JPH03195946A - Thermal shock tester - Google Patents
Thermal shock testerInfo
- Publication number
- JPH03195946A JPH03195946A JP33796889A JP33796889A JPH03195946A JP H03195946 A JPH03195946 A JP H03195946A JP 33796889 A JP33796889 A JP 33796889A JP 33796889 A JP33796889 A JP 33796889A JP H03195946 A JPH03195946 A JP H03195946A
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- test
- test chamber
- heat exchange
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000035939 shock Effects 0.000 title claims description 24
- 238000012360 testing method Methods 0.000 claims abstract description 134
- 238000001816 cooling Methods 0.000 claims abstract description 31
- 238000010438 heat treatment Methods 0.000 claims abstract description 10
- 238000005057 refrigeration Methods 0.000 claims description 23
- 230000015572 biosynthetic process Effects 0.000 abstract description 2
- 238000010257 thawing Methods 0.000 abstract 1
- 239000003507 refrigerant Substances 0.000 description 8
- 238000005192 partition Methods 0.000 description 4
- 238000007664 blowing Methods 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000009423 ventilation Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009863 impact test Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、冷熱衝撃試験装置、詳しくは、予冷室と予熱
室とをテスト室に隣接して設け、該テスト室を前記予冷
室と予熱室とに選択的に連通させることにより、前記テ
スト室内に冷却空気と加熱空気とを導入させて、電子部
品など被試験品の冷熱衝撃試験を行うようにした冷熱衝
撃試験装置に関する。Detailed Description of the Invention (Industrial Application Field) The present invention provides a thermal shock test apparatus, specifically, a thermal shock test apparatus, in particular, a precooling chamber and a preheating chamber are provided adjacent to a test chamber, and the test chamber is connected to the precooling chamber and the preheating chamber. The present invention relates to a thermal shock test apparatus that conducts a thermal shock test on a test object such as an electronic component by introducing cooling air and heated air into the test chamber by selectively communicating with the test chamber.
(従来の技術)
一般に、電子部品などの冷熱衝撃試験を行う場合、JI
S規格やMIL規格などに基づいて行うのであるが、前
記電子部品などを対象とする冷熱衝撃試験は、低温さら
しと常温さらし及び高温さらしを一定時間置きに繰り返
して行われる3ゾ一ン方式が定められている。(Prior art) Generally, when performing thermal shock tests on electronic components, etc., JI
Thermal shock testing for electronic components, etc., is conducted in accordance with S standards and MIL standards. It is determined.
しかして、以上のような冷熱衝撃試験を行う冷熱衝撃試
験装置として、従来では、例えば特開昭81−2E39
042号公報に記載されたものが知られており、この公
報記載のものは、第4図に示したごとく、テスト室(T
)に隣接する両側に、冷却器(C)及び冷却ファン(C
F)などを備えた予冷室(A)と、加熱器(H)及び加
熱ファン(HF)などを備えた予熱室CB)とをそれぞ
れ画成状に形成すると共に、前記テスト室(T)と予冷
室(A)とを画成する隔壁に、前記テスト室(T)側の
室内空気を予冷室(A)に供給する供給口(E1)と、
この予冷室(A)で冷却された冷却空気を前記テスト室
(T)側に吹出す吹出口(E2)とを形成して、これら
供給口(E1)と吹出口(E2)とに、それぞれ第1及
び第2切換ダンパ(Di)(D2)を開閉可能に取付け
る一方、前記テスト室(T)と予熱室(B)とを画成す
る隔壁に、前記テスト室(T)側の室内空気を予熱室(
B)に供給する供給口(E3)と、この予熱室(B)で
加熱した加熱空気を前記テスト室(T)側に吹出す吹出
口(E4)とを形成して、これら供給口(E3)と吹出
口(E4)とに、それぞれ第3及び第4切換ダンパ(D
3)(D4)を開閉可能に取付けている。Conventionally, as a thermal shock test device for performing the above-mentioned thermal shock test, for example, Japanese Patent Application Laid-Open No. 81-2E39 has been used.
The one described in Publication No. 042 is known, and the one described in this publication is installed in the test chamber (T
) on both sides adjacent to the cooler (C) and cooling fan (C
A pre-cooling chamber (A) equipped with a heater (H), a heating fan (HF), etc., and a pre-heating chamber CB) equipped with a heater (H), a heating fan (HF), etc. are respectively formed in a defined shape, and the test chamber (T) and A supply port (E1) for supplying indoor air from the test chamber (T) side to the precooling chamber (A) in a partition wall defining the precooling chamber (A);
An air outlet (E2) is formed to blow out the cooling air cooled in the pre-cooling chamber (A) to the test chamber (T) side, and these air outlets (E1) and (E2) are connected to each other. While the first and second switching dampers (Di) (D2) are installed so as to be openable and closable, the room air on the test chamber (T) side is The preheating chamber (
A supply port (E3) for supplying air to the test chamber (T) and a blow-off port (E4) for blowing out the heated air heated in the preheating chamber (B) to the test chamber (T) side are formed. ) and the air outlet (E4), the third and fourth switching dampers (D
3) (D4) is installed so that it can be opened and closed.
また、前記テスト室(T)には、外気に連通ずる吸気ダ
クト(K)を設け、該吸気ダクト(K)の前記テスト室
(T)への入口側に第5切換ダンパ(D5)を開閉可能
に取付けると共に、前記テスト室(T)の内部に排気口
(E5)を設けて、この排気口(E5)に第6切換ダン
パ(D6)を開閉可能に取付けている。Further, the test chamber (T) is provided with an intake duct (K) that communicates with the outside air, and a fifth switching damper (D5) is provided on the entrance side of the intake duct (K) to the test chamber (T) for opening and closing. In addition, an exhaust port (E5) is provided inside the test chamber (T), and a sixth switching damper (D6) is attached to the exhaust port (E5) so as to be openable and closable.
そして、前記テスト室(T)で電子部品など被試験品の
冷熱衝撃試験を行う場合には、先ず、前記第3.第4切
換ダンパ(D3)(D4)を開放し、前記予熱室(B)
内の加熱空気を前記テスト室(T)へと導入することに
より、前記被試験品を所定時間高温状態にさらし、次に
、前記第3゜第4切換ダンパ(D3)(D4)を閉鎖し
た後、前記吸気ダク) (K)の第5切換ダンパ(D5
)を開放し、前記排気口(E5)の第6切換ダンパ(D
6)を開放させて、前記テスト室(T)内の空気を外気
と入れ換えることにより、該テスト室(T)内を常温と
なして、前記被試験品を所定時間常温状態にさらし、こ
の後前記第5.第6切換ダンパ(D5)(D8)を閉鎖
し、前記第1.第2切換ダンパ(Di)(D2)を開放
して、前記予冷室(A)内の冷却空気を前記テスト室(
T)側へと導入することにより、前記被試験品を所定時
間低温状態にさらすのである。When performing a thermal shock test on a test object such as an electronic component in the test chamber (T), the third test is performed first. The fourth switching damper (D3) (D4) is opened and the preheating chamber (B) is opened.
By introducing the heated air inside the chamber into the test chamber (T), the test article was exposed to a high temperature state for a predetermined period of time, and then the third and fourth switching dampers (D3) and (D4) were closed. After that, the fifth switching damper (D5) of the intake duct) (K)
), and the sixth switching damper (D) of the exhaust port (E5) is opened.
6) by opening the test chamber (T) and replacing the air in the test chamber (T) with outside air to bring the inside of the test chamber (T) to room temperature, and expose the product to be tested to room temperature for a predetermined period of time; Said 5th. The sixth switching damper (D5) (D8) is closed, and the first switching damper (D5) (D8) is closed. The second switching damper (Di) (D2) is opened to direct the cooling air in the precooling chamber (A) to the test chamber (
By introducing the sample to the T) side, the product to be tested is exposed to a low temperature state for a predetermined period of time.
(発明が解決しようとする課題)
所で、以上の冷熱衝撃試験装置では、前記被試験品の冷
熱衝撃試験時で、該被試験品を常温状態にさらすとき、
前記テスト室(T)内に湿分の多い外気を取入れること
で、このテスト室(T)を常温とするようにしているた
め、前記被試験品の低温さらしを行うときに、前記テス
ト室(T)内の湿分の多い外気が前記予冷室(A)側へ
と取入れられて、該予冷室、(A)に配設した前記冷却
器(C)に着氷が発生し、この冷却器(C)の能力低下
を招くのであり、従って、該冷却器(C)の着水を除去
するために、一定時間毎にデフロスト運転を行う必要が
あった。(Problems to be Solved by the Invention) However, in the above-described thermal shock test apparatus, when the test object is exposed to room temperature during the thermal shock test of the test object,
By introducing humid outside air into the test chamber (T), the test chamber (T) is kept at room temperature. The humid outside air inside (T) is taken into the precooling chamber (A) side, and ice builds up on the precooling chamber and the cooler (C) disposed in (A). Therefore, in order to remove the water that landed on the cooler (C), it was necessary to perform a defrost operation at regular intervals.
本発明は以上のような問題に鑑みてなしたもので、その
目的は、自然循環式冷凍回路を追加する極めて簡単な構
成で、外気取入れによる常温さらしゾーンの形成をなく
し前記予冷室側の着氷を少なくして、デフロスト運転サ
イクルを大幅に延長でき、高能率運転を行うことが可能
な冷熱衝撃試験装置を提供することにある。The present invention has been made in view of the above-mentioned problems.The purpose of the present invention is to provide an extremely simple configuration that adds a natural circulation refrigeration circuit, eliminate the formation of a room-temperature exposure zone due to the intake of outside air, and reduce the To provide a thermal shock test device capable of reducing ice, significantly extending a defrost operation cycle, and performing highly efficient operation.
(課題を解決するための手段)
上記目的を達成するために、本発明では、予冷室(2)
と予熱室(3)及びこれら予冷室(2)と予熱室(3)
とに連通ずるテスト室(1)とを備え、該テスト室(1
)を、前記予冷室(2)と予熱室(3)とに選択的に連
通ずるようにした冷熱衝撃試験装置において、室内熱交
換部(41)(51)と室外熱交換部(42)(52)
とを備えた2系統の自然循環式冷凍回路(4)(5)を
設けて、これら冷凍回路(4)(5)の各室内熱交換部
(41)(51)を、前記テスト室(1)に配設し、前
記各室外熱交換部(42)(52)を室外に配設したこ
とを特徴とするものである。(Means for Solving the Problem) In order to achieve the above object, the present invention provides a pre-cooling chamber (2).
and preheating chamber (3), and these precooling chamber (2) and preheating chamber (3)
and a test chamber (1) communicating with the test chamber (1).
) is selectively communicated with the precooling chamber (2) and the preheating chamber (3), the indoor heat exchange section (41) (51) and the outdoor heat exchange section (42) ( 52)
Two systems of natural circulation refrigeration circuits (4) and (5) having ), and each of the outdoor heat exchange parts (42) and (52) is arranged outdoors.
(作用)
前記テスト室(1)で被試験品の低温さらしを行うとき
には、該テスト室(1)内に前記予冷室(2)から冷却
空気が導入され、また、前記被試験品の高温さらしを行
うときには、前記テスト室(1)内に前記予熱室(3)
から加熱空気が導入される。そして、以上のような低温
及び高温さらしの途中で、前記テスト室(1)内を常温
状態として、前記被試験品の常温さらしを行うとき、即
ち、低温さらしから常温さらしに、又、高温さらしから
常温さらしへと移行するときには、前記テスト室(1)
を外気に開放させることなく、該テスト室(1)が外気
と遮断された状態で、前記2系統の自然循環式冷凍回路
(4)(5)が選択的に作動され、前記テスト室(1)
を常温状態にできるのである。従って、前記被試験品の
常温さらしを行った後に、低温さらしを行うとき、前記
テスト室(1)には外気が取入れられることがないため
、前記予冷室(2)側での着水が少なくなって、デフロ
スト運転サイクルが大幅に延長され、高能率運転が行わ
れる。(Function) When the test article is subjected to low-temperature exposure in the test chamber (1), cooling air is introduced into the test chamber (1) from the pre-cooling chamber (2), and the test article is subjected to high-temperature exposure. When performing this, the preheating chamber (3) is placed in the test chamber (1).
Heated air is introduced from Then, in the middle of the above-mentioned low-temperature and high-temperature exposure, when the test chamber (1) is brought to room temperature and the test article is subjected to room-temperature exposure, that is, from low-temperature exposure to room-temperature exposure, and then high-temperature exposure. When transitioning from exposure to room temperature, the test chamber (1)
With the test chamber (1) isolated from the outside air without opening the test chamber (1) to the outside air, the two natural circulation refrigeration circuits (4) and (5) are selectively activated. )
can be kept at room temperature. Therefore, when exposing the test product to a low temperature after exposing it to room temperature, since outside air is not taken into the test chamber (1), there is less water landing on the pre-cooling chamber (2) side. As a result, the defrost operation cycle is significantly extended, resulting in highly efficient operation.
(実施例)
第1図に示した冷熱衝撃試験装置は、ハウジング(HG
)の内部を断熱隔壁(W)で3つに区画して、中央部に
被試験品の冷熱衝撃試験を行うテスト室(1)を、該テ
スト室(1)に隣接する両側に、予冷室(2)と予熱室
(3)とをそれぞれ区画形成すると共に、前記予冷室(
2)の内部には、冷却器(21)と冷却ファン(22)
及び蓄冷器(23)を配設し、又、前記予熱室(3)の
内部には、加熱器(31)と加熱ファン(32)とを配
設している。尚、前記予冷室(1)と予熱室(2)に設
ける前記各ファン(22)(32)は、それぞれ室外側
に配設されたモータ(24)(33)で回転駆動される
。(Example) The thermal shock test device shown in FIG.
) is divided into three parts by heat insulating partitions (W), with a test chamber (1) in the center for performing thermal shock tests on test items, and a pre-cooling chamber on both sides adjacent to the test chamber (1). (2) and a preheating chamber (3) are respectively formed into sections, and the precooling chamber (
2) has a cooler (21) and a cooling fan (22) inside.
and a regenerator (23), and a heater (31) and a heating fan (32) are provided inside the preheating chamber (3). The fans (22) and (32) provided in the pre-cooling chamber (1) and the pre-heating chamber (2) are rotationally driven by motors (24) and (33) respectively disposed on the outside of the room.
また、前記テスト室(1)と予冷室(2)とを画成する
隔壁(W)に、前記テスト室(1)の室内空気を予冷室
(2)に供給する供給口(11)と、この予冷室(2)
で冷却された冷却空気を前記テスト室(1)側に吹出す
吹出口(12)とを設けて、これら供給口(11)と吹
出口(12)とに、第1及び第2切換ダンパ(13)(
14)をそれぞれ開閉可能に取付けると共に、前記テス
ト室(1)と前記予熱室(3)とを画成する隔壁(W)
に、前記テスト室(1)側の室内空気を予熱室(3)に
供給する供給口(15)と、この予熱室(3)で加熱さ
れた加熱空気を前記テスト室(1)側に吹出す吹出口(
16)とを形成して、これら供給口(15)と吹出口(
16)とに、第3及び第4切換ダンパ(17)(18)
をそれぞれ開閉可能に取付ける一方、前記テスト室(1
)には、試料出入れ用開閉扉(19)を設けている。Further, a supply port (11) for supplying room air from the test chamber (1) to the pre-cooling chamber (2) in a partition wall (W) that defines the test chamber (1) and the pre-cooling chamber (2); This pre-cooling chamber (2)
A blowout port (12) is provided to blow out the cooling air cooled by the cooling air to the test chamber (1) side, and first and second switching dampers ( 13)(
14) are attached so as to be openable and closable, respectively, and a partition wall (W) that defines the test chamber (1) and the preheating chamber (3).
and a supply port (15) for supplying room air from the test chamber (1) side to the preheating chamber (3), and a supply port (15) for supplying indoor air from the test chamber (1) side to the preheating chamber (3), and a supply port (15) for blowing heated air heated in the preheating chamber (3) to the test chamber (1) side. Air outlet (
16), and these supply ports (15) and air outlets (
16) Third and fourth switching dampers (17) (18)
The test chamber (1) is installed so that it can be opened and closed.
) is provided with an opening/closing door (19) for sample entry/exit.
しかして以上の衝撃試験装置において、室内熱交換部(
41)(51)と室外熱交換部(42)(52)とを備
えた2系統の第1及び第2自然循環式冷凍回路(4)、
、(5)を用い、該各冷凍回路(4)(5)の各室内熱
交換部(41)(51)を、前記テスト室(1)内に配
設すると共に、前記各室外熱交換部(42)(52)を
室外側に配設したのである。However, in the above impact test equipment, the indoor heat exchange section (
41) (51) and two systems of first and second natural circulation refrigeration circuits (4) equipped with outdoor heat exchange sections (42) (52),
, (5), each indoor heat exchange section (41) (51) of each of the refrigeration circuits (4) (5) is arranged in the test chamber (1), and each of the outdoor heat exchange section (42) and (52) were placed outside the room.
具体的には、第1図で明らかにしたように、前記第1冷
凍回路(4)の室内熱交換部(41)と室外熱交換部(
42)との間を、2つの第1及び第2配管(43)(4
4)で接続して、これら各配管(43)(44)を介し
て前記室内熱交換部(41)と室外熱交換部(42)と
の間で冷媒の自然循環を行うようになすと共に、前記第
1配管(43)の途中に、第1電磁弁(SVI)、!:
第1膨張弁(v1)とをそれぞれ介装させる一方、前記
第2配管(44)の途中に逆止弁(G1)を介装させる
。Specifically, as shown in FIG. 1, the indoor heat exchange section (41) and the outdoor heat exchange section (41) of the first refrigeration circuit (4)
42) between the two first and second pipes (43) (4
4) to perform natural circulation of the refrigerant between the indoor heat exchange section (41) and the outdoor heat exchange section (42) via these piping (43) and (44), In the middle of the first pipe (43), there is a first solenoid valve (SVI)! :
A first expansion valve (v1) is interposed therein, and a check valve (G1) is interposed in the middle of the second pipe (44).
また、前記第2冷凍回路(5)の室内熱交換部(51)
と室外熱交換部(52)との間を、前述した第1冷凍回
路(4)の場合と同様に、2つの第1及び第2配管(5
3)(54)で接続して、これら各配管(53)(54
)を介して前記室内熱交換部(51)と室外熱交換部(
52)との間で冷媒の循環を行うようになすと共に、前
記第1配管(53)の途中に第2電磁弁(SV2)と第
2膨張弁(v2)とをそれぞれ介装させる一方、前記第
2配管(54)の途中に逆止弁(G2)を介装させる。Further, the indoor heat exchange section (51) of the second refrigeration circuit (5)
As in the case of the first refrigeration circuit (4) described above, two first and second pipes (52) are connected between the
3) (54) and connect these pipes (53) (54).
) to the indoor heat exchange section (51) and the outdoor heat exchange section (
52), and a second solenoid valve (SV2) and a second expansion valve (v2) are interposed in the middle of the first pipe (53), respectively. A check valve (G2) is interposed in the middle of the second pipe (54).
更に、前記各冷凍回路(4)(5)に設ける前。Furthermore, before being provided in each of the refrigeration circuits (4) and (5).
記各室内熱交換部(41)(51)は、それぞれ前記テ
スト室(1)の内部で前記開閉扉(19)とは反対側に
重ね合わせた状態で配設し、前記各室内熱交換部(41
)(51)における前記テスト室(1)の壁部側に、1
つの送風ファン(6)を配設すると共に、該送風ファン
(6)を室外側に配設したモータ(61)で回転駆動さ
せるようになす。また、前記テスト室(1)内には、該
テスト室(1)の内部温度を検出するテスト室温度セン
サー(7)を配設し、また、前記予冷室(2)及び予冷
室(3)には、それぞれ予冷室温度センサー(8)及び
予熱室温度センサー(9)を配設している。Each of the indoor heat exchange units (41) and (51) is arranged in a stacked state inside the test chamber (1) on the opposite side of the opening/closing door (19), and (41
) (51) on the wall side of the test chamber (1).
Two ventilation fans (6) are provided, and the ventilation fans (6) are rotationally driven by a motor (61) provided on the outdoor side. Further, a test chamber temperature sensor (7) for detecting the internal temperature of the test chamber (1) is installed in the test chamber (1), and the pre-cooling chamber (2) and the pre-cooling chamber (3) A pre-cooling chamber temperature sensor (8) and a pre-heating chamber temperature sensor (9) are disposed in each of the chambers.
次に、以上の構成とした冷熱衝撃試験装置の作用を、第
2図に基づき乍ら説明する。この第2図は縦軸に温度(
’C)を、横軸に時間をとった前記テスト室(1)と予
冷室(2)及び予熱室(3)での温度変化を示すもので
あり、読図において、実線(イ)は、前記テスト室(1
)での温度変化を示し、また、点線(ロ)は、前記予熱
室(3)での温度変化を示し、更に、−点鎖線(ハ)は
、前記予冷室(2)での温度変化を示している。Next, the operation of the thermal shock test apparatus having the above structure will be explained based on FIG. 2. In this second figure, the vertical axis is temperature (
'C) shows the temperature changes in the test chamber (1), pre-cooling chamber (2) and pre-heating chamber (3) with time plotted on the horizontal axis; in the reading, the solid line (A) is Test room (1
), the dotted line (b) shows the temperature change in the preheating chamber (3), and the - dotted line (c) shows the temperature change in the precooling chamber (2). It shows.
前記テスト室(1)の内部で被試験品の冷熱衝撃試験を
行う場合には、予め、前記予熱室(3)の内部を、所定
の高温さらし温度(THI)よりも若干高い温度(TH
2)に保持すると共に、前記予冷室(2)の内部を、所
定の低温さらし温度(TLI)よりも若干低い温度(T
L2)に保持する。When performing a thermal shock test on a test object inside the test chamber (1), the inside of the preheating chamber (3) is heated to a temperature (THI) slightly higher than the predetermined high temperature exposure temperature (THI).
2), and the inside of the precooling chamber (2) is maintained at a temperature (TLI) slightly lower than the predetermined low temperature exposure temperature (TLI).
L2).
そして、以上の準備を行った後に、同図の実線(イ)で
示したごとく、先ず、前記第3.第4切換ダンパ(17
)(18)を開放し、前記予熱室(3)内の加熱空気を
前記テスト室(1)側へと導入させることにより、前記
予熱室(3)の内部温度(TH2)が低くなると同時に
、前記テスト室(1)の内部温度が所定の高温さらし温
度(TH1)にまで上昇され、この高温さらし温度(T
H1)で前記被試験品の所定時間にわたる高温さらしが
行われる。また、斯かる高温さらし時に、前記第1冷凍
回路(4)は作動することがなく、前記第1電磁弁(S
VI)が閉鎖状態に保持され、かつ、前記テスト室(1
)が高温状態に保持されているため、前記第1冷凍回路
(4)の室内熱交換部(41)で冷媒が蒸発され、この
冷媒が前記逆止弁(G1)を介して前記室外熱交換部(
42)に至り、該室外熱交換部(42)において凝縮状
態で貯溜される。After making the above preparations, first, as shown by the solid line (A) in the same figure, the third. 4th switching damper (17
) (18) is opened and the heated air in the preheating chamber (3) is introduced into the test chamber (1), thereby lowering the internal temperature (TH2) of the preheating chamber (3). The internal temperature of the test chamber (1) is raised to a predetermined high temperature exposure temperature (TH1), and this high temperature exposure temperature (T
In H1), the test article is exposed to high temperature for a predetermined period of time. Further, during such high temperature exposure, the first refrigeration circuit (4) does not operate, and the first solenoid valve (S
VI) is kept closed and said test chamber (1
) is maintained at a high temperature, the refrigerant is evaporated in the indoor heat exchange section (41) of the first refrigeration circuit (4), and this refrigerant is transferred to the outdoor heat exchanger via the check valve (G1). Department (
42) and is stored in a condensed state in the outdoor heat exchange section (42).
次に、以上の高温さらしを行った後には、前記第3.第
4切換ダンパ(17)(18)が閉鎖されて、前記第1
冷凍回路(4)が作動され、つまり、前記第1電磁弁(
SVI)が開動作されて、前記室外熱交換部(42)に
貯溜された凝縮冷媒が、前記第1膨張弁(V1)から前
記室内熱交換部(41)に自然落下で供給されて、該熱
交換部(41)で蒸発され、これに伴い前記テスト室(
1)の内部温度が常温(例えば25℃)にまで冷却され
て、斯かる常温状態で前記被試験品の常温さらしが所定
時間にわたって行われる。Next, after performing the above-mentioned high-temperature exposure, the third. The fourth switching damper (17) (18) is closed and the first switching damper (17) (18) is closed.
The refrigeration circuit (4) is activated, that is, the first solenoid valve (
SVI) is opened, and the condensed refrigerant stored in the outdoor heat exchange section (42) is supplied from the first expansion valve (V1) to the indoor heat exchange section (41) by gravity, and It is evaporated in the heat exchange section (41), and along with this, the test chamber (
The internal temperature of step 1) is cooled to room temperature (for example, 25° C.), and the test article is exposed to room temperature for a predetermined period of time in this room temperature state.
また、以上の常温さらしを行った後には、前記第1.第
2切換ダンパ(13)(14)を開放させて、前記予冷
室(2)内の冷却空気を前記テス)室(1)側へと導入
することにより、前記予冷室(2)の内部温度(TL2
)が上昇すると同時に、前記テスト室(1)の内部温度
が低温さらし温度(TLI)にまで冷却され、この低温
さらし温度(TLI)で前記被試験品の所定時間にわた
る低温さらしが行われる。また、斯かる低温さらし時に
、前記第2冷凍回路(5)は作動することがなく、前記
第2電磁弁(SV2)が閉鎖状態に保持され、かつ、前
記テスト室(1)が低温状態に保持されているため、前
記第2冷凍回路(5)の室内熱交換部(51)で冷媒が
凝縮される。Moreover, after performing the above room temperature exposure, the above-mentioned step 1. By opening the second switching dampers (13) and (14) and introducing the cooling air in the precooling chamber (2) into the test chamber (1), the internal temperature of the precooling chamber (2) is increased. (TL2
) increases, the internal temperature of the test chamber (1) is cooled down to the low temperature exposure temperature (TLI), and the test article is subjected to low temperature exposure for a predetermined period of time at this low temperature exposure temperature (TLI). Further, during such low temperature exposure, the second refrigeration circuit (5) does not operate, the second solenoid valve (SV2) is maintained in a closed state, and the test chamber (1) is kept in a low temperature state. Since the refrigerant is retained, the refrigerant is condensed in the indoor heat exchange section (51) of the second refrigeration circuit (5).
更に、以上の低温さらしを行った後には、前記第1.第
2切換ダンパ(13)(14)が閉鎖されて、前記第2
冷凍回路(5)が作動され、つまり、前記第2電磁弁(
SV2)が開動作されて、前記室内熱交換部(51)に
貯溜された凝縮冷媒が、前記第2膨張弁(v2)から前
記室外熱交換部(52)に自然落下で供給されて蒸発さ
れ、この蒸発冷媒が前記室内熱交換部(51)側に供給
されて凝縮されるために、このときの凝縮熱で前記テス
ト室(1)の内部温度が常温(例えば25℃)にまで加
熱されて、斯かる常温状態で再度前配液試験品の常温さ
らしが所定時間にわたって行われる。以上のように、高
温さらしと常温さらし及び低温さらしが順次繰り返えさ
れて、前記被試験品の冷熱衝撃試験が行われる。Furthermore, after performing the above low-temperature exposure, the above-mentioned step 1. The second switching damper (13) (14) is closed and the second switching damper (13) (14) is closed.
The refrigeration circuit (5) is activated, that is, the second solenoid valve (
SV2) is opened, and the condensed refrigerant stored in the indoor heat exchange section (51) is supplied from the second expansion valve (v2) to the outdoor heat exchange section (52) by gravity and evaporated. Since this evaporative refrigerant is supplied to the indoor heat exchange section (51) and condensed, the internal temperature of the test chamber (1) is heated to room temperature (for example, 25° C.) by the heat of condensation at this time. Then, the pre-liquid distribution test article is exposed to room temperature again for a predetermined period of time at room temperature. As described above, the thermal shock test of the test article is performed by sequentially repeating high temperature exposure, room temperature exposure, and low temperature exposure.
以上のように、高温さらしや低温さらしを行った後に、
前記テスト室(1)内を常温状態となして、前記被試験
品の常温さらしを行うとき、前記テスト室(1)は外気
に開放されることなく、該テスト室(1)が外気と遮断
された状態で、前記第1及び第2冷凍回路(4)(5)
が選択的に作動されて、前記テスト室(1)が常温状態
とされるのであり、従って、以上の低温さらしを行うと
き、前記予冷室(2)の冷却器(21)などでの着氷発
生が殆どなく、デフロスト運転サイクルを大幅に延長で
きて、高能率運転が可能となる。As mentioned above, after high temperature and low temperature exposure,
When the test chamber (1) is kept at room temperature and the test item is exposed to room temperature, the test chamber (1) is not opened to the outside air, but the test chamber (1) is isolated from the outside air. The first and second refrigeration circuits (4) (5)
is selectively activated to bring the test chamber (1) to room temperature. Therefore, when performing the above-mentioned low-temperature exposure, there is no possibility of icing forming in the cooler (21) of the pre-cooling chamber (2), etc. Almost no generation occurs, the defrost operation cycle can be significantly extended, and highly efficient operation is possible.
次に、以上のことを、第3図に示したフローチャートに
基づいて説明する。Next, the above will be explained based on the flowchart shown in FIG.
先ず、スタート開始に伴い、冷熱衝撃試験装置が高温さ
らしモード(ステップ1)で運転され、前記テスト室(
1)内で前記被試験品の所定時間にわたる高温さらしが
行われ、この後、常温さらしモード(ステップ2)によ
る運転が開始され、ステップ3において、常温さらしタ
イマがカウントを開始し、ステップ4において、前記第
1冷凍回路(4)に備えた第1電磁弁(SVI)が開動
作され、これと同時に前記テスト室(1)内に設けた送
風ファン(6)が駆動され、次に、ステップ5において
、前記タイマがカウントアツプしたか否かが判断され、
ノーの場合には、ステップ6において、前記テスト室(
1)内に配設した前記温度センサー(7)による検出温
度が、常温(例えば25℃)と同等か小であるかが判断
され、ノーの場合、即ち、前記テスト室(1)が常温以
上のときには、前記前記ステップ4へとリターンされ、
また、イエスの場合には、即ち、前記テスト室(1)が
常温と同等又は以下にまで冷却されたときには、ステッ
プ7において、前記第1電磁弁(SVI)が閉鎖され、
これと同時に前記送風ファン(6)が停止される。First, with the start, the thermal shock test device is operated in high temperature exposure mode (step 1), and the test chamber (
In step 1), the test article is exposed to high temperature for a predetermined period of time, after which operation is started in the room temperature exposure mode (step 2), in step 3 the room temperature exposure timer starts counting, and in step 4 , the first solenoid valve (SVI) provided in the first refrigeration circuit (4) is opened, and at the same time the blower fan (6) provided in the test chamber (1) is driven. 5, it is determined whether the timer has counted up;
If no, in step 6 the test chamber (
1) It is determined whether the temperature detected by the temperature sensor (7) installed in the test chamber (1) is equal to or lower than room temperature (for example, 25 degrees Celsius), and if no, that is, the temperature of the test chamber (1) is above room temperature. When , the process returns to step 4,
Further, in the case of YES, that is, when the test chamber (1) has been cooled to a temperature equal to or lower than room temperature, in step 7, the first solenoid valve (SVI) is closed;
At the same time, the blower fan (6) is stopped.
また、前記ステップ5において、イエスの場合は、即ち
、タイマが既にカウントアツプしているときには、低温
さらしモード運転(ステップ8)に移行され、前記テス
ト室(1)内で前記被試験品の所定時間にわたる低温さ
らしが行われ、この後、常温さらしモード(ステップ9
)による運転が開始され、また、ステップ10において
、常温さらしタイマがカウントを開始し、ステップ11
において、前記第2冷凍回路(5)に備えた第2電磁弁
(SV2)が開動作され、これと同時に前記テスト室(
1)内に設けた送風ファン(6)が駆動され、次に、ス
テップ12において、前記タイマがカウントアツプした
か否かが判断され、イエスの場合は、リターン(ステッ
プ13)され、ノーの場合には、ステップ14において
、前記テスト室(1)内に設けた前記温度センサー(7
)による検出温度が、常温(例えば25℃)と同等か大
であるかが判断され、ノーの場合、即ち、前記テスト室
(1)が常温以下のとき、前記ステップ12へとリター
ンされ、イエスの場合、即ち、前記テスト室(1)が常
温と同程度又は以下にまで加熱されたとき、前記第2電
磁弁(SV2)が閉鎖され、これと同時に前記送風ファ
ン(6)が停止される。In addition, if the answer is YES in step 5, that is, if the timer has already counted up, the operation is shifted to low temperature exposure mode (step 8), and the product under test is placed in the test chamber (1). A low temperature exposure is performed for a period of time, followed by a room temperature exposure mode (step 9).
) is started, and in step 10, the room temperature exposure timer starts counting, and in step 11
, the second solenoid valve (SV2) provided in the second refrigeration circuit (5) is operated to open, and at the same time, the test chamber (
1) The blower fan (6) provided in In step 14, the temperature sensor (7) provided in the test chamber (1) is
) is determined to be equal to or greater than normal temperature (for example, 25°C), and if the result is no, that is, the temperature of the test chamber (1) is below normal temperature, the process returns to step 12, and if the result is YES. In this case, that is, when the test chamber (1) is heated to a temperature equal to or lower than room temperature, the second solenoid valve (SV2) is closed, and at the same time, the blower fan (6) is stopped. .
(発明の効果)
以上説明したように、本発明にかかる冷熱衝撃試験装置
では、室内熱交換部(41)(51)と室外熱交換部(
42)(52)とを備えた2系統の自然循環式冷凍回路
(4)(5)を設けて、これら冷凍回路(4)(5)の
前記各室内熱交換部(41)(51)を、前記テスト室
(1)^に配設し、前記各室外熱交換部(42)(52
)を室外側に配設したから、被試験品の冷熱衝撃試験時
で、前記テスト室(1)内を常温状態となして、前記被
試験品の常温さらしを行うとき、前記テスト室(1)を
外気に開放することなく、該テスト室(1)を外気と遮
断した状態で、前記2系統の自然循環式冷凍回路(4)
(5)により、前記テスト室(1)を常温状態にできる
のであり、従って、前記予冷室(2)側での着氷を少な
くして、デフロスト運転サイクルを大幅に延長でき、高
能率運転を行い得るに至ったのである。(Effects of the Invention) As explained above, in the thermal shock test apparatus according to the present invention, the indoor heat exchange section (41) (51) and the outdoor heat exchange section (
42) (52) are provided, and each indoor heat exchange section (41) (51) of these refrigeration circuits (4) (5) is , arranged in the test room (1)^, and each of the outdoor heat exchange parts (42) (52
) is placed on the outside of the room, so when the test chamber (1) is brought to room temperature and the test article is exposed to room temperature during the thermal shock test of the test object, the test chamber (1) is placed outside the room. ) without opening it to the outside air, and with the test chamber (1) isolated from the outside air, the two natural circulation refrigeration circuits (4)
According to (5), the test chamber (1) can be kept at room temperature. Therefore, icing on the pre-cooling chamber (2) side can be reduced, the defrost operation cycle can be significantly extended, and high-efficiency operation can be achieved. It has now become possible to do so.
第1図は本発明にかかる冷熱衝撃試験装置の断面図、第
2図はテスト室と予冷室及び予熱室での変化状態を説明
する説明図、第3図は同冷熱衝撃試験装置の作用を説明
するフローチャート図、第4図は従来例を示す断面図で
ある。
(1)・・・・・テスト室
(2)・・・・・予冷室
(3)・・・・e予熱室
(4,5)・・・自然循環式冷凍回路
(41,51)・・・室内熱交換部
(42,52)・・・室外熱交換部Fig. 1 is a sectional view of the thermal shock test apparatus according to the present invention, Fig. 2 is an explanatory diagram explaining the test chamber, precooling chamber, and changing conditions in the preheating chamber, and Fig. 3 is an illustration of the operation of the thermal shock test apparatus. The flowchart for explanation and FIG. 4 are cross-sectional views showing a conventional example. (1)...Test chamber (2)...Precooling chamber (3)...e Preheating chamber (4, 5)...Natural circulation refrigeration circuit (41, 51)...・Indoor heat exchange section (42, 52)...Outdoor heat exchange section
Claims (1)
)と予熱室(3)とに連通するテスト室(1)とを備え
、該テスト室(1)を、前記予冷室(2)と予熱室(3
)とに選択的に連通するようにした冷熱衝撃試験装置に
おいて、室内熱交換部(41)(51)と室外熱交換部
(42)(52)とを備えた2系統の自然循環式冷凍回
路(4)(5)を設けて、これら冷凍回路(4)(5)
の各室内熱交換部(41)(51)を、前記テスト室(
1)内に配設し、前記各室外熱交換部(42)(52)
を室外に配設したことを特徴とする冷熱衝撃試験装置。1) Pre-cooling chamber (2) and pre-heating chamber (3) and these pre-cooling chambers (2)
) and a preheating chamber (3), the test chamber (1) is connected to the precooling chamber (2) and the preheating chamber (3).
), a two-system natural circulation refrigeration circuit comprising an indoor heat exchange section (41) (51) and an outdoor heat exchange section (42) (52). (4) (5) are provided, and these refrigeration circuits (4) (5)
Each of the indoor heat exchange parts (41) (51) is connected to the test chamber (
1), each of the outdoor heat exchange parts (42) (52)
A thermal shock test device characterized in that it is installed outdoors.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1337968A JPH087126B2 (en) | 1989-12-25 | 1989-12-25 | Thermal shock test equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1337968A JPH087126B2 (en) | 1989-12-25 | 1989-12-25 | Thermal shock test equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH03195946A true JPH03195946A (en) | 1991-08-27 |
JPH087126B2 JPH087126B2 (en) | 1996-01-29 |
Family
ID=18313689
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1337968A Expired - Lifetime JPH087126B2 (en) | 1989-12-25 | 1989-12-25 | Thermal shock test equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH087126B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108132199A (en) * | 2018-01-30 | 2018-06-08 | 重庆大学 | A kind of hyperthermal material batch thermal shock test device |
CN108132200A (en) * | 2018-01-30 | 2018-06-08 | 重庆大学 | A kind of two-box type thermal shock experiment device for superhigh temperature ceramics |
CN108398349A (en) * | 2018-01-30 | 2018-08-14 | 重庆大学 | A kind of batch type cooling thermal shock rig for superhigh temperature ceramic material |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63153378A (en) * | 1986-12-17 | 1988-06-25 | ダイキン工業株式会社 | Refrigerator |
JPS63150266U (en) * | 1987-03-25 | 1988-10-03 | ||
JPH01274035A (en) * | 1988-04-27 | 1989-11-01 | Hitachi Ltd | Thermal impact tester |
-
1989
- 1989-12-25 JP JP1337968A patent/JPH087126B2/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63153378A (en) * | 1986-12-17 | 1988-06-25 | ダイキン工業株式会社 | Refrigerator |
JPS63150266U (en) * | 1987-03-25 | 1988-10-03 | ||
JPH01274035A (en) * | 1988-04-27 | 1989-11-01 | Hitachi Ltd | Thermal impact tester |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108132199A (en) * | 2018-01-30 | 2018-06-08 | 重庆大学 | A kind of hyperthermal material batch thermal shock test device |
CN108132200A (en) * | 2018-01-30 | 2018-06-08 | 重庆大学 | A kind of two-box type thermal shock experiment device for superhigh temperature ceramics |
CN108398349A (en) * | 2018-01-30 | 2018-08-14 | 重庆大学 | A kind of batch type cooling thermal shock rig for superhigh temperature ceramic material |
CN108132199B (en) * | 2018-01-30 | 2020-08-07 | 重庆大学 | Batch thermal shock testing device for ultra-high temperature materials |
CN108398349B (en) * | 2018-01-30 | 2020-11-06 | 重庆大学 | Batch type cooling thermal shock test device for ultra-high temperature ceramic material |
Also Published As
Publication number | Publication date |
---|---|
JPH087126B2 (en) | 1996-01-29 |
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