and a dry air storage chamber are installed side by side to prevent humid outside air from entering the test chamber in each test. Frost is no longer necessary. This makes it possible to conduct thermal shock tests continuously over a long period of time, shorten the test period, and discover defective parts of samples at an early stage.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明の一実施例の熱衝撃試験装置の通常の常
温試験状態を示す縦断面図である。
FIG. 1 is a longitudinal sectional view showing a normal room temperature test condition of a thermal shock test apparatus according to an embodiment of the present invention.

【図2】一般的な熱衝撃試験に於ける試験室内の温度変
化を示した図である。
FIG. 2 is a diagram showing temperature changes in a test chamber in a general thermal shock test.

【符号の説明】[Explanation of symbols]

1…試験室、2…高温室、3…加熱器、4…送風機、5
…蓄熱材、6…熱風吹出口、7,9…高温ダンパ、8…
熱風吸込口、10…低温室、11…冷却器、12…加熱
器、13…送風機、14…冷風吹出口、15,17…低
温ダンパ、16…冷風吸込口、18…乾燥空気保管室、
19…乾燥空気吹出口、20,22…常温ダンパ、21
…乾燥空気吸込口、23…送風機、24…蓄冷材。
1...Testing room, 2...High temperature chamber, 3...Heater, 4...Blower, 5
...Heat storage material, 6...Hot air outlet, 7, 9...High temperature damper, 8...
Hot air inlet, 10...Cold room, 11...Cooler, 12...Heater, 13...Blower, 14...Cold air outlet, 15, 17...Low temperature damper, 16...Cold air inlet, 18...Dry air storage room,
19... Dry air outlet, 20, 22... Room temperature damper, 21
...Dry air suction port, 23...Blower, 24...Cold storage material.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】試験室に対し独立した低温室・高温室を備
えた熱衝撃試験装置に於いて、乾燥空気保管室を備えた
ことを特徴とする熱衝撃試験装置。
1. A thermal shock test apparatus comprising a low temperature chamber and a high temperature chamber independent of the test chamber, the apparatus comprising a dry air storage chamber.
JP13997491A 1991-06-12 1991-06-12 Thermal-shock testing apparatus Pending JPH04364440A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13997491A JPH04364440A (en) 1991-06-12 1991-06-12 Thermal-shock testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13997491A JPH04364440A (en) 1991-06-12 1991-06-12 Thermal-shock testing apparatus

Publications (1)

Publication Number Publication Date
JPH04364440A true JPH04364440A (en) 1992-12-16

Family

ID=15258005

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13997491A Pending JPH04364440A (en) 1991-06-12 1991-06-12 Thermal-shock testing apparatus

Country Status (1)

Country Link
JP (1) JPH04364440A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007081022A (en) * 2005-09-13 2007-03-29 Oki Electric Ind Co Ltd Thermal shock test device, thermal shock test method and method of inspecting semiconductor wafer
KR20200112226A (en) * 2019-03-21 2020-10-05 국방과학연구소 High temperature test equipment by using dual chamber

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007081022A (en) * 2005-09-13 2007-03-29 Oki Electric Ind Co Ltd Thermal shock test device, thermal shock test method and method of inspecting semiconductor wafer
JP4690153B2 (en) * 2005-09-13 2011-06-01 Okiセミコンダクタ株式会社 Thermal shock test equipment
KR20200112226A (en) * 2019-03-21 2020-10-05 국방과학연구소 High temperature test equipment by using dual chamber

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